
Ernest F Karlsen
Examiner (ID: 15736)
| Most Active Art Unit | 2607 |
| Art Unit(s) | 2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858 |
| Total Applications | 2295 |
| Issued Applications | 1990 |
| Pending Applications | 49 |
| Abandoned Applications | 256 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 474413
[patent_doc_number] => 07230438
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-06-12
[patent_title] => 'Thin film probe card contact drive system'
[patent_app_type] => utility
[patent_app_number] => 10/884552
[patent_app_country] => US
[patent_app_date] => 2004-07-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 3593
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 57
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/230/07230438.pdf
[firstpage_image] =>[orig_patent_app_number] => 10884552
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/884552 | Thin film probe card contact drive system | Jul 1, 2004 | Issued |
Array
(
[id] => 5893623
[patent_doc_number] => 20060002161
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-01-05
[patent_title] => 'Temperature and voltage controlled integrated circuit processes'
[patent_app_type] => utility
[patent_app_number] => 10/882905
[patent_app_country] => US
[patent_app_date] => 2004-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 9468
[patent_no_of_claims] => 64
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0002/20060002161.pdf
[firstpage_image] =>[orig_patent_app_number] => 10882905
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/882905 | Temperature and voltage controlled integrated circuit processes | Jun 29, 2004 | Issued |
Array
(
[id] => 444002
[patent_doc_number] => 07256594
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-08-14
[patent_title] => 'Method and apparatus for testing semiconductor devices using the back side of a circuit board'
[patent_app_type] => utility
[patent_app_number] => 10/876346
[patent_app_country] => US
[patent_app_date] => 2004-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 2039
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 167
[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/256/07256594.pdf
[firstpage_image] =>[orig_patent_app_number] => 10876346
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/876346 | Method and apparatus for testing semiconductor devices using the back side of a circuit board | Jun 22, 2004 | Issued |
Array
(
[id] => 465821
[patent_doc_number] => 07239152
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-07-03
[patent_title] => 'Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer'
[patent_app_type] => utility
[patent_app_number] => 10/873692
[patent_app_country] => US
[patent_app_date] => 2004-06-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 17
[patent_no_of_words] => 12435
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 235
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/239/07239152.pdf
[firstpage_image] =>[orig_patent_app_number] => 10873692
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/873692 | Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer | Jun 21, 2004 | Issued |
Array
(
[id] => 7607067
[patent_doc_number] => 07098649
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-08-29
[patent_title] => 'Testing circuits on substrates'
[patent_app_type] => utility
[patent_app_number] => 10/871630
[patent_app_country] => US
[patent_app_date] => 2004-06-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 19
[patent_no_of_words] => 3423
[patent_no_of_claims] => 14
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/098/07098649.pdf
[firstpage_image] =>[orig_patent_app_number] => 10871630
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/871630 | Testing circuits on substrates | Jun 16, 2004 | Issued |
Array
(
[id] => 5629526
[patent_doc_number] => 20060145994
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-07-06
[patent_title] => 'Display system with impending failure indicator'
[patent_app_type] => utility
[patent_app_number] => 10/560007
[patent_app_country] => US
[patent_app_date] => 2004-06-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2675
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0145/20060145994.pdf
[firstpage_image] =>[orig_patent_app_number] => 10560007
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/560007 | Display system with impending failure indicator | Jun 14, 2004 | Abandoned |
Array
(
[id] => 7314703
[patent_doc_number] => 20040222785
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-11-11
[patent_title] => 'Signal sampling using flex circuits on direct inter-connects'
[patent_app_type] => new
[patent_app_number] => 10/865113
[patent_app_country] => US
[patent_app_date] => 2004-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2537
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 4
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0222/20040222785.pdf
[firstpage_image] =>[orig_patent_app_number] => 10865113
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/865113 | Signal sampling using flex circuits on direct inter-connects | Jun 9, 2004 | Abandoned |
Array
(
[id] => 229382
[patent_doc_number] => 07602197
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-13
[patent_title] => 'High current electron beam inspection'
[patent_app_type] => utility
[patent_app_number] => 10/560205
[patent_app_country] => US
[patent_app_date] => 2004-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 15
[patent_no_of_words] => 6077
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 160
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/602/07602197.pdf
[firstpage_image] =>[orig_patent_app_number] => 10560205
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/560205 | High current electron beam inspection | Jun 6, 2004 | Issued |
Array
(
[id] => 982749
[patent_doc_number] => 06927593
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-08-09
[patent_title] => 'System for testing semiconductor die on multiple semiconductor wafers'
[patent_app_type] => utility
[patent_app_number] => 10/860679
[patent_app_country] => US
[patent_app_date] => 2004-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 5873
[patent_no_of_claims] => 29
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/927/06927593.pdf
[firstpage_image] =>[orig_patent_app_number] => 10860679
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/860679 | System for testing semiconductor die on multiple semiconductor wafers | Jun 2, 2004 | Issued |
Array
(
[id] => 7207800
[patent_doc_number] => 20050258818
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-11-24
[patent_title] => 'Reduced pin count test method and apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/851454
[patent_app_country] => US
[patent_app_date] => 2004-05-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2938
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0258/20050258818.pdf
[firstpage_image] =>[orig_patent_app_number] => 10851454
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/851454 | Reduced pin count test method and apparatus | May 20, 2004 | Issued |
Array
(
[id] => 700523
[patent_doc_number] => 07068025
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-06-27
[patent_title] => 'Compensation of simple fibre optic Faraday effect sensors'
[patent_app_type] => utility
[patent_app_number] => 10/849507
[patent_app_country] => US
[patent_app_date] => 2004-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 34
[patent_no_of_words] => 8199
[patent_no_of_claims] => 3
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[patent_words_short_claim] => 449
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/068/07068025.pdf
[firstpage_image] =>[orig_patent_app_number] => 10849507
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/849507 | Compensation of simple fibre optic Faraday effect sensors | May 18, 2004 | Issued |
Array
(
[id] => 841070
[patent_doc_number] => 07391227
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-06-24
[patent_title] => 'Sheet-like probe, process for producing the same and its application'
[patent_app_type] => utility
[patent_app_number] => 10/556782
[patent_app_country] => US
[patent_app_date] => 2004-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
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[patent_no_of_words] => 20357
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/391/07391227.pdf
[firstpage_image] =>[orig_patent_app_number] => 10556782
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/556782 | Sheet-like probe, process for producing the same and its application | May 11, 2004 | Issued |
Array
(
[id] => 651398
[patent_doc_number] => 07112976
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-26
[patent_title] => 'Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested'
[patent_app_type] => utility
[patent_app_number] => 10/842554
[patent_app_country] => US
[patent_app_date] => 2004-05-11
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/112/07112976.pdf
[firstpage_image] =>[orig_patent_app_number] => 10842554
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/842554 | Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested | May 10, 2004 | Issued |
Array
(
[id] => 7414283
[patent_doc_number] => 20040207419
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-10-21
[patent_title] => 'Inspecting device and probe card'
[patent_app_type] => new
[patent_app_number] => 10/840254
[patent_app_country] => US
[patent_app_date] => 2004-05-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => publications/A1/0207/20040207419.pdf
[firstpage_image] =>[orig_patent_app_number] => 10840254
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/840254 | Inspecting device and probe card | May 6, 2004 | Abandoned |
Array
(
[id] => 7414325
[patent_doc_number] => 20040207425
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-10-21
[patent_title] => 'Inspection apparatus and probe card'
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[pdf_file] => publications/A1/0207/20040207425.pdf
[firstpage_image] =>[orig_patent_app_number] => 10840244
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/840244 | Inspection apparatus and probe card | May 6, 2004 | Abandoned |
Array
(
[id] => 419245
[patent_doc_number] => 07276922
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-10-02
[patent_title] => 'Closed-grid bus architecture for wafer interconnect structure'
[patent_app_type] => utility
[patent_app_number] => 10/832700
[patent_app_country] => US
[patent_app_date] => 2004-04-27
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/276/07276922.pdf
[firstpage_image] =>[orig_patent_app_number] => 10832700
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/832700 | Closed-grid bus architecture for wafer interconnect structure | Apr 26, 2004 | Issued |
Array
(
[id] => 432754
[patent_doc_number] => 07265531
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-04
[patent_title] => 'Integrated current sensor'
[patent_app_type] => utility
[patent_app_number] => 10/831906
[patent_app_country] => US
[patent_app_date] => 2004-04-26
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/265/07265531.pdf
[firstpage_image] =>[orig_patent_app_number] => 10831906
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/831906 | Integrated current sensor | Apr 25, 2004 | Issued |
Array
(
[id] => 549027
[patent_doc_number] => 07167013
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-01-23
[patent_title] => 'Suction cap for IC sockets and IC socket assembly using same'
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[patent_app_number] => 10/831006
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[patent_app_date] => 2004-04-23
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[pdf_file] => patents/07/167/07167013.pdf
[firstpage_image] =>[orig_patent_app_number] => 10831006
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/831006 | Suction cap for IC sockets and IC socket assembly using same | Apr 22, 2004 | Issued |
Array
(
[id] => 6964256
[patent_doc_number] => 20050231153
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-20
[patent_title] => 'High voltage isolation detection of a fuel cell system using magnetic field cancellation'
[patent_app_type] => utility
[patent_app_number] => 10/828420
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[patent_app_date] => 2004-04-20
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[pdf_file] => publications/A1/0231/20050231153.pdf
[firstpage_image] =>[orig_patent_app_number] => 10828420
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/828420 | High voltage isolation detection of a fuel cell system using magnetic field cancellation | Apr 19, 2004 | Abandoned |
Array
(
[id] => 422265
[patent_doc_number] => 07274199
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-25
[patent_title] => 'Method and arrangement of testing device in mobile station'
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/274/07274199.pdf
[firstpage_image] =>[orig_patent_app_number] => 10552403
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/552403 | Method and arrangement of testing device in mobile station | Apr 6, 2004 | Issued |