
Emily Y. Chan
Examiner (ID: 14533)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2302, 2829, 2858, 2866, CSDE |
| Total Applications | 763 |
| Issued Applications | 602 |
| Pending Applications | 16 |
| Abandoned Applications | 153 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7724802
[patent_doc_number] => 08098075
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-17
[patent_title] => 'Testing method for electronic apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/625865
[patent_app_country] => US
[patent_app_date] => 2009-11-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 4168
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 195
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/098/08098075.pdf
[firstpage_image] =>[orig_patent_app_number] => 12625865
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/625865 | Testing method for electronic apparatus | Nov 24, 2009 | Issued |
Array
(
[id] => 8283545
[patent_doc_number] => 08217657
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-07-10
[patent_title] => 'Diplex filter and method to filter signals'
[patent_app_type] => utility
[patent_app_number] => 12/616855
[patent_app_country] => US
[patent_app_date] => 2009-11-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 13
[patent_no_of_words] => 4849
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 219
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12616855
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/616855 | Diplex filter and method to filter signals | Nov 11, 2009 | Issued |
Array
(
[id] => 6282170
[patent_doc_number] => 20100156416
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-24
[patent_title] => 'Method and apparatus for processing combined MR/emission tomography recordings'
[patent_app_type] => utility
[patent_app_number] => 12/591177
[patent_app_country] => US
[patent_app_date] => 2009-11-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 7917
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0156/20100156416.pdf
[firstpage_image] =>[orig_patent_app_number] => 12591177
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/591177 | Method and apparatus for processing combined MR/emission tomography recordings | Nov 11, 2009 | Issued |
Array
(
[id] => 8550012
[patent_doc_number] => 08324897
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-12-04
[patent_title] => 'Digital NMR signal processing systems and methods'
[patent_app_type] => utility
[patent_app_number] => 12/616727
[patent_app_country] => US
[patent_app_date] => 2009-11-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 5966
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 83
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12616727
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/616727 | Digital NMR signal processing systems and methods | Nov 10, 2009 | Issued |
Array
(
[id] => 6453048
[patent_doc_number] => 20100283476
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-11-11
[patent_title] => 'Testing System and Testing Method'
[patent_app_type] => utility
[patent_app_number] => 12/609145
[patent_app_country] => US
[patent_app_date] => 2009-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3646
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0283/20100283476.pdf
[firstpage_image] =>[orig_patent_app_number] => 12609145
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/609145 | Testing system and testing method | Oct 29, 2009 | Issued |
Array
(
[id] => 5981168
[patent_doc_number] => 20110095774
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-04-28
[patent_title] => 'TESTING A NONVOLATILE CIRCUIT ELEMENT HAVING MULTIPLE INTERMEDIATE STATES'
[patent_app_type] => utility
[patent_app_number] => 12/605441
[patent_app_country] => US
[patent_app_date] => 2009-10-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2621
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0095/20110095774.pdf
[firstpage_image] =>[orig_patent_app_number] => 12605441
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/605441 | Testing a nonvolatile circuit element having multiple intermediate states | Oct 25, 2009 | Issued |
Array
(
[id] => 6021897
[patent_doc_number] => 20110050223
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-03
[patent_title] => 'MAGNETIC RESONANCE APPARATUS AND METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/605123
[patent_app_country] => US
[patent_app_date] => 2009-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5793
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0050/20110050223.pdf
[firstpage_image] =>[orig_patent_app_number] => 12605123
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/605123 | Magnetic resonance apparatus and method | Oct 22, 2009 | Issued |
Array
(
[id] => 8166176
[patent_doc_number] => 08174282
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-05-08
[patent_title] => 'Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method'
[patent_app_type] => utility
[patent_app_number] => 12/576670
[patent_app_country] => US
[patent_app_date] => 2009-10-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 10032
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 174
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/174/08174282.pdf
[firstpage_image] =>[orig_patent_app_number] => 12576670
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/576670 | Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method | Oct 8, 2009 | Issued |
Array
(
[id] => 6059432
[patent_doc_number] => 20110199115
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-08-18
[patent_title] => 'FAILURE DIAGNOSIS CIRCUIT, POWER SUPPLY DEVICE, AND FAILURE DIAGNOSIS METHOD'
[patent_app_type] => utility
[patent_app_number] => 13/125012
[patent_app_country] => US
[patent_app_date] => 2009-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 8545
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0199/20110199115.pdf
[firstpage_image] =>[orig_patent_app_number] => 13125012
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/125012 | FAILURE DIAGNOSIS CIRCUIT, POWER SUPPLY DEVICE, AND FAILURE DIAGNOSIS METHOD | Oct 1, 2009 | Abandoned |
Array
(
[id] => 8271068
[patent_doc_number] => 08212581
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-07-03
[patent_title] => 'Defective emitter detection for electroluminescent display'
[patent_app_type] => utility
[patent_app_number] => 12/570239
[patent_app_country] => US
[patent_app_date] => 2009-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5393
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 337
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12570239
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/570239 | Defective emitter detection for electroluminescent display | Sep 29, 2009 | Issued |
Array
(
[id] => 6115573
[patent_doc_number] => 20110074413
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-31
[patent_title] => 'SYSTEM AND METHOD FOR CONTROLLING CURRENT IN GRADIENT COIL OF MAGNETIC RESONANCE IMAGING SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 12/569138
[patent_app_country] => US
[patent_app_date] => 2009-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5162
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0074/20110074413.pdf
[firstpage_image] =>[orig_patent_app_number] => 12569138
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/569138 | System and method for controlling current in gradient coil of magnetic resonance imaging system | Sep 28, 2009 | Issued |
Array
(
[id] => 8105327
[patent_doc_number] => 08154313
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2012-04-10
[patent_title] => 'Water detection assembly for primary drain lines'
[patent_app_type] => utility
[patent_app_number] => 12/565765
[patent_app_country] => US
[patent_app_date] => 2009-09-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 9941
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 445
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/154/08154313.pdf
[firstpage_image] =>[orig_patent_app_number] => 12565765
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/565765 | Water detection assembly for primary drain lines | Sep 23, 2009 | Issued |
Array
(
[id] => 6403774
[patent_doc_number] => 20100148810
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-17
[patent_title] => 'PROBE DEVICE, PROCESSING DEVICE, AND PROBE TESTING METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/560272
[patent_app_country] => US
[patent_app_date] => 2009-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 10399
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0148/20100148810.pdf
[firstpage_image] =>[orig_patent_app_number] => 12560272
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/560272 | Probe device, processing device, and probe testing method | Sep 14, 2009 | Issued |
Array
(
[id] => 6426103
[patent_doc_number] => 20100102840
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-04-29
[patent_title] => 'TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/557468
[patent_app_country] => US
[patent_app_date] => 2009-09-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 22
[patent_no_of_words] => 14710
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0102/20100102840.pdf
[firstpage_image] =>[orig_patent_app_number] => 12557468
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/557468 | Test apparatus additional module and test method | Sep 9, 2009 | Issued |
Array
(
[id] => 8592692
[patent_doc_number] => 08350569
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-01-08
[patent_title] => 'Device and method for switching a pin diode'
[patent_app_type] => utility
[patent_app_number] => 12/547628
[patent_app_country] => US
[patent_app_date] => 2009-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 3156
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 194
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12547628
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/547628 | Device and method for switching a pin diode | Aug 25, 2009 | Issued |
Array
(
[id] => 6021947
[patent_doc_number] => 20110050273
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-03
[patent_title] => 'FAST TESTABLE WAFER AND WAFER TEST METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/547268
[patent_app_country] => US
[patent_app_date] => 2009-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 24
[patent_no_of_words] => 9565
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0050/20110050273.pdf
[firstpage_image] =>[orig_patent_app_number] => 12547268
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/547268 | FAST TESTABLE WAFER AND WAFER TEST METHOD | Aug 24, 2009 | Abandoned |
Array
(
[id] => 5990279
[patent_doc_number] => 20110012634
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-01-20
[patent_title] => 'Test probe'
[patent_app_type] => utility
[patent_app_number] => 12/545869
[patent_app_country] => US
[patent_app_date] => 2009-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1141
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0012/20110012634.pdf
[firstpage_image] =>[orig_patent_app_number] => 12545869
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/545869 | Test probe | Aug 23, 2009 | Issued |
Array
(
[id] => 8352754
[patent_doc_number] => 08248094
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-08-21
[patent_title] => 'Acquisition of silicon-on-insulator switching history effects statistics'
[patent_app_type] => utility
[patent_app_number] => 12/544772
[patent_app_country] => US
[patent_app_date] => 2009-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 8
[patent_no_of_words] => 6119
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 187
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12544772
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/544772 | Acquisition of silicon-on-insulator switching history effects statistics | Aug 19, 2009 | Issued |
Array
(
[id] => 5488582
[patent_doc_number] => 20090289653
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-11-26
[patent_title] => 'Inspection apparatus and method for semiconductor IC'
[patent_app_type] => utility
[patent_app_number] => 12/461194
[patent_app_country] => US
[patent_app_date] => 2009-08-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 9619
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0289/20090289653.pdf
[firstpage_image] =>[orig_patent_app_number] => 12461194
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/461194 | Inspection apparatus and method for semiconductor IC | Aug 3, 2009 | Abandoned |
Array
(
[id] => 8271075
[patent_doc_number] => 08212583
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-07-03
[patent_title] => 'Method and system for testing yawing system for wind turbine'
[patent_app_type] => utility
[patent_app_number] => 12/533268
[patent_app_country] => US
[patent_app_date] => 2009-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 2684
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 307
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12533268
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/533268 | Method and system for testing yawing system for wind turbine | Jul 30, 2009 | Issued |