
Ernest F Karlsen
Examiner (ID: 15736)
| Most Active Art Unit | 2607 |
| Art Unit(s) | 2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858 |
| Total Applications | 2295 |
| Issued Applications | 1990 |
| Pending Applications | 49 |
| Abandoned Applications | 256 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 613274
[patent_doc_number] => 07148674
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-12-12
[patent_title] => 'Apparatus for automatically measuring a relatively wide range of leakage currents'
[patent_app_type] => utility
[patent_app_number] => 10/929807
[patent_app_country] => US
[patent_app_date] => 2004-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3260
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/148/07148674.pdf
[firstpage_image] =>[orig_patent_app_number] => 10929807
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/929807 | Apparatus for automatically measuring a relatively wide range of leakage currents | Aug 29, 2004 | Issued |
Array
(
[id] => 7160622
[patent_doc_number] => 20050028041
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-02-03
[patent_title] => 'Motherboard memory slot ribbon cable and apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/928385
[patent_app_country] => US
[patent_app_date] => 2004-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 4481
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0028/20050028041.pdf
[firstpage_image] =>[orig_patent_app_number] => 10928385
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/928385 | Motherboard memory slot ribbon cable and apparatus | Aug 26, 2004 | Issued |
Array
(
[id] => 7023347
[patent_doc_number] => 20050017741
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-27
[patent_title] => 'Wafer probe station having environment control enclosure'
[patent_app_type] => utility
[patent_app_number] => 10/925526
[patent_app_country] => US
[patent_app_date] => 2004-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 4203
[patent_no_of_claims] => 9
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[patent_maintenance] => 1
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[pdf_file] => publications/A1/0017/20050017741.pdf
[firstpage_image] =>[orig_patent_app_number] => 10925526
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/925526 | Wafer probe station having environment control enclosure | Aug 24, 2004 | Issued |
Array
(
[id] => 901234
[patent_doc_number] => 07339388
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-03-04
[patent_title] => 'Intra-clip power and test signal generation for use with test structures on wafers'
[patent_app_type] => utility
[patent_app_number] => 10/927406
[patent_app_country] => US
[patent_app_date] => 2004-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 30
[patent_no_of_words] => 24043
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 273
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/339/07339388.pdf
[firstpage_image] =>[orig_patent_app_number] => 10927406
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/927406 | Intra-clip power and test signal generation for use with test structures on wafers | Aug 24, 2004 | Issued |
Array
(
[id] => 487988
[patent_doc_number] => 07218130
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-05-15
[patent_title] => 'Bottom side stiffener probe card'
[patent_app_type] => utility
[patent_app_number] => 10/925260
[patent_app_country] => US
[patent_app_date] => 2004-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 2077
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/218/07218130.pdf
[firstpage_image] =>[orig_patent_app_number] => 10925260
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/925260 | Bottom side stiffener probe card | Aug 24, 2004 | Issued |
Array
(
[id] => 616910
[patent_doc_number] => 07145323
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-12-05
[patent_title] => 'Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer'
[patent_app_type] => utility
[patent_app_number] => 10/925337
[patent_app_country] => US
[patent_app_date] => 2004-08-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 17
[patent_no_of_words] => 12395
[patent_no_of_claims] => 4
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[patent_words_short_claim] => 297
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/145/07145323.pdf
[firstpage_image] =>[orig_patent_app_number] => 10925337
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/925337 | Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer | Aug 22, 2004 | Issued |
Array
(
[id] => 7150453
[patent_doc_number] => 20050024806
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-02-03
[patent_title] => 'Current detection resistor, mounting structure thereof and method of measuring effective inductance'
[patent_app_type] => utility
[patent_app_number] => 10/921915
[patent_app_country] => US
[patent_app_date] => 2004-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[patent_no_of_words] => 7780
[patent_no_of_claims] => 7
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0024/20050024806.pdf
[firstpage_image] =>[orig_patent_app_number] => 10921915
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/921915 | Current detection resistor, mounting structure thereof and method of measuring effective inductance | Aug 19, 2004 | Issued |
Array
(
[id] => 677414
[patent_doc_number] => 07088122
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-08-08
[patent_title] => 'Test arrangement for testing semiconductor circuit chips'
[patent_app_type] => utility
[patent_app_number] => 10/922005
[patent_app_country] => US
[patent_app_date] => 2004-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 2727
[patent_no_of_claims] => 20
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/088/07088122.pdf
[firstpage_image] =>[orig_patent_app_number] => 10922005
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/922005 | Test arrangement for testing semiconductor circuit chips | Aug 18, 2004 | Issued |
Array
(
[id] => 7023355
[patent_doc_number] => 20050017749
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-27
[patent_title] => 'Electronic devices mounted on electronic equipment board test system and test method'
[patent_app_type] => utility
[patent_app_number] => 10/918477
[patent_app_country] => US
[patent_app_date] => 2004-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => publications/A1/0017/20050017749.pdf
[firstpage_image] =>[orig_patent_app_number] => 10918477
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/918477 | Electronic devices mounted on electronic equipment board test system and test method | Aug 15, 2004 | Abandoned |
Array
(
[id] => 5796841
[patent_doc_number] => 20060033518
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-16
[patent_title] => 'Probe retention kit, and system and method for probing a pattern of points on a printed circuit board'
[patent_app_type] => utility
[patent_app_number] => 10/918236
[patent_app_country] => US
[patent_app_date] => 2004-08-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 2221
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[pdf_file] => publications/A1/0033/20060033518.pdf
[firstpage_image] =>[orig_patent_app_number] => 10918236
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/918236 | Probe retention kit, and system and method for probing a pattern of points on a printed circuit board | Aug 12, 2004 | Issued |
Array
(
[id] => 703522
[patent_doc_number] => 07064567
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-06-20
[patent_title] => 'Interposer probe and method for testing'
[patent_app_type] => utility
[patent_app_number] => 10/916706
[patent_app_country] => US
[patent_app_date] => 2004-08-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => patents/07/064/07064567.pdf
[firstpage_image] =>[orig_patent_app_number] => 10916706
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/916706 | Interposer probe and method for testing | Aug 11, 2004 | Issued |
Array
(
[id] => 415701
[patent_doc_number] => 07279887
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-10-09
[patent_title] => 'In-process system level test before surface mount'
[patent_app_type] => utility
[patent_app_number] => 10/912910
[patent_app_country] => US
[patent_app_date] => 2004-08-06
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[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/07/279/07279887.pdf
[firstpage_image] =>[orig_patent_app_number] => 10912910
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/912910 | In-process system level test before surface mount | Aug 5, 2004 | Issued |
Array
(
[id] => 7087469
[patent_doc_number] => 20050007581
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-13
[patent_title] => 'Optical testing device'
[patent_app_type] => utility
[patent_app_number] => 10/912789
[patent_app_country] => US
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[pdf_file] => publications/A1/0007/20050007581.pdf
[firstpage_image] =>[orig_patent_app_number] => 10912789
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/912789 | Optical testing device | Aug 5, 2004 | Issued |
Array
(
[id] => 726251
[patent_doc_number] => 07046022
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-05-16
[patent_title] => 'Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component'
[patent_app_type] => utility
[patent_app_number] => 10/912785
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[pdf_file] => patents/07/046/07046022.pdf
[firstpage_image] =>[orig_patent_app_number] => 10912785
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/912785 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | Aug 5, 2004 | Issued |
Array
(
[id] => 540309
[patent_doc_number] => 07173442
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[patent_issue_date] => 2007-02-06
[patent_title] => 'Integrated printed circuit board and test contactor for high speed semiconductor testing'
[patent_app_type] => utility
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[pdf_file] => patents/07/173/07173442.pdf
[firstpage_image] =>[orig_patent_app_number] => 10912331
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/912331 | Integrated printed circuit board and test contactor for high speed semiconductor testing | Aug 4, 2004 | Issued |
Array
(
[id] => 5818351
[patent_doc_number] => 20060022664
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-02
[patent_title] => 'Method and apparatus for electromagnetic interference shielding in an automated test system'
[patent_app_type] => utility
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[pdf_file] => publications/A1/0022/20060022664.pdf
[firstpage_image] =>[orig_patent_app_number] => 10903132
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/903132 | Method and apparatus for electromagnetic interference shielding in an automated test system | Jul 29, 2004 | Issued |
Array
(
[id] => 7238299
[patent_doc_number] => 20040257107
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[patent_kind] => A1
[patent_issue_date] => 2004-12-23
[patent_title] => 'TDDB test pattern and method for testing TDDB of MOS capacitor dielectric'
[patent_app_type] => new
[patent_app_number] => 10/895285
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/895285 | TDDB test pattern and method for testing TDDB of MOS capacitor dielectric | Jul 20, 2004 | Issued |
Array
(
[id] => 747180
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[patent_title] => 'Method of setting grids and/or markers in measuring apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/891999 | Method of setting grids and/or markers in measuring apparatus | Jul 14, 2004 | Issued |
Array
(
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[patent_title] => 'Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam'
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[firstpage_image] =>[orig_patent_app_number] => 10890241
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/890241 | Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam | Jul 13, 2004 | Issued |
Array
(
[id] => 7148929
[patent_doc_number] => 20050024067
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[patent_kind] => A1
[patent_issue_date] => 2005-02-03
[patent_title] => 'Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts'
[patent_app_type] => utility
[patent_app_number] => 10/885777
[patent_app_country] => US
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[pdf_file] => publications/A1/0024/20050024067.pdf
[firstpage_image] =>[orig_patent_app_number] => 10885777
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/885777 | Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts | Jul 7, 2004 | Issued |