
Darren W. Ark
Examiner (ID: 2038, Phone: (571)272-6885 , Office: P/3643 )
| Most Active Art Unit | 3647 |
| Art Unit(s) | 3647, 3205, 3616, 3643 |
| Total Applications | 2764 |
| Issued Applications | 1616 |
| Pending Applications | 196 |
| Abandoned Applications | 968 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6767968
[patent_doc_number] => 20030213908
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-11-20
[patent_title] => 'Ion trap mass spectrometer'
[patent_app_type] => new
[patent_app_number] => 10/440113
[patent_app_country] => US
[patent_app_date] => 2003-05-19
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[patent_no_of_words] => 4838
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[pdf_file] => publications/A1/0213/20030213908.pdf
[firstpage_image] =>[orig_patent_app_number] => 10440113
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/440113 | Ion trap mass spectrometer | May 18, 2003 | Issued |
Array
(
[id] => 1081227
[patent_doc_number] => 06835931
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-12-28
[patent_title] => 'Chemical prefiltering for phase differentiation via simultaneous energy dispersive spectrometry and electron backscatter diffraction'
[patent_app_type] => B2
[patent_app_number] => 10/439346
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/439346 | Chemical prefiltering for phase differentiation via simultaneous energy dispersive spectrometry and electron backscatter diffraction | May 14, 2003 | Issued |
Array
(
[id] => 6767982
[patent_doc_number] => 20030213922
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[patent_kind] => A1
[patent_issue_date] => 2003-11-20
[patent_title] => 'Nanolithography molecular beam machine'
[patent_app_type] => new
[patent_app_number] => 10/437620
[patent_app_country] => US
[patent_app_date] => 2003-05-14
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[patent_drawing_sheets_cnt] => 10
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/437620 | Nanolithography molecular beam machine | May 13, 2003 | Abandoned |
Array
(
[id] => 1106002
[patent_doc_number] => 06812462
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-11-02
[patent_title] => 'Dual electron beam instrument for multi-perspective'
[patent_app_type] => B1
[patent_app_number] => 10/435011
[patent_app_country] => US
[patent_app_date] => 2003-05-09
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10435011
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/435011 | Dual electron beam instrument for multi-perspective | May 8, 2003 | Issued |
Array
(
[id] => 1031378
[patent_doc_number] => 06878932
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-04-12
[patent_title] => 'Mass spectrometer ionization source and related methods'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/435312 | Mass spectrometer ionization source and related methods | May 8, 2003 | Issued |
Array
(
[id] => 1224985
[patent_doc_number] => 06700121
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[patent_kind] => B1
[patent_issue_date] => 2004-03-02
[patent_title] => 'Methods of sampling specimens for microanalysis'
[patent_app_type] => B1
[patent_app_number] => 10/428372
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 10428372
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/428372 | Methods of sampling specimens for microanalysis | Apr 30, 2003 | Issued |
Array
(
[id] => 1132033
[patent_doc_number] => 06787759
[patent_country] => US
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[patent_issue_date] => 2004-09-07
[patent_title] => 'Atomic lithography of two dimensional nanostructures'
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[patent_app_number] => 10/421192
[patent_app_country] => US
[patent_app_date] => 2003-04-23
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[pdf_file] => patents/06/787/06787759.pdf
[firstpage_image] =>[orig_patent_app_number] => 10421192
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/421192 | Atomic lithography of two dimensional nanostructures | Apr 22, 2003 | Issued |
Array
(
[id] => 1232294
[patent_doc_number] => 06693283
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-02-17
[patent_title] => 'Beam scanning system for a heavy ion gantry'
[patent_app_type] => B2
[patent_app_number] => 10/240518
[patent_app_country] => US
[patent_app_date] => 2003-04-16
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/693/06693283.pdf
[firstpage_image] =>[orig_patent_app_number] => 10240518
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/240518 | Beam scanning system for a heavy ion gantry | Apr 15, 2003 | Issued |
Array
(
[id] => 7387751
[patent_doc_number] => 20040016880
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-01-29
[patent_title] => 'Method for the preparation of a TEM lamella'
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[patent_app_number] => 10/414422
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/414422 | Method for the preparation of a TEM lamella | Apr 14, 2003 | Abandoned |
Array
(
[id] => 1050442
[patent_doc_number] => 06861653
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-03-01
[patent_title] => 'Equipment and method for inline infrared and ultraviolet irradiation of recording media'
[patent_app_type] => utility
[patent_app_number] => 10/411114
[patent_app_country] => US
[patent_app_date] => 2003-04-11
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Array
(
[id] => 7180342
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[patent_title] => 'Integrated optical filters utilizing resonators'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/406794 | Integrated optical filters utilizing resonators | Apr 2, 2003 | Issued |
Array
(
[id] => 7607261
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[patent_title] => 'Method of inspecting a circuit pattern and inspecting instrument'
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Array
(
[id] => 721044
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[patent_title] => 'Device for measuring the emission of X-rays produced by an object exposed to an electron beam'
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Array
(
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[patent_title] => 'Lithographic apparatus and device manufacturing method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/396693 | Lithographic apparatus and device manufacturing method | Mar 25, 2003 | Issued |
Array
(
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[patent_title] => 'Charged particle beam lithography system, lithography method using charged particle beam, method of controlling charged particle beam, and method of manufacturing semiconductor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/394208 | Charged particle beam lithography system, lithography method using charged particle beam, method of controlling charged particle beam, and method of manufacturing semiconductor device | Mar 23, 2003 | Issued |
Array
(
[id] => 7420175
[patent_doc_number] => 20040183007
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[patent_title] => 'MULTIPLEXED ORTHOGONAL TIME-OF-FLIGHT MASS SPECTROMETER'
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Array
(
[id] => 7432978
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[patent_title] => 'Optical fiber system'
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Array
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Array
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Array
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[patent_title] => 'Motion picture output from electron microscope'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/386815 | Motion picture output from electron microscope | Mar 11, 2003 | Issued |