
David Nhu
Examiner (ID: 12263, Phone: (571)272-1792 , Office: P/2817 )
| Most Active Art Unit | 2818 |
| Art Unit(s) | 2895, 2818, 2817 |
| Total Applications | 2355 |
| Issued Applications | 2255 |
| Pending Applications | 12 |
| Abandoned Applications | 91 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5247082
[patent_doc_number] => 20070243316
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[patent_issue_date] => 2007-10-18
[patent_title] => 'Method for Conditioning a Microelectronics Device Deposition Chamber'
[patent_app_type] => utility
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[pdf_file] => publications/A1/0243/20070243316.pdf
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Array
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[patent_issue_date] => 2010-10-05
[patent_title] => 'Oxide semiconductor, thin-film transistor and method for producing the same'
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Array
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[patent_title] => 'Structure of Metal Interconnect and Fabrication Method Thereof'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/748472 | Structure of metal interconnect and fabrication method thereof | May 13, 2007 | Issued |
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[patent_title] => 'Methods of fabricating glass-based substrates and apparatus employing same'
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Array
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[patent_title] => 'DAMASCENE PROCESS FOR USE IN FABRICATING SEMICONDUCTOR STRUCTURES HAVING MICRO/NANO GAPS'
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Array
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[patent_title] => 'ASYMMETRIC SOURCE/DRAIN TRANSISTOR EMPLOYING SELECTIVE EPITAXIAL GROWTH (SEG) LAYER AND METHOD OF FABRICATING SAME'
[patent_app_type] => utility
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Array
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[id] => 5069569
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[patent_issue_date] => 2007-08-16
[patent_title] => 'Manufacturing method of semiconductor integrated circuit device and probe card'
[patent_app_type] => utility
[patent_app_number] => 11/783778
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Array
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[patent_title] => 'Method of fabricating a self-aligning damascene memory structure'
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Array
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[patent_title] => 'Method for forming a semiconductor structure having nanometer line-width'
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Array
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Array
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Array
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Array
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