Ernest F Karlsen

Array ( [id] => 205594 [patent_doc_number] => 07629809 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-08 [patent_title] => 'IC tester' [patent_app_type] => utility [patent_app_number] => 12/255407 [patent_app_country] => US [patent_app_date] => 2008-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2909 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 253 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/629/07629809.pdf [firstpage_image] =>[orig_patent_app_number] => 12255407 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 191454 [patent_doc_number] => 07642768 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-01-05 [patent_title] => 'Current sensor having field screening arrangement including electrical conductors sandwiching magnetic permeability layer' [patent_app_type] => utility [patent_app_number] => 12/255006 [patent_app_country] => US [patent_app_date] => 2008-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 4516 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/642/07642768.pdf [firstpage_image] =>[orig_patent_app_number] => 12255006 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 143470 [patent_doc_number] => 07692439 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-06 [patent_title] => 'Structure for modeling stress-induced degradation of conductive interconnects' [patent_app_type] => utility [patent_app_number] => 12/154304 [patent_app_country] => US [patent_app_date] => 2008-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 7433 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 259 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/692/07692439.pdf [firstpage_image] =>[orig_patent_app_number] => 12154304 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4724526 [patent_doc_number] => 20080204067 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'SYNCHRONOUS SEMICONDUCTOR DEVICE, AND INSPECTION SYSTEM AND METHOD FOR THE SAME' [patent_app_type] => utility [patent_app_number] => 12/112782 [patent_app_country] => US [patent_app_date] => 2008-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9868 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0204/20080204067.pdf [firstpage_image] =>[orig_patent_app_number] => 12112782 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4811100 [patent_doc_number] => 20080191731 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-14 [patent_title] => 'Semiconductor device testing apparatus and device interface board' [patent_app_type] => utility [patent_app_number] => 12/082048 [patent_app_country] => US [patent_app_date] => 2008-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8772 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0191/20080191731.pdf [firstpage_image] =>[orig_patent_app_number] => 12082048 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1077475 [patent_doc_number] => 07615992 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-10 [patent_title] => 'Apparatus and method for detecting electronic device testing socket' [patent_app_type] => utility [patent_app_number] => 12/056000 [patent_app_country] => US [patent_app_date] => 2008-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3089 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/615/07615992.pdf [firstpage_image] =>[orig_patent_app_number] => 12056000 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 253216 [patent_doc_number] => 07579852 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-25 [patent_title] => 'Wafer translator having metallization pattern providing high density interdigitated contact pads for component' [patent_app_type] => utility [patent_app_number] => 12/079202 [patent_app_country] => US [patent_app_date] => 2008-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 2865 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/579/07579852.pdf [firstpage_image] =>[orig_patent_app_number] => 12079202 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 205590 [patent_doc_number] => 07629805 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-08 [patent_title] => 'Method and system to dynamically compensate for probe tip misalignement when testing integrated circuits' [patent_app_type] => utility [patent_app_number] => 12/051300 [patent_app_country] => US [patent_app_date] => 2008-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5602 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/629/07629805.pdf [firstpage_image] =>[orig_patent_app_number] => 12051300 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 160462 [patent_doc_number] => 07675307 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-09 [patent_title] => 'Heating apparatus for semiconductor devices' [patent_app_type] => utility [patent_app_number] => 12/050204 [patent_app_country] => US [patent_app_date] => 2008-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 1909 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/675/07675307.pdf [firstpage_image] =>[orig_patent_app_number] => 12050204 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 331022 [patent_doc_number] => 07511521 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-31 [patent_title] => 'Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component' [patent_app_type] => utility [patent_app_number] => 12/045480 [patent_app_country] => US [patent_app_date] => 2008-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 20 [patent_no_of_words] => 4475 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/511/07511521.pdf [firstpage_image] =>[orig_patent_app_number] => 12045480 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4821392 [patent_doc_number] => 20080122452 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-29 [patent_title] => 'Impedance Calibration for Source Series Terminated Serial Link Transmitter' [patent_app_type] => utility [patent_app_number] => 12/028451 [patent_app_country] => US [patent_app_date] => 2008-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5010 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20080122452.pdf [firstpage_image] =>[orig_patent_app_number] => 12028451 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4763123 [patent_doc_number] => 20080174333 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-24 [patent_title] => 'TEST SOCKETS HAVING PELTIER ELEMENTS, TEST EQUIPMENT INCLUDING THE SAME AND METHODS OF TESTING SEMICONDUCTOR PACKAGES USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/017202 [patent_app_country] => US [patent_app_date] => 2008-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3428 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20080174333.pdf [firstpage_image] =>[orig_patent_app_number] => 12017202 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 186270 [patent_doc_number] => 07646208 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-12 [patent_title] => 'On-chip detection of power supply vulnerabilities' [patent_app_type] => utility [patent_app_number] => 12/013833 [patent_app_country] => US [patent_app_date] => 2008-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 5616 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/646/07646208.pdf [firstpage_image] =>[orig_patent_app_number] => 12013833 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4925501 [patent_doc_number] => 20080164864 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-10 [patent_title] => 'COMPENSATION OF SIMPLE FIBRE OPTIC FARADAY EFFECT SENSORS' [patent_app_type] => utility [patent_app_number] => 11/972832 [patent_app_country] => US [patent_app_date] => 2008-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 8125 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20080164864.pdf [firstpage_image] =>[orig_patent_app_number] => 11972832 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 236650 [patent_doc_number] => 07595632 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-29 [patent_title] => 'Wafer probe station having environment control enclosure' [patent_app_type] => utility [patent_app_number] => 12/006438 [patent_app_country] => US [patent_app_date] => 2008-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 4263 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/595/07595632.pdf [firstpage_image] =>[orig_patent_app_number] => 12006438 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5431404 [patent_doc_number] => 20090165990 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-02 [patent_title] => 'METHOD OF OBTAINING ACCURATELY A HEAT-DISSIPATING REQUIREMENT FOR ELECTRONIC SYSTEMS' [patent_app_type] => utility [patent_app_number] => 11/967100 [patent_app_country] => US [patent_app_date] => 2007-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1230 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0165/20090165990.pdf [firstpage_image] =>[orig_patent_app_number] => 11967100 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 197842 [patent_doc_number] => 07639032 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-29 [patent_title] => 'Structure for monitoring stress-induced degradation of conductive interconnects' [patent_app_type] => utility [patent_app_number] => 12/004011 [patent_app_country] => US [patent_app_date] => 2007-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 6528 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/639/07639032.pdf [firstpage_image] =>[orig_patent_app_number] => 12004011 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4952997 [patent_doc_number] => 20080186021 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-07 [patent_title] => 'Current sensor and molding method thereof' [patent_app_type] => utility [patent_app_number] => 12/000501 [patent_app_country] => US [patent_app_date] => 2007-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3665 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20080186021.pdf [firstpage_image] =>[orig_patent_app_number] => 12000501 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 103453 [patent_doc_number] => 07728612 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-01 [patent_title] => 'Probe card assembly and method of forming same' [patent_app_type] => utility [patent_app_number] => 11/986453 [patent_app_country] => US [patent_app_date] => 2007-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 22 [patent_no_of_words] => 7875 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/728/07728612.pdf [firstpage_image] =>[orig_patent_app_number] => 11986453 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4897312 [patent_doc_number] => 20080116925 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'Probe device' [patent_app_type] => utility [patent_app_number] => 11/984601 [patent_app_country] => US [patent_app_date] => 2007-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5271 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116925.pdf [firstpage_image] =>[orig_patent_app_number] => 11984601 [rel_patent_id] =>[rel_patent_doc_number] =>)