
Dominic Joseph Bologna
Examiner (ID: 1442, Phone: (571)272-9282 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877 |
| Total Applications | 877 |
| Issued Applications | 705 |
| Pending Applications | 96 |
| Abandoned Applications | 115 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 9864079
[patent_doc_number] => 20150044098
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-02-12
[patent_title] => 'HYPERSPECTRAL IMAGING SYSTEMS, UNITS, AND METHODS'
[patent_app_type] => utility
[patent_app_number] => 14/374518
[patent_app_country] => US
[patent_app_date] => 2013-01-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 30624
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14374518
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/374518 | HYPERSPECTRAL IMAGING SYSTEMS, UNITS, AND METHODS | Jan 29, 2013 | Abandoned |
Array
(
[id] => 9052580
[patent_doc_number] => 20130250294
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-09-26
[patent_title] => 'AUTOMATIC REAL-TIME WAVELENGTH CALIBRATION OF FIBER-OPTIC-BASED SPECTROMETERS'
[patent_app_type] => utility
[patent_app_number] => 13/743210
[patent_app_country] => US
[patent_app_date] => 2013-01-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5850
[patent_no_of_claims] => 96
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13743210
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/743210 | Automatic real-time wavelength calibration of fiber-optic-based spectrometers | Jan 15, 2013 | Issued |
Array
(
[id] => 8926496
[patent_doc_number] => 20130182256
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-07-18
[patent_title] => 'APPARATUS AND METHOD FOR OBTAINING SPECTRAL CHARACTERISTICS'
[patent_app_type] => utility
[patent_app_number] => 13/741513
[patent_app_country] => US
[patent_app_date] => 2013-01-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
[patent_figures_cnt] => 23
[patent_no_of_words] => 9335
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13741513
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/741513 | Apparatus and method for obtaining spectral characteristics | Jan 14, 2013 | Issued |
Array
(
[id] => 10040486
[patent_doc_number] => 09081187
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-07-14
[patent_title] => 'Multiple parallel confocal system and surface measurement method using the same'
[patent_app_type] => utility
[patent_app_number] => 14/350578
[patent_app_country] => US
[patent_app_date] => 2013-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 22
[patent_no_of_words] => 6790
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 224
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14350578
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/350578 | Multiple parallel confocal system and surface measurement method using the same | Jan 10, 2013 | Issued |
Array
(
[id] => 8926500
[patent_doc_number] => 20130182260
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-07-18
[patent_title] => 'Swept source optical coherence tomography (OCT) method and system'
[patent_app_type] => utility
[patent_app_number] => 13/729643
[patent_app_country] => US
[patent_app_date] => 2012-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3526
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13729643
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/729643 | Swept source optical coherence tomography (OCT) method and system | Dec 27, 2012 | Issued |
Array
(
[id] => 10917833
[patent_doc_number] => 20140320852
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-10-30
[patent_title] => 'DEPOLARIZER, TELESCOPE AND REMOTE SENSING DEVICE AND METHOD'
[patent_app_type] => utility
[patent_app_number] => 14/363552
[patent_app_country] => US
[patent_app_date] => 2012-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4731
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14363552
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/363552 | Depolarizer, telescope and remote sensing device and method | Dec 9, 2012 | Issued |
Array
(
[id] => 10937659
[patent_doc_number] => 20140340680
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-11-20
[patent_title] => 'APPARATUS AND METHOD FOR MOBILE DEVICE CAMERA TESTING'
[patent_app_type] => utility
[patent_app_number] => 14/361747
[patent_app_country] => US
[patent_app_date] => 2012-11-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5245
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14361747
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/361747 | APPARATUS AND METHOD FOR MOBILE DEVICE CAMERA TESTING | Nov 29, 2012 | Abandoned |
Array
(
[id] => 14090259
[patent_doc_number] => 10241030
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-03-26
[patent_title] => Optical spectrometer and downhole spectrometry method
[patent_app_type] => utility
[patent_app_number] => 14/359345
[patent_app_country] => US
[patent_app_date] => 2012-11-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 3363
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 208
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14359345
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/359345 | Optical spectrometer and downhole spectrometry method | Nov 29, 2012 | Issued |
Array
(
[id] => 8790289
[patent_doc_number] => 20130107258
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-05-02
[patent_title] => 'Downhole Sensors Using Anisotropic Permittivity'
[patent_app_type] => utility
[patent_app_number] => 13/688907
[patent_app_country] => US
[patent_app_date] => 2012-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 7314
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13688907
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/688907 | Downhole Sensors Using Anisotropic Permittivity | Nov 28, 2012 | Abandoned |
Array
(
[id] => 13001987
[patent_doc_number] => 10024655
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-07-17
[patent_title] => Ambient light rejection for non-imaging contact sensors
[patent_app_type] => utility
[patent_app_number] => 13/676058
[patent_app_country] => US
[patent_app_date] => 2012-11-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 14
[patent_no_of_words] => 9765
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 199
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13676058
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/676058 | Ambient light rejection for non-imaging contact sensors | Nov 12, 2012 | Issued |
Array
(
[id] => 8790305
[patent_doc_number] => 20130107274
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-05-02
[patent_title] => 'OPTICAL IMAGING AND MAPPING USING PROPAGATION MODES OF LIGHT'
[patent_app_type] => utility
[patent_app_number] => 13/665796
[patent_app_country] => US
[patent_app_date] => 2012-10-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 22
[patent_no_of_words] => 15030
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13665796
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/665796 | OPTICAL IMAGING AND MAPPING USING PROPAGATION MODES OF LIGHT | Oct 30, 2012 | Abandoned |
Array
(
[id] => 9732422
[patent_doc_number] => 20140268131
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-09-18
[patent_title] => 'MEASUREMENT APPARATUS AND MEASUREMENT METHOD'
[patent_app_type] => utility
[patent_app_number] => 14/360248
[patent_app_country] => US
[patent_app_date] => 2012-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 19552
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14360248
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/360248 | Measurement apparatus and measurement method | Oct 28, 2012 | Issued |
Array
(
[id] => 9782931
[patent_doc_number] => 20140299750
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-10-09
[patent_title] => 'CHEMICAL SENSOR, CHEMICAL SENSOR MODULE, CHEMICAL DETECTION APPARATUS, AND CHEMICAL DETECTION METHOD'
[patent_app_type] => utility
[patent_app_number] => 14/356730
[patent_app_country] => US
[patent_app_date] => 2012-10-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 25
[patent_no_of_words] => 11591
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14356730
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/356730 | Chemical sensor, chemical sensor module, chemical detection apparatus, and chemical detection method | Oct 25, 2012 | Issued |
Array
(
[id] => 9092461
[patent_doc_number] => 20130271772
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-10-17
[patent_title] => 'Multi-speed OCT swept source with optimized k-clock'
[patent_app_type] => utility
[patent_app_number] => 13/650665
[patent_app_country] => US
[patent_app_date] => 2012-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 8003
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13650665
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/650665 | Multi-speed OCT swept source with optimized k-clock | Oct 11, 2012 | Issued |
Array
(
[id] => 11780029
[patent_doc_number] => 09389189
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-07-12
[patent_title] => 'Dark-field semiconductor wafer inspection device'
[patent_app_type] => utility
[patent_app_number] => 14/350978
[patent_app_country] => US
[patent_app_date] => 2012-10-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 12
[patent_no_of_words] => 6531
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14350978
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/350978 | Dark-field semiconductor wafer inspection device | Oct 8, 2012 | Issued |
Array
(
[id] => 9924390
[patent_doc_number] => 08982362
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-03-17
[patent_title] => 'System and method for measuring layer thickness and depositing semiconductor layers'
[patent_app_type] => utility
[patent_app_number] => 13/645000
[patent_app_country] => US
[patent_app_date] => 2012-10-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3728
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 135
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13645000
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/645000 | System and method for measuring layer thickness and depositing semiconductor layers | Oct 3, 2012 | Issued |
Array
(
[id] => 8719039
[patent_doc_number] => 20130070256
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-03-21
[patent_title] => 'MEASURING APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 13/611156
[patent_app_country] => US
[patent_app_date] => 2012-09-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5523
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13611156
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/611156 | MEASURING APPARATUS | Sep 11, 2012 | Abandoned |
Array
(
[id] => 9828496
[patent_doc_number] => 08937726
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-01-20
[patent_title] => 'Rotary position measuring instrument'
[patent_app_type] => utility
[patent_app_number] => 13/603846
[patent_app_country] => US
[patent_app_date] => 2012-09-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 4320
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 155
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13603846
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/603846 | Rotary position measuring instrument | Sep 4, 2012 | Issued |
Array
(
[id] => 9329010
[patent_doc_number] => 20140055792
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-02-27
[patent_title] => 'ESTIMATING MATERIAL PROPERTIES USING SPECKLE STATISTICS'
[patent_app_type] => utility
[patent_app_number] => 13/595058
[patent_app_country] => US
[patent_app_date] => 2012-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5941
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13595058
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/595058 | Estimating material properties using speckle statistics | Aug 26, 2012 | Issued |
Array
(
[id] => 8864417
[patent_doc_number] => 20130148120
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-06-13
[patent_title] => 'OVERLAY MEASURING METHOD'
[patent_app_type] => utility
[patent_app_number] => 13/566248
[patent_app_country] => US
[patent_app_date] => 2012-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 14877
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13566248
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/566248 | OVERLAY MEASURING METHOD | Aug 2, 2012 | Abandoned |