
Dung H. Bui
Examiner (ID: 7927, Phone: (571)270-7077 , Office: P/1773 )
| Most Active Art Unit | 1773 |
| Art Unit(s) | 4153, 1773, 1797, 1775, 1776, 1772 |
| Total Applications | 1707 |
| Issued Applications | 1289 |
| Pending Applications | 185 |
| Abandoned Applications | 275 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6012235
[patent_doc_number] => 20020100895
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-08-01
[patent_title] => 'Chemical mechanical polishing slurry'
[patent_app_type] => new
[patent_app_number] => 09/770547
[patent_app_country] => US
[patent_app_date] => 2001-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1806
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 23
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0100/20020100895.pdf
[firstpage_image] =>[orig_patent_app_number] => 09770547
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/770547 | Chemical mechanical polishing slurry | Jan 25, 2001 | Abandoned |
Array
(
[id] => 1550529
[patent_doc_number] => 06399503
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-06-04
[patent_title] => 'Method of preventing dishing phenomenon atop a dual damascene structure'
[patent_app_type] => B1
[patent_app_number] => 09/764329
[patent_app_country] => US
[patent_app_date] => 2001-01-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 1825
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 196
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/399/06399503.pdf
[firstpage_image] =>[orig_patent_app_number] => 09764329
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/764329 | Method of preventing dishing phenomenon atop a dual damascene structure | Jan 18, 2001 | Issued |
Array
(
[id] => 6887808
[patent_doc_number] => 20010008802
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-07-19
[patent_title] => 'Manufacturing method semiconductor integrated circuit including simultaneous formation of via hole reaching metal wiring and concave groove in interlayter film and semiconductor integrated circuit manufactured with the manufacturing method'
[patent_app_type] => new-utility
[patent_app_number] => 09/751979
[patent_app_country] => US
[patent_app_date] => 2000-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3662
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 258
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0008/20010008802.pdf
[firstpage_image] =>[orig_patent_app_number] => 09751979
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/751979 | MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING SIMULTANEOUS FORMATION OF VIA-HOLE REACHING METAL WIRING AND CONCAVE GROOVE IN INTERLAYER FILM AND SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURED WITH THE MANUFACTURING METHOD | Dec 28, 2000 | Issued |
Array
(
[id] => 1231475
[patent_doc_number] => 06693042
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-02-17
[patent_title] => 'Method for etching a dielectric layer formed upon a barrier layer'
[patent_app_type] => B1
[patent_app_number] => 09/752539
[patent_app_country] => US
[patent_app_date] => 2000-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 8
[patent_no_of_words] => 7686
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/693/06693042.pdf
[firstpage_image] =>[orig_patent_app_number] => 09752539
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/752539 | Method for etching a dielectric layer formed upon a barrier layer | Dec 27, 2000 | Issued |
Array
(
[id] => 7041050
[patent_doc_number] => 20010005637
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-06-28
[patent_title] => 'Method for fabricating semiconductor device'
[patent_app_type] => new-utility
[patent_app_number] => 09/745429
[patent_app_country] => US
[patent_app_date] => 2000-12-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3020
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 239
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0005/20010005637.pdf
[firstpage_image] =>[orig_patent_app_number] => 09745429
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/745429 | Method for fabricating semiconductor device | Dec 25, 2000 | Issued |
Array
(
[id] => 7105366
[patent_doc_number] => 20010004538
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-06-21
[patent_title] => 'High through-put copper CMP with reduced erosion and dishing'
[patent_app_type] => new-utility
[patent_app_number] => 09/741538
[patent_app_country] => US
[patent_app_date] => 2000-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 6018
[patent_no_of_claims] => 42
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0004/20010004538.pdf
[firstpage_image] =>[orig_patent_app_number] => 09741538
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/741538 | High through-put copper CMP with reduced erosion and dishing | Dec 19, 2000 | Abandoned |
Array
(
[id] => 6141875
[patent_doc_number] => 20020001959
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-01-03
[patent_title] => 'Method of manufacturing semiconductor device, and semiconductor device manufactured thereby'
[patent_app_type] => new
[patent_app_number] => 09/739229
[patent_app_country] => US
[patent_app_date] => 2000-12-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4387
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0001/20020001959.pdf
[firstpage_image] =>[orig_patent_app_number] => 09739229
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/739229 | Method of manufacturing semiconductor device, and semiconductor device manufactured thereby | Dec 18, 2000 | Issued |
Array
(
[id] => 6946605
[patent_doc_number] => 20010020516
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-09-13
[patent_title] => 'Apparatus for performing self cleaning method of forming deep trenches in silicon substrates'
[patent_app_type] => new
[patent_app_number] => 09/740146
[patent_app_country] => US
[patent_app_date] => 2000-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 20611
[patent_no_of_claims] => 37
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0020/20010020516.pdf
[firstpage_image] =>[orig_patent_app_number] => 09740146
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/740146 | Apparatus for performing self cleaning method of forming deep trenches in silicon substrates | Dec 17, 2000 | Issued |
Array
(
[id] => 6122601
[patent_doc_number] => 20020074311
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-06-20
[patent_title] => 'Methods of endpoint detection for wafer planarization'
[patent_app_type] => new
[patent_app_number] => 09/727935
[patent_app_country] => US
[patent_app_date] => 2000-12-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3311
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0074/20020074311.pdf
[firstpage_image] =>[orig_patent_app_number] => 09727935
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/727935 | Methods of endpoint detection for wafer planarization | Nov 30, 2000 | Abandoned |
Array
(
[id] => 6892979
[patent_doc_number] => 20010015345
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-08-23
[patent_title] => 'Planarized copper cleaning for reduced defects'
[patent_app_type] => new
[patent_app_number] => 09/727133
[patent_app_country] => US
[patent_app_date] => 2000-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 4012
[patent_no_of_claims] => 60
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0015/20010015345.pdf
[firstpage_image] =>[orig_patent_app_number] => 09727133
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/727133 | Planarized copper cleaning for reduced defects | Nov 28, 2000 | Issued |
Array
(
[id] => 1567267
[patent_doc_number] => 06497238
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-12-24
[patent_title] => 'Method of manufacturing electronic devices and apparatus for carrying out such a method'
[patent_app_type] => B1
[patent_app_number] => 09/723133
[patent_app_country] => US
[patent_app_date] => 2000-11-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3768
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 183
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/497/06497238.pdf
[firstpage_image] =>[orig_patent_app_number] => 09723133
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/723133 | Method of manufacturing electronic devices and apparatus for carrying out such a method | Nov 26, 2000 | Issued |
Array
(
[id] => 1005208
[patent_doc_number] => 06905800
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-06-14
[patent_title] => 'Etching a substrate in a process zone'
[patent_app_type] => utility
[patent_app_number] => 09/718319
[patent_app_country] => US
[patent_app_date] => 2000-11-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 15
[patent_no_of_words] => 10262
[patent_no_of_claims] => 54
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 66
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/905/06905800.pdf
[firstpage_image] =>[orig_patent_app_number] => 09718319
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/718319 | Etching a substrate in a process zone | Nov 20, 2000 | Issued |
Array
(
[id] => 1396676
[patent_doc_number] => 06513537
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-02-04
[patent_title] => 'Substrate processing method and substrate processing apparatus'
[patent_app_type] => B1
[patent_app_number] => 09/702679
[patent_app_country] => US
[patent_app_date] => 2000-11-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 12
[patent_no_of_words] => 9431
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/513/06513537.pdf
[firstpage_image] =>[orig_patent_app_number] => 09702679
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/702679 | Substrate processing method and substrate processing apparatus | Oct 31, 2000 | Issued |
Array
(
[id] => 1088195
[patent_doc_number] => 06827870
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-12-07
[patent_title] => 'Method and apparatus for etching and deposition using micro-plasmas'
[patent_app_type] => B1
[patent_app_number] => 09/686259
[patent_app_country] => US
[patent_app_date] => 2000-10-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 12
[patent_no_of_words] => 8165
[patent_no_of_claims] => 48
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 25
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/827/06827870.pdf
[firstpage_image] =>[orig_patent_app_number] => 09686259
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/686259 | Method and apparatus for etching and deposition using micro-plasmas | Oct 10, 2000 | Issued |
Array
(
[id] => 4322339
[patent_doc_number] => 06312557
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-06
[patent_title] => 'Method and apparatus for using photoemission to determine the endpoint of an etch process'
[patent_app_type] => 1
[patent_app_number] => 9/680246
[patent_app_country] => US
[patent_app_date] => 2000-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 4497
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 159
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/312/06312557.pdf
[firstpage_image] =>[orig_patent_app_number] => 680246
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/680246 | Method and apparatus for using photoemission to determine the endpoint of an etch process | Oct 4, 2000 | Issued |
Array
(
[id] => 1434669
[patent_doc_number] => 06354309
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-12
[patent_title] => 'Process for treating a semiconductor substrate'
[patent_app_type] => B1
[patent_app_number] => 09/671730
[patent_app_country] => US
[patent_app_date] => 2000-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 1731
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/354/06354309.pdf
[firstpage_image] =>[orig_patent_app_number] => 09671730
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/671730 | Process for treating a semiconductor substrate | Sep 28, 2000 | Issued |
Array
(
[id] => 1462659
[patent_doc_number] => 06350696
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-02-26
[patent_title] => 'Spacer etch method for semiconductor device'
[patent_app_type] => B1
[patent_app_number] => 09/671209
[patent_app_country] => US
[patent_app_date] => 2000-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 1986
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 148
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/350/06350696.pdf
[firstpage_image] =>[orig_patent_app_number] => 09671209
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/671209 | Spacer etch method for semiconductor device | Sep 27, 2000 | Issued |
Array
(
[id] => 4321942
[patent_doc_number] => 06283131
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-09-04
[patent_title] => 'In-situ strip process for polysilicon etching in deep sub-micron technology'
[patent_app_type] => 1
[patent_app_number] => 9/669159
[patent_app_country] => US
[patent_app_date] => 2000-09-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 12
[patent_no_of_words] => 3539
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 170
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/283/06283131.pdf
[firstpage_image] =>[orig_patent_app_number] => 669159
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/669159 | In-situ strip process for polysilicon etching in deep sub-micron technology | Sep 24, 2000 | Issued |
Array
(
[id] => 1561247
[patent_doc_number] => 06362106
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-26
[patent_title] => 'Chemical mechanical polishing method useful for copper substrates'
[patent_app_type] => B1
[patent_app_number] => 09/660847
[patent_app_country] => US
[patent_app_date] => 2000-09-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 7257
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/362/06362106.pdf
[firstpage_image] =>[orig_patent_app_number] => 09660847
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/660847 | Chemical mechanical polishing method useful for copper substrates | Sep 12, 2000 | Issued |
Array
(
[id] => 1488769
[patent_doc_number] => 06416615
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-07-09
[patent_title] => 'Device for detecting abnormality in chemical-mechanical polishing operation'
[patent_app_type] => B1
[patent_app_number] => 09/660863
[patent_app_country] => US
[patent_app_date] => 2000-09-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 2395
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/416/06416615.pdf
[firstpage_image] =>[orig_patent_app_number] => 09660863
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/660863 | Device for detecting abnormality in chemical-mechanical polishing operation | Sep 12, 2000 | Issued |