Search

Eliza W. Osenbaugh-stewart

Examiner (ID: 14050, Phone: (571)270-5782 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2896
Total Applications
891
Issued Applications
633
Pending Applications
89
Abandoned Applications
194

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 11854711 [patent_doc_number] => 20170229203 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-10 [patent_title] => 'SYSTEMS AND METHODS FOR ELIMINATING MULTI-PATH ERRORS FROM ATOMIC INERTIAL SENSORS' [patent_app_type] => utility [patent_app_number] => 15/016180 [patent_app_country] => US [patent_app_date] => 2016-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3500 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15016180 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/016180
Systems and methods for eliminating multi-path errors from atomic inertial sensors Feb 3, 2016 Issued
Array ( [id] => 11063636 [patent_doc_number] => 20160260598 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-09-08 [patent_title] => 'LASER ENABLED IMAGING MASS CYTOMETRY' [patent_app_type] => utility [patent_app_number] => 15/016134 [patent_app_country] => US [patent_app_date] => 2016-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 39 [patent_figures_cnt] => 39 [patent_no_of_words] => 13843 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15016134 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/016134
LASER ENABLED IMAGING MASS CYTOMETRY Feb 3, 2016 Abandoned
Array ( [id] => 12953302 [patent_doc_number] => 09837243 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-12-05 [patent_title] => Ion pump and charged particle beam device using the same [patent_app_type] => utility [patent_app_number] => 15/015930 [patent_app_country] => US [patent_app_date] => 2016-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 23 [patent_no_of_words] => 11317 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15015930 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/015930
Ion pump and charged particle beam device using the same Feb 3, 2016 Issued
Array ( [id] => 11034397 [patent_doc_number] => 20160231353 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-08-11 [patent_title] => 'METHOD FOR IMAGING A FEATURE USING A SCANNING PROBE MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 15/015067 [patent_app_country] => US [patent_app_date] => 2016-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6316 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15015067 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/015067
Method for imaging a feature using a scanning probe microscope Feb 2, 2016 Issued
Array ( [id] => 11839974 [patent_doc_number] => 20170221694 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-03 [patent_title] => 'SEGMENTED LINEAR ION TRAP FOR ENHANCED ION ACTIVATION AND STORAGE' [patent_app_type] => utility [patent_app_number] => 15/015101 [patent_app_country] => US [patent_app_date] => 2016-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 12743 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15015101 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/015101
Segmented linear ion trap for enhanced ion activation and storage Feb 2, 2016 Issued
Array ( [id] => 11839873 [patent_doc_number] => 20170221593 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-03 [patent_title] => 'USING ADDITIVE MANUFACTURING TO PRODUCE SHIELDING OR MODULATING MATERIAL FOR NUCLEAR DETECTORS' [patent_app_type] => utility [patent_app_number] => 15/013560 [patent_app_country] => US [patent_app_date] => 2016-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3573 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15013560 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/013560
USING ADDITIVE MANUFACTURING TO PRODUCE SHIELDING OR MODULATING MATERIAL FOR NUCLEAR DETECTORS Feb 1, 2016 Abandoned
Array ( [id] => 11911094 [patent_doc_number] => 09779911 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-10-03 [patent_title] => 'Electron microscope and method of measuring aberrations' [patent_app_type] => utility [patent_app_number] => 15/013192 [patent_app_country] => US [patent_app_date] => 2016-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 17 [patent_no_of_words] => 9047 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15013192 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/013192
Electron microscope and method of measuring aberrations Feb 1, 2016 Issued
Array ( [id] => 11028627 [patent_doc_number] => 20160225582 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-08-04 [patent_title] => 'Method and System for Imaging of a Photomask Through a Pellicle' [patent_app_type] => utility [patent_app_number] => 15/012599 [patent_app_country] => US [patent_app_date] => 2016-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7347 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15012599 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/012599
Method and system for imaging of a photomask through a pellicle Jan 31, 2016 Issued
Array ( [id] => 13084941 [patent_doc_number] => 10062542 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-08-28 [patent_title] => Particle beam microscope and method for operating a particle beam microscope [patent_app_type] => utility [patent_app_number] => 15/010046 [patent_app_country] => US [patent_app_date] => 2016-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 8424 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15010046 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/010046
Particle beam microscope and method for operating a particle beam microscope Jan 28, 2016 Issued
Array ( [id] => 12101993 [patent_doc_number] => 09859092 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-01-02 [patent_title] => 'Particle beam microscope and method for operating a particle beam microscope' [patent_app_type] => utility [patent_app_number] => 15/010346 [patent_app_country] => US [patent_app_date] => 2016-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 8106 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15010346 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/010346
Particle beam microscope and method for operating a particle beam microscope Jan 28, 2016 Issued
Array ( [id] => 11021014 [patent_doc_number] => 20160217968 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-28 [patent_title] => 'Objective Lens System for Fast Scanning Large FOV' [patent_app_type] => utility [patent_app_number] => 15/007873 [patent_app_country] => US [patent_app_date] => 2016-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5089 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15007873 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/007873
Objective lens system for fast scanning large FOV Jan 26, 2016 Issued
Array ( [id] => 11021013 [patent_doc_number] => 20160217967 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-28 [patent_title] => 'Charged Particle Beam Device' [patent_app_type] => utility [patent_app_number] => 15/006721 [patent_app_country] => US [patent_app_date] => 2016-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 10235 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15006721 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/006721
Charged particle beam device Jan 25, 2016 Issued
Array ( [id] => 11645022 [patent_doc_number] => 09666412 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2017-05-30 [patent_title] => 'Method for charging and imaging an object' [patent_app_type] => utility [patent_app_number] => 15/005679 [patent_app_country] => US [patent_app_date] => 2016-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6969 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 322 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15005679 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/005679
Method for charging and imaging an object Jan 24, 2016 Issued
Array ( [id] => 11539373 [patent_doc_number] => 09613789 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2017-04-04 [patent_title] => 'Compact dual ion composition instrument' [patent_app_type] => utility [patent_app_number] => 15/005662 [patent_app_country] => US [patent_app_date] => 2016-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2882 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 276 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15005662 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/005662
Compact dual ion composition instrument Jan 24, 2016 Issued
Array ( [id] => 11824760 [patent_doc_number] => 20170213697 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-07-27 [patent_title] => 'MULTI MODE SYSTEM WITH A DISPERSION X-RAY DETECTOR' [patent_app_type] => utility [patent_app_number] => 15/005949 [patent_app_country] => US [patent_app_date] => 2016-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4504 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15005949 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/005949
Multi mode system with a dispersion X-ray detector Jan 24, 2016 Issued
Array ( [id] => 11014159 [patent_doc_number] => 20160211112 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-21 [patent_title] => 'Method and Apparatus for Reviewing Defects' [patent_app_type] => utility [patent_app_number] => 14/995813 [patent_app_country] => US [patent_app_date] => 2016-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 6945 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14995813 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/995813
Method and Apparatus for Reviewing Defects Jan 13, 2016 Abandoned
Array ( [id] => 10758460 [patent_doc_number] => 20160104611 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-04-14 [patent_title] => 'Space Focus Time of Flight Mass Spectrometer' [patent_app_type] => utility [patent_app_number] => 14/968171 [patent_app_country] => US [patent_app_date] => 2015-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4290 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14968171 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/968171
Space focus time of flight mass spectrometer Dec 13, 2015 Issued
Array ( [id] => 11048971 [patent_doc_number] => 20160245929 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-08-25 [patent_title] => 'ION INDUCED IMPACT IONIZATION DETECTOR AND USES THEREOF' [patent_app_type] => utility [patent_app_number] => 14/966980 [patent_app_country] => US [patent_app_date] => 2015-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 16358 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14966980 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/966980
ION INDUCED IMPACT IONIZATION DETECTOR AND USES THEREOF Dec 10, 2015 Abandoned
Array ( [id] => 10823649 [patent_doc_number] => 20160169814 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-06-16 [patent_title] => 'PLASMA LIGHT SOURCE AND INSPECTION APPARATUS INCLUDING THE SAME' [patent_app_type] => utility [patent_app_number] => 14/964065 [patent_app_country] => US [patent_app_date] => 2015-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 16423 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14964065 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/964065
Plasma light source and inspection apparatus including the same Dec 8, 2015 Issued
Array ( [id] => 11028646 [patent_doc_number] => 20160225602 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-08-04 [patent_title] => 'TIME-OF-FLIGHT MASS SPECTROMETRY USING MULTI-CHANNEL DETECTORS' [patent_app_type] => utility [patent_app_number] => 14/959795 [patent_app_country] => US [patent_app_date] => 2015-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 15404 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14959795 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/959795
Time-of-flight mass spectrometry using multi-channel detectors Dec 3, 2015 Issued
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