David E Harvey
Examiner (ID: 1742)
Most Active Art Unit | 2602 |
Art Unit(s) | 3992, 2621, 2481, 2714, 2602, 2614 |
Total Applications | 1668 |
Issued Applications | 1258 |
Pending Applications | 60 |
Abandoned Applications | 342 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 103626
[patent_doc_number] => 07723707
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-05-25
[patent_title] => 'Techniques for plasma injection'
[patent_app_type] => utility
[patent_app_number] => 11/781700
[patent_app_country] => US
[patent_app_date] => 2007-07-23
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[pdf_file] => patents/07/723/07723707.pdf
[firstpage_image] =>[orig_patent_app_number] => 11781700
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/781700 | Techniques for plasma injection | Jul 22, 2007 | Issued |
Array
(
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[patent_doc_number] => 07608817
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[patent_kind] => B2
[patent_issue_date] => 2009-10-27
[patent_title] => 'Adiabatically-tuned linear ion trap with fourier transform mass spectrometry with reduced packet coalescence'
[patent_app_type] => utility
[patent_app_number] => 11/780667
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[pdf_file] => patents/07/608/07608817.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/780667 | Adiabatically-tuned linear ion trap with fourier transform mass spectrometry with reduced packet coalescence | Jul 19, 2007 | Issued |
Array
(
[id] => 4870542
[patent_doc_number] => 20080197276
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[patent_kind] => A1
[patent_issue_date] => 2008-08-21
[patent_title] => 'MASS SPECTROMETER'
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[patent_app_number] => 11/781072
[patent_app_country] => US
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[pdf_file] => publications/A1/0197/20080197276.pdf
[firstpage_image] =>[orig_patent_app_number] => 11781072
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/781072 | Mass spectrometer | Jul 19, 2007 | Issued |
Array
(
[id] => 4795184
[patent_doc_number] => 20080006770
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[patent_kind] => A1
[patent_issue_date] => 2008-01-10
[patent_title] => 'MASS SPECTROMETRIC IMAGING METHOD UNDER AMBIENT CONDITIONS USING ELECTROSPRAY-ASSISTED LASER DESORPTION IONIZATION MASS SPECTROMETRY'
[patent_app_type] => utility
[patent_app_number] => 11/780055
[patent_app_country] => US
[patent_app_date] => 2007-07-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
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[pdf_file] => publications/A1/0006/20080006770.pdf
[firstpage_image] =>[orig_patent_app_number] => 11780055
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/780055 | Mass spectrometric imaging method under ambient conditions using electrospray-assisted laser desorption ionization mass spectrometry | Jul 18, 2007 | Issued |
Array
(
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[patent_doc_number] => 07687788
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[patent_issue_date] => 2010-03-30
[patent_title] => 'Debris prevention system, radiation system, and lithographic apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/826525
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[patent_app_date] => 2007-07-16
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/826525 | Debris prevention system, radiation system, and lithographic apparatus | Jul 15, 2007 | Issued |
Array
(
[id] => 341863
[patent_doc_number] => 07501621
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[patent_issue_date] => 2009-03-10
[patent_title] => 'Data acquisition system for a spectrometer using an adaptive threshold'
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[patent_app_number] => 11/776106
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[pdf_file] => patents/07/501/07501621.pdf
[firstpage_image] =>[orig_patent_app_number] => 11776106
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/776106 | Data acquisition system for a spectrometer using an adaptive threshold | Jul 10, 2007 | Issued |
Array
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[id] => 4919088
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[patent_title] => 'Distortion correcting apparatus for X-ray image tube'
[patent_app_type] => utility
[patent_app_number] => 11/822634
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[patent_app_date] => 2007-07-09
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[firstpage_image] =>[orig_patent_app_number] => 11822634
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/822634 | Distortion correcting apparatus for X-ray image tube | Jul 8, 2007 | Abandoned |
Array
(
[id] => 4648589
[patent_doc_number] => 20080035844
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-14
[patent_title] => 'Inductively coupled plasma mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 11/825702
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[patent_app_date] => 2007-07-09
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[firstpage_image] =>[orig_patent_app_number] => 11825702
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/825702 | Inductively coupled plasma mass spectrometer | Jul 8, 2007 | Issued |
Array
(
[id] => 4919073
[patent_doc_number] => 20080067384
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[patent_issue_date] => 2008-03-20
[patent_title] => 'Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample'
[patent_app_type] => utility
[patent_app_number] => 11/824994
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/824994 | Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample | Jul 1, 2007 | Issued |
Array
(
[id] => 247354
[patent_doc_number] => 07586108
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[patent_issue_date] => 2009-09-08
[patent_title] => 'Radiation detector, method of manufacturing a radiation detector and lithographic apparatus comprising a radiation detector'
[patent_app_type] => utility
[patent_app_number] => 11/819160
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[patent_app_date] => 2007-06-25
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[pdf_file] => patents/07/586/07586108.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/819160 | Radiation detector, method of manufacturing a radiation detector and lithographic apparatus comprising a radiation detector | Jun 24, 2007 | Issued |
Array
(
[id] => 5014001
[patent_doc_number] => 20070257209
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[patent_issue_date] => 2007-11-08
[patent_title] => 'Optimized correction of water thermal deformations in a lithographic process'
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[patent_app_number] => 11/812801
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11812801
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/812801 | Optimized correction of wafer thermal deformations in a lithographic process | Jun 20, 2007 | Issued |
Array
(
[id] => 5208080
[patent_doc_number] => 20070246664
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[patent_title] => 'Laser apparatus, laser irradiation method, semiconductor manufacturing method, semiconductor device, and electronic equipment'
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Array
(
[id] => 23113
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[patent_title] => 'Laser irradiation apparatus and method of manufacturing semiconductor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/812529 | Laser irradiation apparatus and method of manufacturing semiconductor device | Jun 18, 2007 | Issued |
Array
(
[id] => 4828975
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[patent_title] => 'Electric sector time-of-flight mass spectrometer with adjustable ion optical elements'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/818913 | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements | Jun 14, 2007 | Abandoned |
Array
(
[id] => 263320
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[patent_title] => 'Position control for scanning probe spectroscopy'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/763677 | Position control for scanning probe spectroscopy | Jun 14, 2007 | Issued |
Array
(
[id] => 4919131
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[patent_title] => 'Apparatus for Preparing Cross-Sectional Specimen Using Ion Beam'
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Array
(
[id] => 4707964
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/762491 | Lithography system and lithography method using the same | Jun 12, 2007 | Issued |