Search

Eric Frank Winakur

Examiner (ID: 185, Phone: (571)272-4736 , Office: P/3777 )

Most Active Art Unit
3736
Art Unit(s)
3791, 3735, 3768, 3777, 2899, 3311, 3736
Total Applications
2497
Issued Applications
1849
Pending Applications
331
Abandoned Applications
337

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5448128 [patent_doc_number] => 20090049354 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'Single-pass, concurrent-validation methods for generating test patterns for sequential circuits' [patent_app_type] => utility [patent_app_number] => 11/893683 [patent_app_country] => US [patent_app_date] => 2007-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 14590 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0049/20090049354.pdf [firstpage_image] =>[orig_patent_app_number] => 11893683 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/893683
Single-pass, concurrent-validation methods for generating test patterns for sequential circuits Aug 15, 2007 Issued
Array ( [id] => 5362989 [patent_doc_number] => 20090037783 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-05 [patent_title] => 'PROTECTING DATA STORAGE STRUCTURES FROM INTERMITTENT ERRORS' [patent_app_type] => utility [patent_app_number] => 11/833765 [patent_app_country] => US [patent_app_date] => 2007-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3232 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0037/20090037783.pdf [firstpage_image] =>[orig_patent_app_number] => 11833765 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/833765
Protecting data storage structures from intermittent errors Aug 2, 2007 Issued
Array ( [id] => 4798988 [patent_doc_number] => 20080010574 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-10 [patent_title] => 'INTEGRATED CIRCUIT ARRANGEMENT AND METHOD FOR OPERATING AN INTEGRATED CIRCUIT ARRANGEMENT' [patent_app_type] => utility [patent_app_number] => 11/763140 [patent_app_country] => US [patent_app_date] => 2007-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2716 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0010/20080010574.pdf [firstpage_image] =>[orig_patent_app_number] => 11763140 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/763140
INTEGRATED CIRCUIT ARRANGEMENT AND METHOD FOR OPERATING AN INTEGRATED CIRCUIT ARRANGEMENT Jun 13, 2007 Abandoned
Array ( [id] => 4934056 [patent_doc_number] => 20080004831 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-03 [patent_title] => 'Circuitry and Method for an At-Speed Scan Test' [patent_app_type] => utility [patent_app_number] => 11/762353 [patent_app_country] => US [patent_app_date] => 2007-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6335 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0004/20080004831.pdf [firstpage_image] =>[orig_patent_app_number] => 11762353 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/762353
Circuitry and method for an at-speed scan test Jun 12, 2007 Issued
Array ( [id] => 7530042 [patent_doc_number] => 08046648 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-10-25 [patent_title] => 'Method and apparatus for controlling operating modes of an electronic device' [patent_app_type] => utility [patent_app_number] => 11/761815 [patent_app_country] => US [patent_app_date] => 2007-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 11739 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/046/08046648.pdf [firstpage_image] =>[orig_patent_app_number] => 11761815 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/761815
Method and apparatus for controlling operating modes of an electronic device Jun 11, 2007 Issued
Array ( [id] => 5009536 [patent_doc_number] => 20070280014 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-06 [patent_title] => 'Semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/806122 [patent_app_country] => US [patent_app_date] => 2007-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1897 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0280/20070280014.pdf [firstpage_image] =>[orig_patent_app_number] => 11806122 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/806122
Semiconductor device May 29, 2007 Abandoned
Array ( [id] => 4923804 [patent_doc_number] => 20080072121 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-20 [patent_title] => 'Method and Apparatus For Repairing Defective Cell for Each Cell Section Word Line' [patent_app_type] => utility [patent_app_number] => 11/750527 [patent_app_country] => US [patent_app_date] => 2007-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3712 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20080072121.pdf [firstpage_image] =>[orig_patent_app_number] => 11750527 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/750527
Method and Apparatus For Repairing Defective Cell for Each Cell Section Word Line May 17, 2007 Abandoned
Array ( [id] => 5200789 [patent_doc_number] => 20070300107 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'Device test apparatus' [patent_app_type] => utility [patent_app_number] => 11/798635 [patent_app_country] => US [patent_app_date] => 2007-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3914 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0300/20070300107.pdf [firstpage_image] =>[orig_patent_app_number] => 11798635 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/798635
Device test apparatus May 14, 2007 Abandoned
Array ( [id] => 7510582 [patent_doc_number] => 08037371 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-10-11 [patent_title] => 'Apparatus and method for testing high-speed serial transmitters and other devices' [patent_app_type] => utility [patent_app_number] => 11/803231 [patent_app_country] => US [patent_app_date] => 2007-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 6138 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/037/08037371.pdf [firstpage_image] =>[orig_patent_app_number] => 11803231 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/803231
Apparatus and method for testing high-speed serial transmitters and other devices May 13, 2007 Issued
Array ( [id] => 5167219 [patent_doc_number] => 20070288808 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-13 [patent_title] => 'Method and system for detecting of errors within optical storage media' [patent_app_type] => utility [patent_app_number] => 11/798073 [patent_app_country] => US [patent_app_date] => 2007-05-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 5327 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0288/20070288808.pdf [firstpage_image] =>[orig_patent_app_number] => 11798073 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/798073
Method and system for detecting of errors within optical storage media May 9, 2007 Abandoned
Array ( [id] => 5132579 [patent_doc_number] => 20070208976 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-06 [patent_title] => 'LOW OVERHEAD INPUT AND OUTPUT BOUNDARY SCAN CELLS' [patent_app_type] => utility [patent_app_number] => 11/745532 [patent_app_country] => US [patent_app_date] => 2007-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 10270 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0208/20070208976.pdf [firstpage_image] =>[orig_patent_app_number] => 11745532 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/745532
Two boundary scan cell switches controlling input to output buffer May 7, 2007 Issued
Array ( [id] => 76652 [patent_doc_number] => 07757138 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-13 [patent_title] => 'Semiconductor integrated circuit, test data generating device, LSI test device, and computer product' [patent_app_type] => utility [patent_app_number] => 11/797347 [patent_app_country] => US [patent_app_date] => 2007-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 19 [patent_no_of_words] => 8618 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/757/07757138.pdf [firstpage_image] =>[orig_patent_app_number] => 11797347 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/797347
Semiconductor integrated circuit, test data generating device, LSI test device, and computer product May 1, 2007 Issued
Array ( [id] => 5167230 [patent_doc_number] => 20070288819 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-13 [patent_title] => 'Semiconductor integrated circuit, test data generating device, lsi test device, and computer product' [patent_app_type] => utility [patent_app_number] => 11/797348 [patent_app_country] => US [patent_app_date] => 2007-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8213 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0288/20070288819.pdf [firstpage_image] =>[orig_patent_app_number] => 11797348 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/797348
Semiconductor integrated circuit, test data generating device, LSI test device, and computer product May 1, 2007 Issued
Array ( [id] => 4793977 [patent_doc_number] => 20080294951 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-27 [patent_title] => 'Methods and devices for testing computer memory' [patent_app_type] => utility [patent_app_number] => 11/797146 [patent_app_country] => US [patent_app_date] => 2007-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3545 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0294/20080294951.pdf [firstpage_image] =>[orig_patent_app_number] => 11797146 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/797146
Methods and devices for testing computer memory Apr 30, 2007 Abandoned
Array ( [id] => 8878807 [patent_doc_number] => 08473791 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-25 [patent_title] => 'Redundant memory to mask DRAM failures' [patent_app_type] => utility [patent_app_number] => 11/742446 [patent_app_country] => US [patent_app_date] => 2007-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2530 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11742446 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/742446
Redundant memory to mask DRAM failures Apr 29, 2007 Issued
Array ( [id] => 4862366 [patent_doc_number] => 20080270828 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-30 [patent_title] => 'Memory Redundancy Method and Apparatus' [patent_app_type] => utility [patent_app_number] => 11/741337 [patent_app_country] => US [patent_app_date] => 2007-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3135 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0270/20080270828.pdf [firstpage_image] =>[orig_patent_app_number] => 11741337 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/741337
Memory Redundancy Method and Apparatus Apr 26, 2007 Abandoned
Array ( [id] => 7537709 [patent_doc_number] => 08051352 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-01 [patent_title] => 'Timing-aware test generation and fault simulation' [patent_app_type] => utility [patent_app_number] => 11/796374 [patent_app_country] => US [patent_app_date] => 2007-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 20 [patent_no_of_words] => 16454 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/051/08051352.pdf [firstpage_image] =>[orig_patent_app_number] => 11796374 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/796374
Timing-aware test generation and fault simulation Apr 26, 2007 Issued
Array ( [id] => 4862400 [patent_doc_number] => 20080270846 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-30 [patent_title] => 'Methods and Apparatus for Compiling and Displaying Test Data Items' [patent_app_type] => utility [patent_app_number] => 11/740746 [patent_app_country] => US [patent_app_date] => 2007-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2865 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0270/20080270846.pdf [firstpage_image] =>[orig_patent_app_number] => 11740746 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/740746
Methods and Apparatus for Compiling and Displaying Test Data Items Apr 25, 2007 Abandoned
Array ( [id] => 4730710 [patent_doc_number] => 20080209294 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'BUILT-IN SELF TESTING OF A FLASH MEMORY' [patent_app_type] => utility [patent_app_number] => 11/740314 [patent_app_country] => US [patent_app_date] => 2007-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4568 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0209/20080209294.pdf [firstpage_image] =>[orig_patent_app_number] => 11740314 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/740314
BUILT-IN SELF TESTING OF A FLASH MEMORY Apr 25, 2007 Abandoned
Array ( [id] => 4862433 [patent_doc_number] => 20080270854 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-30 [patent_title] => 'SYSTEM AND METHOD FOR RUNNING TEST AND REDUNDANCY ANALYSIS IN PARALLEL' [patent_app_type] => utility [patent_app_number] => 11/739599 [patent_app_country] => US [patent_app_date] => 2007-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3630 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0270/20080270854.pdf [firstpage_image] =>[orig_patent_app_number] => 11739599 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/739599
SYSTEM AND METHOD FOR RUNNING TEST AND REDUNDANCY ANALYSIS IN PARALLEL Apr 23, 2007 Abandoned
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