Search

Ernest F Karlsen

Examiner (ID: 15736)

Most Active Art Unit
2607
Art Unit(s)
2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858
Total Applications
2295
Issued Applications
1990
Pending Applications
49
Abandoned Applications
256

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 474413 [patent_doc_number] => 07230438 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-06-12 [patent_title] => 'Thin film probe card contact drive system' [patent_app_type] => utility [patent_app_number] => 10/884552 [patent_app_country] => US [patent_app_date] => 2004-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3593 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/230/07230438.pdf [firstpage_image] =>[orig_patent_app_number] => 10884552 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/884552
Thin film probe card contact drive system Jul 1, 2004 Issued
Array ( [id] => 5893623 [patent_doc_number] => 20060002161 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-05 [patent_title] => 'Temperature and voltage controlled integrated circuit processes' [patent_app_type] => utility [patent_app_number] => 10/882905 [patent_app_country] => US [patent_app_date] => 2004-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9468 [patent_no_of_claims] => 64 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0002/20060002161.pdf [firstpage_image] =>[orig_patent_app_number] => 10882905 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/882905
Temperature and voltage controlled integrated circuit processes Jun 29, 2004 Issued
Array ( [id] => 444002 [patent_doc_number] => 07256594 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-08-14 [patent_title] => 'Method and apparatus for testing semiconductor devices using the back side of a circuit board' [patent_app_type] => utility [patent_app_number] => 10/876346 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 2039 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/256/07256594.pdf [firstpage_image] =>[orig_patent_app_number] => 10876346 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/876346
Method and apparatus for testing semiconductor devices using the back side of a circuit board Jun 22, 2004 Issued
Array ( [id] => 465821 [patent_doc_number] => 07239152 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-03 [patent_title] => 'Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer' [patent_app_type] => utility [patent_app_number] => 10/873692 [patent_app_country] => US [patent_app_date] => 2004-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 17 [patent_no_of_words] => 12435 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/239/07239152.pdf [firstpage_image] =>[orig_patent_app_number] => 10873692 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/873692
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Jun 21, 2004 Issued
Array ( [id] => 7607067 [patent_doc_number] => 07098649 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-29 [patent_title] => 'Testing circuits on substrates' [patent_app_type] => utility [patent_app_number] => 10/871630 [patent_app_country] => US [patent_app_date] => 2004-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 19 [patent_no_of_words] => 3423 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/098/07098649.pdf [firstpage_image] =>[orig_patent_app_number] => 10871630 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/871630
Testing circuits on substrates Jun 16, 2004 Issued
Array ( [id] => 5629526 [patent_doc_number] => 20060145994 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-06 [patent_title] => 'Display system with impending failure indicator' [patent_app_type] => utility [patent_app_number] => 10/560007 [patent_app_country] => US [patent_app_date] => 2004-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2675 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0145/20060145994.pdf [firstpage_image] =>[orig_patent_app_number] => 10560007 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/560007
Display system with impending failure indicator Jun 14, 2004 Abandoned
Array ( [id] => 7314703 [patent_doc_number] => 20040222785 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-11-11 [patent_title] => 'Signal sampling using flex circuits on direct inter-connects' [patent_app_type] => new [patent_app_number] => 10/865113 [patent_app_country] => US [patent_app_date] => 2004-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2537 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 3 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0222/20040222785.pdf [firstpage_image] =>[orig_patent_app_number] => 10865113 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/865113
Signal sampling using flex circuits on direct inter-connects Jun 9, 2004 Abandoned
Array ( [id] => 229382 [patent_doc_number] => 07602197 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-13 [patent_title] => 'High current electron beam inspection' [patent_app_type] => utility [patent_app_number] => 10/560205 [patent_app_country] => US [patent_app_date] => 2004-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 6077 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/602/07602197.pdf [firstpage_image] =>[orig_patent_app_number] => 10560205 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/560205
High current electron beam inspection Jun 6, 2004 Issued
Array ( [id] => 982749 [patent_doc_number] => 06927593 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-09 [patent_title] => 'System for testing semiconductor die on multiple semiconductor wafers' [patent_app_type] => utility [patent_app_number] => 10/860679 [patent_app_country] => US [patent_app_date] => 2004-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5873 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/927/06927593.pdf [firstpage_image] =>[orig_patent_app_number] => 10860679 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/860679
System for testing semiconductor die on multiple semiconductor wafers Jun 2, 2004 Issued
Array ( [id] => 7207800 [patent_doc_number] => 20050258818 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-24 [patent_title] => 'Reduced pin count test method and apparatus' [patent_app_type] => utility [patent_app_number] => 10/851454 [patent_app_country] => US [patent_app_date] => 2004-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2938 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20050258818.pdf [firstpage_image] =>[orig_patent_app_number] => 10851454 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/851454
Reduced pin count test method and apparatus May 20, 2004 Issued
Array ( [id] => 700523 [patent_doc_number] => 07068025 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-27 [patent_title] => 'Compensation of simple fibre optic Faraday effect sensors' [patent_app_type] => utility [patent_app_number] => 10/849507 [patent_app_country] => US [patent_app_date] => 2004-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 34 [patent_no_of_words] => 8199 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 449 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/068/07068025.pdf [firstpage_image] =>[orig_patent_app_number] => 10849507 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/849507
Compensation of simple fibre optic Faraday effect sensors May 18, 2004 Issued
Array ( [id] => 841070 [patent_doc_number] => 07391227 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-06-24 [patent_title] => 'Sheet-like probe, process for producing the same and its application' [patent_app_type] => utility [patent_app_number] => 10/556782 [patent_app_country] => US [patent_app_date] => 2004-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 42 [patent_no_of_words] => 20357 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 231 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/391/07391227.pdf [firstpage_image] =>[orig_patent_app_number] => 10556782 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/556782
Sheet-like probe, process for producing the same and its application May 11, 2004 Issued
Array ( [id] => 651398 [patent_doc_number] => 07112976 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-26 [patent_title] => 'Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested' [patent_app_type] => utility [patent_app_number] => 10/842554 [patent_app_country] => US [patent_app_date] => 2004-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 34 [patent_no_of_words] => 19110 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/112/07112976.pdf [firstpage_image] =>[orig_patent_app_number] => 10842554 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/842554
Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested May 10, 2004 Issued
Array ( [id] => 7414283 [patent_doc_number] => 20040207419 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-21 [patent_title] => 'Inspecting device and probe card' [patent_app_type] => new [patent_app_number] => 10/840254 [patent_app_country] => US [patent_app_date] => 2004-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 13983 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20040207419.pdf [firstpage_image] =>[orig_patent_app_number] => 10840254 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/840254
Inspecting device and probe card May 6, 2004 Abandoned
Array ( [id] => 7414325 [patent_doc_number] => 20040207425 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-21 [patent_title] => 'Inspection apparatus and probe card' [patent_app_type] => new [patent_app_number] => 10/840244 [patent_app_country] => US [patent_app_date] => 2004-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 13986 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20040207425.pdf [firstpage_image] =>[orig_patent_app_number] => 10840244 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/840244
Inspection apparatus and probe card May 6, 2004 Abandoned
Array ( [id] => 419245 [patent_doc_number] => 07276922 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-02 [patent_title] => 'Closed-grid bus architecture for wafer interconnect structure' [patent_app_type] => utility [patent_app_number] => 10/832700 [patent_app_country] => US [patent_app_date] => 2004-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 7287 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/276/07276922.pdf [firstpage_image] =>[orig_patent_app_number] => 10832700 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/832700
Closed-grid bus architecture for wafer interconnect structure Apr 26, 2004 Issued
Array ( [id] => 432754 [patent_doc_number] => 07265531 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-04 [patent_title] => 'Integrated current sensor' [patent_app_type] => utility [patent_app_number] => 10/831906 [patent_app_country] => US [patent_app_date] => 2004-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 7200 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/265/07265531.pdf [firstpage_image] =>[orig_patent_app_number] => 10831906 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/831906
Integrated current sensor Apr 25, 2004 Issued
Array ( [id] => 549027 [patent_doc_number] => 07167013 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-23 [patent_title] => 'Suction cap for IC sockets and IC socket assembly using same' [patent_app_type] => utility [patent_app_number] => 10/831006 [patent_app_country] => US [patent_app_date] => 2004-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 28 [patent_no_of_words] => 4958 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/167/07167013.pdf [firstpage_image] =>[orig_patent_app_number] => 10831006 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/831006
Suction cap for IC sockets and IC socket assembly using same Apr 22, 2004 Issued
Array ( [id] => 6964256 [patent_doc_number] => 20050231153 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-20 [patent_title] => 'High voltage isolation detection of a fuel cell system using magnetic field cancellation' [patent_app_type] => utility [patent_app_number] => 10/828420 [patent_app_country] => US [patent_app_date] => 2004-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1978 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20050231153.pdf [firstpage_image] =>[orig_patent_app_number] => 10828420 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/828420
High voltage isolation detection of a fuel cell system using magnetic field cancellation Apr 19, 2004 Abandoned
Array ( [id] => 422265 [patent_doc_number] => 07274199 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-25 [patent_title] => 'Method and arrangement of testing device in mobile station' [patent_app_type] => utility [patent_app_number] => 10/552403 [patent_app_country] => US [patent_app_date] => 2004-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5303 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/274/07274199.pdf [firstpage_image] =>[orig_patent_app_number] => 10552403 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/552403
Method and arrangement of testing device in mobile station Apr 6, 2004 Issued
Menu