
Daniel D. Chang
Examiner (ID: 9281, Phone: (571)272-1801 , Office: P/2844 )
| Most Active Art Unit | 2844 |
| Art Unit(s) | 2844, 0, 2819 |
| Total Applications | 2537 |
| Issued Applications | 2319 |
| Pending Applications | 103 |
| Abandoned Applications | 143 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7019494
[patent_doc_number] => 20050221513
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-06
[patent_title] => 'Method of controlling trimming of a gate electrode structure'
[patent_app_type] => utility
[patent_app_number] => 10/812952
[patent_app_country] => US
[patent_app_date] => 2004-03-31
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0221/20050221513.pdf
[firstpage_image] =>[orig_patent_app_number] => 10812952
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/812952 | Method of controlling trimming of a gate electrode structure | Mar 30, 2004 | Abandoned |
Array
(
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[patent_doc_number] => 20050217796
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[patent_kind] => A1
[patent_issue_date] => 2005-10-06
[patent_title] => 'Techniques for packaging and encapsulating components of diagnostic plasma measurement devices'
[patent_app_type] => utility
[patent_app_number] => 10/815124
[patent_app_country] => US
[patent_app_date] => 2004-03-31
[patent_effective_date] => 0000-00-00
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Array
(
[id] => 5690972
[patent_doc_number] => 20060151117
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-07-13
[patent_title] => 'Semiconductor producing device and semiconductor producing method'
[patent_app_type] => utility
[patent_app_number] => 10/544937
[patent_app_country] => US
[patent_app_date] => 2004-03-30
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/544937 | Semiconductor producing device and semiconductor producing method | Mar 29, 2004 | Abandoned |
Array
(
[id] => 7015353
[patent_doc_number] => 20050217795
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-06
[patent_title] => 'Method of plasma etch endpoint detection using a V-I probe diagnostics'
[patent_app_type] => utility
[patent_app_number] => 10/813829
[patent_app_country] => US
[patent_app_date] => 2004-03-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 3680
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/813829 | Method of plasma etch endpoint detection using a V-I probe diagnostics | Mar 29, 2004 | Abandoned |
Array
(
[id] => 7372714
[patent_doc_number] => 20040177925
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-09-16
[patent_title] => 'Plasma processing system and apparatus and a sample processing method'
[patent_app_type] => new
[patent_app_number] => 10/810598
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[patent_app_date] => 2004-03-29
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[firstpage_image] =>[orig_patent_app_number] => 10810598
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/810598 | Plasma processing system and apparatus and a sample processing method | Mar 28, 2004 | Abandoned |
Array
(
[id] => 7372704
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[patent_kind] => A1
[patent_issue_date] => 2004-09-16
[patent_title] => 'Data processing apparatus for semiconductor processing apparatus'
[patent_app_type] => new
[patent_app_number] => 10/807181
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[firstpage_image] =>[orig_patent_app_number] => 10807181
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/807181 | Data processing apparatus for semiconductor processing apparatus | Mar 23, 2004 | Abandoned |
Array
(
[id] => 7264156
[patent_doc_number] => 20040241995
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[patent_kind] => A1
[patent_issue_date] => 2004-12-02
[patent_title] => 'Etching apparatus and etching method'
[patent_app_type] => new
[patent_app_number] => 10/807191
[patent_app_country] => US
[patent_app_date] => 2004-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[pdf_file] => publications/A1/0241/20040241995.pdf
[firstpage_image] =>[orig_patent_app_number] => 10807191
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/807191 | Etching apparatus and etching method | Mar 23, 2004 | Abandoned |
Array
(
[id] => 7332276
[patent_doc_number] => 20040188021
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-09-30
[patent_title] => 'Method and system for monitoring RF impedance to determine conditions of a wafer on an electrostatic chuck'
[patent_app_type] => new
[patent_app_number] => 10/807439
[patent_app_country] => US
[patent_app_date] => 2004-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => publications/A1/0188/20040188021.pdf
[firstpage_image] =>[orig_patent_app_number] => 10807439
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/807439 | Method and system for monitoring RF impedance to determine conditions of a wafer on an electrostatic chuck | Mar 23, 2004 | Issued |
Array
(
[id] => 6980395
[patent_doc_number] => 20050150463
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-14
[patent_title] => 'Holder for sample materials used in high throughput physical vapor deposition material studies'
[patent_app_type] => utility
[patent_app_number] => 10/800553
[patent_app_country] => US
[patent_app_date] => 2004-03-15
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[patent_drawing_sheets_cnt] => 7
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/800553 | Holder for sample materials used in high throughput physical vapor deposition material studies | Mar 14, 2004 | Abandoned |
Array
(
[id] => 7143681
[patent_doc_number] => 20040169012
[patent_country] => US
[patent_kind] => A1
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[patent_title] => 'Cleaning of semiconductor wafers by contaminate encapsulation'
[patent_app_type] => new
[patent_app_number] => 10/798816
[patent_app_country] => US
[patent_app_date] => 2004-03-10
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[patent_drawing_sheets_cnt] => 4
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/798816 | Cleaning of semiconductor wafers by contaminate encapsulation | Mar 9, 2004 | Issued |
Array
(
[id] => 7142979
[patent_doc_number] => 20040168632
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-09-02
[patent_title] => 'Manufacturing system in electronic devices'
[patent_app_type] => new
[patent_app_number] => 10/794057
[patent_app_country] => US
[patent_app_date] => 2004-03-08
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/794057 | Manufacturing system in electronic devices | Mar 7, 2004 | Abandoned |
Array
(
[id] => 7029760
[patent_doc_number] => 20050028934
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[patent_kind] => A1
[patent_issue_date] => 2005-02-10
[patent_title] => 'Apparatus and method for plasma etching'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/793886 | Apparatus and method for plasma etching | Mar 7, 2004 | Abandoned |
Array
(
[id] => 7212945
[patent_doc_number] => 20050054205
[patent_country] => US
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[patent_issue_date] => 2005-03-10
[patent_title] => 'Mask trimming apparatus and mask trimming method'
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[firstpage_image] =>[orig_patent_app_number] => 10790212
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/790212 | Mask trimming apparatus and mask trimming method | Mar 1, 2004 | Abandoned |
Array
(
[id] => 6942047
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/790185 | Semiconductor production apparatus | Mar 1, 2004 | Abandoned |
Array
(
[id] => 7372696
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Array
(
[id] => 7429515
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Array
(
[id] => 7465173
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[patent_title] => 'processing method'
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Array
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Array
(
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Array
(
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[patent_title] => 'Device for producing electroconductive passages in a semiconductor wafer by means of thermomigration'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/542662 | Device for producing electroconductive passages in a semiconductor wafer by means of thermomigration | Jan 19, 2004 | Abandoned |