David E Harvey
Examiner (ID: 1742)
Most Active Art Unit | 2602 |
Art Unit(s) | 3992, 2621, 2481, 2714, 2602, 2614 |
Total Applications | 1668 |
Issued Applications | 1258 |
Pending Applications | 60 |
Abandoned Applications | 342 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
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[id] => 5282225
[patent_doc_number] => 20090095898
[patent_country] => US
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[patent_issue_date] => 2009-04-16
[patent_title] => 'Collision cell for mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 12/232618
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[patent_app_date] => 2008-09-19
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[pdf_file] => publications/A1/0095/20090095898.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/232618 | Collision cell for mass spectrometer | Sep 18, 2008 | Issued |
Array
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[patent_issue_date] => 2009-03-12
[patent_title] => 'High pressure collision cell for mass spectrometer'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/230949 | High pressure collision cell for mass spectrometer | Sep 7, 2008 | Issued |
Array
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[patent_issue_date] => 2011-10-25
[patent_title] => 'Gas ion source with high mechanical stability'
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[patent_app_number] => 12/199574
[patent_app_country] => US
[patent_app_date] => 2008-08-27
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/199574 | Gas ion source with high mechanical stability | Aug 26, 2008 | Issued |
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[patent_doc_number] => 20110271412
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[patent_issue_date] => 2011-11-03
[patent_title] => 'Method for Measuring a Piezoelectric Response by Means of a Scanning Probe Microscope'
[patent_app_type] => utility
[patent_app_number] => 13/060858
[patent_app_country] => US
[patent_app_date] => 2008-08-27
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[firstpage_image] =>[orig_patent_app_number] => 13060858
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/060858 | Method for measuring a piezoelectric response by means of a scanning probe microscope | Aug 26, 2008 | Issued |
Array
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[patent_issue_date] => 2009-03-05
[patent_title] => 'Mass Spectrometer Equipped With MALDI Ion Source and Sample Plate for MALDI Ion Source'
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[patent_app_number] => 12/197565
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/197565 | Mass spectrometer equipped with MALDI ion source and sample plate for MALDI ion source | Aug 24, 2008 | Issued |
Array
(
[id] => 4513972
[patent_doc_number] => 07921465
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[patent_issue_date] => 2011-04-05
[patent_title] => 'Nanotip repair and characterization using field ion microscopy'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/191855 | Nanotip repair and characterization using field ion microscopy | Aug 13, 2008 | Issued |
Array
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[patent_title] => 'Localized static charge distribution precision measurement method and device'
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[patent_app_date] => 2008-08-12
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[pdf_file] => patents/07/928/07928384.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/222577 | Localized static charge distribution precision measurement method and device | Aug 11, 2008 | Issued |
Array
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[id] => 4946838
[patent_doc_number] => 20080302964
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[patent_issue_date] => 2008-12-11
[patent_title] => 'METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN'
[patent_app_type] => utility
[patent_app_number] => 12/190388
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[patent_app_date] => 2008-08-12
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[pdf_file] => publications/A1/0302/20080302964.pdf
[firstpage_image] =>[orig_patent_app_number] => 12190388
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/190388 | Method and apparatus for inspecting integrated circuit pattern | Aug 11, 2008 | Issued |
Array
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[id] => 5444112
[patent_doc_number] => 20090045338
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[patent_title] => 'Inspection method and apparatus using an electron beam'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/222606 | Inspection method and apparatus using an electron beam | Aug 11, 2008 | Issued |
Array
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[id] => 6597180
[patent_doc_number] => 20100032562
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[patent_issue_date] => 2010-02-11
[patent_title] => 'Slit Disk for Modified Faraday Cup Diagnostic for Determing Power Density of Electron and Ion Beams'
[patent_app_type] => utility
[patent_app_number] => 12/188398
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/188398 | Slit disk for modified faraday cup diagnostic for determining power density of electron and ion beams | Aug 7, 2008 | Issued |
Array
(
[id] => 5413394
[patent_doc_number] => 20090039281
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[patent_issue_date] => 2009-02-12
[patent_title] => 'ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/187635
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/187635 | Aberration corrector and charged particle beam apparatus using the same | Aug 6, 2008 | Issued |
Array
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[id] => 6597531
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[patent_title] => 'Debris protection system having a magnetic field for an EUV light source'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/221822 | Debris protection system having a magnetic field for an EUV light source | Aug 5, 2008 | Issued |
Array
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[id] => 4537268
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[patent_title] => 'Focusing and positioning device for a particle-optical raster microscope'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/222087 | Focusing and positioning device for a particle-optical raster microscope | Jul 31, 2008 | Issued |
Array
(
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[patent_title] => 'Objective lens, electron beam system and method of inspecting defect'
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Array
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[patent_title] => 'MICRO DISCHARGE DEVICE IONIZER AND METHOD OF FABRICATING THE SAME'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/179969 | Micro discharge device ionizer and method of fabricating the same | Jul 24, 2008 | Issued |
Array
(
[id] => 4536087
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[patent_title] => 'Laser annealing method and semiconductor device fabricating method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/219649 | Laser annealing method and semiconductor device fabricating method | Jul 24, 2008 | Issued |
Array
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[patent_title] => 'Apparatus for forming nano pattern and method for forming the nano pattern using the same'
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Array
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[patent_title] => 'A PARTICLE BEAM APPLICATION DEVICE AND AN IRRADIATION DEVICE AS WELL AS A METHOD FOR GUIDING A PARTICLE BEAM'
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Array
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[patent_title] => 'REMOVABLE LINERS FOR CHARGED PARTICLE BEAM SYSTEMS'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/168168 | Removable liners for charged particle beam systems | Jul 6, 2008 | Issued |