Search

David E Harvey

Examiner (ID: 1742)

Most Active Art Unit
2602
Art Unit(s)
3992, 2621, 2481, 2714, 2602, 2614
Total Applications
1668
Issued Applications
1258
Pending Applications
60
Abandoned Applications
342

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5282225 [patent_doc_number] => 20090095898 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-16 [patent_title] => 'Collision cell for mass spectrometer' [patent_app_type] => utility [patent_app_number] => 12/232618 [patent_app_country] => US [patent_app_date] => 2008-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 6960 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0095/20090095898.pdf [firstpage_image] =>[orig_patent_app_number] => 12232618 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/232618
Collision cell for mass spectrometer Sep 18, 2008 Issued
Array ( [id] => 5449656 [patent_doc_number] => 20090065692 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-12 [patent_title] => 'High pressure collision cell for mass spectrometer' [patent_app_type] => utility [patent_app_number] => 12/230949 [patent_app_country] => US [patent_app_date] => 2008-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7722 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0065/20090065692.pdf [firstpage_image] =>[orig_patent_app_number] => 12230949 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/230949
High pressure collision cell for mass spectrometer Sep 7, 2008 Issued
Array ( [id] => 7527777 [patent_doc_number] => 08044370 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-10-25 [patent_title] => 'Gas ion source with high mechanical stability' [patent_app_type] => utility [patent_app_number] => 12/199574 [patent_app_country] => US [patent_app_date] => 2008-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 5475 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/044/08044370.pdf [firstpage_image] =>[orig_patent_app_number] => 12199574 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/199574
Gas ion source with high mechanical stability Aug 26, 2008 Issued
Array ( [id] => 7575756 [patent_doc_number] => 20110271412 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-03 [patent_title] => 'Method for Measuring a Piezoelectric Response by Means of a Scanning Probe Microscope' [patent_app_type] => utility [patent_app_number] => 13/060858 [patent_app_country] => US [patent_app_date] => 2008-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4158 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20110271412.pdf [firstpage_image] =>[orig_patent_app_number] => 13060858 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/060858
Method for measuring a piezoelectric response by means of a scanning probe microscope Aug 26, 2008 Issued
Array ( [id] => 5319562 [patent_doc_number] => 20090057552 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-05 [patent_title] => 'Mass Spectrometer Equipped With MALDI Ion Source and Sample Plate for MALDI Ion Source' [patent_app_type] => utility [patent_app_number] => 12/197565 [patent_app_country] => US [patent_app_date] => 2008-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4370 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0057/20090057552.pdf [firstpage_image] =>[orig_patent_app_number] => 12197565 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/197565
Mass spectrometer equipped with MALDI ion source and sample plate for MALDI ion source Aug 24, 2008 Issued
Array ( [id] => 4513972 [patent_doc_number] => 07921465 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-05 [patent_title] => 'Nanotip repair and characterization using field ion microscopy' [patent_app_type] => utility [patent_app_number] => 12/191855 [patent_app_country] => US [patent_app_date] => 2008-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4757 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/921/07921465.pdf [firstpage_image] =>[orig_patent_app_number] => 12191855 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/191855
Nanotip repair and characterization using field ion microscopy Aug 13, 2008 Issued
Array ( [id] => 4443293 [patent_doc_number] => 07928384 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Localized static charge distribution precision measurement method and device' [patent_app_type] => utility [patent_app_number] => 12/222577 [patent_app_country] => US [patent_app_date] => 2008-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 8921 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928384.pdf [firstpage_image] =>[orig_patent_app_number] => 12222577 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/222577
Localized static charge distribution precision measurement method and device Aug 11, 2008 Issued
Array ( [id] => 4946838 [patent_doc_number] => 20080302964 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-11 [patent_title] => 'METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN' [patent_app_type] => utility [patent_app_number] => 12/190388 [patent_app_country] => US [patent_app_date] => 2008-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 22089 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0302/20080302964.pdf [firstpage_image] =>[orig_patent_app_number] => 12190388 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/190388
Method and apparatus for inspecting integrated circuit pattern Aug 11, 2008 Issued
Array ( [id] => 5444112 [patent_doc_number] => 20090045338 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'Inspection method and apparatus using an electron beam' [patent_app_type] => utility [patent_app_number] => 12/222606 [patent_app_country] => US [patent_app_date] => 2008-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 10057 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20090045338.pdf [firstpage_image] =>[orig_patent_app_number] => 12222606 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/222606
Inspection method and apparatus using an electron beam Aug 11, 2008 Issued
Array ( [id] => 6597180 [patent_doc_number] => 20100032562 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-11 [patent_title] => 'Slit Disk for Modified Faraday Cup Diagnostic for Determing Power Density of Electron and Ion Beams' [patent_app_type] => utility [patent_app_number] => 12/188398 [patent_app_country] => US [patent_app_date] => 2008-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4324 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0032/20100032562.pdf [firstpage_image] =>[orig_patent_app_number] => 12188398 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/188398
Slit disk for modified faraday cup diagnostic for determining power density of electron and ion beams Aug 7, 2008 Issued
Array ( [id] => 5413394 [patent_doc_number] => 20090039281 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-12 [patent_title] => 'ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/187635 [patent_app_country] => US [patent_app_date] => 2008-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7509 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20090039281.pdf [firstpage_image] =>[orig_patent_app_number] => 12187635 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/187635
Aberration corrector and charged particle beam apparatus using the same Aug 6, 2008 Issued
Array ( [id] => 6597531 [patent_doc_number] => 20100032590 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-11 [patent_title] => 'Debris protection system having a magnetic field for an EUV light source' [patent_app_type] => utility [patent_app_number] => 12/221822 [patent_app_country] => US [patent_app_date] => 2008-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8448 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0032/20100032590.pdf [firstpage_image] =>[orig_patent_app_number] => 12221822 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/221822
Debris protection system having a magnetic field for an EUV light source Aug 5, 2008 Issued
Array ( [id] => 4537268 [patent_doc_number] => 07888643 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-15 [patent_title] => 'Focusing and positioning device for a particle-optical raster microscope' [patent_app_type] => utility [patent_app_number] => 12/222087 [patent_app_country] => US [patent_app_date] => 2008-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4135 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/888/07888643.pdf [firstpage_image] =>[orig_patent_app_number] => 12222087 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/222087
Focusing and positioning device for a particle-optical raster microscope Jul 31, 2008 Issued
Array ( [id] => 4849348 [patent_doc_number] => 20080315090 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-25 [patent_title] => 'Objective lens, electron beam system and method of inspecting defect' [patent_app_type] => utility [patent_app_number] => 12/219802 [patent_app_country] => US [patent_app_date] => 2008-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 30096 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20080315090.pdf [firstpage_image] =>[orig_patent_app_number] => 12219802 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/219802
Objective lens, electron beam system and method of inspecting defect Jul 28, 2008 Abandoned
Array ( [id] => 6335350 [patent_doc_number] => 20100019139 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'MICRO DISCHARGE DEVICE IONIZER AND METHOD OF FABRICATING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/179969 [patent_app_country] => US [patent_app_date] => 2008-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2093 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019139.pdf [firstpage_image] =>[orig_patent_app_number] => 12179969 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/179969
Micro discharge device ionizer and method of fabricating the same Jul 24, 2008 Issued
Array ( [id] => 4536087 [patent_doc_number] => 07872246 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-18 [patent_title] => 'Laser annealing method and semiconductor device fabricating method' [patent_app_type] => utility [patent_app_number] => 12/219649 [patent_app_country] => US [patent_app_date] => 2008-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 44 [patent_no_of_words] => 15069 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/872/07872246.pdf [firstpage_image] =>[orig_patent_app_number] => 12219649 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/219649
Laser annealing method and semiconductor device fabricating method Jul 24, 2008 Issued
Array ( [id] => 5413406 [patent_doc_number] => 20090039293 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-12 [patent_title] => 'Apparatus for forming nano pattern and method for forming the nano pattern using the same' [patent_app_type] => utility [patent_app_number] => 12/219547 [patent_app_country] => US [patent_app_date] => 2008-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3969 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20090039293.pdf [firstpage_image] =>[orig_patent_app_number] => 12219547 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/219547
Apparatus for forming nano pattern and method for forming the nano pattern using the same Jul 22, 2008 Issued
Array ( [id] => 5287981 [patent_doc_number] => 20090020711 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-22 [patent_title] => 'A PARTICLE BEAM APPLICATION DEVICE AND AN IRRADIATION DEVICE AS WELL AS A METHOD FOR GUIDING A PARTICLE BEAM' [patent_app_type] => utility [patent_app_number] => 12/218724 [patent_app_country] => US [patent_app_date] => 2008-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5595 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0020/20090020711.pdf [firstpage_image] =>[orig_patent_app_number] => 12218724 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/218724
A PARTICLE BEAM APPLICATION DEVICE AND AN IRRADIATION DEVICE AS WELL AS A METHOD FOR GUIDING A PARTICLE BEAM Jul 16, 2008 Abandoned
Array ( [id] => 4707990 [patent_doc_number] => 20080296516 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'METHOD AND APPARATUS FOR SPECIMEN FABRICATION' [patent_app_type] => utility [patent_app_number] => 12/168238 [patent_app_country] => US [patent_app_date] => 2008-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 30 [patent_no_of_words] => 29023 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20080296516.pdf [firstpage_image] =>[orig_patent_app_number] => 12168238 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/168238
METHOD AND APPARATUS FOR SPECIMEN FABRICATION Jul 6, 2008 Abandoned
Array ( [id] => 4836602 [patent_doc_number] => 20080277597 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-13 [patent_title] => 'REMOVABLE LINERS FOR CHARGED PARTICLE BEAM SYSTEMS' [patent_app_type] => utility [patent_app_number] => 12/168168 [patent_app_country] => US [patent_app_date] => 2008-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4422 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0277/20080277597.pdf [firstpage_image] =>[orig_patent_app_number] => 12168168 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/168168
Removable liners for charged particle beam systems Jul 6, 2008 Issued
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