Search

Ernest F Karlsen

Examiner (ID: 15736)

Most Active Art Unit
2607
Art Unit(s)
2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858
Total Applications
2295
Issued Applications
1990
Pending Applications
49
Abandoned Applications
256

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 613274 [patent_doc_number] => 07148674 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-12-12 [patent_title] => 'Apparatus for automatically measuring a relatively wide range of leakage currents' [patent_app_type] => utility [patent_app_number] => 10/929807 [patent_app_country] => US [patent_app_date] => 2004-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3260 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/148/07148674.pdf [firstpage_image] =>[orig_patent_app_number] => 10929807 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/929807
Apparatus for automatically measuring a relatively wide range of leakage currents Aug 29, 2004 Issued
Array ( [id] => 7160622 [patent_doc_number] => 20050028041 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-03 [patent_title] => 'Motherboard memory slot ribbon cable and apparatus' [patent_app_type] => utility [patent_app_number] => 10/928385 [patent_app_country] => US [patent_app_date] => 2004-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4481 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20050028041.pdf [firstpage_image] =>[orig_patent_app_number] => 10928385 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/928385
Motherboard memory slot ribbon cable and apparatus Aug 26, 2004 Issued
Array ( [id] => 7023347 [patent_doc_number] => 20050017741 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-27 [patent_title] => 'Wafer probe station having environment control enclosure' [patent_app_type] => utility [patent_app_number] => 10/925526 [patent_app_country] => US [patent_app_date] => 2004-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4203 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20050017741.pdf [firstpage_image] =>[orig_patent_app_number] => 10925526 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/925526
Wafer probe station having environment control enclosure Aug 24, 2004 Issued
Array ( [id] => 901234 [patent_doc_number] => 07339388 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-04 [patent_title] => 'Intra-clip power and test signal generation for use with test structures on wafers' [patent_app_type] => utility [patent_app_number] => 10/927406 [patent_app_country] => US [patent_app_date] => 2004-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 30 [patent_no_of_words] => 24043 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 273 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/339/07339388.pdf [firstpage_image] =>[orig_patent_app_number] => 10927406 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/927406
Intra-clip power and test signal generation for use with test structures on wafers Aug 24, 2004 Issued
Array ( [id] => 487988 [patent_doc_number] => 07218130 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-05-15 [patent_title] => 'Bottom side stiffener probe card' [patent_app_type] => utility [patent_app_number] => 10/925260 [patent_app_country] => US [patent_app_date] => 2004-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2077 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/218/07218130.pdf [firstpage_image] =>[orig_patent_app_number] => 10925260 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/925260
Bottom side stiffener probe card Aug 24, 2004 Issued
Array ( [id] => 616910 [patent_doc_number] => 07145323 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-12-05 [patent_title] => 'Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer' [patent_app_type] => utility [patent_app_number] => 10/925337 [patent_app_country] => US [patent_app_date] => 2004-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 17 [patent_no_of_words] => 12395 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 297 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/145/07145323.pdf [firstpage_image] =>[orig_patent_app_number] => 10925337 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/925337
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Aug 22, 2004 Issued
Array ( [id] => 7150453 [patent_doc_number] => 20050024806 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-03 [patent_title] => 'Current detection resistor, mounting structure thereof and method of measuring effective inductance' [patent_app_type] => utility [patent_app_number] => 10/921915 [patent_app_country] => US [patent_app_date] => 2004-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 7780 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20050024806.pdf [firstpage_image] =>[orig_patent_app_number] => 10921915 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/921915
Current detection resistor, mounting structure thereof and method of measuring effective inductance Aug 19, 2004 Issued
Array ( [id] => 677414 [patent_doc_number] => 07088122 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-08 [patent_title] => 'Test arrangement for testing semiconductor circuit chips' [patent_app_type] => utility [patent_app_number] => 10/922005 [patent_app_country] => US [patent_app_date] => 2004-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 2727 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/088/07088122.pdf [firstpage_image] =>[orig_patent_app_number] => 10922005 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/922005
Test arrangement for testing semiconductor circuit chips Aug 18, 2004 Issued
Array ( [id] => 7023355 [patent_doc_number] => 20050017749 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-27 [patent_title] => 'Electronic devices mounted on electronic equipment board test system and test method' [patent_app_type] => utility [patent_app_number] => 10/918477 [patent_app_country] => US [patent_app_date] => 2004-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2627 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20050017749.pdf [firstpage_image] =>[orig_patent_app_number] => 10918477 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/918477
Electronic devices mounted on electronic equipment board test system and test method Aug 15, 2004 Abandoned
Array ( [id] => 5796841 [patent_doc_number] => 20060033518 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-16 [patent_title] => 'Probe retention kit, and system and method for probing a pattern of points on a printed circuit board' [patent_app_type] => utility [patent_app_number] => 10/918236 [patent_app_country] => US [patent_app_date] => 2004-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2221 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0033/20060033518.pdf [firstpage_image] =>[orig_patent_app_number] => 10918236 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/918236
Probe retention kit, and system and method for probing a pattern of points on a printed circuit board Aug 12, 2004 Issued
Array ( [id] => 703522 [patent_doc_number] => 07064567 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-20 [patent_title] => 'Interposer probe and method for testing' [patent_app_type] => utility [patent_app_number] => 10/916706 [patent_app_country] => US [patent_app_date] => 2004-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5279 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/064/07064567.pdf [firstpage_image] =>[orig_patent_app_number] => 10916706 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/916706
Interposer probe and method for testing Aug 11, 2004 Issued
Array ( [id] => 415701 [patent_doc_number] => 07279887 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-10-09 [patent_title] => 'In-process system level test before surface mount' [patent_app_type] => utility [patent_app_number] => 10/912910 [patent_app_country] => US [patent_app_date] => 2004-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3627 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/279/07279887.pdf [firstpage_image] =>[orig_patent_app_number] => 10912910 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/912910
In-process system level test before surface mount Aug 5, 2004 Issued
Array ( [id] => 7087469 [patent_doc_number] => 20050007581 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-13 [patent_title] => 'Optical testing device' [patent_app_type] => utility [patent_app_number] => 10/912789 [patent_app_country] => US [patent_app_date] => 2004-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3402 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 33 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20050007581.pdf [firstpage_image] =>[orig_patent_app_number] => 10912789 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/912789
Optical testing device Aug 5, 2004 Issued
Array ( [id] => 726251 [patent_doc_number] => 07046022 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-16 [patent_title] => 'Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component' [patent_app_type] => utility [patent_app_number] => 10/912785 [patent_app_country] => US [patent_app_date] => 2004-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 20 [patent_no_of_words] => 4399 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/046/07046022.pdf [firstpage_image] =>[orig_patent_app_number] => 10912785 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/912785
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component Aug 5, 2004 Issued
Array ( [id] => 540309 [patent_doc_number] => 07173442 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-06 [patent_title] => 'Integrated printed circuit board and test contactor for high speed semiconductor testing' [patent_app_type] => utility [patent_app_number] => 10/912331 [patent_app_country] => US [patent_app_date] => 2004-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2077 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/173/07173442.pdf [firstpage_image] =>[orig_patent_app_number] => 10912331 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/912331
Integrated printed circuit board and test contactor for high speed semiconductor testing Aug 4, 2004 Issued
Array ( [id] => 5818351 [patent_doc_number] => 20060022664 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-02 [patent_title] => 'Method and apparatus for electromagnetic interference shielding in an automated test system' [patent_app_type] => utility [patent_app_number] => 10/903132 [patent_app_country] => US [patent_app_date] => 2004-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2739 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0022/20060022664.pdf [firstpage_image] =>[orig_patent_app_number] => 10903132 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/903132
Method and apparatus for electromagnetic interference shielding in an automated test system Jul 29, 2004 Issued
Array ( [id] => 7238299 [patent_doc_number] => 20040257107 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-23 [patent_title] => 'TDDB test pattern and method for testing TDDB of MOS capacitor dielectric' [patent_app_type] => new [patent_app_number] => 10/895285 [patent_app_country] => US [patent_app_date] => 2004-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3429 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0257/20040257107.pdf [firstpage_image] =>[orig_patent_app_number] => 10895285 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/895285
TDDB test pattern and method for testing TDDB of MOS capacitor dielectric Jul 20, 2004 Issued
Array ( [id] => 747180 [patent_doc_number] => 07026805 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-04-11 [patent_title] => 'Method of setting grids and/or markers in measuring apparatus' [patent_app_type] => utility [patent_app_number] => 10/891999 [patent_app_country] => US [patent_app_date] => 2004-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4277 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/026/07026805.pdf [firstpage_image] =>[orig_patent_app_number] => 10891999 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/891999
Method of setting grids and/or markers in measuring apparatus Jul 14, 2004 Issued
Array ( [id] => 767512 [patent_doc_number] => 07009411 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-07 [patent_title] => 'Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam' [patent_app_type] => utility [patent_app_number] => 10/890241 [patent_app_country] => US [patent_app_date] => 2004-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 6774 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/009/07009411.pdf [firstpage_image] =>[orig_patent_app_number] => 10890241 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/890241
Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam Jul 13, 2004 Issued
Array ( [id] => 7148929 [patent_doc_number] => 20050024067 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-03 [patent_title] => 'Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts' [patent_app_type] => utility [patent_app_number] => 10/885777 [patent_app_country] => US [patent_app_date] => 2004-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 10148 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20050024067.pdf [firstpage_image] =>[orig_patent_app_number] => 10885777 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/885777
Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts Jul 7, 2004 Issued
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