Search

Emily Y. Chan

Examiner (ID: 4479)

Most Active Art Unit
2829
Art Unit(s)
2858, CSDE, 2302, 2866, 2829
Total Applications
763
Issued Applications
602
Pending Applications
16
Abandoned Applications
153

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8653680 [patent_doc_number] => 08373431 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-02-12 [patent_title] => 'Probe for scanning over a substrate and data storage device' [patent_app_type] => utility [patent_app_number] => 12/054938 [patent_app_country] => US [patent_app_date] => 2008-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 13 [patent_no_of_words] => 7322 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12054938 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/054938
Probe for scanning over a substrate and data storage device Mar 24, 2008 Issued
Array ( [id] => 4737651 [patent_doc_number] => 20080231303 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => 'SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 12/052070 [patent_app_country] => US [patent_app_date] => 2008-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4543 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20080231303.pdf [firstpage_image] =>[orig_patent_app_number] => 12052070 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/052070
SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES Mar 19, 2008 Abandoned
Array ( [id] => 160461 [patent_doc_number] => 07675306 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-09 [patent_title] => 'Prober apparatus and operating method therefor' [patent_app_type] => utility [patent_app_number] => 12/043365 [patent_app_country] => US [patent_app_date] => 2008-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2691 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/675/07675306.pdf [firstpage_image] =>[orig_patent_app_number] => 12043365 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/043365
Prober apparatus and operating method therefor Mar 5, 2008 Issued
Array ( [id] => 4783111 [patent_doc_number] => 20080136440 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-12 [patent_title] => 'METHOD AND APPARATUS FOR TESTING LIQUID CRYSTAL DISPLAY DEVICE' [patent_app_type] => utility [patent_app_number] => 12/034422 [patent_app_country] => US [patent_app_date] => 2008-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7121 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0136/20080136440.pdf [firstpage_image] =>[orig_patent_app_number] => 12034422 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/034422
Method and apparatus for testing liquid crystal display device Feb 19, 2008 Issued
Array ( [id] => 229390 [patent_doc_number] => 07602205 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-13 [patent_title] => 'Electromigration tester for high capacity and high current' [patent_app_type] => utility [patent_app_number] => 12/033270 [patent_app_country] => US [patent_app_date] => 2008-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1449 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/602/07602205.pdf [firstpage_image] =>[orig_patent_app_number] => 12033270 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/033270
Electromigration tester for high capacity and high current Feb 18, 2008 Issued
Array ( [id] => 4783102 [patent_doc_number] => 20080136431 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-12 [patent_title] => 'Apparatus, system and method for testing electronic elements' [patent_app_type] => utility [patent_app_number] => 12/069814 [patent_app_country] => US [patent_app_date] => 2008-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 8621 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0136/20080136431.pdf [firstpage_image] =>[orig_patent_app_number] => 12069814 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/069814
Apparatus, system and method for testing electronic elements Feb 12, 2008 Issued
Array ( [id] => 4811093 [patent_doc_number] => 20080191724 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-14 [patent_title] => 'Electrical testing device for testing electrical test samples' [patent_app_type] => utility [patent_app_number] => 12/012967 [patent_app_country] => US [patent_app_date] => 2008-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3494 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0191/20080191724.pdf [firstpage_image] =>[orig_patent_app_number] => 12012967 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/012967
Electrical testing device for testing electrical test samples Feb 5, 2008 Abandoned
Array ( [id] => 143027 [patent_doc_number] => 07688088 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-30 [patent_title] => 'Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object' [patent_app_type] => utility [patent_app_number] => 12/007403 [patent_app_country] => US [patent_app_date] => 2008-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4689 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 255 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/688/07688088.pdf [firstpage_image] =>[orig_patent_app_number] => 12007403 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/007403
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object Jan 9, 2008 Issued
Array ( [id] => 4902158 [patent_doc_number] => 20080111571 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-15 [patent_title] => 'Membrane probing system' [patent_app_type] => utility [patent_app_number] => 12/008594 [patent_app_country] => US [patent_app_date] => 2008-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 8903 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0111/20080111571.pdf [firstpage_image] =>[orig_patent_app_number] => 12008594 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/008594
Membrane probing system Jan 9, 2008 Issued
Array ( [id] => 6241416 [patent_doc_number] => 20100134119 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-03 [patent_title] => 'MICROCIRCUIT TESTING INTERFACE HAVING KELVIN AND SIGNAL CONTACTS WITHIN A SINGLE SLOT' [patent_app_type] => utility [patent_app_number] => 12/521843 [patent_app_country] => US [patent_app_date] => 2008-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2951 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0134/20100134119.pdf [firstpage_image] =>[orig_patent_app_number] => 12521843 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/521843
Microcircuit testing interface having kelvin and signal contacts within a single slot Jan 1, 2008 Issued
Array ( [id] => 5499783 [patent_doc_number] => 20090160471 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-25 [patent_title] => 'Contact Alignment Verification/Adjustment Fixture' [patent_app_type] => utility [patent_app_number] => 11/963469 [patent_app_country] => US [patent_app_date] => 2007-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3665 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0160/20090160471.pdf [firstpage_image] =>[orig_patent_app_number] => 11963469 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/963469
Contact alignment verification/adjustment fixture Dec 20, 2007 Issued
Array ( [id] => 5499782 [patent_doc_number] => 20090160470 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-25 [patent_title] => 'SEMICONDUCTOR AND METHOD' [patent_app_type] => utility [patent_app_number] => 11/963073 [patent_app_country] => US [patent_app_date] => 2007-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3103 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0160/20090160470.pdf [firstpage_image] =>[orig_patent_app_number] => 11963073 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/963073
Method and device for position detection using connection pads Dec 20, 2007 Issued
Array ( [id] => 4877165 [patent_doc_number] => 20080150548 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-26 [patent_title] => 'TEST CARTRIDGE WITH INTERNAL GENERATION OF THE TEST SIGNALS' [patent_app_type] => utility [patent_app_number] => 11/961266 [patent_app_country] => US [patent_app_date] => 2007-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3840 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0150/20080150548.pdf [firstpage_image] =>[orig_patent_app_number] => 11961266 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/961266
TEST CARTRIDGE WITH INTERNAL GENERATION OF THE TEST SIGNALS Dec 19, 2007 Abandoned
Array ( [id] => 5493813 [patent_doc_number] => 20090261841 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-22 [patent_title] => 'TEST APPARATUS AND PERFORMANCE BOARD' [patent_app_type] => utility [patent_app_number] => 11/946870 [patent_app_country] => US [patent_app_date] => 2007-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6813 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0261/20090261841.pdf [firstpage_image] =>[orig_patent_app_number] => 11946870 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/946870
Test apparatus and performance board Nov 28, 2007 Issued
Array ( [id] => 590322 [patent_doc_number] => 07443182 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-28 [patent_title] => 'Coordinate transformation device for electrical signal connection' [patent_app_type] => utility [patent_app_number] => 11/935868 [patent_app_country] => US [patent_app_date] => 2007-11-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 3996 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 325 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/443/07443182.pdf [firstpage_image] =>[orig_patent_app_number] => 11935868 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/935868
Coordinate transformation device for electrical signal connection Nov 5, 2007 Issued
Array ( [id] => 253215 [patent_doc_number] => 07579851 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-25 [patent_title] => 'Operation voltage supply apparatus and operation voltage supply method for semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/979290 [patent_app_country] => US [patent_app_date] => 2007-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 4406 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/579/07579851.pdf [firstpage_image] =>[orig_patent_app_number] => 11979290 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/979290
Operation voltage supply apparatus and operation voltage supply method for semiconductor device Oct 31, 2007 Issued
Array ( [id] => 4891217 [patent_doc_number] => 20080100314 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-01 [patent_title] => 'ELECTRICAL TEST SYSTEM INCLUDING COAXIAL CABLES' [patent_app_type] => utility [patent_app_number] => 11/926172 [patent_app_country] => US [patent_app_date] => 2007-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2329 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0100/20080100314.pdf [firstpage_image] =>[orig_patent_app_number] => 11926172 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/926172
Electrical test system including coaxial cables Oct 28, 2007 Issued
Array ( [id] => 6579265 [patent_doc_number] => 20100097060 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'Apparatus for and method of determining an angle between an element and a magnetic field' [patent_app_type] => utility [patent_app_number] => 12/446828 [patent_app_country] => US [patent_app_date] => 2007-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6243 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20100097060.pdf [firstpage_image] =>[orig_patent_app_number] => 12446828 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/446828
Apparatus for and method of determining an angle between an element and a magnetic field Oct 18, 2007 Issued
Array ( [id] => 4667620 [patent_doc_number] => 20080042680 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'Probe station thermal chuck with shielding for capacitive current' [patent_app_type] => utility [patent_app_number] => 11/975221 [patent_app_country] => US [patent_app_date] => 2007-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3634 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20080042680.pdf [firstpage_image] =>[orig_patent_app_number] => 11975221 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/975221
Probe station thermal chuck with shielding for capacitive current Oct 16, 2007 Issued
Array ( [id] => 5426279 [patent_doc_number] => 20090085589 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-02 [patent_title] => 'WAFER LEVEL TESTING METHOD FOR RFID TAGS' [patent_app_type] => utility [patent_app_number] => 11/865076 [patent_app_country] => US [patent_app_date] => 2007-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 3695 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20090085589.pdf [firstpage_image] =>[orig_patent_app_number] => 11865076 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/865076
WAFER LEVEL TESTING METHOD FOR RFID TAGS Sep 30, 2007 Abandoned
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