
Emily Y. Chan
Examiner (ID: 14533)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2302, 2829, 2858, 2866, CSDE |
| Total Applications | 763 |
| Issued Applications | 602 |
| Pending Applications | 16 |
| Abandoned Applications | 153 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
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[id] => 8503895
[patent_doc_number] => 20120303303
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[patent_kind] => A1
[patent_issue_date] => 2012-11-29
[patent_title] => 'CORRECTION FOR STRESS INDUCED LEAKAGE CURRENT IN DIELECTRIC RELIABILITY EVALUATIONS'
[patent_app_type] => utility
[patent_app_number] => 13/117819
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Array
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[patent_doc_number] => 20110215824
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[patent_kind] => A1
[patent_issue_date] => 2011-09-08
[patent_title] => 'OPERATION VOLTAGE SUPPLY APPARATUS'
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Array
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[patent_issue_date] => 2014-09-23
[patent_title] => 'Prober for testing devices in a repeat structure on a substrate'
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Array
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[patent_title] => 'POWER SUPPLY TESTING DEVICE AND COMPUTER SYSTEM HAVING SAME'
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Array
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[patent_title] => 'Testing jig for pogo pin connector'
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Array
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[patent_issue_date] => 2012-04-26
[patent_title] => 'INSPECTION DEVICE WITH VERTICALLY MOVEABLE ASSEMBLY'
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Array
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Array
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[patent_issue_date] => 2011-11-03
[patent_title] => 'TEST CIRCUIT OF AN INTEGRATED CIRCUIT ON A WAFER'
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[patent_app_number] => 13/093738
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Array
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Array
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Array
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Array
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