
Deoram Persaud
Examiner (ID: 2531)
| Most Active Art Unit | 2882 |
| Art Unit(s) | 2882 |
| Total Applications | 881 |
| Issued Applications | 633 |
| Pending Applications | 83 |
| Abandoned Applications | 181 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 18904305
[patent_doc_number] => 20240019790
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-01-18
[patent_title] => GRIPPER AND LITHOGRAPHIC APPARATUS COMPRISING THE GRIPPER
[patent_app_type] => utility
[patent_app_number] => 18/252491
[patent_app_country] => US
[patent_app_date] => 2021-12-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8019
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 83
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18252491
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/252491 | GRIPPER AND LITHOGRAPHIC APPARATUS COMPRISING THE GRIPPER | Dec 12, 2021 | Pending |
Array
(
[id] => 19912061
[patent_doc_number] => 12288272
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-04-29
[patent_title] => Method for determining a production aerial image of an object to be measured
[patent_app_type] => utility
[patent_app_number] => 17/547762
[patent_app_country] => US
[patent_app_date] => 2021-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 0
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 155
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17547762
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/547762 | Method for determining a production aerial image of an object to be measured | Dec 9, 2021 | Issued |
Array
(
[id] => 17483998
[patent_doc_number] => 20220091502
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-03-24
[patent_title] => IMPRINT APPARATUS AND PRODUCT MANUFACTURING METHOD
[patent_app_type] => utility
[patent_app_number] => 17/544447
[patent_app_country] => US
[patent_app_date] => 2021-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12153
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17544447
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/544447 | Imprint apparatus and product manufacturing method | Dec 6, 2021 | Issued |
Array
(
[id] => 19052672
[patent_doc_number] => 20240094641
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-03-21
[patent_title] => INTENSITY ORDER DIFFERENCE BASED METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/255543
[patent_app_country] => US
[patent_app_date] => 2021-12-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 14200
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18255543
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/255543 | Intensity order difference based metrology system, lithographic apparatus, and methods thereof | Dec 1, 2021 | Issued |
Array
(
[id] => 18927667
[patent_doc_number] => 20240030671
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-01-25
[patent_title] => APPARATUS FOR AND METHOD OF OPTICAL COMPONENT ALIGNMENT
[patent_app_type] => utility
[patent_app_number] => 18/039613
[patent_app_country] => US
[patent_app_date] => 2021-12-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 15368
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 158
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18039613
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/039613 | APPARATUS FOR AND METHOD OF OPTICAL COMPONENT ALIGNMENT | Dec 1, 2021 | Pending |
Array
(
[id] => 18821068
[patent_doc_number] => 20230395409
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-12-07
[patent_title] => RETICLE EXCHANGE DEVICE WITH RETICLE LEVITATION
[patent_app_type] => utility
[patent_app_number] => 18/248474
[patent_app_country] => US
[patent_app_date] => 2021-11-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7599
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -21
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18248474
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/248474 | RETICLE EXCHANGE DEVICE WITH RETICLE LEVITATION | Nov 11, 2021 | Pending |
Array
(
[id] => 17549788
[patent_doc_number] => 20220121130
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-04-21
[patent_title] => CONTROL METHOD AND DEVICE OF OVERLAY ACCURACY
[patent_app_type] => utility
[patent_app_number] => 17/454242
[patent_app_country] => US
[patent_app_date] => 2021-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6901
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17454242
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/454242 | Control method and device of overlay accuracy | Nov 8, 2021 | Issued |
Array
(
[id] => 18880815
[patent_doc_number] => 20240004184
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-01-04
[patent_title] => HIGH ACCURACY TEMPERATURE-COMPENSATED PIEZORESISTIVE POSITION SENSING SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/037957
[patent_app_country] => US
[patent_app_date] => 2021-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 15756
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18037957
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/037957 | HIGH ACCURACY TEMPERATURE-COMPENSATED PIEZORESISTIVE POSITION SENSING SYSTEM | Nov 7, 2021 | Pending |
Array
(
[id] => 18896857
[patent_doc_number] => 20240012342
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-01-11
[patent_title] => METROLOGY METHOD AND ASSOCIATED METROLOGY AND LITHOGRAPHIC APPARATUSES
[patent_app_type] => utility
[patent_app_number] => 18/035008
[patent_app_country] => US
[patent_app_date] => 2021-11-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10001
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18035008
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/035008 | Metrology method and associated metrology and lithographic apparatuses | Nov 3, 2021 | Issued |
Array
(
[id] => 20214770
[patent_doc_number] => 12411421
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-09
[patent_title] => Metrology apparatus based on high harmonic generation and associated method
[patent_app_type] => utility
[patent_app_number] => 18/253734
[patent_app_country] => US
[patent_app_date] => 2021-10-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 16
[patent_no_of_words] => 13986
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 88
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18253734
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/253734 | Metrology apparatus based on high harmonic generation and associated method | Oct 27, 2021 | Issued |
Array
(
[id] => 18667967
[patent_doc_number] => 11774862
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-10-03
[patent_title] => Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus
[patent_app_type] => utility
[patent_app_number] => 17/501911
[patent_app_country] => US
[patent_app_date] => 2021-10-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 26
[patent_no_of_words] => 17346
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 57
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17501911
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/501911 | Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus | Oct 13, 2021 | Issued |
Array
(
[id] => 17764716
[patent_doc_number] => 20220238329
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-07-28
[patent_title] => SEMICONDUCTOR LITHOGRAPHY APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/494964
[patent_app_country] => US
[patent_app_date] => 2021-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3625
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 69
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17494964
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/494964 | SEMICONDUCTOR LITHOGRAPHY APPARATUS | Oct 5, 2021 | Abandoned |
Array
(
[id] => 18917862
[patent_doc_number] => 11880139
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-01-23
[patent_title] => Photolithography system including selective light array
[patent_app_type] => utility
[patent_app_number] => 17/482992
[patent_app_country] => US
[patent_app_date] => 2021-09-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 10293
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 116
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17482992
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/482992 | Photolithography system including selective light array | Sep 22, 2021 | Issued |
Array
(
[id] => 20528633
[patent_doc_number] => 12547068
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-02-10
[patent_title] => Information processing apparatus, inspection method, storage medium, exposure apparatus, determination method, and article manufacturing method
[patent_app_type] => utility
[patent_app_number] => 17/478329
[patent_app_country] => US
[patent_app_date] => 2021-09-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 21
[patent_no_of_words] => 5749
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 201
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17478329
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/478329 | Information processing apparatus, inspection method, storage medium, exposure apparatus, determination method, and article manufacturing method | Sep 16, 2021 | Issued |
Array
(
[id] => 17301262
[patent_doc_number] => 20210397101
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2021-12-23
[patent_title] => OVERLAY COMPENSATION METHOD, EXPOSURE SYSTEM, SERVER AND READABLE STORAGE MEDIUM
[patent_app_type] => utility
[patent_app_number] => 17/446825
[patent_app_country] => US
[patent_app_date] => 2021-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4661
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17446825
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/446825 | OVERLAY COMPENSATION METHOD, EXPOSURE SYSTEM, SERVER AND READABLE STORAGE MEDIUM | Sep 1, 2021 | Abandoned |
Array
(
[id] => 17507005
[patent_doc_number] => 20220100108
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-03-31
[patent_title] => METHOD OF DETERMINING SET OF SAMPLE SHOT REGIONS, METHOD OF OBTAINING MEASUREMENT VALUE, INFORMATION PROCESSING APPARATUS, LITHOGRAPHY APPARATUS, STORAGE MEDIUM, AND ARTICLE MANUFACTURING METHOD
[patent_app_type] => utility
[patent_app_number] => 17/463769
[patent_app_country] => US
[patent_app_date] => 2021-09-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6219
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 102
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17463769
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/463769 | Method of determining set of sample shot regions, method of obtaining measurement value, information processing apparatus, lithography apparatus, storage medium, and article manufacturing method | Aug 31, 2021 | Issued |
Array
(
[id] => 18222555
[patent_doc_number] => 20230061549
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-02
[patent_title] => METHOD AND DEVICE FOR PLACING SEMICONDUCTOR WAFER
[patent_app_type] => utility
[patent_app_number] => 17/461076
[patent_app_country] => US
[patent_app_date] => 2021-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8319
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17461076
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/461076 | Method and device for placing semiconductor wafer | Aug 29, 2021 | Issued |
Array
(
[id] => 19283371
[patent_doc_number] => 20240219847
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-04
[patent_title] => REAL-TIME PATTERNING HOTSPOT ANALYZER
[patent_app_type] => utility
[patent_app_number] => 18/558455
[patent_app_country] => US
[patent_app_date] => 2021-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6550
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18558455
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/558455 | REAL-TIME PATTERNING HOTSPOT ANALYZER | Aug 29, 2021 | Pending |
Array
(
[id] => 17415479
[patent_doc_number] => 20220050383
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-02-17
[patent_title] => METHOD OF REDUCING EFFECTS OF LENS HEATING AND/OR COOLING IN A LITHOGRAPHIC PROCESS
[patent_app_type] => utility
[patent_app_number] => 17/458216
[patent_app_country] => US
[patent_app_date] => 2021-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12704
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17458216
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/458216 | Method of reducing effects of lens heating and/or cooling in a lithographic process | Aug 25, 2021 | Issued |
Array
(
[id] => 19933341
[patent_doc_number] => 12306544
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-05-20
[patent_title] => Metrology tool with position control of projection system
[patent_app_type] => utility
[patent_app_number] => 18/026115
[patent_app_country] => US
[patent_app_date] => 2021-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 6457
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18026115
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/026115 | Metrology tool with position control of projection system | Aug 23, 2021 | Issued |