Search

Deoram Persaud

Examiner (ID: 2531)

Most Active Art Unit
2882
Art Unit(s)
2882
Total Applications
881
Issued Applications
633
Pending Applications
83
Abandoned Applications
181

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18904305 [patent_doc_number] => 20240019790 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-18 [patent_title] => GRIPPER AND LITHOGRAPHIC APPARATUS COMPRISING THE GRIPPER [patent_app_type] => utility [patent_app_number] => 18/252491 [patent_app_country] => US [patent_app_date] => 2021-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8019 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18252491 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/252491
GRIPPER AND LITHOGRAPHIC APPARATUS COMPRISING THE GRIPPER Dec 12, 2021 Pending
Array ( [id] => 19912061 [patent_doc_number] => 12288272 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-04-29 [patent_title] => Method for determining a production aerial image of an object to be measured [patent_app_type] => utility [patent_app_number] => 17/547762 [patent_app_country] => US [patent_app_date] => 2021-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17547762 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/547762
Method for determining a production aerial image of an object to be measured Dec 9, 2021 Issued
Array ( [id] => 17483998 [patent_doc_number] => 20220091502 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-24 [patent_title] => IMPRINT APPARATUS AND PRODUCT MANUFACTURING METHOD [patent_app_type] => utility [patent_app_number] => 17/544447 [patent_app_country] => US [patent_app_date] => 2021-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12153 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17544447 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/544447
Imprint apparatus and product manufacturing method Dec 6, 2021 Issued
Array ( [id] => 19052672 [patent_doc_number] => 20240094641 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => INTENSITY ORDER DIFFERENCE BASED METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOF [patent_app_type] => utility [patent_app_number] => 18/255543 [patent_app_country] => US [patent_app_date] => 2021-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14200 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18255543 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/255543
Intensity order difference based metrology system, lithographic apparatus, and methods thereof Dec 1, 2021 Issued
Array ( [id] => 18927667 [patent_doc_number] => 20240030671 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-25 [patent_title] => APPARATUS FOR AND METHOD OF OPTICAL COMPONENT ALIGNMENT [patent_app_type] => utility [patent_app_number] => 18/039613 [patent_app_country] => US [patent_app_date] => 2021-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15368 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18039613 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/039613
APPARATUS FOR AND METHOD OF OPTICAL COMPONENT ALIGNMENT Dec 1, 2021 Pending
Array ( [id] => 18821068 [patent_doc_number] => 20230395409 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-07 [patent_title] => RETICLE EXCHANGE DEVICE WITH RETICLE LEVITATION [patent_app_type] => utility [patent_app_number] => 18/248474 [patent_app_country] => US [patent_app_date] => 2021-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7599 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18248474 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/248474
RETICLE EXCHANGE DEVICE WITH RETICLE LEVITATION Nov 11, 2021 Pending
Array ( [id] => 17549788 [patent_doc_number] => 20220121130 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-21 [patent_title] => CONTROL METHOD AND DEVICE OF OVERLAY ACCURACY [patent_app_type] => utility [patent_app_number] => 17/454242 [patent_app_country] => US [patent_app_date] => 2021-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6901 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17454242 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/454242
Control method and device of overlay accuracy Nov 8, 2021 Issued
Array ( [id] => 18880815 [patent_doc_number] => 20240004184 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-04 [patent_title] => HIGH ACCURACY TEMPERATURE-COMPENSATED PIEZORESISTIVE POSITION SENSING SYSTEM [patent_app_type] => utility [patent_app_number] => 18/037957 [patent_app_country] => US [patent_app_date] => 2021-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15756 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18037957 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/037957
HIGH ACCURACY TEMPERATURE-COMPENSATED PIEZORESISTIVE POSITION SENSING SYSTEM Nov 7, 2021 Pending
Array ( [id] => 18896857 [patent_doc_number] => 20240012342 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-11 [patent_title] => METROLOGY METHOD AND ASSOCIATED METROLOGY AND LITHOGRAPHIC APPARATUSES [patent_app_type] => utility [patent_app_number] => 18/035008 [patent_app_country] => US [patent_app_date] => 2021-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10001 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18035008 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/035008
Metrology method and associated metrology and lithographic apparatuses Nov 3, 2021 Issued
Array ( [id] => 20214770 [patent_doc_number] => 12411421 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-09 [patent_title] => Metrology apparatus based on high harmonic generation and associated method [patent_app_type] => utility [patent_app_number] => 18/253734 [patent_app_country] => US [patent_app_date] => 2021-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 16 [patent_no_of_words] => 13986 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18253734 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/253734
Metrology apparatus based on high harmonic generation and associated method Oct 27, 2021 Issued
Array ( [id] => 18667967 [patent_doc_number] => 11774862 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-03 [patent_title] => Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus [patent_app_type] => utility [patent_app_number] => 17/501911 [patent_app_country] => US [patent_app_date] => 2021-10-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 26 [patent_no_of_words] => 17346 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17501911 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/501911
Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus Oct 13, 2021 Issued
Array ( [id] => 17764716 [patent_doc_number] => 20220238329 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-28 [patent_title] => SEMICONDUCTOR LITHOGRAPHY APPARATUS [patent_app_type] => utility [patent_app_number] => 17/494964 [patent_app_country] => US [patent_app_date] => 2021-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3625 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17494964 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/494964
SEMICONDUCTOR LITHOGRAPHY APPARATUS Oct 5, 2021 Abandoned
Array ( [id] => 18917862 [patent_doc_number] => 11880139 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-01-23 [patent_title] => Photolithography system including selective light array [patent_app_type] => utility [patent_app_number] => 17/482992 [patent_app_country] => US [patent_app_date] => 2021-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 10293 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17482992 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/482992
Photolithography system including selective light array Sep 22, 2021 Issued
Array ( [id] => 20528633 [patent_doc_number] => 12547068 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-02-10 [patent_title] => Information processing apparatus, inspection method, storage medium, exposure apparatus, determination method, and article manufacturing method [patent_app_type] => utility [patent_app_number] => 17/478329 [patent_app_country] => US [patent_app_date] => 2021-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 21 [patent_no_of_words] => 5749 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17478329 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/478329
Information processing apparatus, inspection method, storage medium, exposure apparatus, determination method, and article manufacturing method Sep 16, 2021 Issued
Array ( [id] => 17301262 [patent_doc_number] => 20210397101 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-12-23 [patent_title] => OVERLAY COMPENSATION METHOD, EXPOSURE SYSTEM, SERVER AND READABLE STORAGE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/446825 [patent_app_country] => US [patent_app_date] => 2021-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4661 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17446825 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/446825
OVERLAY COMPENSATION METHOD, EXPOSURE SYSTEM, SERVER AND READABLE STORAGE MEDIUM Sep 1, 2021 Abandoned
Array ( [id] => 17507005 [patent_doc_number] => 20220100108 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-31 [patent_title] => METHOD OF DETERMINING SET OF SAMPLE SHOT REGIONS, METHOD OF OBTAINING MEASUREMENT VALUE, INFORMATION PROCESSING APPARATUS, LITHOGRAPHY APPARATUS, STORAGE MEDIUM, AND ARTICLE MANUFACTURING METHOD [patent_app_type] => utility [patent_app_number] => 17/463769 [patent_app_country] => US [patent_app_date] => 2021-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6219 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17463769 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/463769
Method of determining set of sample shot regions, method of obtaining measurement value, information processing apparatus, lithography apparatus, storage medium, and article manufacturing method Aug 31, 2021 Issued
Array ( [id] => 18222555 [patent_doc_number] => 20230061549 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => METHOD AND DEVICE FOR PLACING SEMICONDUCTOR WAFER [patent_app_type] => utility [patent_app_number] => 17/461076 [patent_app_country] => US [patent_app_date] => 2021-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8319 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17461076 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/461076
Method and device for placing semiconductor wafer Aug 29, 2021 Issued
Array ( [id] => 19283371 [patent_doc_number] => 20240219847 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-04 [patent_title] => REAL-TIME PATTERNING HOTSPOT ANALYZER [patent_app_type] => utility [patent_app_number] => 18/558455 [patent_app_country] => US [patent_app_date] => 2021-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6550 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18558455 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/558455
REAL-TIME PATTERNING HOTSPOT ANALYZER Aug 29, 2021 Pending
Array ( [id] => 17415479 [patent_doc_number] => 20220050383 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-17 [patent_title] => METHOD OF REDUCING EFFECTS OF LENS HEATING AND/OR COOLING IN A LITHOGRAPHIC PROCESS [patent_app_type] => utility [patent_app_number] => 17/458216 [patent_app_country] => US [patent_app_date] => 2021-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12704 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17458216 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/458216
Method of reducing effects of lens heating and/or cooling in a lithographic process Aug 25, 2021 Issued
Array ( [id] => 19933341 [patent_doc_number] => 12306544 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-20 [patent_title] => Metrology tool with position control of projection system [patent_app_type] => utility [patent_app_number] => 18/026115 [patent_app_country] => US [patent_app_date] => 2021-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6457 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18026115 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/026115
Metrology tool with position control of projection system Aug 23, 2021 Issued
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