
Eric Frank Winakur
Examiner (ID: 185, Phone: (571)272-4736 , Office: P/3777 )
| Most Active Art Unit | 3736 |
| Art Unit(s) | 3791, 3735, 3768, 3777, 2899, 3311, 3736 |
| Total Applications | 2497 |
| Issued Applications | 1849 |
| Pending Applications | 331 |
| Abandoned Applications | 337 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6789057
[patent_doc_number] => 20030140296
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-24
[patent_title] => 'Method of improving system performance in a wireless network by making requests without acknowledgement'
[patent_app_type] => new
[patent_app_number] => 10/348011
[patent_app_country] => US
[patent_app_date] => 2003-01-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 11171
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0140/20030140296.pdf
[firstpage_image] =>[orig_patent_app_number] => 10348011
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/348011 | Method of improving system performance in a wireless network by making requests without acknowledgement | Jan 21, 2003 | Abandoned |
Array
(
[id] => 7312810
[patent_doc_number] => 20040143781
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-22
[patent_title] => 'System and method for non-intrusive loopback testing'
[patent_app_type] => new
[patent_app_number] => 10/348744
[patent_app_country] => US
[patent_app_date] => 2003-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[firstpage_image] =>[orig_patent_app_number] => 10348744
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/348744 | System and method for non-intrusive loopback testing | Jan 20, 2003 | Abandoned |
Array
(
[id] => 7312809
[patent_doc_number] => 20040143780
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-22
[patent_title] => 'Method and apparatus for determining loopback capabilities of a communication device'
[patent_app_type] => new
[patent_app_number] => 10/348633
[patent_app_country] => US
[patent_app_date] => 2003-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[firstpage_image] =>[orig_patent_app_number] => 10348633
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/348633 | Method and apparatus for determining loopback capabilities of a communication device | Jan 20, 2003 | Abandoned |
Array
(
[id] => 6661151
[patent_doc_number] => 20030135795
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-17
[patent_title] => 'Integrated circuit and method for operating a test configuration with an integrated circuit'
[patent_app_type] => new
[patent_app_number] => 10/345527
[patent_app_country] => US
[patent_app_date] => 2003-01-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[firstpage_image] =>[orig_patent_app_number] => 10345527
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/345527 | Integrated circuit and method for operating a test configuration with an integrated circuit | Jan 15, 2003 | Abandoned |
Array
(
[id] => 7394608
[patent_doc_number] => 20040030972
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-02-12
[patent_title] => 'Semiconductor memory device having time reduced in testing of memory cell data reading or writing, or testing of sense amplifier performance'
[patent_app_type] => new
[patent_app_number] => 10/342396
[patent_app_country] => US
[patent_app_date] => 2003-01-15
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 12184
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[pdf_file] => publications/A1/0030/20040030972.pdf
[firstpage_image] =>[orig_patent_app_number] => 10342396
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/342396 | Semiconductor memory device having time reduced in testing of memory cell data reading or writing, or testing of sense amplifier performance | Jan 14, 2003 | Issued |
Array
(
[id] => 7328947
[patent_doc_number] => 20040139377
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-15
[patent_title] => 'METHOD AND APPARATUS FOR COMPACT SCAN TESTING'
[patent_app_type] => new
[patent_app_number] => 10/248352
[patent_app_country] => US
[patent_app_date] => 2003-01-13
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[firstpage_image] =>[orig_patent_app_number] => 10248352
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/248352 | METHOD AND APPARATUS FOR COMPACT SCAN TESTING | Jan 12, 2003 | Abandoned |
Array
(
[id] => 6698233
[patent_doc_number] => 20030110427
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-06-12
[patent_title] => 'Semiconductor test system storing pin calibration data in non-volatile memory'
[patent_app_type] => new
[patent_app_number] => 10/340349
[patent_app_country] => US
[patent_app_date] => 2003-01-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
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[patent_no_of_words] => 7712
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[pdf_file] => publications/A1/0110/20030110427.pdf
[firstpage_image] =>[orig_patent_app_number] => 10340349
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/340349 | Semiconductor test system storing pin calibration data in non-volatile memory | Jan 9, 2003 | Abandoned |
Array
(
[id] => 7293560
[patent_doc_number] => 20040111654
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-06-10
[patent_title] => 'Memory device with debug mode'
[patent_app_type] => new
[patent_app_number] => 10/338343
[patent_app_country] => US
[patent_app_date] => 2003-01-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1356
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[pdf_file] => publications/A1/0111/20040111654.pdf
[firstpage_image] =>[orig_patent_app_number] => 10338343
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/338343 | Memory device with debug mode | Jan 7, 2003 | Abandoned |
Array
(
[id] => 7341664
[patent_doc_number] => 20040133827
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-08
[patent_title] => 'Internal data generation and compare via unused external pins'
[patent_app_type] => new
[patent_app_number] => 10/336140
[patent_app_country] => US
[patent_app_date] => 2003-01-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => publications/A1/0133/20040133827.pdf
[firstpage_image] =>[orig_patent_app_number] => 10336140
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/336140 | Internal data generation and compare via unused external pins | Jan 1, 2003 | Abandoned |
Array
(
[id] => 6763170
[patent_doc_number] => 20030126532
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-03
[patent_title] => 'Integrated circuit'
[patent_app_type] => new
[patent_app_number] => 10/330443
[patent_app_country] => US
[patent_app_date] => 2002-12-27
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[pdf_file] => publications/A1/0126/20030126532.pdf
[firstpage_image] =>[orig_patent_app_number] => 10330443
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/330443 | Integrated circuit | Dec 26, 2002 | Abandoned |
Array
(
[id] => 6704688
[patent_doc_number] => 20030151422
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-08-14
[patent_title] => 'Method for burn-in testing'
[patent_app_type] => new
[patent_app_number] => 10/248126
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[pdf_file] => publications/A1/0151/20030151422.pdf
[firstpage_image] =>[orig_patent_app_number] => 10248126
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/248126 | Method for burn-in testing | Dec 18, 2002 | Abandoned |
Array
(
[id] => 539983
[patent_doc_number] => 07188270
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[patent_issue_date] => 2007-03-06
[patent_title] => 'Method and system for a disk fault tolerance in a disk array using rotating parity'
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Array
(
[id] => 7477163
[patent_doc_number] => 20040098646
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[patent_title] => 'Method and apparatus to check the integrity of scan chain connectivity by traversing the test logic of the device'
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[firstpage_image] =>[orig_patent_app_number] => 10300513
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/300513 | Method and apparatus to check the integrity of scan chain connectivity by traversing the test logic of the device | Nov 19, 2002 | Abandoned |
Array
(
[id] => 6766987
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[patent_title] => 'Apparatus and method for varying packet frame length'
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Array
(
[id] => 7477172
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/300443 | Rolling CRC scheme for improved error detection | Nov 18, 2002 | Abandoned |
Array
(
[id] => 6707313
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[patent_title] => 'Tester for mixed signal semiconductor device and method of testing semiconductor device using the same'
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[patent_app_number] => 10/300491
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/300491 | Tester for mixed signal semiconductor device and method of testing semiconductor device using the same | Nov 18, 2002 | Abandoned |
Array
(
[id] => 598493
[patent_doc_number] => 07451363
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[patent_issue_date] => 2008-11-11
[patent_title] => 'Semiconductor integrated circuit including memory macro'
[patent_app_type] => utility
[patent_app_number] => 10/300227
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/299549 | Methods and systems for tracking and playing back errors in a communications network | Nov 17, 2002 | Issued |
Array
(
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[patent_title] => 'Error concealment apparatus and method'
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[firstpage_image] =>[orig_patent_app_number] => 10494359
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/494359 | Error concealment apparatus and method | Nov 14, 2002 | Abandoned |
Array
(
[id] => 7449979
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[patent_title] => 'Memory unit test'
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[firstpage_image] =>[orig_patent_app_number] => 10494794
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/494794 | Memory unit test | Oct 29, 2002 | Issued |