
David Ton
Examiner (ID: 2768, Phone: (571)272-3828 , Office: P/2117 )
| Most Active Art Unit | 2117 |
| Art Unit(s) | 2782, 2117, 2784, 2317, 2133, 2138 |
| Total Applications | 1397 |
| Issued Applications | 1295 |
| Pending Applications | 31 |
| Abandoned Applications | 75 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4847659
[patent_doc_number] => 20080184067
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-31
[patent_title] => 'Raid system and data recovery apparatus using galois field'
[patent_app_type] => utility
[patent_app_number] => 12/006994
[patent_app_country] => US
[patent_app_date] => 2008-01-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5667
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[pdf_file] => publications/A1/0184/20080184067.pdf
[firstpage_image] =>[orig_patent_app_number] => 12006994
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/006994 | Raid system and data recovery apparatus using galois field | Jan 7, 2008 | Issued |
Array
(
[id] => 4754757
[patent_doc_number] => 20080162833
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-03
[patent_title] => 'Memory device employing dual clocking for generating systematic code and method thereof'
[patent_app_type] => utility
[patent_app_number] => 12/000837
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[patent_app_date] => 2007-12-18
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[firstpage_image] =>[orig_patent_app_number] => 12000837
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/000837 | Memory device employing dual clocking for generating systematic code and method thereof | Dec 17, 2007 | Issued |
Array
(
[id] => 4832590
[patent_doc_number] => 20080131136
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-05
[patent_title] => 'METHOD AND APPARATUS FOR CONVERTING INTERFACE BETWEEN HIGH SPEED DATA HAVING VARIOUS CAPACITIES'
[patent_app_type] => utility
[patent_app_number] => 11/947349
[patent_app_country] => US
[patent_app_date] => 2007-11-29
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11947349
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/947349 | Method and apparatus for converting interface between high speed data having various capacities | Nov 28, 2007 | Issued |
Array
(
[id] => 193007
[patent_doc_number] => 07644334
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-01-05
[patent_title] => 'Requirements-based test generation'
[patent_app_type] => utility
[patent_app_number] => 11/945021
[patent_app_country] => US
[patent_app_date] => 2007-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[firstpage_image] =>[orig_patent_app_number] => 11945021
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/945021 | Requirements-based test generation | Nov 25, 2007 | Issued |
Array
(
[id] => 4923806
[patent_doc_number] => 20080072123
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[patent_kind] => A1
[patent_issue_date] => 2008-03-20
[patent_title] => 'ITERATIVE DECODER EMPLOYING MULTIPLE EXTERNAL CODE ERROR CHECKS TO LOWER THE ERROR FLOOR'
[patent_app_type] => utility
[patent_app_number] => 11/944320
[patent_app_country] => US
[patent_app_date] => 2007-11-21
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11944320
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/944320 | Iterative decoder employing multiple external code error checks to lower the error floor | Nov 20, 2007 | Issued |
Array
(
[id] => 146887
[patent_doc_number] => 07694196
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[patent_issue_date] => 2010-04-06
[patent_title] => 'Self-diagnostic scheme for detecting errors'
[patent_app_type] => utility
[patent_app_number] => 11/943428
[patent_app_country] => US
[patent_app_date] => 2007-11-20
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[firstpage_image] =>[orig_patent_app_number] => 11943428
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/943428 | Self-diagnostic scheme for detecting errors | Nov 19, 2007 | Issued |
Array
(
[id] => 5277053
[patent_doc_number] => 20090129185
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-05-21
[patent_title] => 'SEMICONDUCTOR CIRCUITS CAPABLE OF SELF DETECTING DEFECTS'
[patent_app_type] => utility
[patent_app_number] => 11/941996
[patent_app_country] => US
[patent_app_date] => 2007-11-19
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[patent_drawing_sheets_cnt] => 4
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[pdf_file] => publications/A1/0129/20090129185.pdf
[firstpage_image] =>[orig_patent_app_number] => 11941996
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/941996 | SEMICONDUCTOR CIRCUITS CAPABLE OF SELF DETECTING DEFECTS | Nov 18, 2007 | Abandoned |
Array
(
[id] => 8460931
[patent_doc_number] => 08296615
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-10-23
[patent_title] => 'System and method for generating data migration plan'
[patent_app_type] => utility
[patent_app_number] => 11/941963
[patent_app_country] => US
[patent_app_date] => 2007-11-18
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[patent_drawing_sheets_cnt] => 2
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11941963
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/941963 | System and method for generating data migration plan | Nov 17, 2007 | Issued |
Array
(
[id] => 4847677
[patent_doc_number] => 20080184085
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-31
[patent_title] => 'SEMICONDUCTOR IC INCLUDING PAD FOR WAFER TEST AND METHOD OF TESTING WAFER INCLUDING SEMICONDUCTOR IC'
[patent_app_type] => utility
[patent_app_number] => 11/938480
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[firstpage_image] =>[orig_patent_app_number] => 11938480
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/938480 | Semiconductor IC including pad for wafer test and method of testing wafer including semiconductor IC | Nov 11, 2007 | Issued |
Array
(
[id] => 4470170
[patent_doc_number] => 07882404
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[patent_issue_date] => 2011-02-01
[patent_title] => 'Backplane emulation technique for automated testing'
[patent_app_type] => utility
[patent_app_number] => 11/935759
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/935759 | Backplane emulation technique for automated testing | Nov 5, 2007 | Issued |
Array
(
[id] => 5430325
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[patent_title] => 'Electronic Device Testing System and Method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/935326 | Electronic device testing system and method | Nov 4, 2007 | Issued |
Array
(
[id] => 4559594
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Array
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[id] => 86756
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Array
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Array
(
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Array
(
[id] => 4592865
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/976652 | Semiconductor memory device and method of testing same | Oct 25, 2007 | Issued |
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/513401 | Diagnostic device, diagnostic method, program, and recording medium | Oct 23, 2007 | Issued |
Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/923576 | APPARATUS FOR EFFICIENT LFSR IN A SIMD PROCESSOR | Oct 23, 2007 | Abandoned |