Darren W. Ark

Array ( [id] => 4800378 [patent_doc_number] => 20080011965 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-17 [patent_title] => 'CHARGED-PARTICLE BEAM PATTERN WRITING METHOD AND APPARATUS AND SOFTWARE PROGRAM FOR USE THEREIN' [patent_app_type] => utility [patent_app_number] => 11/772414 [patent_app_country] => US [patent_app_date] => 2007-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9633 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20080011965.pdf [firstpage_image] =>[orig_patent_app_number] => 11772414 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5014003 [patent_doc_number] => 20070257211 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-08 [patent_title] => 'Implant Optimization Scheme' [patent_app_type] => utility [patent_app_number] => 11/772524 [patent_app_country] => US [patent_app_date] => 2007-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3996 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0257/20070257211.pdf [firstpage_image] =>[orig_patent_app_number] => 11772524 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 239896 [patent_doc_number] => 07592613 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-22 [patent_title] => 'Sensor and system for sensing an electron beam' [patent_app_type] => utility [patent_app_number] => 11/812050 [patent_app_country] => US [patent_app_date] => 2007-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 4670 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/592/07592613.pdf [firstpage_image] =>[orig_patent_app_number] => 11812050 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20154 [patent_doc_number] => RE041665 [patent_country] => US [patent_kind] => E1 [patent_issue_date] => 2010-09-14 [patent_title] => 'Object observation apparatus and object observation' [patent_app_type] => reissue [patent_app_number] => 11/808916 [patent_app_country] => US [patent_app_date] => 2007-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 21 [patent_no_of_words] => 6751 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/RE/041/RE041665.pdf [firstpage_image] =>[orig_patent_app_number] => 11808916 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4919092 [patent_doc_number] => 20080067403 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-20 [patent_title] => 'CHARGED PARTICLE BEAM EXPOSURE APPARATUS' [patent_app_type] => utility [patent_app_number] => 11/762182 [patent_app_country] => US [patent_app_date] => 2007-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 5375 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20080067403.pdf [firstpage_image] =>[orig_patent_app_number] => 11762182 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 92855 [patent_doc_number] => 07737419 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-15 [patent_title] => 'Alignment apparatus, exposure apparatus, and device manufacturing method' [patent_app_type] => utility [patent_app_number] => 11/761951 [patent_app_country] => US [patent_app_date] => 2007-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 10911 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/737/07737419.pdf [firstpage_image] =>[orig_patent_app_number] => 11761951 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5123374 [patent_doc_number] => 20070235644 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-11 [patent_title] => 'Inspection system by charged particle beam and method of manufacturing devices using the same' [patent_app_type] => utility [patent_app_number] => 11/806573 [patent_app_country] => US [patent_app_date] => 2007-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 51 [patent_figures_cnt] => 51 [patent_no_of_words] => 52312 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0235/20070235644.pdf [firstpage_image] =>[orig_patent_app_number] => 11806573 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4919129 [patent_doc_number] => 20080067441 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-20 [patent_title] => 'CHARGED-PARTICLE BEAM LITHOGRAPHY WITH GRID MATCHING FOR CORRECTION OF BEAM SHOT POSITION DEVIATION' [patent_app_type] => utility [patent_app_number] => 11/754598 [patent_app_country] => US [patent_app_date] => 2007-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 5946 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20080067441.pdf [firstpage_image] =>[orig_patent_app_number] => 11754598 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4920394 [patent_doc_number] => 20080068707 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-20 [patent_title] => 'DEVICE FOR PREPARING MICROSCOPY SAMPLES' [patent_app_type] => utility [patent_app_number] => 11/752570 [patent_app_country] => US [patent_app_date] => 2007-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 14411 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0068/20080068707.pdf [firstpage_image] =>[orig_patent_app_number] => 11752570 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7978427 [patent_doc_number] => 08071961 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-12-06 [patent_title] => 'Charged particle beam apparatus' [patent_app_type] => utility [patent_app_number] => 11/802452 [patent_app_country] => US [patent_app_date] => 2007-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 5283 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/071/08071961.pdf [firstpage_image] =>[orig_patent_app_number] => 11802452 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7591030 [patent_doc_number] => 07663101 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-16 [patent_title] => 'System and methods for preparing microscopy samples' [patent_app_type] => utility [patent_app_number] => 11/752239 [patent_app_country] => US [patent_app_date] => 2007-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 58 [patent_no_of_words] => 14342 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/663/07663101.pdf [firstpage_image] =>[orig_patent_app_number] => 11752239 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4974573 [patent_doc_number] => 20070215803 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-20 [patent_title] => 'Method and an apparatus of an inspection system using an electron beam' [patent_app_type] => utility [patent_app_number] => 11/798239 [patent_app_country] => US [patent_app_date] => 2007-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8431 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0215/20070215803.pdf [firstpage_image] =>[orig_patent_app_number] => 11798239 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 270792 [patent_doc_number] => 07564028 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-07-21 [patent_title] => 'Vacuum housing system for MALDI-TOF mass spectrometry' [patent_app_type] => utility [patent_app_number] => 11/742679 [patent_app_country] => US [patent_app_date] => 2007-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8570 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/564/07564028.pdf [firstpage_image] =>[orig_patent_app_number] => 11742679 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 270790 [patent_doc_number] => 07564026 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-07-21 [patent_title] => 'Linear TOF geometry for high sensitivity at high mass' [patent_app_type] => utility [patent_app_number] => 11/742685 [patent_app_country] => US [patent_app_date] => 2007-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7875 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/564/07564026.pdf [firstpage_image] =>[orig_patent_app_number] => 11742685 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4752212 [patent_doc_number] => 20080160285 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'STRUCTURE HAVING NANO-HOLE AND FABRICATING METHOD THEREOF, TIP ARRAY STRUCTURE AND FABRICATING METHOD OF TIP STRUCTURE' [patent_app_type] => utility [patent_app_number] => 11/737768 [patent_app_country] => US [patent_app_date] => 2007-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4394 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0160/20080160285.pdf [firstpage_image] =>[orig_patent_app_number] => 11737768 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4883744 [patent_doc_number] => 20080258076 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-23 [patent_title] => 'MEDICAL ISOTOPE GENERATOR SYSTEMS' [patent_app_type] => utility [patent_app_number] => 11/737885 [patent_app_country] => US [patent_app_date] => 2007-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3771 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20080258076.pdf [firstpage_image] =>[orig_patent_app_number] => 11737885 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5007943 [patent_doc_number] => 20070278420 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-06 [patent_title] => 'MICROFABRICATED CANTILEVER CHIP' [patent_app_type] => utility [patent_app_number] => 11/737295 [patent_app_country] => US [patent_app_date] => 2007-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 12644 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0278/20070278420.pdf [firstpage_image] =>[orig_patent_app_number] => 11737295 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 169405 [patent_doc_number] => 07667196 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-23 [patent_title] => 'Sample preparation for mass spectrometric imaging' [patent_app_type] => utility [patent_app_number] => 11/737380 [patent_app_country] => US [patent_app_date] => 2007-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 7488 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/667/07667196.pdf [firstpage_image] =>[orig_patent_app_number] => 11737380 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 820842 [patent_doc_number] => 07408175 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-05 [patent_title] => 'Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former' [patent_app_type] => utility [patent_app_number] => 11/783780 [patent_app_country] => US [patent_app_date] => 2007-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 55 [patent_figures_cnt] => 74 [patent_no_of_words] => 54113 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 204 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/408/07408175.pdf [firstpage_image] =>[orig_patent_app_number] => 11783780 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 23104 [patent_doc_number] => 07800076 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-09-21 [patent_title] => 'Electron-optical corrector for aplanatic imaging systems' [patent_app_type] => utility [patent_app_number] => 12/297306 [patent_app_country] => US [patent_app_date] => 2007-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3633 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/800/07800076.pdf [firstpage_image] =>[orig_patent_app_number] => 12297306 [rel_patent_id] =>[rel_patent_doc_number] =>)