
Darren W. Ark
Examiner (ID: 2038, Phone: (571)272-6885 , Office: P/3643 )
| Most Active Art Unit | 3647 |
| Art Unit(s) | 3647, 3205, 3616, 3643 |
| Total Applications | 2764 |
| Issued Applications | 1616 |
| Pending Applications | 196 |
| Abandoned Applications | 968 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7154070
[patent_doc_number] => 20050082475
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-04-21
[patent_title] => 'Methods for preparing samples for atom probe analysis'
[patent_app_type] => utility
[patent_app_number] => 10/687111
[patent_app_country] => US
[patent_app_date] => 2003-10-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 5625
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0082/20050082475.pdf
[firstpage_image] =>[orig_patent_app_number] => 10687111
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/687111 | Methods for preparing samples for atom probe analysis | Oct 14, 2003 | Issued |
Array
(
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[patent_doc_number] => 20040164239
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[patent_kind] => A1
[patent_issue_date] => 2004-08-26
[patent_title] => 'High resolution method for using time-of-flight mass spectrometers with orthogonal ion injection'
[patent_app_type] => new
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[firstpage_image] =>[orig_patent_app_number] => 10685332
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/685332 | High resolution method for using time-of-flight mass spectrometers with orthogonal ion injection | Oct 13, 2003 | Issued |
Array
(
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[patent_doc_number] => 06987277
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[patent_issue_date] => 2006-01-17
[patent_title] => 'Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces'
[patent_app_type] => utility
[patent_app_number] => 10/684120
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[patent_app_date] => 2003-10-10
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/684120 | Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces | Oct 9, 2003 | Issued |
Array
(
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[patent_doc_number] => 20040061052
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[patent_kind] => A1
[patent_issue_date] => 2004-04-01
[patent_title] => 'Method of determining degree of charge-up induced by plasma used for manufacturing semiconductor device and apparatus therefor'
[patent_app_type] => new
[patent_app_number] => 10/673581
[patent_app_country] => US
[patent_app_date] => 2003-09-30
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10673581
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/673581 | Method of determining whether a conductive layer of a semiconductor device is exposed through a contact hold | Sep 29, 2003 | Issued |
Array
(
[id] => 6969590
[patent_doc_number] => 20050035300
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[patent_issue_date] => 2005-02-17
[patent_title] => 'Deflector, method of manufacturing deflector, and charged particle beam exposure apparatus'
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[patent_app_number] => 10/670328
[patent_app_country] => US
[patent_app_date] => 2003-09-26
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/670328 | Deflector, method of manufacturing deflector, and charged particle beam exposure apparatus | Sep 25, 2003 | Issued |
Array
(
[id] => 5652617
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[patent_issue_date] => 2006-06-29
[patent_title] => 'Electron beam irradiation apparatus, electron beam irradiation method, and apparatus for and method of manufacturing disc-shape object'
[patent_app_type] => utility
[patent_app_number] => 10/528511
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[firstpage_image] =>[orig_patent_app_number] => 10528511
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/528511 | Electron beam irradiation apparatus, electron beam irradiation method, and apparatus for and method of manufacturing disc-shape object | Sep 16, 2003 | Abandoned |
Array
(
[id] => 712079
[patent_doc_number] => 07057189
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-06-06
[patent_title] => 'Monochromatic fluid treatment systems'
[patent_app_type] => utility
[patent_app_number] => 10/660930
[patent_app_country] => US
[patent_app_date] => 2003-09-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[firstpage_image] =>[orig_patent_app_number] => 10660930
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/660930 | Monochromatic fluid treatment systems | Sep 11, 2003 | Issued |
Array
(
[id] => 7318658
[patent_doc_number] => 20040135080
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[patent_issue_date] => 2004-07-15
[patent_title] => 'Rectilinear ion trap and mass analyzer system and method'
[patent_app_type] => new
[patent_app_number] => 10/656667
[patent_app_country] => US
[patent_app_date] => 2003-09-04
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10656667
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/656667 | Rectilinear ion trap and mass analyzer system and method | Sep 3, 2003 | Issued |
Array
(
[id] => 7080439
[patent_doc_number] => 20050045819
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-03-03
[patent_title] => 'AN ELECTRON MICROSCOPE MAGNIFICATION STANDARD PROVIDING PRECISE CALIBRATION IN THE MAGNIFICATION RANGE 5000X-2000,000X'
[patent_app_type] => utility
[patent_app_number] => 10/604989
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[pdf_file] => publications/A1/0045/20050045819.pdf
[firstpage_image] =>[orig_patent_app_number] => 10604989
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/604989 | Electron microscope magnification standard providing precise calibration in the magnification range 5000X-2000,000X | Aug 28, 2003 | Issued |
Array
(
[id] => 1066068
[patent_doc_number] => 06847032
[patent_country] => US
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[patent_issue_date] => 2005-01-25
[patent_title] => 'Optical peristaltic pumping with optical traps'
[patent_app_type] => utility
[patent_app_number] => 10/651370
[patent_app_country] => US
[patent_app_date] => 2003-08-29
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[firstpage_image] =>[orig_patent_app_number] => 10651370
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/651370 | Optical peristaltic pumping with optical traps | Aug 28, 2003 | Issued |
Array
(
[id] => 7159051
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[patent_title] => 'Electron microscopy system and electron microscopy method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/636626 | Electron microscopy system and electron microscopy method | Aug 7, 2003 | Issued |
Array
(
[id] => 979308
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[patent_title] => 'Emission source having carbon nanotube, electron microscope using this emission source, and electron beam drawing device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/636701 | Emission source having carbon nanotube, electron microscope using this emission source, and electron beam drawing device | Aug 7, 2003 | Issued |
Array
(
[id] => 1086361
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[patent_title] => 'Ion mobility spectrometers with improved resolution'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/628753 | Ion mobility spectrometers with improved resolution | Jul 27, 2003 | Issued |
Array
(
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[patent_title] => 'Time-of-flight mass spectrometry utilizing finite impulse response filters to improve resolution and reduce noise'
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Array
(
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Array
(
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Array
(
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[patent_title] => 'Container for nuclear fuel transportation'
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Array
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Array
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Array
(
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