Search

Darren W. Ark

Examiner (ID: 2038, Phone: (571)272-6885 , Office: P/3643 )

Most Active Art Unit
3647
Art Unit(s)
3647, 3205, 3616, 3643
Total Applications
2764
Issued Applications
1616
Pending Applications
196
Abandoned Applications
968

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8959315 [patent_doc_number] => 08505109 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-08-06 [patent_title] => 'Measuring probe device for a probe microscope, measuring cell and scanning probe microscope' [patent_app_type] => utility [patent_app_number] => 12/670561 [patent_app_country] => US [patent_app_date] => 2008-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 5749 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12670561 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/670561
Measuring probe device for a probe microscope, measuring cell and scanning probe microscope Jul 23, 2008 Issued
Array ( [id] => 7545753 [patent_doc_number] => 08053726 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-08 [patent_title] => 'Inspection system by charged particle beam and method of manufacturing devices using the system' [patent_app_type] => utility [patent_app_number] => 12/216233 [patent_app_country] => US [patent_app_date] => 2008-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 50 [patent_figures_cnt] => 62 [patent_no_of_words] => 52327 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 251 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/053/08053726.pdf [firstpage_image] =>[orig_patent_app_number] => 12216233 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/216233
Inspection system by charged particle beam and method of manufacturing devices using the system Jun 30, 2008 Issued
Array ( [id] => 6074812 [patent_doc_number] => 20110047662 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-24 [patent_title] => 'APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFERENT MATERIALS' [patent_app_type] => utility [patent_app_number] => 12/666745 [patent_app_country] => US [patent_app_date] => 2008-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2224 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0047/20110047662.pdf [firstpage_image] =>[orig_patent_app_number] => 12666745 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/666745
Apparatus and method for investigating surface properties of different materials Jun 25, 2008 Issued
Array ( [id] => 5439236 [patent_doc_number] => 20090090875 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-09 [patent_title] => 'Higher pressure, modular target system for radioisotope production' [patent_app_type] => utility [patent_app_number] => 12/213614 [patent_app_country] => US [patent_app_date] => 2008-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4833 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20090090875.pdf [firstpage_image] =>[orig_patent_app_number] => 12213614 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/213614
Higher pressure, modular target system for radioisotope production Jun 22, 2008 Abandoned
Array ( [id] => 4537408 [patent_doc_number] => 07888662 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-15 [patent_title] => 'Ion source cleaning method and apparatus' [patent_app_type] => utility [patent_app_number] => 12/143247 [patent_app_country] => US [patent_app_date] => 2008-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3691 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/888/07888662.pdf [firstpage_image] =>[orig_patent_app_number] => 12143247 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/143247
Ion source cleaning method and apparatus Jun 19, 2008 Issued
Array ( [id] => 5582616 [patent_doc_number] => 20090101818 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-23 [patent_title] => 'Corrector' [patent_app_type] => utility [patent_app_number] => 12/213493 [patent_app_country] => US [patent_app_date] => 2008-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4433 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0101/20090101818.pdf [firstpage_image] =>[orig_patent_app_number] => 12213493 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/213493
Corrector Jun 19, 2008 Issued
Array ( [id] => 103625 [patent_doc_number] => 07723706 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-25 [patent_title] => 'Horizontal and vertical beam angle measurement technique' [patent_app_type] => utility [patent_app_number] => 12/142553 [patent_app_country] => US [patent_app_date] => 2008-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3573 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/723/07723706.pdf [firstpage_image] =>[orig_patent_app_number] => 12142553 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/142553
Horizontal and vertical beam angle measurement technique Jun 18, 2008 Issued
Array ( [id] => 64810 [patent_doc_number] => 07759657 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-20 [patent_title] => 'Methods for implanting B22Hx and its ionized lower mass byproducts' [patent_app_type] => utility [patent_app_number] => 12/142081 [patent_app_country] => US [patent_app_date] => 2008-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6905 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/759/07759657.pdf [firstpage_image] =>[orig_patent_app_number] => 12142081 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/142081
Methods for implanting B22Hx and its ionized lower mass byproducts Jun 18, 2008 Issued
Array ( [id] => 4756517 [patent_doc_number] => 20080308742 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'IN-CHAMBER ELECTRON DETECTOR' [patent_app_type] => utility [patent_app_number] => 12/141723 [patent_app_country] => US [patent_app_date] => 2008-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3892 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0308/20080308742.pdf [firstpage_image] =>[orig_patent_app_number] => 12141723 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/141723
In-chamber electron detector Jun 17, 2008 Issued
Array ( [id] => 103624 [patent_doc_number] => 07723705 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-25 [patent_title] => 'Techniques for measuring ion beam emittance' [patent_app_type] => utility [patent_app_number] => 12/141570 [patent_app_country] => US [patent_app_date] => 2008-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 5287 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 40 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/723/07723705.pdf [firstpage_image] =>[orig_patent_app_number] => 12141570 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/141570
Techniques for measuring ion beam emittance Jun 17, 2008 Issued
Array ( [id] => 4758478 [patent_doc_number] => 20080310704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'SCANNING ELECTRON MICROSCOPE AND METHOD OF IMAGING AN OBJECT BY USING THE SCANNING ELECTRON MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 12/139970 [patent_app_country] => US [patent_app_date] => 2008-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5384 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0310/20080310704.pdf [firstpage_image] =>[orig_patent_app_number] => 12139970 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/139970
Scanning electron microscope and method of imaging an object by using the scanning electron microscope Jun 15, 2008 Issued
Array ( [id] => 4849371 [patent_doc_number] => 20080315113 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-25 [patent_title] => 'BEAM GUIDANCE MAGNET' [patent_app_type] => utility [patent_app_number] => 12/138774 [patent_app_country] => US [patent_app_date] => 2008-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5376 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20080315113.pdf [firstpage_image] =>[orig_patent_app_number] => 12138774 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/138774
BEAM GUIDANCE MAGNET Jun 12, 2008 Abandoned
Array ( [id] => 4600543 [patent_doc_number] => 07977658 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-07-12 [patent_title] => 'Flexible infrared delivery apparatus and method' [patent_app_type] => utility [patent_app_number] => 12/137691 [patent_app_country] => US [patent_app_date] => 2008-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 29 [patent_no_of_words] => 5255 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/977/07977658.pdf [firstpage_image] =>[orig_patent_app_number] => 12137691 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/137691
Flexible infrared delivery apparatus and method Jun 11, 2008 Issued
Array ( [id] => 4563226 [patent_doc_number] => 07838832 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-11-23 [patent_title] => 'Electron beam apparatus and inspection method using dual illumination beams with dynamically controllable offsets' [patent_app_type] => utility [patent_app_number] => 12/135058 [patent_app_country] => US [patent_app_date] => 2008-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5411 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/838/07838832.pdf [firstpage_image] =>[orig_patent_app_number] => 12135058 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/135058
Electron beam apparatus and inspection method using dual illumination beams with dynamically controllable offsets Jun 5, 2008 Issued
Array ( [id] => 4462098 [patent_doc_number] => 07880139 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-01 [patent_title] => 'Method and apparatus of uniform gas-phase molecular matrix deposition for imaging mass spectrometry' [patent_app_type] => utility [patent_app_number] => 12/154912 [patent_app_country] => US [patent_app_date] => 2008-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 4304 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/880/07880139.pdf [firstpage_image] =>[orig_patent_app_number] => 12154912 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/154912
Method and apparatus of uniform gas-phase molecular matrix deposition for imaging mass spectrometry May 27, 2008 Issued
Array ( [id] => 72540 [patent_doc_number] => 07755038 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-13 [patent_title] => 'Nanostructured thin films and their uses' [patent_app_type] => utility [patent_app_number] => 12/121008 [patent_app_country] => US [patent_app_date] => 2008-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 27 [patent_no_of_words] => 9076 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/755/07755038.pdf [firstpage_image] =>[orig_patent_app_number] => 12121008 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/121008
Nanostructured thin films and their uses May 14, 2008 Issued
Array ( [id] => 6020928 [patent_doc_number] => 20110049353 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-03 [patent_title] => 'Mass Spectrometer' [patent_app_type] => utility [patent_app_number] => 12/600209 [patent_app_country] => US [patent_app_date] => 2008-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6240 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0049/20110049353.pdf [firstpage_image] =>[orig_patent_app_number] => 12600209 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/600209
Mass spectrometer May 13, 2008 Issued
Array ( [id] => 4723780 [patent_doc_number] => 20080203321 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'Radiation Source for Irradiating the Interior Walls of Elongated Cavities' [patent_app_type] => utility [patent_app_number] => 12/115569 [patent_app_country] => US [patent_app_date] => 2008-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2898 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0203/20080203321.pdf [firstpage_image] =>[orig_patent_app_number] => 12115569 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/115569
Radiation source for irradiating the interior walls of elongated cavities May 5, 2008 Issued
Array ( [id] => 63463 [patent_doc_number] => 07763849 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-07-27 [patent_title] => 'Reflecting ion cyclotron resonance cell' [patent_app_type] => utility [patent_app_number] => 12/113813 [patent_app_country] => US [patent_app_date] => 2008-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8856 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/763/07763849.pdf [firstpage_image] =>[orig_patent_app_number] => 12113813 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/113813
Reflecting ion cyclotron resonance cell Apr 30, 2008 Issued
Array ( [id] => 5483135 [patent_doc_number] => 20090272900 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-05 [patent_title] => 'Pattern Invariant Focusing of a Charged Particle Beam' [patent_app_type] => utility [patent_app_number] => 12/112913 [patent_app_country] => US [patent_app_date] => 2008-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 6809 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0272/20090272900.pdf [firstpage_image] =>[orig_patent_app_number] => 12112913 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/112913
Pattern invariant focusing of a charged particle beam Apr 29, 2008 Issued
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