Search

David E Harvey

Examiner (ID: 1742)

Most Active Art Unit
2602
Art Unit(s)
3992, 2621, 2481, 2714, 2602, 2614
Total Applications
1668
Issued Applications
1258
Pending Applications
60
Abandoned Applications
342

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 9721399 [patent_doc_number] => 20140257099 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-09-11 [patent_title] => 'TREATMENT DELIVERY CONTROL SYSTEM AND METHOD OF OPERATION THEREOF' [patent_app_type] => utility [patent_app_number] => 13/789235 [patent_app_country] => US [patent_app_date] => 2013-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 46 [patent_figures_cnt] => 46 [patent_no_of_words] => 39933 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13789235 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/789235
Treatment delivery control system and method of operation thereof Mar 6, 2013 Issued
Array ( [id] => 10844928 [patent_doc_number] => 08872106 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-10-28 [patent_title] => 'Pattern measuring apparatus' [patent_app_type] => utility [patent_app_number] => 13/789346 [patent_app_country] => US [patent_app_date] => 2013-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 18 [patent_no_of_words] => 6617 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13789346 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/789346
Pattern measuring apparatus Mar 6, 2013 Issued
Array ( [id] => 11847438 [patent_doc_number] => 09734995 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-08-15 [patent_title] => 'Time of flight quantitation using alternative characteristic ions' [patent_app_type] => utility [patent_app_number] => 14/385788 [patent_app_country] => US [patent_app_date] => 2013-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 4604 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14385788 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/385788
Time of flight quantitation using alternative characteristic ions Mar 5, 2013 Issued
Array ( [id] => 9273885 [patent_doc_number] => 08637817 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2014-01-28 [patent_title] => 'Multi-pole ion trap for mass spectrometry' [patent_app_type] => utility [patent_app_number] => 13/782708 [patent_app_country] => US [patent_app_date] => 2013-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 6189 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13782708 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/782708
Multi-pole ion trap for mass spectrometry Feb 28, 2013 Issued
Array ( [id] => 10610845 [patent_doc_number] => 09330883 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-05-03 [patent_title] => 'Charged particle beam device' [patent_app_type] => utility [patent_app_number] => 14/382165 [patent_app_country] => US [patent_app_date] => 2013-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 16 [patent_no_of_words] => 9073 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14382165 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/382165
Charged particle beam device Feb 19, 2013 Issued
Array ( [id] => 9861632 [patent_doc_number] => 20150041649 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-02-12 [patent_title] => 'Pattern Dimension Measuring Device, Charged Particle Beam Apparatus, and Computer Program' [patent_app_type] => utility [patent_app_number] => 14/379659 [patent_app_country] => US [patent_app_date] => 2013-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 6977 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14379659 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/379659
Pattern dimension measuring device, charged particle beam apparatus, and computer program Feb 17, 2013 Issued
Array ( [id] => 10125163 [patent_doc_number] => 09159529 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-10-13 [patent_title] => 'Scanning electron microscope' [patent_app_type] => utility [patent_app_number] => 14/379704 [patent_app_country] => US [patent_app_date] => 2013-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 6836 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14379704 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/379704
Scanning electron microscope Feb 17, 2013 Issued
Array ( [id] => 8986893 [patent_doc_number] => 20130214174 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-08-22 [patent_title] => 'SYSTEMS METHODS AND DEVICES FOR DISINFECTING USING UV LIGHT' [patent_app_type] => utility [patent_app_number] => 13/769301 [patent_app_country] => US [patent_app_date] => 2013-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 4263 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13769301 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/769301
Systems methods and devices for disinfecting using UV light Feb 15, 2013 Issued
Array ( [id] => 10583620 [patent_doc_number] => 09305745 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-04-05 [patent_title] => 'Scanning electron microscope' [patent_app_type] => utility [patent_app_number] => 14/379733 [patent_app_country] => US [patent_app_date] => 2013-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3967 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14379733 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/379733
Scanning electron microscope Feb 14, 2013 Issued
Array ( [id] => 8937269 [patent_doc_number] => 20130187065 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-07-25 [patent_title] => 'EXTREME ULTRAVIOLET LIGHT SOURCE DEVICE AND CONTROL METHOD FOR EXTREME ULTRAVIOLET LIGHT SOURCE DEVICE' [patent_app_type] => utility [patent_app_number] => 13/767789 [patent_app_country] => US [patent_app_date] => 2013-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 55 [patent_figures_cnt] => 55 [patent_no_of_words] => 30649 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13767789 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/767789
Extreme ultraviolet light source device and control method for extreme ultraviolet light source device Feb 13, 2013 Issued
Array ( [id] => 9656448 [patent_doc_number] => 20140227453 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-08-14 [patent_title] => 'PROCESSING APPARATUS, ION IMPLANTATION APPARATUS AND ION IMPLANTATION METHOD' [patent_app_type] => utility [patent_app_number] => 13/764260 [patent_app_country] => US [patent_app_date] => 2013-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7553 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13764260 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/764260
Processing apparatus and ion implantation apparatus Feb 10, 2013 Issued
Array ( [id] => 9286651 [patent_doc_number] => 08642981 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2014-02-04 [patent_title] => 'Electron microscope assembly for viewing the wafer plane image of an electron beam lithography tool' [patent_app_type] => utility [patent_app_number] => 13/753657 [patent_app_country] => US [patent_app_date] => 2013-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 5055 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13753657 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/753657
Electron microscope assembly for viewing the wafer plane image of an electron beam lithography tool Jan 29, 2013 Issued
Array ( [id] => 9074830 [patent_doc_number] => 08552409 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-08 [patent_title] => 'Wafer temperature correction system for ion implantation device' [patent_app_type] => utility [patent_app_number] => 13/744889 [patent_app_country] => US [patent_app_date] => 2013-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 5805 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13744889 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/744889
Wafer temperature correction system for ion implantation device Jan 17, 2013 Issued
Array ( [id] => 10842130 [patent_doc_number] => RE045206 [patent_country] => US [patent_kind] => E1 [patent_issue_date] => 2014-10-28 [patent_title] => 'Lithography system, sensor and measuring method' [patent_app_type] => reissue [patent_app_number] => 13/738947 [patent_app_country] => US [patent_app_date] => 2013-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 9516 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13738947 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/738947
Lithography system, sensor and measuring method Jan 9, 2013 Issued
Array ( [id] => 9109161 [patent_doc_number] => 20130282293 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-10-24 [patent_title] => 'METHOD AND APPARATUS FOR IDENTIFYING PROTEINS IN MIXTURES' [patent_app_type] => utility [patent_app_number] => 13/736272 [patent_app_country] => US [patent_app_date] => 2013-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 18022 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13736272 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/736272
METHOD AND APPARATUS FOR IDENTIFYING PROTEINS IN MIXTURES Jan 7, 2013 Abandoned
Array ( [id] => 9958487 [patent_doc_number] => 09006695 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-04-14 [patent_title] => 'Use of a mixture comprising erbium and praseodymium as a radiation attenuating composition, radiation attenuating material, and article providing protection against ionising radiation and comprising such a composition' [patent_app_type] => utility [patent_app_number] => 14/369357 [patent_app_country] => US [patent_app_date] => 2012-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 4937 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14369357 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/369357
Use of a mixture comprising erbium and praseodymium as a radiation attenuating composition, radiation attenuating material, and article providing protection against ionising radiation and comprising such a composition Dec 27, 2012 Issued
Array ( [id] => 10958168 [patent_doc_number] => 20140361194 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-12-11 [patent_title] => 'SAMPLE HOLDER FOR ELECTRON MICROSCOPY FOR LOW-CURRENT, LOW-NOISE ANALYSIS' [patent_app_type] => utility [patent_app_number] => 14/369537 [patent_app_country] => US [patent_app_date] => 2012-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2295 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14369537 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/369537
Sample holder for electron microscopy for low-current, low-noise analysis Dec 27, 2012 Issued
Array ( [id] => 9789449 [patent_doc_number] => 20150001393 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-01-01 [patent_title] => 'CHARGED PARTICLE BEAM DEVICE AND INCLINED OBSERVATION IMAGE DISPLAY METHOD' [patent_app_type] => utility [patent_app_number] => 14/370736 [patent_app_country] => US [patent_app_date] => 2012-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7771 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14370736 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/370736
Charged particle beam device and inclined observation image display method Dec 19, 2012 Issued
Array ( [id] => 9428090 [patent_doc_number] => 08704168 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-04-22 [patent_title] => 'End cap voltage control of ion traps' [patent_app_type] => utility [patent_app_number] => 13/717169 [patent_app_country] => US [patent_app_date] => 2012-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2884 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13717169 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/717169
End cap voltage control of ion traps Dec 16, 2012 Issued
Array ( [id] => 9789479 [patent_doc_number] => 20150001423 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-01-01 [patent_title] => 'DEVICE FOR SPOT SIZE MEASUREMENT AT WAFER LEVEL USING A KNIFE EDGE AND A METHOD FOR MANUFACTURING SUCH A DEVICE' [patent_app_type] => utility [patent_app_number] => 14/373893 [patent_app_country] => US [patent_app_date] => 2012-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4318 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14373893 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/373893
Device for spot size measurement at wafer level using a knife edge and a method for manufacturing such a device Dec 4, 2012 Issued
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