Search

Darren W. Ark

Examiner (ID: 2038, Phone: (571)272-6885 , Office: P/3643 )

Most Active Art Unit
3647
Art Unit(s)
3647, 3205, 3616, 3643
Total Applications
2764
Issued Applications
1616
Pending Applications
196
Abandoned Applications
968

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7154070 [patent_doc_number] => 20050082475 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-21 [patent_title] => 'Methods for preparing samples for atom probe analysis' [patent_app_type] => utility [patent_app_number] => 10/687111 [patent_app_country] => US [patent_app_date] => 2003-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5625 [patent_no_of_claims] => 52 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0082/20050082475.pdf [firstpage_image] =>[orig_patent_app_number] => 10687111 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/687111
Methods for preparing samples for atom probe analysis Oct 14, 2003 Issued
Array ( [id] => 7446986 [patent_doc_number] => 20040164239 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-26 [patent_title] => 'High resolution method for using time-of-flight mass spectrometers with orthogonal ion injection' [patent_app_type] => new [patent_app_number] => 10/685332 [patent_app_country] => US [patent_app_date] => 2003-10-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5768 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20040164239.pdf [firstpage_image] =>[orig_patent_app_number] => 10685332 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/685332
High resolution method for using time-of-flight mass spectrometers with orthogonal ion injection Oct 13, 2003 Issued
Array ( [id] => 788344 [patent_doc_number] => 06987277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-01-17 [patent_title] => 'Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces' [patent_app_type] => utility [patent_app_number] => 10/684120 [patent_app_country] => US [patent_app_date] => 2003-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 22 [patent_no_of_words] => 10591 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/987/06987277.pdf [firstpage_image] =>[orig_patent_app_number] => 10684120 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/684120
Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces Oct 9, 2003 Issued
Array ( [id] => 7278675 [patent_doc_number] => 20040061052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-01 [patent_title] => 'Method of determining degree of charge-up induced by plasma used for manufacturing semiconductor device and apparatus therefor' [patent_app_type] => new [patent_app_number] => 10/673581 [patent_app_country] => US [patent_app_date] => 2003-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 10066 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0061/20040061052.pdf [firstpage_image] =>[orig_patent_app_number] => 10673581 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/673581
Method of determining whether a conductive layer of a semiconductor device is exposed through a contact hold Sep 29, 2003 Issued
Array ( [id] => 6969590 [patent_doc_number] => 20050035300 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-17 [patent_title] => 'Deflector, method of manufacturing deflector, and charged particle beam exposure apparatus' [patent_app_type] => utility [patent_app_number] => 10/670328 [patent_app_country] => US [patent_app_date] => 2003-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 15127 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0035/20050035300.pdf [firstpage_image] =>[orig_patent_app_number] => 10670328 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/670328
Deflector, method of manufacturing deflector, and charged particle beam exposure apparatus Sep 25, 2003 Issued
Array ( [id] => 5652617 [patent_doc_number] => 20060138352 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-29 [patent_title] => 'Electron beam irradiation apparatus, electron beam irradiation method, and apparatus for and method of manufacturing disc-shape object' [patent_app_type] => utility [patent_app_number] => 10/528511 [patent_app_country] => US [patent_app_date] => 2003-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 12831 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0138/20060138352.pdf [firstpage_image] =>[orig_patent_app_number] => 10528511 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/528511
Electron beam irradiation apparatus, electron beam irradiation method, and apparatus for and method of manufacturing disc-shape object Sep 16, 2003 Abandoned
Array ( [id] => 712079 [patent_doc_number] => 07057189 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-06 [patent_title] => 'Monochromatic fluid treatment systems' [patent_app_type] => utility [patent_app_number] => 10/660930 [patent_app_country] => US [patent_app_date] => 2003-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 13579 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/057/07057189.pdf [firstpage_image] =>[orig_patent_app_number] => 10660930 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/660930
Monochromatic fluid treatment systems Sep 11, 2003 Issued
Array ( [id] => 7318658 [patent_doc_number] => 20040135080 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-07-15 [patent_title] => 'Rectilinear ion trap and mass analyzer system and method' [patent_app_type] => new [patent_app_number] => 10/656667 [patent_app_country] => US [patent_app_date] => 2003-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 5972 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0135/20040135080.pdf [firstpage_image] =>[orig_patent_app_number] => 10656667 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/656667
Rectilinear ion trap and mass analyzer system and method Sep 3, 2003 Issued
Array ( [id] => 7080439 [patent_doc_number] => 20050045819 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-03 [patent_title] => 'AN ELECTRON MICROSCOPE MAGNIFICATION STANDARD PROVIDING PRECISE CALIBRATION IN THE MAGNIFICATION RANGE 5000X-2000,000X' [patent_app_type] => utility [patent_app_number] => 10/604989 [patent_app_country] => US [patent_app_date] => 2003-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5120 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20050045819.pdf [firstpage_image] =>[orig_patent_app_number] => 10604989 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/604989
Electron microscope magnification standard providing precise calibration in the magnification range 5000X-2000,000X Aug 28, 2003 Issued
Array ( [id] => 1066068 [patent_doc_number] => 06847032 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-01-25 [patent_title] => 'Optical peristaltic pumping with optical traps' [patent_app_type] => utility [patent_app_number] => 10/651370 [patent_app_country] => US [patent_app_date] => 2003-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 21 [patent_no_of_words] => 4972 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/847/06847032.pdf [firstpage_image] =>[orig_patent_app_number] => 10651370 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/651370
Optical peristaltic pumping with optical traps Aug 28, 2003 Issued
Array ( [id] => 7159051 [patent_doc_number] => 20040075054 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-22 [patent_title] => 'Electron microscopy system and electron microscopy method' [patent_app_type] => new [patent_app_number] => 10/636626 [patent_app_country] => US [patent_app_date] => 2003-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6033 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0075/20040075054.pdf [firstpage_image] =>[orig_patent_app_number] => 10636626 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/636626
Electron microscopy system and electron microscopy method Aug 7, 2003 Issued
Array ( [id] => 979308 [patent_doc_number] => 06930313 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-16 [patent_title] => 'Emission source having carbon nanotube, electron microscope using this emission source, and electron beam drawing device' [patent_app_type] => utility [patent_app_number] => 10/636701 [patent_app_country] => US [patent_app_date] => 2003-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 14 [patent_no_of_words] => 6202 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/930/06930313.pdf [firstpage_image] =>[orig_patent_app_number] => 10636701 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/636701
Emission source having carbon nanotube, electron microscope using this emission source, and electron beam drawing device Aug 7, 2003 Issued
Array ( [id] => 1086361 [patent_doc_number] => 06831273 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-12-14 [patent_title] => 'Ion mobility spectrometers with improved resolution' [patent_app_type] => B2 [patent_app_number] => 10/628753 [patent_app_country] => US [patent_app_date] => 2003-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1368 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/831/06831273.pdf [firstpage_image] =>[orig_patent_app_number] => 10628753 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/628753
Ion mobility spectrometers with improved resolution Jul 27, 2003 Issued
Array ( [id] => 1097183 [patent_doc_number] => 06822227 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-11-23 [patent_title] => 'Time-of-flight mass spectrometry utilizing finite impulse response filters to improve resolution and reduce noise' [patent_app_type] => B1 [patent_app_number] => 10/628953 [patent_app_country] => US [patent_app_date] => 2003-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2220 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/822/06822227.pdf [firstpage_image] =>[orig_patent_app_number] => 10628953 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/628953
Time-of-flight mass spectrometry utilizing finite impulse response filters to improve resolution and reduce noise Jul 27, 2003 Issued
Array ( [id] => 7204436 [patent_doc_number] => 20040069957 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-15 [patent_title] => 'System and method for maskless lithography using an array of improved diffractive focusing elements' [patent_app_type] => new [patent_app_number] => 10/624316 [patent_app_country] => US [patent_app_date] => 2003-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 6302 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 35 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0069/20040069957.pdf [firstpage_image] =>[orig_patent_app_number] => 10624316 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/624316
System and method for maskless lithography using an array of improved diffractive focusing elements Jul 20, 2003 Issued
Array ( [id] => 738690 [patent_doc_number] => 07034321 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-04-25 [patent_title] => 'Electron beam exposure apparatus and electron beam measurement module' [patent_app_type] => utility [patent_app_number] => 10/624423 [patent_app_country] => US [patent_app_date] => 2003-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6182 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/034/07034321.pdf [firstpage_image] =>[orig_patent_app_number] => 10624423 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/624423
Electron beam exposure apparatus and electron beam measurement module Jul 20, 2003 Issued
Array ( [id] => 1093822 [patent_doc_number] => 06825483 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-11-30 [patent_title] => 'Container for nuclear fuel transportation' [patent_app_type] => B2 [patent_app_number] => 10/618833 [patent_app_country] => US [patent_app_date] => 2003-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 3440 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/825/06825483.pdf [firstpage_image] =>[orig_patent_app_number] => 10618833 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/618833
Container for nuclear fuel transportation Jul 13, 2003 Issued
Array ( [id] => 1113617 [patent_doc_number] => 06803570 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-10-12 [patent_title] => 'Electron transmissive window usable with high pressure electron spectrometry' [patent_app_type] => B1 [patent_app_number] => 10/618078 [patent_app_country] => US [patent_app_date] => 2003-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 5337 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/803/06803570.pdf [firstpage_image] =>[orig_patent_app_number] => 10618078 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/618078
Electron transmissive window usable with high pressure electron spectrometry Jul 10, 2003 Issued
Array ( [id] => 7387759 [patent_doc_number] => 20040016882 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-01-29 [patent_title] => 'Scanning electron microscope' [patent_app_type] => new [patent_app_number] => 10/615864 [patent_app_country] => US [patent_app_date] => 2003-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 5229 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0016/20040016882.pdf [firstpage_image] =>[orig_patent_app_number] => 10615864 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/615864
Scanning electron microscope Jul 9, 2003 Issued
Array ( [id] => 394247 [patent_doc_number] => 07297944 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-20 [patent_title] => 'Ion beam device and ion beam processing method, and holder member' [patent_app_type] => utility [patent_app_number] => 10/520982 [patent_app_country] => US [patent_app_date] => 2003-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 12 [patent_no_of_words] => 5956 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/297/07297944.pdf [firstpage_image] =>[orig_patent_app_number] => 10520982 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/520982
Ion beam device and ion beam processing method, and holder member Jul 8, 2003 Issued
Menu