
Eric Frank Winakur
Examiner (ID: 185, Phone: (571)272-4736 , Office: P/3777 )
| Most Active Art Unit | 3736 |
| Art Unit(s) | 3791, 3735, 3768, 3777, 2899, 3311, 3736 |
| Total Applications | 2497 |
| Issued Applications | 1849 |
| Pending Applications | 331 |
| Abandoned Applications | 337 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5448128
[patent_doc_number] => 20090049354
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-19
[patent_title] => 'Single-pass, concurrent-validation methods for generating test patterns for sequential circuits'
[patent_app_type] => utility
[patent_app_number] => 11/893683
[patent_app_country] => US
[patent_app_date] => 2007-08-16
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[pdf_file] => publications/A1/0049/20090049354.pdf
[firstpage_image] =>[orig_patent_app_number] => 11893683
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/893683 | Single-pass, concurrent-validation methods for generating test patterns for sequential circuits | Aug 15, 2007 | Issued |
Array
(
[id] => 5362989
[patent_doc_number] => 20090037783
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[patent_issue_date] => 2009-02-05
[patent_title] => 'PROTECTING DATA STORAGE STRUCTURES FROM INTERMITTENT ERRORS'
[patent_app_type] => utility
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[patent_app_date] => 2007-08-03
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/833765 | Protecting data storage structures from intermittent errors | Aug 2, 2007 | Issued |
Array
(
[id] => 4798988
[patent_doc_number] => 20080010574
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[patent_kind] => A1
[patent_issue_date] => 2008-01-10
[patent_title] => 'INTEGRATED CIRCUIT ARRANGEMENT AND METHOD FOR OPERATING AN INTEGRATED CIRCUIT ARRANGEMENT'
[patent_app_type] => utility
[patent_app_number] => 11/763140
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[firstpage_image] =>[orig_patent_app_number] => 11763140
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/763140 | INTEGRATED CIRCUIT ARRANGEMENT AND METHOD FOR OPERATING AN INTEGRATED CIRCUIT ARRANGEMENT | Jun 13, 2007 | Abandoned |
Array
(
[id] => 4934056
[patent_doc_number] => 20080004831
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[patent_kind] => A1
[patent_issue_date] => 2008-01-03
[patent_title] => 'Circuitry and Method for an At-Speed Scan Test'
[patent_app_type] => utility
[patent_app_number] => 11/762353
[patent_app_country] => US
[patent_app_date] => 2007-06-13
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/762353 | Circuitry and method for an at-speed scan test | Jun 12, 2007 | Issued |
Array
(
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[patent_doc_number] => 08046648
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[patent_issue_date] => 2011-10-25
[patent_title] => 'Method and apparatus for controlling operating modes of an electronic device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/761815 | Method and apparatus for controlling operating modes of an electronic device | Jun 11, 2007 | Issued |
Array
(
[id] => 5009536
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[patent_title] => 'Semiconductor device'
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[firstpage_image] =>[orig_patent_app_number] => 11806122
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/806122 | Semiconductor device | May 29, 2007 | Abandoned |
Array
(
[id] => 4923804
[patent_doc_number] => 20080072121
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[patent_issue_date] => 2008-03-20
[patent_title] => 'Method and Apparatus For Repairing Defective Cell for Each Cell Section Word Line'
[patent_app_type] => utility
[patent_app_number] => 11/750527
[patent_app_country] => US
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[patent_drawing_sheets_cnt] => 8
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/750527 | Method and Apparatus For Repairing Defective Cell for Each Cell Section Word Line | May 17, 2007 | Abandoned |
Array
(
[id] => 5200789
[patent_doc_number] => 20070300107
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-27
[patent_title] => 'Device test apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/798635
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[patent_app_date] => 2007-05-15
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[firstpage_image] =>[orig_patent_app_number] => 11798635
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/798635 | Device test apparatus | May 14, 2007 | Abandoned |
Array
(
[id] => 7510582
[patent_doc_number] => 08037371
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[patent_kind] => B1
[patent_issue_date] => 2011-10-11
[patent_title] => 'Apparatus and method for testing high-speed serial transmitters and other devices'
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[pdf_file] => patents/08/037/08037371.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/803231 | Apparatus and method for testing high-speed serial transmitters and other devices | May 13, 2007 | Issued |
Array
(
[id] => 5167219
[patent_doc_number] => 20070288808
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[patent_kind] => A1
[patent_issue_date] => 2007-12-13
[patent_title] => 'Method and system for detecting of errors within optical storage media'
[patent_app_type] => utility
[patent_app_number] => 11/798073
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[patent_app_date] => 2007-05-10
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Array
(
[id] => 5132579
[patent_doc_number] => 20070208976
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[patent_issue_date] => 2007-09-06
[patent_title] => 'LOW OVERHEAD INPUT AND OUTPUT BOUNDARY SCAN CELLS'
[patent_app_type] => utility
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[patent_app_date] => 2007-05-08
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[firstpage_image] =>[orig_patent_app_number] => 11745532
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/745532 | Two boundary scan cell switches controlling input to output buffer | May 7, 2007 | Issued |
Array
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Array
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Array
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Array
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Array
(
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Array
(
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Array
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Array
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Array
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