Elly Gerald Stoica
Examiner (ID: 13856, Phone: (571)272-9941 , Office: P/1647 )
Most Active Art Unit | 1647 |
Art Unit(s) | 1647, 1646 |
Total Applications | 1381 |
Issued Applications | 805 |
Pending Applications | 99 |
Abandoned Applications | 477 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 4973116
[patent_doc_number] => 20070113119
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-17
[patent_title] => 'High-Speed Transceiver Tester Incorporating Jitter Injection'
[patent_app_type] => utility
[patent_app_number] => 11/553035
[patent_app_country] => US
[patent_app_date] => 2006-10-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4343
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0113/20070113119.pdf
[firstpage_image] =>[orig_patent_app_number] => 11553035
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/553035 | High-speed transceiver tester incorporating jitter injection | Oct 25, 2006 | Issued |
Array
(
[id] => 5047509
[patent_doc_number] => 20070266183
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-11-15
[patent_title] => 'SAMPLING A DEVICE BUS'
[patent_app_type] => utility
[patent_app_number] => 11/552128
[patent_app_country] => US
[patent_app_date] => 2006-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3803
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0266/20070266183.pdf
[firstpage_image] =>[orig_patent_app_number] => 11552128
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/552128 | Sampling a device bus | Oct 22, 2006 | Issued |
Array
(
[id] => 8120239
[patent_doc_number] => 08161338
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-17
[patent_title] => 'Modular compaction of test responses'
[patent_app_type] => utility
[patent_app_number] => 11/580650
[patent_app_country] => US
[patent_app_date] => 2006-10-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 18
[patent_no_of_words] => 12930
[patent_no_of_claims] => 44
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/161/08161338.pdf
[firstpage_image] =>[orig_patent_app_number] => 11580650
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/580650 | Modular compaction of test responses | Oct 12, 2006 | Issued |
Array
(
[id] => 595775
[patent_doc_number] => 07458005
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-11-25
[patent_title] => 'System and method for providing adjustable read margins in a semiconductor memory'
[patent_app_type] => utility
[patent_app_number] => 11/524691
[patent_app_country] => US
[patent_app_date] => 2006-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 4314
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/458/07458005.pdf
[firstpage_image] =>[orig_patent_app_number] => 11524691
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/524691 | System and method for providing adjustable read margins in a semiconductor memory | Sep 20, 2006 | Issued |
Array
(
[id] => 7510592
[patent_doc_number] => 08037379
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2011-10-11
[patent_title] => 'Prediction of impact on post-repair yield resulting from manufacturing process modification'
[patent_app_type] => utility
[patent_app_number] => 11/469353
[patent_app_country] => US
[patent_app_date] => 2006-08-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 11
[patent_no_of_words] => 6886
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 127
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/037/08037379.pdf
[firstpage_image] =>[orig_patent_app_number] => 11469353
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/469353 | Prediction of impact on post-repair yield resulting from manufacturing process modification | Aug 30, 2006 | Issued |
Array
(
[id] => 235088
[patent_doc_number] => 07600162
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-06
[patent_title] => 'Semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/508222
[patent_app_country] => US
[patent_app_date] => 2006-08-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5220
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 91
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/600/07600162.pdf
[firstpage_image] =>[orig_patent_app_number] => 11508222
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/508222 | Semiconductor device | Aug 22, 2006 | Issued |
Array
(
[id] => 223540
[patent_doc_number] => 07610530
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-27
[patent_title] => 'Test data generator, test system and method thereof'
[patent_app_type] => utility
[patent_app_number] => 11/508177
[patent_app_country] => US
[patent_app_date] => 2006-08-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 13
[patent_no_of_words] => 5712
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/610/07610530.pdf
[firstpage_image] =>[orig_patent_app_number] => 11508177
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/508177 | Test data generator, test system and method thereof | Aug 22, 2006 | Issued |
Array
(
[id] => 118340
[patent_doc_number] => 07716544
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-05-11
[patent_title] => 'Path data transmission unit'
[patent_app_type] => utility
[patent_app_number] => 11/507892
[patent_app_country] => US
[patent_app_date] => 2006-08-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 4561
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 162
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/716/07716544.pdf
[firstpage_image] =>[orig_patent_app_number] => 11507892
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/507892 | Path data transmission unit | Aug 21, 2006 | Issued |
Array
(
[id] => 4530824
[patent_doc_number] => 07913141
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-03-22
[patent_title] => 'Power gating in integrated circuits for leakage reduction'
[patent_app_type] => utility
[patent_app_number] => 11/505113
[patent_app_country] => US
[patent_app_date] => 2006-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 6
[patent_no_of_words] => 1879
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 222
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/913/07913141.pdf
[firstpage_image] =>[orig_patent_app_number] => 11505113
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/505113 | Power gating in integrated circuits for leakage reduction | Aug 15, 2006 | Issued |
Array
(
[id] => 223529
[patent_doc_number] => 07610524
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-27
[patent_title] => 'Memory with test mode output'
[patent_app_type] => utility
[patent_app_number] => 11/491640
[patent_app_country] => US
[patent_app_date] => 2006-07-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 12
[patent_no_of_words] => 9545
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/610/07610524.pdf
[firstpage_image] =>[orig_patent_app_number] => 11491640
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/491640 | Memory with test mode output | Jul 23, 2006 | Issued |
Array
(
[id] => 5190470
[patent_doc_number] => 20070168779
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-19
[patent_title] => 'Testing of a CAM'
[patent_app_type] => utility
[patent_app_number] => 11/474496
[patent_app_country] => US
[patent_app_date] => 2006-06-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 29
[patent_figures_cnt] => 29
[patent_no_of_words] => 8348
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0168/20070168779.pdf
[firstpage_image] =>[orig_patent_app_number] => 11474496
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/474496 | Testing of a CAM | Jun 25, 2006 | Abandoned |
Array
(
[id] => 7598060
[patent_doc_number] => 07584393
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-09-01
[patent_title] => 'Scan test circuit and method of arranging the same'
[patent_app_type] => utility
[patent_app_number] => 11/421885
[patent_app_country] => US
[patent_app_date] => 2006-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 4656
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 220
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/584/07584393.pdf
[firstpage_image] =>[orig_patent_app_number] => 11421885
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/421885 | Scan test circuit and method of arranging the same | Jun 1, 2006 | Issued |
Array
(
[id] => 5012625
[patent_doc_number] => 20070283104
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-06
[patent_title] => 'Concurrent Hardware Selftest for Central Storage'
[patent_app_type] => utility
[patent_app_number] => 11/421167
[patent_app_country] => US
[patent_app_date] => 2006-05-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2710
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0283/20070283104.pdf
[firstpage_image] =>[orig_patent_app_number] => 11421167
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/421167 | Concurrent Hardware Selftest for Central Storage | May 30, 2006 | Abandoned |
Array
(
[id] => 245157
[patent_doc_number] => 07590901
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-09-15
[patent_title] => 'Apparatus, system, and method for dynamic recovery and restoration from design defects in an integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 11/419271
[patent_app_country] => US
[patent_app_date] => 2006-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5716
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/590/07590901.pdf
[firstpage_image] =>[orig_patent_app_number] => 11419271
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/419271 | Apparatus, system, and method for dynamic recovery and restoration from design defects in an integrated circuit | May 18, 2006 | Issued |
Array
(
[id] => 5607108
[patent_doc_number] => 20060268624
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-30
[patent_title] => 'SEMICONDUCTOR MEMORY DEVICE AND DATA WRITE AND READ METHOD THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/419155
[patent_app_country] => US
[patent_app_date] => 2006-05-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 7347
[patent_no_of_claims] => 33
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0268/20060268624.pdf
[firstpage_image] =>[orig_patent_app_number] => 11419155
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/419155 | Semiconductor memory device and data write and read method thereof | May 17, 2006 | Issued |
Array
(
[id] => 4984432
[patent_doc_number] => 20070088991
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-04-19
[patent_title] => 'Method and apparatus for verifying multi-channel data'
[patent_app_type] => utility
[patent_app_number] => 11/417980
[patent_app_country] => US
[patent_app_date] => 2006-05-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4912
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0088/20070088991.pdf
[firstpage_image] =>[orig_patent_app_number] => 11417980
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/417980 | Method and apparatus for verifying multi-channel data | May 3, 2006 | Issued |
Array
(
[id] => 7521082
[patent_doc_number] => 07975191
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-07-05
[patent_title] => 'Nonvolatile memory device comprising a programming and deletion checking option'
[patent_app_type] => utility
[patent_app_number] => 11/417520
[patent_app_country] => US
[patent_app_date] => 2006-05-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4625
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 148
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/975/07975191.pdf
[firstpage_image] =>[orig_patent_app_number] => 11417520
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/417520 | Nonvolatile memory device comprising a programming and deletion checking option | May 3, 2006 | Issued |
Array
(
[id] => 17540
[patent_doc_number] => 07805646
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-09-28
[patent_title] => 'LSI internal signal observing circuit'
[patent_app_type] => utility
[patent_app_number] => 11/415584
[patent_app_country] => US
[patent_app_date] => 2006-05-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 2195
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 110
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/805/07805646.pdf
[firstpage_image] =>[orig_patent_app_number] => 11415584
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/415584 | LSI internal signal observing circuit | Apr 30, 2006 | Issued |
Array
(
[id] => 5167224
[patent_doc_number] => 20070288813
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-13
[patent_title] => 'Cell board interconnection architecture with serviceable switch board'
[patent_app_type] => utility
[patent_app_number] => 11/414852
[patent_app_country] => US
[patent_app_date] => 2006-05-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 11308
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0288/20070288813.pdf
[firstpage_image] =>[orig_patent_app_number] => 11414852
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/414852 | Cell board interconnection architecture with serviceable switch board | Apr 30, 2006 | Abandoned |
Array
(
[id] => 5036672
[patent_doc_number] => 20070101211
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-03
[patent_title] => 'Defect management method and disk drive using the same'
[patent_app_type] => utility
[patent_app_number] => 11/412428
[patent_app_country] => US
[patent_app_date] => 2006-04-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 3467
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0101/20070101211.pdf
[firstpage_image] =>[orig_patent_app_number] => 11412428
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/412428 | Defect management method and disk drive using the same | Apr 26, 2006 | Abandoned |