Edward Michael Wacyra

Array ( [id] => 20616029 [patent_doc_number] => 20260086120 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-03-26 [patent_title] => METHOD OF TESTING SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/890785 [patent_app_country] => US [patent_app_date] => 2024-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18890785 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20512342 [patent_doc_number] => 20260036443 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-02-05 [patent_title] => SYSTEMS, METHODS, AND TECHNIQUES FOR VARYING OUTPUT RESOLUTION OF A SENSOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/788327 [patent_app_country] => US [patent_app_date] => 2024-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15389 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18788327 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19771362 [patent_doc_number] => 20250052788 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-13 [patent_title] => SYSTEMS, APPARATUSES, AND METHODS FOR ON CHIP DYNAMIC IR DROP OSCILLOSCOPE [patent_app_type] => utility [patent_app_number] => 18/788967 [patent_app_country] => US [patent_app_date] => 2024-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10508 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18788967 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19544326 [patent_doc_number] => 20240361362 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-31 [patent_title] => CURRENT SENSOR [patent_app_type] => utility [patent_app_number] => 18/767125 [patent_app_country] => US [patent_app_date] => 2024-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7268 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 281 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18767125 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19513446 [patent_doc_number] => 20240345132 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING [patent_app_type] => utility [patent_app_number] => 18/748876 [patent_app_country] => US [patent_app_date] => 2024-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6792 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 305 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18748876 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20280840 [patent_doc_number] => 20250306082 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-10-02 [patent_title] => TESTING JIG AND METHOD FOR TESTING AT LEAST ONE ASSEMBLY INCLUDING CIRCUIT BOARD AND LASERS THEREON [patent_app_type] => utility [patent_app_number] => 18/740103 [patent_app_country] => US [patent_app_date] => 2024-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18740103 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20609362 [patent_doc_number] => 12584960 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-03-24 [patent_title] => Test apparatus for semiconductor package [patent_app_type] => utility [patent_app_number] => 18/738341 [patent_app_country] => US [patent_app_date] => 2024-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 2451 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 248 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18738341 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19710608 [patent_doc_number] => 20250020750 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => PROBE CARD TEST SYSTEM AND METHOD [patent_app_type] => utility [patent_app_number] => 18/734009 [patent_app_country] => US [patent_app_date] => 2024-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8079 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18734009 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19632519 [patent_doc_number] => 20240410968 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => SENSING BLOCK INSPECTION DEVICE THERMALLY FUSED AND LASER-WELDED TO BE MOUNTED ON BATTERY MODULE [patent_app_type] => utility [patent_app_number] => 18/674925 [patent_app_country] => US [patent_app_date] => 2024-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7992 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 275 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18674925 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19433911 [patent_doc_number] => 20240302409 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-12 [patent_title] => MEASUREMENT UNIT [patent_app_type] => utility [patent_app_number] => 18/666102 [patent_app_country] => US [patent_app_date] => 2024-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5650 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 233 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18666102 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20350877 [patent_doc_number] => 20250347729 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-11-13 [patent_title] => ANALYZING BUNDLES OF WIRES [patent_app_type] => utility [patent_app_number] => 18/657422 [patent_app_country] => US [patent_app_date] => 2024-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7102 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -25 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18657422 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19573185 [patent_doc_number] => 20240377477 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => MEASUREMENT APPARATUS AND MEASUREMENT METHOD [patent_app_type] => utility [patent_app_number] => 18/655776 [patent_app_country] => US [patent_app_date] => 2024-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6486 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 204 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18655776 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19941550 [patent_doc_number] => 12313676 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2025-05-27 [patent_title] => Planarity control for load pull tuner on wafer [patent_app_type] => utility [patent_app_number] => 18/646174 [patent_app_country] => US [patent_app_date] => 2024-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 0 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 265 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18646174 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19544367 [patent_doc_number] => 20240361403 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-31 [patent_title] => MAGNETIC SENSOR [patent_app_type] => utility [patent_app_number] => 18/642084 [patent_app_country] => US [patent_app_date] => 2024-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14476 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18642084 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19573145 [patent_doc_number] => 20240377437 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF [patent_app_type] => utility [patent_app_number] => 18/632321 [patent_app_country] => US [patent_app_date] => 2024-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4647 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18632321 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19573144 [patent_doc_number] => 20240377436 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF [patent_app_type] => utility [patent_app_number] => 18/632322 [patent_app_country] => US [patent_app_date] => 2024-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4536 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 257 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18632322 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19985101 [patent_doc_number] => 20250123323 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-17 [patent_title] => SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME [patent_app_type] => utility [patent_app_number] => 18/628896 [patent_app_country] => US [patent_app_date] => 2024-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18628896 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19497047 [patent_doc_number] => 20240336065 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-10 [patent_title] => FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSPECTING FLEXIBLE ELECTRIC WIRING SUBSTRATE [patent_app_type] => utility [patent_app_number] => 18/602732 [patent_app_country] => US [patent_app_date] => 2024-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9341 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18602732 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19235058 [patent_doc_number] => 20240192252 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-13 [patent_title] => CHIP SOCKET, TESTING FIXTURE AND CHIP TESTING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/585507 [patent_app_country] => US [patent_app_date] => 2024-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4961 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18585507 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19450303 [patent_doc_number] => 20240310433 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-19 [patent_title] => PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVEL RELIABILITY TEST [patent_app_type] => utility [patent_app_number] => 18/427076 [patent_app_country] => US [patent_app_date] => 2024-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4252 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18427076 [rel_patent_id] =>[rel_patent_doc_number] =>)