Search

Diem M. Tran

Examiner (ID: 6445, Phone: (571)270-7825 , Office: P/3654 )

Most Active Art Unit
3654
Art Unit(s)
3654
Total Applications
705
Issued Applications
528
Pending Applications
50
Abandoned Applications
147

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7189085 [patent_doc_number] => 20040084621 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-05-06 [patent_title] => 'Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system' [patent_app_type] => new [patent_app_number] => 10/638328 [patent_app_country] => US [patent_app_date] => 2003-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 11807 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0084/20040084621.pdf [firstpage_image] =>[orig_patent_app_number] => 10638328 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/638328
Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system Aug 11, 2003 Issued
Array ( [id] => 7159046 [patent_doc_number] => 20040075053 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-22 [patent_title] => 'Particle-optical arrangements and particle-optical systems' [patent_app_type] => new [patent_app_number] => 10/634810 [patent_app_country] => US [patent_app_date] => 2003-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8781 [patent_no_of_claims] => 62 [patent_no_of_ind_claims] => 20 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0075/20040075053.pdf [firstpage_image] =>[orig_patent_app_number] => 10634810 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/634810
Particle-optical arrangements and particle-optical systems Aug 5, 2003 Issued
Array ( [id] => 7286235 [patent_doc_number] => 20040108457 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-06-10 [patent_title] => 'Electron microscopy system' [patent_app_type] => new [patent_app_number] => 10/631748 [patent_app_country] => US [patent_app_date] => 2003-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5263 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0108/20040108457.pdf [firstpage_image] =>[orig_patent_app_number] => 10631748 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/631748
Electron microscopy system Jul 31, 2003 Issued
Array ( [id] => 7627969 [patent_doc_number] => 06806467 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-10-19 [patent_title] => 'Continuous time-of-flight ion mass spectrometer' [patent_app_type] => B1 [patent_app_number] => 10/625935 [patent_app_country] => US [patent_app_date] => 2003-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4448 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 9 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/806/06806467.pdf [firstpage_image] =>[orig_patent_app_number] => 10625935 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/625935
Continuous time-of-flight ion mass spectrometer Jul 23, 2003 Issued
Array ( [id] => 759056 [patent_doc_number] => 07015489 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-21 [patent_title] => 'Collector having unused region for illumination systems using a wavelength less than or equal to 193 nm' [patent_app_type] => utility [patent_app_number] => 10/625254 [patent_app_country] => US [patent_app_date] => 2003-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 26 [patent_no_of_words] => 12301 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/015/07015489.pdf [firstpage_image] =>[orig_patent_app_number] => 10625254 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/625254
Collector having unused region for illumination systems using a wavelength less than or equal to 193 nm Jul 22, 2003 Issued
Array ( [id] => 7328604 [patent_doc_number] => 20040129876 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-07-08 [patent_title] => 'Ionization at atomspheric pressure for mass spectrometric analyses' [patent_app_type] => new [patent_app_number] => 10/624913 [patent_app_country] => US [patent_app_date] => 2003-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 7149 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0129/20040129876.pdf [firstpage_image] =>[orig_patent_app_number] => 10624913 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/624913
Ionization at atmospheric pressure for mass spectrometric analyses Jul 21, 2003 Issued
Array ( [id] => 1074011 [patent_doc_number] => 06838676 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-01-04 [patent_title] => 'Particle beam processing system' [patent_app_type] => utility [patent_app_number] => 10/623754 [patent_app_country] => US [patent_app_date] => 2003-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 3421 [patent_no_of_claims] => 67 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 28 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/838/06838676.pdf [firstpage_image] =>[orig_patent_app_number] => 10623754 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/623754
Particle beam processing system Jul 20, 2003 Issued
Array ( [id] => 1081257 [patent_doc_number] => 06835945 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-12-28 [patent_title] => 'Portable shielding system' [patent_app_type] => B2 [patent_app_number] => 10/622228 [patent_app_country] => US [patent_app_date] => 2003-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 6582 [patent_no_of_claims] => 55 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/835/06835945.pdf [firstpage_image] =>[orig_patent_app_number] => 10622228 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/622228
Portable shielding system Jul 17, 2003 Issued
Array ( [id] => 7267693 [patent_doc_number] => 20040056211 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-03-25 [patent_title] => 'Method of surface texturizing' [patent_app_type] => new [patent_app_number] => 10/622178 [patent_app_country] => US [patent_app_date] => 2003-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9789 [patent_no_of_claims] => 56 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0056/20040056211.pdf [firstpage_image] =>[orig_patent_app_number] => 10622178 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/622178
Method of surface texturizing Jul 16, 2003 Issued
Array ( [id] => 975890 [patent_doc_number] => 06933507 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-23 [patent_title] => 'Controlling the characteristics of implanter ion-beams' [patent_app_type] => utility [patent_app_number] => 10/619702 [patent_app_country] => US [patent_app_date] => 2003-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 20 [patent_no_of_words] => 6215 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/933/06933507.pdf [firstpage_image] =>[orig_patent_app_number] => 10619702 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/619702
Controlling the characteristics of implanter ion-beams Jul 14, 2003 Issued
Array ( [id] => 7622119 [patent_doc_number] => 06977382 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-12-20 [patent_title] => 'Method for measuring the intensity profile of an electron beam, in particular a beam of an electron-beam machining device, and/or for measuring an optical system for an electron beam and/or for adjusting an optical system for an electron beam, measuring structure for such a method and electron-beam machining device' [patent_app_type] => utility [patent_app_number] => 10/619933 [patent_app_country] => US [patent_app_date] => 2003-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 4893 [patent_no_of_claims] => 62 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/977/06977382.pdf [firstpage_image] =>[orig_patent_app_number] => 10619933 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/619933
Method for measuring the intensity profile of an electron beam, in particular a beam of an electron-beam machining device, and/or for measuring an optical system for an electron beam and/or for adjusting an optical system for an electron beam, measuring structure for such a method and electron-beam machining device Jul 14, 2003 Issued
Array ( [id] => 1102501 [patent_doc_number] => 06815688 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-11-09 [patent_title] => 'Devices for guiding and manipulating electron beams' [patent_app_type] => B2 [patent_app_number] => 10/615499 [patent_app_country] => US [patent_app_date] => 2003-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 31 [patent_no_of_words] => 10044 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/815/06815688.pdf [firstpage_image] =>[orig_patent_app_number] => 10615499 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/615499
Devices for guiding and manipulating electron beams Jul 7, 2003 Issued
Array ( [id] => 7619829 [patent_doc_number] => 06943356 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-09-13 [patent_title] => 'Tip for nanoscanning electron microscope' [patent_app_type] => utility [patent_app_number] => 10/615452 [patent_app_country] => US [patent_app_date] => 2003-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6090 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/943/06943356.pdf [firstpage_image] =>[orig_patent_app_number] => 10615452 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/615452
Tip for nanoscanning electron microscope Jul 7, 2003 Issued
Array ( [id] => 941463 [patent_doc_number] => 06969854 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-11-29 [patent_title] => 'Arrangement for holding a particle beam apparatus' [patent_app_type] => utility [patent_app_number] => 10/614614 [patent_app_country] => US [patent_app_date] => 2003-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4203 [patent_no_of_claims] => 47 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 34 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/969/06969854.pdf [firstpage_image] =>[orig_patent_app_number] => 10614614 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/614614
Arrangement for holding a particle beam apparatus Jul 6, 2003 Issued
Array ( [id] => 7426945 [patent_doc_number] => 20040007677 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-01-15 [patent_title] => 'Non-magnetic robotic manipulators for moving objects relative to a charged-particle-beam optical system' [patent_app_type] => new [patent_app_number] => 10/612572 [patent_app_country] => US [patent_app_date] => 2003-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6425 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20040007677.pdf [firstpage_image] =>[orig_patent_app_number] => 10612572 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/612572
Non-magnetic robotic manipulators for moving objects relative to a charged-particle-beam optical system Jun 30, 2003 Issued
Array ( [id] => 7420828 [patent_doc_number] => 20040000642 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-01-01 [patent_title] => 'Apparatus and methods for secondary electron emission microscope with dual beam' [patent_app_type] => new [patent_app_number] => 10/610722 [patent_app_country] => US [patent_app_date] => 2003-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7010 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0000/20040000642.pdf [firstpage_image] =>[orig_patent_app_number] => 10610722 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/610722
Apparatus and methods for secondary electron emission microscope with dual beam Jun 30, 2003 Issued
Array ( [id] => 7267696 [patent_doc_number] => 20040056214 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-03-25 [patent_title] => 'ION IMPLANTING APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICES' [patent_app_type] => new [patent_app_number] => 10/608339 [patent_app_country] => US [patent_app_date] => 2003-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2409 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0056/20040056214.pdf [firstpage_image] =>[orig_patent_app_number] => 10608339 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/608339
Ion implanting apparatus for manufacturing semiconductor devices Jun 29, 2003 Issued
Array ( [id] => 1102471 [patent_doc_number] => 06815676 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-11-09 [patent_title] => 'Material defect evaluation apparatus using positron and its evaluation method' [patent_app_type] => B2 [patent_app_number] => 10/606485 [patent_app_country] => US [patent_app_date] => 2003-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4692 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/815/06815676.pdf [firstpage_image] =>[orig_patent_app_number] => 10606485 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/606485
Material defect evaluation apparatus using positron and its evaluation method Jun 25, 2003 Issued
Array ( [id] => 1120711 [patent_doc_number] => 06797955 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-09-28 [patent_title] => 'Filtered e-beam inspection and review' [patent_app_type] => B1 [patent_app_number] => 10/607224 [patent_app_country] => US [patent_app_date] => 2003-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 7656 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/797/06797955.pdf [firstpage_image] =>[orig_patent_app_number] => 10607224 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/607224
Filtered e-beam inspection and review Jun 25, 2003 Issued
Array ( [id] => 7420185 [patent_doc_number] => 20040183009 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-23 [patent_title] => 'MALDI mass spectrometer having a laser steering assembly and method of operating the same' [patent_app_type] => new [patent_app_number] => 10/603526 [patent_app_country] => US [patent_app_date] => 2003-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8323 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0183/20040183009.pdf [firstpage_image] =>[orig_patent_app_number] => 10603526 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/603526
MALDI mass spectrometer having a laser steering assembly and method of operating the same Jun 24, 2003 Abandoned
Menu