| Application number | Title of the application | Filing Date | Status |
|---|
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[patent_title] => 'Apparatus and method for margin testing single polysilicon EEPROM cells'
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[patent_issue_date] => 2000-10-31
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| 08/989822 | HIGH DENSITY ISOLATION USING AN IMPLANT AS A POLISH STOP | Dec 11, 1997 | Abandoned |
| 08/990141 | SYMMETRICALLY IMPLANTED PUNCH-THROUGH STOPPER FOR RUGGED DMOS POWER DEVICE STRUCTURE AND METHOD OF MAKING SAME | Dec 11, 1997 | Abandoned |
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Array
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[patent_issue_date] => 2000-07-18
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Array
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Array
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| 08/949504 | APPARATUS AND METHOD OF FABRICATING INVERSION CHANNEL DEVICES WITH PRECISION GATE DOPING FOR A MONOLITHIC INTERGRATED CIRCUIT | Oct 13, 1997 | Abandoned |
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