David A. Vanore

Array ( [id] => 17956286 [patent_doc_number] => 11482399 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-10-25 [patent_title] => Method and apparatus for an advanced charged controller for wafer inspection [patent_app_type] => utility [patent_app_number] => 16/652352 [patent_app_country] => US [patent_app_date] => 2018-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 23 [patent_no_of_words] => 7063 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16652352 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16284922 [patent_doc_number] => 20200278524 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-09-03 [patent_title] => OPTICAL OBJECTIVE LENS [patent_app_type] => utility [patent_app_number] => 16/650862 [patent_app_country] => US [patent_app_date] => 2018-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3910 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16650862 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16030573 [patent_doc_number] => 10677697 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-06-09 [patent_title] => Automatic sample preparation apparatus [patent_app_type] => utility [patent_app_number] => 16/139545 [patent_app_country] => US [patent_app_date] => 2018-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 33 [patent_no_of_words] => 20411 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16139545 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16904698 [patent_doc_number] => 20210183614 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-06-17 [patent_title] => CHARGED PARTICLE BEAM APPARATUS [patent_app_type] => utility [patent_app_number] => 17/269424 [patent_app_country] => US [patent_app_date] => 2018-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15067 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17269424 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13841531 [patent_doc_number] => 20190024250 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-01-24 [patent_title] => SYSTEMS AND METHODS FOR PRODUCING METAL CLUSTERS; FUNCTIONALIZED SURFACES; AND DROPLETS INCLUDING SOLVATED METAL IONS [patent_app_type] => utility [patent_app_number] => 16/138069 [patent_app_country] => US [patent_app_date] => 2018-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13070 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16138069 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16798766 [patent_doc_number] => 10993680 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-05-04 [patent_title] => Automated cancer therapy apparatus and method of use thereof [patent_app_type] => utility [patent_app_number] => 16/131015 [patent_app_country] => US [patent_app_date] => 2018-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 40 [patent_figures_cnt] => 75 [patent_no_of_words] => 55561 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16131015 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 15733167 [patent_doc_number] => 10615016 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-04-07 [patent_title] => Determining isotope ratios using mass spectrometry [patent_app_type] => utility [patent_app_number] => 16/123705 [patent_app_country] => US [patent_app_date] => 2018-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 13054 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16123705 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14137713 [patent_doc_number] => 20190103246 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-04-04 [patent_title] => STAGE DEVICE AND CHARGED PARTICLE BEAM DEVICE [patent_app_type] => utility [patent_app_number] => 16/122189 [patent_app_country] => US [patent_app_date] => 2018-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7520 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16122189 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16093465 [patent_doc_number] => 20200200719 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-06-25 [patent_title] => Process For The Characterization Of Glatiramer Acetate [patent_app_type] => utility [patent_app_number] => 16/643692 [patent_app_country] => US [patent_app_date] => 2018-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3994 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 36 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16643692 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14049571 [patent_doc_number] => 20190080893 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-03-14 [patent_title] => SYSTEMS AND METHODS USING A GAS MIXTURE TO SELECT IONS [patent_app_type] => utility [patent_app_number] => 16/119141 [patent_app_country] => US [patent_app_date] => 2018-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13809 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16119141 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13625453 [patent_doc_number] => 20180364278 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-12-20 [patent_title] => Frequency Comb Feedback Control for Scanning Probe Microscopy [patent_app_type] => utility [patent_app_number] => 16/116479 [patent_app_country] => US [patent_app_date] => 2018-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9500 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16116479 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14024331 [patent_doc_number] => 20190074159 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-03-07 [patent_title] => SCANNING ELECTRON MICROSCOPE [patent_app_type] => utility [patent_app_number] => 16/115287 [patent_app_country] => US [patent_app_date] => 2018-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6928 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16115287 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 15593427 [patent_doc_number] => 20200073248 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-03-05 [patent_title] => SEMICONDUCTOR APPARATUS AND METHOD OF OPERATING THE SAME [patent_app_type] => utility [patent_app_number] => 16/115476 [patent_app_country] => US [patent_app_date] => 2018-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6389 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16115476 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 15045457 [patent_doc_number] => 20190333733 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-10-31 [patent_title] => Laser-Assisted Electron-Beam Inspection for Semiconductor Devices [patent_app_type] => utility [patent_app_number] => 16/113829 [patent_app_country] => US [patent_app_date] => 2018-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6002 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16113829 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17122006 [patent_doc_number] => 11133147 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-09-28 [patent_title] => Charged particle ray device and cross-sectional shape estimation program [patent_app_type] => utility [patent_app_number] => 16/645511 [patent_app_country] => US [patent_app_date] => 2018-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 6260 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16645511 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17122006 [patent_doc_number] => 11133147 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-09-28 [patent_title] => Charged particle ray device and cross-sectional shape estimation program [patent_app_type] => utility [patent_app_number] => 16/645511 [patent_app_country] => US [patent_app_date] => 2018-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 6260 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16645511 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17122006 [patent_doc_number] => 11133147 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-09-28 [patent_title] => Charged particle ray device and cross-sectional shape estimation program [patent_app_type] => utility [patent_app_number] => 16/645511 [patent_app_country] => US [patent_app_date] => 2018-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 6260 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16645511 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17122006 [patent_doc_number] => 11133147 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-09-28 [patent_title] => Charged particle ray device and cross-sectional shape estimation program [patent_app_type] => utility [patent_app_number] => 16/645511 [patent_app_country] => US [patent_app_date] => 2018-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 6260 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16645511 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 15564185 [patent_doc_number] => 20200066504 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-02-27 [patent_title] => METHODS FOR OPERATING ELECTROSTATIC TRAP MASS ANALYZERS [patent_app_type] => utility [patent_app_number] => 16/111024 [patent_app_country] => US [patent_app_date] => 2018-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8884 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16111024 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14904087 [patent_doc_number] => 20190295809 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-09-26 [patent_title] => CHARGED PARTICLE BEAM DEFLECTION DEVICE [patent_app_type] => utility [patent_app_number] => 16/106845 [patent_app_country] => US [patent_app_date] => 2018-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9430 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16106845 [rel_patent_id] =>[rel_patent_doc_number] =>)