Search

Emily Y. Chan

Examiner (ID: 14533)

Most Active Art Unit
2829
Art Unit(s)
2302, 2829, 2858, 2866, CSDE
Total Applications
763
Issued Applications
602
Pending Applications
16
Abandoned Applications
153

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7724802 [patent_doc_number] => 08098075 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-01-17 [patent_title] => 'Testing method for electronic apparatus' [patent_app_type] => utility [patent_app_number] => 12/625865 [patent_app_country] => US [patent_app_date] => 2009-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4168 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/098/08098075.pdf [firstpage_image] =>[orig_patent_app_number] => 12625865 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/625865
Testing method for electronic apparatus Nov 24, 2009 Issued
Array ( [id] => 8283545 [patent_doc_number] => 08217657 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-10 [patent_title] => 'Diplex filter and method to filter signals' [patent_app_type] => utility [patent_app_number] => 12/616855 [patent_app_country] => US [patent_app_date] => 2009-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 4849 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 219 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12616855 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/616855
Diplex filter and method to filter signals Nov 11, 2009 Issued
Array ( [id] => 6282170 [patent_doc_number] => 20100156416 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-24 [patent_title] => 'Method and apparatus for processing combined MR/emission tomography recordings' [patent_app_type] => utility [patent_app_number] => 12/591177 [patent_app_country] => US [patent_app_date] => 2009-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7917 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20100156416.pdf [firstpage_image] =>[orig_patent_app_number] => 12591177 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/591177
Method and apparatus for processing combined MR/emission tomography recordings Nov 11, 2009 Issued
Array ( [id] => 8550012 [patent_doc_number] => 08324897 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-12-04 [patent_title] => 'Digital NMR signal processing systems and methods' [patent_app_type] => utility [patent_app_number] => 12/616727 [patent_app_country] => US [patent_app_date] => 2009-11-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 5966 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12616727 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/616727
Digital NMR signal processing systems and methods Nov 10, 2009 Issued
Array ( [id] => 6453048 [patent_doc_number] => 20100283476 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-11 [patent_title] => 'Testing System and Testing Method' [patent_app_type] => utility [patent_app_number] => 12/609145 [patent_app_country] => US [patent_app_date] => 2009-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3646 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0283/20100283476.pdf [firstpage_image] =>[orig_patent_app_number] => 12609145 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/609145
Testing system and testing method Oct 29, 2009 Issued
Array ( [id] => 5981168 [patent_doc_number] => 20110095774 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-28 [patent_title] => 'TESTING A NONVOLATILE CIRCUIT ELEMENT HAVING MULTIPLE INTERMEDIATE STATES' [patent_app_type] => utility [patent_app_number] => 12/605441 [patent_app_country] => US [patent_app_date] => 2009-10-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2621 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0095/20110095774.pdf [firstpage_image] =>[orig_patent_app_number] => 12605441 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/605441
Testing a nonvolatile circuit element having multiple intermediate states Oct 25, 2009 Issued
Array ( [id] => 6021897 [patent_doc_number] => 20110050223 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-03 [patent_title] => 'MAGNETIC RESONANCE APPARATUS AND METHOD' [patent_app_type] => utility [patent_app_number] => 12/605123 [patent_app_country] => US [patent_app_date] => 2009-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5793 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20110050223.pdf [firstpage_image] =>[orig_patent_app_number] => 12605123 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/605123
Magnetic resonance apparatus and method Oct 22, 2009 Issued
Array ( [id] => 8166176 [patent_doc_number] => 08174282 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-05-08 [patent_title] => 'Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method' [patent_app_type] => utility [patent_app_number] => 12/576670 [patent_app_country] => US [patent_app_date] => 2009-10-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 10032 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/174/08174282.pdf [firstpage_image] =>[orig_patent_app_number] => 12576670 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/576670
Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method Oct 8, 2009 Issued
Array ( [id] => 6059432 [patent_doc_number] => 20110199115 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-18 [patent_title] => 'FAILURE DIAGNOSIS CIRCUIT, POWER SUPPLY DEVICE, AND FAILURE DIAGNOSIS METHOD' [patent_app_type] => utility [patent_app_number] => 13/125012 [patent_app_country] => US [patent_app_date] => 2009-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 8545 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0199/20110199115.pdf [firstpage_image] =>[orig_patent_app_number] => 13125012 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/125012
FAILURE DIAGNOSIS CIRCUIT, POWER SUPPLY DEVICE, AND FAILURE DIAGNOSIS METHOD Oct 1, 2009 Abandoned
Array ( [id] => 8271068 [patent_doc_number] => 08212581 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-03 [patent_title] => 'Defective emitter detection for electroluminescent display' [patent_app_type] => utility [patent_app_number] => 12/570239 [patent_app_country] => US [patent_app_date] => 2009-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5393 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 337 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12570239 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/570239
Defective emitter detection for electroluminescent display Sep 29, 2009 Issued
Array ( [id] => 6115573 [patent_doc_number] => 20110074413 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-31 [patent_title] => 'SYSTEM AND METHOD FOR CONTROLLING CURRENT IN GRADIENT COIL OF MAGNETIC RESONANCE IMAGING SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/569138 [patent_app_country] => US [patent_app_date] => 2009-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5162 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20110074413.pdf [firstpage_image] =>[orig_patent_app_number] => 12569138 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/569138
System and method for controlling current in gradient coil of magnetic resonance imaging system Sep 28, 2009 Issued
Array ( [id] => 8105327 [patent_doc_number] => 08154313 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2012-04-10 [patent_title] => 'Water detection assembly for primary drain lines' [patent_app_type] => utility [patent_app_number] => 12/565765 [patent_app_country] => US [patent_app_date] => 2009-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 9941 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 445 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/154/08154313.pdf [firstpage_image] =>[orig_patent_app_number] => 12565765 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/565765
Water detection assembly for primary drain lines Sep 23, 2009 Issued
Array ( [id] => 6403774 [patent_doc_number] => 20100148810 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-17 [patent_title] => 'PROBE DEVICE, PROCESSING DEVICE, AND PROBE TESTING METHOD' [patent_app_type] => utility [patent_app_number] => 12/560272 [patent_app_country] => US [patent_app_date] => 2009-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 10399 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20100148810.pdf [firstpage_image] =>[orig_patent_app_number] => 12560272 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/560272
Probe device, processing device, and probe testing method Sep 14, 2009 Issued
Array ( [id] => 6426103 [patent_doc_number] => 20100102840 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-29 [patent_title] => 'TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD' [patent_app_type] => utility [patent_app_number] => 12/557468 [patent_app_country] => US [patent_app_date] => 2009-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 14710 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0102/20100102840.pdf [firstpage_image] =>[orig_patent_app_number] => 12557468 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/557468
Test apparatus additional module and test method Sep 9, 2009 Issued
Array ( [id] => 8592692 [patent_doc_number] => 08350569 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-08 [patent_title] => 'Device and method for switching a pin diode' [patent_app_type] => utility [patent_app_number] => 12/547628 [patent_app_country] => US [patent_app_date] => 2009-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3156 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12547628 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/547628
Device and method for switching a pin diode Aug 25, 2009 Issued
Array ( [id] => 6021947 [patent_doc_number] => 20110050273 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-03 [patent_title] => 'FAST TESTABLE WAFER AND WAFER TEST METHOD' [patent_app_type] => utility [patent_app_number] => 12/547268 [patent_app_country] => US [patent_app_date] => 2009-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 9565 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20110050273.pdf [firstpage_image] =>[orig_patent_app_number] => 12547268 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/547268
FAST TESTABLE WAFER AND WAFER TEST METHOD Aug 24, 2009 Abandoned
Array ( [id] => 5990279 [patent_doc_number] => 20110012634 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-20 [patent_title] => 'Test probe' [patent_app_type] => utility [patent_app_number] => 12/545869 [patent_app_country] => US [patent_app_date] => 2009-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1141 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20110012634.pdf [firstpage_image] =>[orig_patent_app_number] => 12545869 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/545869
Test probe Aug 23, 2009 Issued
Array ( [id] => 8352754 [patent_doc_number] => 08248094 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-21 [patent_title] => 'Acquisition of silicon-on-insulator switching history effects statistics' [patent_app_type] => utility [patent_app_number] => 12/544772 [patent_app_country] => US [patent_app_date] => 2009-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6119 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12544772 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/544772
Acquisition of silicon-on-insulator switching history effects statistics Aug 19, 2009 Issued
Array ( [id] => 5488582 [patent_doc_number] => 20090289653 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-26 [patent_title] => 'Inspection apparatus and method for semiconductor IC' [patent_app_type] => utility [patent_app_number] => 12/461194 [patent_app_country] => US [patent_app_date] => 2009-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9619 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0289/20090289653.pdf [firstpage_image] =>[orig_patent_app_number] => 12461194 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/461194
Inspection apparatus and method for semiconductor IC Aug 3, 2009 Abandoned
Array ( [id] => 8271075 [patent_doc_number] => 08212583 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-03 [patent_title] => 'Method and system for testing yawing system for wind turbine' [patent_app_type] => utility [patent_app_number] => 12/533268 [patent_app_country] => US [patent_app_date] => 2009-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 2684 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 307 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12533268 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/533268
Method and system for testing yawing system for wind turbine Jul 30, 2009 Issued
Menu