Search

Diem M. Tran

Examiner (ID: 6445, Phone: (571)270-7825 , Office: P/3654 )

Most Active Art Unit
3654
Art Unit(s)
3654
Total Applications
705
Issued Applications
528
Pending Applications
50
Abandoned Applications
147

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 928712 [patent_doc_number] => 07315022 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-01-01 [patent_title] => 'High-speed electron beam inspection' [patent_app_type] => utility [patent_app_number] => 11/031091 [patent_app_country] => US [patent_app_date] => 2005-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2849 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/315/07315022.pdf [firstpage_image] =>[orig_patent_app_number] => 11031091 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/031091
High-speed electron beam inspection Jan 5, 2005 Issued
Array ( [id] => 7048347 [patent_doc_number] => 20050184234 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-25 [patent_title] => 'Standard reference for metrology and calibration method of electron-beam metrology system using the same' [patent_app_type] => utility [patent_app_number] => 11/028219 [patent_app_country] => US [patent_app_date] => 2005-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 7853 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0184/20050184234.pdf [firstpage_image] =>[orig_patent_app_number] => 11028219 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/028219
Standard reference for metrology and calibration method of electron-beam metrology system using the same Jan 3, 2005 Issued
Array ( [id] => 547126 [patent_doc_number] => 07170056 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-30 [patent_title] => 'Methodology and apparatus for leakage detection' [patent_app_type] => utility [patent_app_number] => 11/025197 [patent_app_country] => US [patent_app_date] => 2004-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4729 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/170/07170056.pdf [firstpage_image] =>[orig_patent_app_number] => 11025197 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/025197
Methodology and apparatus for leakage detection Dec 28, 2004 Issued
Array ( [id] => 495545 [patent_doc_number] => 07211810 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-05-01 [patent_title] => 'Method for the protection of an optical element, lithographic apparatus, and device manufacturing method' [patent_app_type] => utility [patent_app_number] => 11/024011 [patent_app_country] => US [patent_app_date] => 2004-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 12357 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/211/07211810.pdf [firstpage_image] =>[orig_patent_app_number] => 11024011 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/024011
Method for the protection of an optical element, lithographic apparatus, and device manufacturing method Dec 28, 2004 Issued
Array ( [id] => 561932 [patent_doc_number] => 07161352 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-09 [patent_title] => 'Beam current measuring device and apparatus using the same' [patent_app_type] => utility [patent_app_number] => 11/023495 [patent_app_country] => US [patent_app_date] => 2004-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 2805 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/161/07161352.pdf [firstpage_image] =>[orig_patent_app_number] => 11023495 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/023495
Beam current measuring device and apparatus using the same Dec 28, 2004 Issued
Array ( [id] => 6942485 [patent_doc_number] => 20050194533 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-08 [patent_title] => 'Method of observing a specimen using a scanning electron microscope' [patent_app_type] => utility [patent_app_number] => 11/020265 [patent_app_country] => US [patent_app_date] => 2004-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4848 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0194/20050194533.pdf [firstpage_image] =>[orig_patent_app_number] => 11020265 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/020265
Method of observing a specimen using a scanning electron microscope Dec 26, 2004 Issued
Array ( [id] => 904136 [patent_doc_number] => 07335881 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-26 [patent_title] => 'Method of measuring dimensions of pattern' [patent_app_type] => utility [patent_app_number] => 11/019995 [patent_app_country] => US [patent_app_date] => 2004-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 51 [patent_no_of_words] => 10139 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/335/07335881.pdf [firstpage_image] =>[orig_patent_app_number] => 11019995 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/019995
Method of measuring dimensions of pattern Dec 22, 2004 Issued
Array ( [id] => 5685787 [patent_doc_number] => 20060284102 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-21 [patent_title] => 'COUPLED IONIZATION APPARATUS AND METHODS' [patent_app_type] => utility [patent_app_number] => 11/018191 [patent_app_country] => US [patent_app_date] => 2004-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3012 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20060284102.pdf [firstpage_image] =>[orig_patent_app_number] => 11018191 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/018191
Coupled ionization apparatus and methods Dec 20, 2004 Issued
Array ( [id] => 6958445 [patent_doc_number] => 20050214815 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-29 [patent_title] => 'Bi-functional polymer chip' [patent_app_type] => utility [patent_app_number] => 11/014225 [patent_app_country] => US [patent_app_date] => 2004-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 5488 [patent_no_of_claims] => 52 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0214/20050214815.pdf [firstpage_image] =>[orig_patent_app_number] => 11014225 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/014225
Bi-functional polymer chip Dec 16, 2004 Issued
Array ( [id] => 708514 [patent_doc_number] => 07060985 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-13 [patent_title] => 'Multipole field-producing apparatus in charged-particle optical system and aberration corrector' [patent_app_type] => utility [patent_app_number] => 11/009962 [patent_app_country] => US [patent_app_date] => 2004-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 4140 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/060/07060985.pdf [firstpage_image] =>[orig_patent_app_number] => 11009962 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/009962
Multipole field-producing apparatus in charged-particle optical system and aberration corrector Dec 9, 2004 Issued
Array ( [id] => 7161786 [patent_doc_number] => 20050199823 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-15 [patent_title] => 'Desorption and ionization of analyte molecules at atmospheric pressure' [patent_app_type] => utility [patent_app_number] => 11/003017 [patent_app_country] => US [patent_app_date] => 2004-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4010 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0199/20050199823.pdf [firstpage_image] =>[orig_patent_app_number] => 11003017 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/003017
Desorption and ionization of analyte molecules at atmospheric pressure Dec 1, 2004 Issued
Array ( [id] => 7213197 [patent_doc_number] => 20050253066 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-17 [patent_title] => 'Electron beam apparatus' [patent_app_type] => utility [patent_app_number] => 10/999124 [patent_app_country] => US [patent_app_date] => 2004-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 52 [patent_figures_cnt] => 52 [patent_no_of_words] => 28308 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0253/20050253066.pdf [firstpage_image] =>[orig_patent_app_number] => 10999124 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/999124
Electron beam apparatus Nov 29, 2004 Issued
Array ( [id] => 700083 [patent_doc_number] => 07067829 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-27 [patent_title] => 'Power sag detection and control in ion implanting system' [patent_app_type] => utility [patent_app_number] => 10/995836 [patent_app_country] => US [patent_app_date] => 2004-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4728 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/067/07067829.pdf [firstpage_image] =>[orig_patent_app_number] => 10995836 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/995836
Power sag detection and control in ion implanting system Nov 22, 2004 Issued
Array ( [id] => 659485 [patent_doc_number] => 07105844 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-12 [patent_title] => 'Method for eliminating low frequency error sources to critical dimension uniformity in shaped beam writing systems' [patent_app_type] => utility [patent_app_number] => 10/996020 [patent_app_country] => US [patent_app_date] => 2004-11-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 3106 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/105/07105844.pdf [firstpage_image] =>[orig_patent_app_number] => 10996020 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/996020
Method for eliminating low frequency error sources to critical dimension uniformity in shaped beam writing systems Nov 21, 2004 Issued
Array ( [id] => 5745619 [patent_doc_number] => 20060108543 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-25 [patent_title] => 'WEAKENING FOCUSING EFFECT OF ACCELERATION-DECELERATION COLUMN OF ION IMPLANTER' [patent_app_type] => utility [patent_app_number] => 10/993346 [patent_app_country] => US [patent_app_date] => 2004-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2322 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0108/20060108543.pdf [firstpage_image] =>[orig_patent_app_number] => 10993346 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/993346
Weakening focusing effect of acceleration-deceleration column of ion implanter Nov 18, 2004 Issued
Array ( [id] => 7176213 [patent_doc_number] => 20050189497 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-01 [patent_title] => 'Systems and methods for treating liquids' [patent_app_type] => utility [patent_app_number] => 10/987172 [patent_app_country] => US [patent_app_date] => 2004-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1884 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0189/20050189497.pdf [firstpage_image] =>[orig_patent_app_number] => 10987172 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/987172
Systems and methods for treating liquids Nov 11, 2004 Issued
Array ( [id] => 415501 [patent_doc_number] => 07279686 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-09 [patent_title] => 'Integrated sub-nanometer-scale electron beam systems' [patent_app_type] => utility [patent_app_number] => 10/983566 [patent_app_country] => US [patent_app_date] => 2004-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 40 [patent_no_of_words] => 16435 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 31 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/279/07279686.pdf [firstpage_image] =>[orig_patent_app_number] => 10983566 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/983566
Integrated sub-nanometer-scale electron beam systems Nov 7, 2004 Issued
Array ( [id] => 5863065 [patent_doc_number] => 20060097195 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-11 [patent_title] => 'Apparatus and methods for two-dimensional ion beam profiling' [patent_app_type] => utility [patent_app_number] => 10/981887 [patent_app_country] => US [patent_app_date] => 2004-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4862 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20060097195.pdf [firstpage_image] =>[orig_patent_app_number] => 10981887 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/981887
Apparatus and methods for two-dimensional ion beam profiling Nov 4, 2004 Issued
Array ( [id] => 646203 [patent_doc_number] => 07119348 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-10-10 [patent_title] => 'Charged beam writing apparatus and writing method' [patent_app_type] => utility [patent_app_number] => 10/972710 [patent_app_country] => US [patent_app_date] => 2004-10-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 4622 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/119/07119348.pdf [firstpage_image] =>[orig_patent_app_number] => 10972710 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/972710
Charged beam writing apparatus and writing method Oct 25, 2004 Issued
Array ( [id] => 668780 [patent_doc_number] => 07095023 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-22 [patent_title] => 'Charged particle beam apparatus, charged particle detection method, and method of manufacturing semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/969856 [patent_app_country] => US [patent_app_date] => 2004-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 18 [patent_no_of_words] => 6917 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/095/07095023.pdf [firstpage_image] =>[orig_patent_app_number] => 10969856 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/969856
Charged particle beam apparatus, charged particle detection method, and method of manufacturing semiconductor device Oct 21, 2004 Issued
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