
Diem M. Tran
Examiner (ID: 6445, Phone: (571)270-7825 , Office: P/3654 )
| Most Active Art Unit | 3654 |
| Art Unit(s) | 3654 |
| Total Applications | 705 |
| Issued Applications | 528 |
| Pending Applications | 50 |
| Abandoned Applications | 147 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7189085
[patent_doc_number] => 20040084621
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-05-06
[patent_title] => 'Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system'
[patent_app_type] => new
[patent_app_number] => 10/638328
[patent_app_country] => US
[patent_app_date] => 2003-08-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 11807
[patent_no_of_claims] => 40
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0084/20040084621.pdf
[firstpage_image] =>[orig_patent_app_number] => 10638328
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/638328 | Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system | Aug 11, 2003 | Issued |
Array
(
[id] => 7159046
[patent_doc_number] => 20040075053
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-04-22
[patent_title] => 'Particle-optical arrangements and particle-optical systems'
[patent_app_type] => new
[patent_app_number] => 10/634810
[patent_app_country] => US
[patent_app_date] => 2003-08-06
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0075/20040075053.pdf
[firstpage_image] =>[orig_patent_app_number] => 10634810
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/634810 | Particle-optical arrangements and particle-optical systems | Aug 5, 2003 | Issued |
Array
(
[id] => 7286235
[patent_doc_number] => 20040108457
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-06-10
[patent_title] => 'Electron microscopy system'
[patent_app_type] => new
[patent_app_number] => 10/631748
[patent_app_country] => US
[patent_app_date] => 2003-08-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[firstpage_image] =>[orig_patent_app_number] => 10631748
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/631748 | Electron microscopy system | Jul 31, 2003 | Issued |
Array
(
[id] => 7627969
[patent_doc_number] => 06806467
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-10-19
[patent_title] => 'Continuous time-of-flight ion mass spectrometer'
[patent_app_type] => B1
[patent_app_number] => 10/625935
[patent_app_country] => US
[patent_app_date] => 2003-07-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[pdf_file] => patents/06/806/06806467.pdf
[firstpage_image] =>[orig_patent_app_number] => 10625935
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/625935 | Continuous time-of-flight ion mass spectrometer | Jul 23, 2003 | Issued |
Array
(
[id] => 759056
[patent_doc_number] => 07015489
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-03-21
[patent_title] => 'Collector having unused region for illumination systems using a wavelength less than or equal to 193 nm'
[patent_app_type] => utility
[patent_app_number] => 10/625254
[patent_app_country] => US
[patent_app_date] => 2003-07-23
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/015/07015489.pdf
[firstpage_image] =>[orig_patent_app_number] => 10625254
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/625254 | Collector having unused region for illumination systems using a wavelength less than or equal to 193 nm | Jul 22, 2003 | Issued |
Array
(
[id] => 7328604
[patent_doc_number] => 20040129876
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-08
[patent_title] => 'Ionization at atomspheric pressure for mass spectrometric analyses'
[patent_app_type] => new
[patent_app_number] => 10/624913
[patent_app_country] => US
[patent_app_date] => 2003-07-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => publications/A1/0129/20040129876.pdf
[firstpage_image] =>[orig_patent_app_number] => 10624913
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/624913 | Ionization at atmospheric pressure for mass spectrometric analyses | Jul 21, 2003 | Issued |
Array
(
[id] => 1074011
[patent_doc_number] => 06838676
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-01-04
[patent_title] => 'Particle beam processing system'
[patent_app_type] => utility
[patent_app_number] => 10/623754
[patent_app_country] => US
[patent_app_date] => 2003-07-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 3421
[patent_no_of_claims] => 67
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/838/06838676.pdf
[firstpage_image] =>[orig_patent_app_number] => 10623754
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/623754 | Particle beam processing system | Jul 20, 2003 | Issued |
Array
(
[id] => 1081257
[patent_doc_number] => 06835945
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-12-28
[patent_title] => 'Portable shielding system'
[patent_app_type] => B2
[patent_app_number] => 10/622228
[patent_app_country] => US
[patent_app_date] => 2003-07-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
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[pdf_file] => patents/06/835/06835945.pdf
[firstpage_image] =>[orig_patent_app_number] => 10622228
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/622228 | Portable shielding system | Jul 17, 2003 | Issued |
Array
(
[id] => 7267693
[patent_doc_number] => 20040056211
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-03-25
[patent_title] => 'Method of surface texturizing'
[patent_app_type] => new
[patent_app_number] => 10/622178
[patent_app_country] => US
[patent_app_date] => 2003-07-17
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0056/20040056211.pdf
[firstpage_image] =>[orig_patent_app_number] => 10622178
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/622178 | Method of surface texturizing | Jul 16, 2003 | Issued |
Array
(
[id] => 975890
[patent_doc_number] => 06933507
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-08-23
[patent_title] => 'Controlling the characteristics of implanter ion-beams'
[patent_app_type] => utility
[patent_app_number] => 10/619702
[patent_app_country] => US
[patent_app_date] => 2003-07-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/933/06933507.pdf
[firstpage_image] =>[orig_patent_app_number] => 10619702
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/619702 | Controlling the characteristics of implanter ion-beams | Jul 14, 2003 | Issued |
Array
(
[id] => 7622119
[patent_doc_number] => 06977382
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-12-20
[patent_title] => 'Method for measuring the intensity profile of an electron beam, in particular a beam of an electron-beam machining device, and/or for measuring an optical system for an electron beam and/or for adjusting an optical system for an electron beam, measuring structure for such a method and electron-beam machining device'
[patent_app_type] => utility
[patent_app_number] => 10/619933
[patent_app_country] => US
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[pdf_file] => patents/06/977/06977382.pdf
[firstpage_image] =>[orig_patent_app_number] => 10619933
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/619933 | Method for measuring the intensity profile of an electron beam, in particular a beam of an electron-beam machining device, and/or for measuring an optical system for an electron beam and/or for adjusting an optical system for an electron beam, measuring structure for such a method and electron-beam machining device | Jul 14, 2003 | Issued |
Array
(
[id] => 1102501
[patent_doc_number] => 06815688
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-11-09
[patent_title] => 'Devices for guiding and manipulating electron beams'
[patent_app_type] => B2
[patent_app_number] => 10/615499
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/615499 | Devices for guiding and manipulating electron beams | Jul 7, 2003 | Issued |
Array
(
[id] => 7619829
[patent_doc_number] => 06943356
[patent_country] => US
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[patent_issue_date] => 2005-09-13
[patent_title] => 'Tip for nanoscanning electron microscope'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/615452 | Tip for nanoscanning electron microscope | Jul 7, 2003 | Issued |
Array
(
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[patent_issue_date] => 2005-11-29
[patent_title] => 'Arrangement for holding a particle beam apparatus'
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[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/614614 | Arrangement for holding a particle beam apparatus | Jul 6, 2003 | Issued |
Array
(
[id] => 7426945
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[patent_issue_date] => 2004-01-15
[patent_title] => 'Non-magnetic robotic manipulators for moving objects relative to a charged-particle-beam optical system'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/612572 | Non-magnetic robotic manipulators for moving objects relative to a charged-particle-beam optical system | Jun 30, 2003 | Issued |
Array
(
[id] => 7420828
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[patent_country] => US
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[patent_issue_date] => 2004-01-01
[patent_title] => 'Apparatus and methods for secondary electron emission microscope with dual beam'
[patent_app_type] => new
[patent_app_number] => 10/610722
[patent_app_country] => US
[patent_app_date] => 2003-07-01
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/610722 | Apparatus and methods for secondary electron emission microscope with dual beam | Jun 30, 2003 | Issued |
Array
(
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[patent_issue_date] => 2004-03-25
[patent_title] => 'ION IMPLANTING APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICES'
[patent_app_type] => new
[patent_app_number] => 10/608339
[patent_app_country] => US
[patent_app_date] => 2003-06-30
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/608339 | Ion implanting apparatus for manufacturing semiconductor devices | Jun 29, 2003 | Issued |
Array
(
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[patent_title] => 'Material defect evaluation apparatus using positron and its evaluation method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/606485 | Material defect evaluation apparatus using positron and its evaluation method | Jun 25, 2003 | Issued |
Array
(
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[patent_title] => 'Filtered e-beam inspection and review'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/607224 | Filtered e-beam inspection and review | Jun 25, 2003 | Issued |
Array
(
[id] => 7420185
[patent_doc_number] => 20040183009
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[patent_title] => 'MALDI mass spectrometer having a laser steering assembly and method of operating the same'
[patent_app_type] => new
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[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/603526 | MALDI mass spectrometer having a laser steering assembly and method of operating the same | Jun 24, 2003 | Abandoned |