
Emily Y. Chan
Examiner (ID: 14533)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2302, 2829, 2858, 2866, CSDE |
| Total Applications | 763 |
| Issued Applications | 602 |
| Pending Applications | 16 |
| Abandoned Applications | 153 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6538999
[patent_doc_number] => 20100271062
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-10-28
[patent_title] => 'METHOD AND APPARATUS FOR PROBE CARD ALIGNMENT IN A TEST SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 12/431271
[patent_app_country] => US
[patent_app_date] => 2009-04-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 7241
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0271/20100271062.pdf
[firstpage_image] =>[orig_patent_app_number] => 12431271
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/431271 | Method and apparatus for probe card alignment in a test system | Apr 27, 2009 | Issued |
Array
(
[id] => 4587961
[patent_doc_number] => 07852103
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-12-14
[patent_title] => 'Implementing at-speed Wafer Final Test (WFT) with complete chip coverage'
[patent_app_type] => utility
[patent_app_number] => 12/429263
[patent_app_country] => US
[patent_app_date] => 2009-04-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2336
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/852/07852103.pdf
[firstpage_image] =>[orig_patent_app_number] => 12429263
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/429263 | Implementing at-speed Wafer Final Test (WFT) with complete chip coverage | Apr 23, 2009 | Issued |
Array
(
[id] => 4587804
[patent_doc_number] => 07852065
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-12-14
[patent_title] => 'Testing apparatus for testing electronic system with 4-wires resistive touch panel and the method therefor'
[patent_app_type] => utility
[patent_app_number] => 12/385774
[patent_app_country] => US
[patent_app_date] => 2009-04-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3565
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 370
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/852/07852065.pdf
[firstpage_image] =>[orig_patent_app_number] => 12385774
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/385774 | Testing apparatus for testing electronic system with 4-wires resistive touch panel and the method therefor | Apr 19, 2009 | Issued |
Array
(
[id] => 6395923
[patent_doc_number] => 20100164523
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-01
[patent_title] => 'SYSTEM FOR TESTING CONNECTIONS OF TWO CONNECTORS'
[patent_app_type] => utility
[patent_app_number] => 12/412373
[patent_app_country] => US
[patent_app_date] => 2009-03-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1988
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0164/20100164523.pdf
[firstpage_image] =>[orig_patent_app_number] => 12412373
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/412373 | System for testing connections of two connectors | Mar 26, 2009 | Issued |
Array
(
[id] => 5470474
[patent_doc_number] => 20090243640
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-01
[patent_title] => 'CONDUCTIVE CONTACT PIN AND SEMICONDUCTOR TESTING EQUIPMENT'
[patent_app_type] => utility
[patent_app_number] => 12/409965
[patent_app_country] => US
[patent_app_date] => 2009-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3848
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0243/20090243640.pdf
[firstpage_image] =>[orig_patent_app_number] => 12409965
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/409965 | CONDUCTIVE CONTACT PIN AND SEMICONDUCTOR TESTING EQUIPMENT | Mar 23, 2009 | Abandoned |
Array
(
[id] => 5578130
[patent_doc_number] => 20090173476
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-07-09
[patent_title] => 'SPRAY COOLING THERMAL MANAGEMENT SYSTEM AND METHOD FOR SEMICONDUCTOR PROBING, DIAGNOSTICS, AND FAILURE ANALYSIS'
[patent_app_type] => utility
[patent_app_number] => 12/402475
[patent_app_country] => US
[patent_app_date] => 2009-03-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5474
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0173/20090173476.pdf
[firstpage_image] =>[orig_patent_app_number] => 12402475
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/402475 | Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis | Mar 10, 2009 | Issued |
Array
(
[id] => 6618384
[patent_doc_number] => 20100225304
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-09
[patent_title] => 'VOLTAGE-MEASURING CIRCUIT AND METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/398666
[patent_app_country] => US
[patent_app_date] => 2009-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 7901
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0225/20100225304.pdf
[firstpage_image] =>[orig_patent_app_number] => 12398666
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/398666 | Voltage-measuring circuit and method | Mar 4, 2009 | Issued |
Array
(
[id] => 6451690
[patent_doc_number] => 20100039101
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-02-18
[patent_title] => 'ELECTRICAL TESTING DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/398975
[patent_app_country] => US
[patent_app_date] => 2009-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 881
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0039/20100039101.pdf
[firstpage_image] =>[orig_patent_app_number] => 12398975
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/398975 | Electrical testing device | Mar 4, 2009 | Issued |
Array
(
[id] => 5386990
[patent_doc_number] => 20090228235
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-10
[patent_title] => 'Accelerometer with Enhanced DC Stability'
[patent_app_type] => utility
[patent_app_number] => 12/397680
[patent_app_country] => US
[patent_app_date] => 2009-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3177
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0228/20090228235.pdf
[firstpage_image] =>[orig_patent_app_number] => 12397680
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/397680 | Accelerometer with enhanced DC stability | Mar 3, 2009 | Issued |
Array
(
[id] => 6217031
[patent_doc_number] => 20100052711
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-03-04
[patent_title] => 'PROBE CARD AND MANUFACTURING METHOD OF THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/396671
[patent_app_country] => US
[patent_app_date] => 2009-03-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2191
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0052/20100052711.pdf
[firstpage_image] =>[orig_patent_app_number] => 12396671
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/396671 | PROBE CARD AND MANUFACTURING METHOD OF THE SAME | Mar 2, 2009 | Abandoned |
Array
(
[id] => 8105321
[patent_doc_number] => 08154310
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2012-04-10
[patent_title] => 'Capacitance sensor with sensor capacitance compensation'
[patent_app_type] => utility
[patent_app_number] => 12/395546
[patent_app_country] => US
[patent_app_date] => 2009-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 11
[patent_no_of_words] => 9516
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/154/08154310.pdf
[firstpage_image] =>[orig_patent_app_number] => 12395546
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/395546 | Capacitance sensor with sensor capacitance compensation | Feb 26, 2009 | Issued |
Array
(
[id] => 5531199
[patent_doc_number] => 20090230987
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-17
[patent_title] => 'Semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 12/379773
[patent_app_country] => US
[patent_app_date] => 2009-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 6606
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0230/20090230987.pdf
[firstpage_image] =>[orig_patent_app_number] => 12379773
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/379773 | Semiconductor device including address signal generating protion and digital-to-analog converter | Feb 26, 2009 | Issued |
Array
(
[id] => 5543301
[patent_doc_number] => 20090153178
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-06-18
[patent_title] => 'METHOD FOR TRANSFERRING TEST TRAYS IN A SIDE-DOCKING TYPE TEST HANDLER'
[patent_app_type] => utility
[patent_app_number] => 12/389469
[patent_app_country] => US
[patent_app_date] => 2009-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 5695
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0153/20090153178.pdf
[firstpage_image] =>[orig_patent_app_number] => 12389469
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/389469 | Method for transferring test trays in a side-docking type test handler | Feb 19, 2009 | Issued |
Array
(
[id] => 6474485
[patent_doc_number] => 20100207603
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-19
[patent_title] => 'AMMETER WITH IMPROVED CURRENT SENSING'
[patent_app_type] => utility
[patent_app_number] => 12/372768
[patent_app_country] => US
[patent_app_date] => 2009-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4093
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0207/20100207603.pdf
[firstpage_image] =>[orig_patent_app_number] => 12372768
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/372768 | Ammeter with improved current sensing | Feb 17, 2009 | Issued |
Array
(
[id] => 83097
[patent_doc_number] => 07746051
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2010-06-29
[patent_title] => 'Voltmeter with dual displays'
[patent_app_type] => utility
[patent_app_number] => 12/372775
[patent_app_country] => US
[patent_app_date] => 2009-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 2182
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/746/07746051.pdf
[firstpage_image] =>[orig_patent_app_number] => 12372775
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/372775 | Voltmeter with dual displays | Feb 17, 2009 | Issued |
Array
(
[id] => 4544358
[patent_doc_number] => 07876115
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-01-25
[patent_title] => 'Chuck for holding a device under test'
[patent_app_type] => utility
[patent_app_number] => 12/378648
[patent_app_country] => US
[patent_app_date] => 2009-02-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 21
[patent_no_of_words] => 5767
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 170
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/876/07876115.pdf
[firstpage_image] =>[orig_patent_app_number] => 12378648
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/378648 | Chuck for holding a device under test | Feb 16, 2009 | Issued |
Array
(
[id] => 5531157
[patent_doc_number] => 20090230945
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-17
[patent_title] => 'DEVICE AND METHOD ALLOWING THE DETECTION AND DISPLAY OF OBJECTS LOCATED BEHIND AN OBSCURING SURFACE'
[patent_app_type] => utility
[patent_app_number] => 12/371385
[patent_app_country] => US
[patent_app_date] => 2009-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 8584
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0230/20090230945.pdf
[firstpage_image] =>[orig_patent_app_number] => 12371385
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/371385 | Device and method allowing the detection and display of objects located behind an obscuring surface | Feb 12, 2009 | Issued |
Array
(
[id] => 5389549
[patent_doc_number] => 20090206861
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-20
[patent_title] => 'SEMICONDUCTOR INSPECTING DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/370072
[patent_app_country] => US
[patent_app_date] => 2009-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 6498
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0206/20090206861.pdf
[firstpage_image] =>[orig_patent_app_number] => 12370072
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/370072 | Semiconductor inspecting device | Feb 11, 2009 | Issued |
Array
(
[id] => 4640208
[patent_doc_number] => 08018236
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-09-13
[patent_title] => 'Device and method for analyzing defects, particularly for items made of plastics'
[patent_app_type] => utility
[patent_app_number] => 12/379066
[patent_app_country] => US
[patent_app_date] => 2009-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1944
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/018/08018236.pdf
[firstpage_image] =>[orig_patent_app_number] => 12379066
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/379066 | Device and method for analyzing defects, particularly for items made of plastics | Feb 11, 2009 | Issued |
Array
(
[id] => 8029621
[patent_doc_number] => 08143897
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-03-27
[patent_title] => 'Short-offset transient electromagnetic geophysical surveying'
[patent_app_type] => utility
[patent_app_number] => 12/378104
[patent_app_country] => US
[patent_app_date] => 2009-02-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 3135
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/143/08143897.pdf
[firstpage_image] =>[orig_patent_app_number] => 12378104
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/378104 | Short-offset transient electromagnetic geophysical surveying | Feb 10, 2009 | Issued |