Search

Eliza W. Osenbaugh-stewart

Examiner (ID: 14050, Phone: (571)270-5782 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2896
Total Applications
891
Issued Applications
633
Pending Applications
89
Abandoned Applications
194

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 17777937 [patent_doc_number] => 20220244287 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-04 [patent_title] => Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating [patent_app_type] => utility [patent_app_number] => 17/620375 [patent_app_country] => US [patent_app_date] => 2020-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3460 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17620375 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/620375
Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating Jun 17, 2020 Abandoned
Array ( [id] => 17803186 [patent_doc_number] => 11417497 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-16 [patent_title] => Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired [patent_app_type] => utility [patent_app_number] => 16/901900 [patent_app_country] => US [patent_app_date] => 2020-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 5658 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16901900 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/901900
Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired Jun 14, 2020 Issued
Array ( [id] => 17183944 [patent_doc_number] => 20210330829 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-28 [patent_title] => UV LIGHT AND STERILIZATION SYSTEM [patent_app_type] => utility [patent_app_number] => 16/897693 [patent_app_country] => US [patent_app_date] => 2020-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6167 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16897693 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/897693
UV light and sterilization system Jun 9, 2020 Issued
Array ( [id] => 17222813 [patent_doc_number] => 11175308 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-11-16 [patent_title] => Chip carrier exchanging device and atomic force microscopy apparatus having same [patent_app_type] => utility [patent_app_number] => 16/897091 [patent_app_country] => US [patent_app_date] => 2020-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 4381 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 227 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16897091 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/897091
Chip carrier exchanging device and atomic force microscopy apparatus having same Jun 8, 2020 Issued
Array ( [id] => 20161272 [patent_doc_number] => 12387905 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Apparatus and method for detecting one or more scanning charged particle beams [patent_app_type] => utility [patent_app_number] => 17/615414 [patent_app_country] => US [patent_app_date] => 2020-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2230 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17615414 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/615414
Apparatus and method for detecting one or more scanning charged particle beams Jun 2, 2020 Issued
Array ( [id] => 20161272 [patent_doc_number] => 12387905 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Apparatus and method for detecting one or more scanning charged particle beams [patent_app_type] => utility [patent_app_number] => 17/615414 [patent_app_country] => US [patent_app_date] => 2020-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2230 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17615414 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/615414
Apparatus and method for detecting one or more scanning charged particle beams Jun 2, 2020 Issued
Array ( [id] => 16658461 [patent_doc_number] => 20210055098 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-02-25 [patent_title] => Charged Particle Beam System and Overlay Shift Amount Measurement Method [patent_app_type] => utility [patent_app_number] => 16/887885 [patent_app_country] => US [patent_app_date] => 2020-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8445 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16887885 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/887885
Charged Particle Beam System and Overlay Shift Amount Measurement Method May 28, 2020 Pending
Array ( [id] => 16507370 [patent_doc_number] => 20200386626 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-12-10 [patent_title] => Polaritonic Fiber Probe and Method for Nanoscale Temperature Mapping [patent_app_type] => utility [patent_app_number] => 16/886169 [patent_app_country] => US [patent_app_date] => 2020-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3863 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16886169 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/886169
Polaritonic fiber probe and method for nanoscale temperature mapping May 27, 2020 Issued
Array ( [id] => 18027845 [patent_doc_number] => 11511006 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-11-29 [patent_title] => LED ultraviolet germicidal lamp [patent_app_type] => utility [patent_app_number] => 16/885374 [patent_app_country] => US [patent_app_date] => 2020-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 1975 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16885374 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/885374
LED ultraviolet germicidal lamp May 27, 2020 Issued
Array ( [id] => 16300999 [patent_doc_number] => 20200286722 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-09-10 [patent_title] => METHODS AND APPARATUSES FOR DETERMINING THE INTACT MASS OF LARGE MOLECULES FROM MASS SPECTROGRAPHIC DATA [patent_app_type] => utility [patent_app_number] => 16/883983 [patent_app_country] => US [patent_app_date] => 2020-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13951 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16883983 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/883983
Methods and apparatuses for determining the intact mass of large molecules from mass spectrographic data May 25, 2020 Issued
Array ( [id] => 17750883 [patent_doc_number] => 20220229088 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-21 [patent_title] => HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICROSCOPY SYSTEM [patent_app_type] => utility [patent_app_number] => 17/612507 [patent_app_country] => US [patent_app_date] => 2020-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8708 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 249 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17612507 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/612507
Heterodyne scanning probe microscopy method and scanning probe microscopy system May 21, 2020 Issued
Array ( [id] => 16578596 [patent_doc_number] => 20210012997 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-01-14 [patent_title] => ADJUSTMENT METHOD AND ELECTRON BEAM DEVICE [patent_app_type] => utility [patent_app_number] => 16/879151 [patent_app_country] => US [patent_app_date] => 2020-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6314 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16879151 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/879151
Adjustment method and electron beam device May 19, 2020 Issued
Array ( [id] => 20229238 [patent_doc_number] => 12417893 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-16 [patent_title] => Diffractometer for charged-particle crystallography [patent_app_type] => utility [patent_app_number] => 17/611424 [patent_app_country] => US [patent_app_date] => 2020-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1144 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 378 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17611424 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/611424
Diffractometer for charged-particle crystallography May 18, 2020 Issued
Array ( [id] => 20229238 [patent_doc_number] => 12417893 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-16 [patent_title] => Diffractometer for charged-particle crystallography [patent_app_type] => utility [patent_app_number] => 17/611424 [patent_app_country] => US [patent_app_date] => 2020-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1144 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 378 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17611424 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/611424
Diffractometer for charged-particle crystallography May 18, 2020 Issued
Array ( [id] => 17229872 [patent_doc_number] => 20210356429 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-11-18 [patent_title] => SYSTEM AND METHOD FOR PERFORMING THREE-DIMENSIONAL COMPOSITIONAL ANALYSES [patent_app_type] => utility [patent_app_number] => 16/874712 [patent_app_country] => US [patent_app_date] => 2020-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11519 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16874712 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/874712
System and method for performing three-dimensional compositional analyses May 14, 2020 Issued
Array ( [id] => 17000601 [patent_doc_number] => 11079405 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2021-08-03 [patent_title] => Method and apparatus for detecting ferroelectric signal [patent_app_type] => utility [patent_app_number] => 16/866560 [patent_app_country] => US [patent_app_date] => 2020-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 8124 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16866560 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/866560
Method and apparatus for detecting ferroelectric signal May 4, 2020 Issued
Array ( [id] => 18576744 [patent_doc_number] => 11733264 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-22 [patent_title] => Cantilever, scanning probe microscope, and measurement method using scanning probe microscope [patent_app_type] => utility [patent_app_number] => 17/630698 [patent_app_country] => US [patent_app_date] => 2020-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 36 [patent_no_of_words] => 14302 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17630698 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/630698
Cantilever, scanning probe microscope, and measurement method using scanning probe microscope Apr 29, 2020 Issued
Array ( [id] => 17590638 [patent_doc_number] => 11328915 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-10 [patent_title] => Methods in mass spectrometry using collision gas as ion source [patent_app_type] => utility [patent_app_number] => 16/857117 [patent_app_country] => US [patent_app_date] => 2020-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 8626 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16857117 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/857117
Methods in mass spectrometry using collision gas as ion source Apr 22, 2020 Issued
Array ( [id] => 17544037 [patent_doc_number] => 11309170 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-04-19 [patent_title] => Methods for testing or adjusting a charged-particle detector, and related detection systems [patent_app_type] => utility [patent_app_number] => 16/856085 [patent_app_country] => US [patent_app_date] => 2020-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 19 [patent_no_of_words] => 8644 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16856085 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/856085
Methods for testing or adjusting a charged-particle detector, and related detection systems Apr 22, 2020 Issued
Array ( [id] => 17181737 [patent_doc_number] => 11158989 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-10-26 [patent_title] => Laser source device, extreme ultraviolet lithography device and method [patent_app_type] => utility [patent_app_number] => 16/846103 [patent_app_country] => US [patent_app_date] => 2020-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5300 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16846103 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/846103
Laser source device, extreme ultraviolet lithography device and method Apr 9, 2020 Issued
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