Search

Daniel H. Miller

Examiner (ID: 17167, Phone: (571)272-1534 , Office: P/1783 )

Most Active Art Unit
1783
Art Unit(s)
1775, 1794, 1783
Total Applications
896
Issued Applications
456
Pending Applications
70
Abandoned Applications
381

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18059235 [patent_doc_number] => 20220390321 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => SPECTRAL AVERAGING OF OTDR TRACES [patent_app_type] => utility [patent_app_number] => 17/738295 [patent_app_country] => US [patent_app_date] => 2022-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8589 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17738295 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/738295
Spectral averaging of OTDR traces May 5, 2022 Issued
Array ( [id] => 18755210 [patent_doc_number] => 20230358637 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-09 [patent_title] => APPARATUSES AND METHODS FOR ANALYZING MULTIPLE OPTICAL SIGNALS IN PARALLEL [patent_app_type] => utility [patent_app_number] => 17/737067 [patent_app_country] => US [patent_app_date] => 2022-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5722 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17737067 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/737067
Apparatuses and methods for analyzing multiple optical signals in parallel May 4, 2022 Issued
Array ( [id] => 18981225 [patent_doc_number] => 11906389 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-02-20 [patent_title] => System and method for assisting in fiber optic splices [patent_app_type] => utility [patent_app_number] => 17/660077 [patent_app_country] => US [patent_app_date] => 2022-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 10344 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 265 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17660077 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/660077
System and method for assisting in fiber optic splices Apr 20, 2022 Issued
Array ( [id] => 20227931 [patent_doc_number] => 12416580 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-16 [patent_title] => Method and system for in-line optical scatterometry [patent_app_type] => utility [patent_app_number] => 17/726023 [patent_app_country] => US [patent_app_date] => 2022-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 3654 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17726023 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/726023
Method and system for in-line optical scatterometry Apr 20, 2022 Issued
Array ( [id] => 20242427 [patent_doc_number] => 12422743 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-23 [patent_title] => Method for measuring a reflectivity of an object for measurement light and metrology system for carrying out the method [patent_app_type] => utility [patent_app_number] => 17/721750 [patent_app_country] => US [patent_app_date] => 2022-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 3291 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17721750 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/721750
Method for measuring a reflectivity of an object for measurement light and metrology system for carrying out the method Apr 14, 2022 Issued
Array ( [id] => 17961232 [patent_doc_number] => 20220341813 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-27 [patent_title] => OPTICAL PULSE TESTER [patent_app_type] => utility [patent_app_number] => 17/715586 [patent_app_country] => US [patent_app_date] => 2022-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6121 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17715586 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/715586
Optical pulse tester Apr 6, 2022 Issued
Array ( [id] => 17961231 [patent_doc_number] => 20220341812 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-27 [patent_title] => OPTICAL PULSE TESTER [patent_app_type] => utility [patent_app_number] => 17/715580 [patent_app_country] => US [patent_app_date] => 2022-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7587 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17715580 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/715580
OPTICAL PULSE TESTER Apr 6, 2022 Abandoned
Array ( [id] => 18486530 [patent_doc_number] => 20230213875 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-06 [patent_title] => SCANNING OVERLAY METROLOGY USING OVERLAY TARGETS HAVING MULTIPLE SPATIAL FREQUENCIES [patent_app_type] => utility [patent_app_number] => 17/709104 [patent_app_country] => US [patent_app_date] => 2022-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10927 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17709104 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/709104
Scanning overlay metrology using overlay targets having multiple spatial frequencies Mar 29, 2022 Issued
Array ( [id] => 18780139 [patent_doc_number] => 11821849 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-11-21 [patent_title] => Defective product determination method for vehicle wheel, non-transitory storage medium, and defective product determination device for vehicle wheel [patent_app_type] => utility [patent_app_number] => 17/690622 [patent_app_country] => US [patent_app_date] => 2022-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7300 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17690622 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/690622
Defective product determination method for vehicle wheel, non-transitory storage medium, and defective product determination device for vehicle wheel Mar 8, 2022 Issued
Array ( [id] => 20316959 [patent_doc_number] => 12455509 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-28 [patent_title] => Semiconductor structure and system for manufacturing the same [patent_app_type] => utility [patent_app_number] => 17/679311 [patent_app_country] => US [patent_app_date] => 2022-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 5633 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17679311 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/679311
Semiconductor structure and system for manufacturing the same Feb 23, 2022 Issued
Array ( [id] => 20026011 [patent_doc_number] => 20250164233 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-22 [patent_title] => DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR [patent_app_type] => utility [patent_app_number] => 18/841193 [patent_app_country] => US [patent_app_date] => 2022-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 262 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18841193 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/841193
DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR Feb 22, 2022 Pending
Array ( [id] => 20116821 [patent_doc_number] => 12366521 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-22 [patent_title] => Circularly polarized light illuminator, analysis device, and microscope [patent_app_type] => utility [patent_app_number] => 18/547335 [patent_app_country] => US [patent_app_date] => 2022-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 27 [patent_no_of_words] => 5832 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18547335 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/547335
Circularly polarized light illuminator, analysis device, and microscope Feb 8, 2022 Issued
Array ( [id] => 18531042 [patent_doc_number] => 20230236113 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-27 [patent_title] => ANNULAR APODIZER FOR SMALL TARGET OVERLAY MEASUREMENT [patent_app_type] => utility [patent_app_number] => 17/584335 [patent_app_country] => US [patent_app_date] => 2022-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2966 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17584335 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/584335
Annular apodizer for small target overlay measurement Jan 24, 2022 Issued
Array ( [id] => 20789472 [patent_doc_number] => 12663383 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-06-23 [patent_title] => Method of evaluating silicon single-crystal ingot, method of evaluating silicon epitaxial wafer, method of manufacturing silicon epitaxial wafer, and method of evaluating silicon mirror polished wafer [patent_app_type] => utility [patent_app_number] => 18/562575 [patent_app_country] => US [patent_app_date] => 2022-01-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2705 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18562575 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/562575
METHOD OF EVALUATING SILICON SINGLE-CRYSTAL INGOT, METHOD OF EVALUATING SILICON EPITAXIAL WAFER, METHOD OF MANUFACTURING SILICON EPITAXIAL WAFER, AND METHOD OF EVALUATING SILICON MIRROR POLISHED WAFER Jan 19, 2022 Issued
Array ( [id] => 18479592 [patent_doc_number] => 11693328 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-04 [patent_title] => Measurement apparatus, lithography apparatus and article manufacturing method [patent_app_type] => utility [patent_app_number] => 17/578578 [patent_app_country] => US [patent_app_date] => 2022-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 22 [patent_no_of_words] => 12746 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17578578 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/578578
Measurement apparatus, lithography apparatus and article manufacturing method Jan 18, 2022 Issued
Array ( [id] => 19326954 [patent_doc_number] => 12044631 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-07-23 [patent_title] => Wafer surface defect inspection method and apparatus thereof [patent_app_type] => utility [patent_app_number] => 17/574565 [patent_app_country] => US [patent_app_date] => 2022-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 6320 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 309 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17574565 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/574565
Wafer surface defect inspection method and apparatus thereof Jan 12, 2022 Issued
Array ( [id] => 18667477 [patent_doc_number] => 11774368 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-03 [patent_title] => Light table apparatus and methods for inspecting heat exchanger plates for defects using light [patent_app_type] => utility [patent_app_number] => 17/567630 [patent_app_country] => US [patent_app_date] => 2022-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 10506 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 249 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17567630 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/567630
Light table apparatus and methods for inspecting heat exchanger plates for defects using light Jan 2, 2022 Issued
Array ( [id] => 18345530 [patent_doc_number] => 20230133640 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-04 [patent_title] => MOIRE SCATTEROMETRY OVERLAY [patent_app_type] => utility [patent_app_number] => 17/562844 [patent_app_country] => US [patent_app_date] => 2021-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10807 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -36 [patent_words_short_claim] => 326 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17562844 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/562844
Moire scatterometry overlay Dec 26, 2021 Issued
Array ( [id] => 17689094 [patent_doc_number] => 20220196386 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-06-23 [patent_title] => THREE-DIMENSIONAL SCANNER WITH EVENT CAMERA [patent_app_type] => utility [patent_app_number] => 17/645375 [patent_app_country] => US [patent_app_date] => 2021-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5713 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17645375 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/645375
THREE-DIMENSIONAL SCANNER WITH EVENT CAMERA Dec 20, 2021 Abandoned
Array ( [id] => 19061164 [patent_doc_number] => 11940389 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-26 [patent_title] => Device for recognizing defects in finished surface of product [patent_app_type] => utility [patent_app_number] => 17/551526 [patent_app_country] => US [patent_app_date] => 2021-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2767 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17551526 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/551526
Device for recognizing defects in finished surface of product Dec 14, 2021 Issued
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