
David Ton
Examiner (ID: 3564, Phone: (571)272-3828 , Office: P/2117 )
| Most Active Art Unit | 2117 |
| Art Unit(s) | 2117, 2784, 2782, 2138, 2317, 2133 |
| Total Applications | 1397 |
| Issued Applications | 1295 |
| Pending Applications | 31 |
| Abandoned Applications | 75 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4441220
[patent_doc_number] => 07971110
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[patent_title] => 'System and method for testing a serial attached small computer system interface'
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[pdf_file] => patents/07/971/07971110.pdf
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Array
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[patent_issue_date] => 2011-12-13
[patent_title] => 'Test pin gating for dynamic optimization'
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Array
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[patent_doc_number] => 20110066904
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[patent_kind] => A1
[patent_issue_date] => 2011-03-17
[patent_title] => 'AVOIDING RACE CONDITIONS AT CLOCK DOMAIN CROSSINGS IN AN EDGE BASED SCAN DESIGN'
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[patent_app_number] => 12/557623
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/557623 | Avoiding race conditions at clock domain crossings in an edge based scan design | Sep 10, 2009 | Issued |
Array
(
[id] => 7682479
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[patent_title] => 'ERROR DETECTOR/CORRECTOR, MEMORY CONTROLLER, AND SEMICONDUCTOR MEMORY DEVICE'
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Array
(
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[patent_title] => 'Systems and Methods for Enhanced Flaw Scan in a Data Processing Device'
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Array
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[patent_title] => 'Multi-CSI (Cyclic Shifted Identity) sub-matrix based LDPC (Low Density Parity Check) codes'
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Array
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[patent_issue_date] => 2011-03-10
[patent_title] => 'Systems and Methods for Stepped Data Retry in a Storage System'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/556145 | Systems and methods for stepped data retry in a storage system | Sep 8, 2009 | Issued |
Array
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[id] => 8878816
[patent_doc_number] => 08473800
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[patent_issue_date] => 2013-06-25
[patent_title] => 'Method and apparatus for ACK/NACK reporting'
[patent_app_type] => utility
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Array
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[id] => 8558221
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[patent_title] => 'Transport layer control device, method for transmitting packet, and method for receiving packet'
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Array
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[patent_title] => 'Reducing bit-error rate using adaptive decision feedback equalization'
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Array
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[patent_title] => 'Semiconductor test system with self-inspection of memory repair analysis'
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Array
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Array
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Array
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Array
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Array
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