
Emily Y. Chan
Examiner (ID: 4479)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, CSDE, 2302, 2866, 2829 |
| Total Applications | 763 |
| Issued Applications | 602 |
| Pending Applications | 16 |
| Abandoned Applications | 153 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8653680
[patent_doc_number] => 08373431
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-02-12
[patent_title] => 'Probe for scanning over a substrate and data storage device'
[patent_app_type] => utility
[patent_app_number] => 12/054938
[patent_app_country] => US
[patent_app_date] => 2008-03-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 13
[patent_no_of_words] => 7322
[patent_no_of_claims] => 26
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[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12054938
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/054938 | Probe for scanning over a substrate and data storage device | Mar 24, 2008 | Issued |
Array
(
[id] => 4737651
[patent_doc_number] => 20080231303
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-09-25
[patent_title] => 'SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES'
[patent_app_type] => utility
[patent_app_number] => 12/052070
[patent_app_country] => US
[patent_app_date] => 2008-03-20
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0231/20080231303.pdf
[firstpage_image] =>[orig_patent_app_number] => 12052070
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/052070 | SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES | Mar 19, 2008 | Abandoned |
Array
(
[id] => 160461
[patent_doc_number] => 07675306
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-03-09
[patent_title] => 'Prober apparatus and operating method therefor'
[patent_app_type] => utility
[patent_app_number] => 12/043365
[patent_app_country] => US
[patent_app_date] => 2008-03-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2691
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[pdf_file] => patents/07/675/07675306.pdf
[firstpage_image] =>[orig_patent_app_number] => 12043365
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/043365 | Prober apparatus and operating method therefor | Mar 5, 2008 | Issued |
Array
(
[id] => 4783111
[patent_doc_number] => 20080136440
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-12
[patent_title] => 'METHOD AND APPARATUS FOR TESTING LIQUID CRYSTAL DISPLAY DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/034422
[patent_app_country] => US
[patent_app_date] => 2008-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 7121
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[pdf_file] => publications/A1/0136/20080136440.pdf
[firstpage_image] =>[orig_patent_app_number] => 12034422
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/034422 | Method and apparatus for testing liquid crystal display device | Feb 19, 2008 | Issued |
Array
(
[id] => 229390
[patent_doc_number] => 07602205
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-13
[patent_title] => 'Electromigration tester for high capacity and high current'
[patent_app_type] => utility
[patent_app_number] => 12/033270
[patent_app_country] => US
[patent_app_date] => 2008-02-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 1449
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/602/07602205.pdf
[firstpage_image] =>[orig_patent_app_number] => 12033270
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/033270 | Electromigration tester for high capacity and high current | Feb 18, 2008 | Issued |
Array
(
[id] => 4783102
[patent_doc_number] => 20080136431
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-12
[patent_title] => 'Apparatus, system and method for testing electronic elements'
[patent_app_type] => utility
[patent_app_number] => 12/069814
[patent_app_country] => US
[patent_app_date] => 2008-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
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[firstpage_image] =>[orig_patent_app_number] => 12069814
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/069814 | Apparatus, system and method for testing electronic elements | Feb 12, 2008 | Issued |
Array
(
[id] => 4811093
[patent_doc_number] => 20080191724
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-08-14
[patent_title] => 'Electrical testing device for testing electrical test samples'
[patent_app_type] => utility
[patent_app_number] => 12/012967
[patent_app_country] => US
[patent_app_date] => 2008-02-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 3494
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[pdf_file] => publications/A1/0191/20080191724.pdf
[firstpage_image] =>[orig_patent_app_number] => 12012967
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/012967 | Electrical testing device for testing electrical test samples | Feb 5, 2008 | Abandoned |
Array
(
[id] => 143027
[patent_doc_number] => 07688088
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-03-30
[patent_title] => 'Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object'
[patent_app_type] => utility
[patent_app_number] => 12/007403
[patent_app_country] => US
[patent_app_date] => 2008-01-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 4689
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[pdf_file] => patents/07/688/07688088.pdf
[firstpage_image] =>[orig_patent_app_number] => 12007403
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/007403 | Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object | Jan 9, 2008 | Issued |
Array
(
[id] => 4902158
[patent_doc_number] => 20080111571
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-15
[patent_title] => 'Membrane probing system'
[patent_app_type] => utility
[patent_app_number] => 12/008594
[patent_app_country] => US
[patent_app_date] => 2008-01-10
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[firstpage_image] =>[orig_patent_app_number] => 12008594
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/008594 | Membrane probing system | Jan 9, 2008 | Issued |
Array
(
[id] => 6241416
[patent_doc_number] => 20100134119
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-03
[patent_title] => 'MICROCIRCUIT TESTING INTERFACE HAVING KELVIN AND SIGNAL CONTACTS WITHIN A SINGLE SLOT'
[patent_app_type] => utility
[patent_app_number] => 12/521843
[patent_app_country] => US
[patent_app_date] => 2008-01-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[pdf_file] => publications/A1/0134/20100134119.pdf
[firstpage_image] =>[orig_patent_app_number] => 12521843
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/521843 | Microcircuit testing interface having kelvin and signal contacts within a single slot | Jan 1, 2008 | Issued |
Array
(
[id] => 5499783
[patent_doc_number] => 20090160471
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-06-25
[patent_title] => 'Contact Alignment Verification/Adjustment Fixture'
[patent_app_type] => utility
[patent_app_number] => 11/963469
[patent_app_country] => US
[patent_app_date] => 2007-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 3665
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[pdf_file] => publications/A1/0160/20090160471.pdf
[firstpage_image] =>[orig_patent_app_number] => 11963469
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/963469 | Contact alignment verification/adjustment fixture | Dec 20, 2007 | Issued |
Array
(
[id] => 5499782
[patent_doc_number] => 20090160470
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-06-25
[patent_title] => 'SEMICONDUCTOR AND METHOD'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/963073 | Method and device for position detection using connection pads | Dec 20, 2007 | Issued |
Array
(
[id] => 4877165
[patent_doc_number] => 20080150548
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-26
[patent_title] => 'TEST CARTRIDGE WITH INTERNAL GENERATION OF THE TEST SIGNALS'
[patent_app_type] => utility
[patent_app_number] => 11/961266
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/961266 | TEST CARTRIDGE WITH INTERNAL GENERATION OF THE TEST SIGNALS | Dec 19, 2007 | Abandoned |
Array
(
[id] => 5493813
[patent_doc_number] => 20090261841
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[patent_issue_date] => 2009-10-22
[patent_title] => 'TEST APPARATUS AND PERFORMANCE BOARD'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/946870 | Test apparatus and performance board | Nov 28, 2007 | Issued |
Array
(
[id] => 590322
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Array
(
[id] => 253215
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[patent_title] => 'Operation voltage supply apparatus and operation voltage supply method for semiconductor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/979290 | Operation voltage supply apparatus and operation voltage supply method for semiconductor device | Oct 31, 2007 | Issued |
Array
(
[id] => 4891217
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/926172 | Electrical test system including coaxial cables | Oct 28, 2007 | Issued |
Array
(
[id] => 6579265
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Array
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[patent_title] => 'Probe station thermal chuck with shielding for capacitive current'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/865076 | WAFER LEVEL TESTING METHOD FOR RFID TAGS | Sep 30, 2007 | Abandoned |