
Daniel A. Hess
Examiner (ID: 9166, Phone: (571)272-2392 , Office: P/2876 )
| Most Active Art Unit | 2876 |
| Art Unit(s) | 2876 |
| Total Applications | 2022 |
| Issued Applications | 1569 |
| Pending Applications | 141 |
| Abandoned Applications | 348 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7450045
[patent_doc_number] => 20040067605
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[patent_kind] => A1
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[patent_title] => 'Semiconductor device having additional functional element and method of manufacturing thereof'
[patent_app_type] => new
[patent_app_number] => 10/673401
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Array
(
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[patent_title] => 'Method for fabricating wafer-level chip scale packages'
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Array
(
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[patent_issue_date] => 2005-12-13
[patent_title] => 'Fabrication method of semiconductor integrated circuit device and testing method'
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Array
(
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[patent_title] => 'Monitoring system comprising infrared thermopile detetor'
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Array
(
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[patent_title] => 'Versatile system for diffusion limiting void formation'
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Array
(
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Array
(
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[patent_title] => 'Optically stimulated electron emission contamination monitor and method'
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[firstpage_image] =>[orig_patent_app_number] => 10662161
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/662161 | Optically stimulated electron emission contamination monitor and method | Sep 10, 2003 | Issued |
Array
(
[id] => 7352684
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[patent_title] => 'Mask repair with electron beam-induced chemical etching'
[patent_app_type] => new
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/659961 | Method of repairing an opaque defect on a mask with electron beam-induced chemical etching | Sep 9, 2003 | Issued |
Array
(
[id] => 7212472
[patent_doc_number] => 20050054125
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[patent_issue_date] => 2005-03-10
[patent_title] => 'Method and apparatus for thermally assisted testing of integrated circuits'
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Array
(
[id] => 7154504
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[patent_issue_date] => 2005-04-21
[patent_title] => 'Package for a semiconductor device'
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[patent_app_number] => 10/651522
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/651522 | Package for semiconductor device having a device-supporting polymeric material covering a solder ball array area | Aug 28, 2003 | Issued |
Array
(
[id] => 7212476
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[patent_title] => 'System and method for marking the surface of a semiconductor package'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/651771 | System and method for marking the surface of a semiconductor package | Aug 28, 2003 | Abandoned |
Array
(
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Array
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Array
(
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[patent_title] => 'Integrated semiconductor structure for reliability tests of dielectrics'
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Array
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Array
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Array
(
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/632471 | Testing multiple levels in integrated circuit technology development | Jul 31, 2003 | Issued |