
Ernest F Karlsen
Examiner (ID: 15736)
| Most Active Art Unit | 2607 |
| Art Unit(s) | 2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858 |
| Total Applications | 2295 |
| Issued Applications | 1990 |
| Pending Applications | 49 |
| Abandoned Applications | 256 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7175793
[patent_doc_number] => 20040201389
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-10-14
[patent_title] => 'Needle assembly of probe card'
[patent_app_type] => new
[patent_app_number] => 10/742122
[patent_app_country] => US
[patent_app_date] => 2003-12-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2831
[patent_no_of_claims] => 5
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[patent_words_short_claim] => 39
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0201/20040201389.pdf
[firstpage_image] =>[orig_patent_app_number] => 10742122
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/742122 | Needle assembly of probe card | Dec 18, 2003 | Issued |
Array
(
[id] => 450181
[patent_doc_number] => 07250780
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-07-31
[patent_title] => 'Probe card for semiconductor wafers having mounting plate and socket'
[patent_app_type] => utility
[patent_app_number] => 10/742729
[patent_app_country] => US
[patent_app_date] => 2003-12-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 8980
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[pdf_file] => patents/07/250/07250780.pdf
[firstpage_image] =>[orig_patent_app_number] => 10742729
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/742729 | Probe card for semiconductor wafers having mounting plate and socket | Dec 18, 2003 | Issued |
Array
(
[id] => 721732
[patent_doc_number] => 07049842
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-05-23
[patent_title] => 'Simultaneous pin short and continuity test on IC packages'
[patent_app_type] => utility
[patent_app_number] => 10/739678
[patent_app_country] => US
[patent_app_date] => 2003-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 1451
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[pdf_file] => patents/07/049/07049842.pdf
[firstpage_image] =>[orig_patent_app_number] => 10739678
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/739678 | Simultaneous pin short and continuity test on IC packages | Dec 17, 2003 | Issued |
Array
(
[id] => 7077311
[patent_doc_number] => 20050149777
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-07
[patent_title] => 'Characterizing circuit performance by separating device and interconnect impact on signal delay'
[patent_app_type] => utility
[patent_app_number] => 10/742300
[patent_app_country] => US
[patent_app_date] => 2003-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 6355
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
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[pdf_file] => publications/A1/0149/20050149777.pdf
[firstpage_image] =>[orig_patent_app_number] => 10742300
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/742300 | Characterizing circuit performance by separating device and interconnect impact on signal delay | Dec 17, 2003 | Issued |
Array
(
[id] => 514220
[patent_doc_number] => 07196534
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-03-27
[patent_title] => 'Semiconductor test instrument'
[patent_app_type] => utility
[patent_app_number] => 10/538901
[patent_app_country] => US
[patent_app_date] => 2003-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => patents/07/196/07196534.pdf
[firstpage_image] =>[orig_patent_app_number] => 10538901
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/538901 | Semiconductor test instrument | Dec 17, 2003 | Issued |
Array
(
[id] => 7238291
[patent_doc_number] => 20040257106
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-12-23
[patent_title] => 'Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same'
[patent_app_type] => new
[patent_app_number] => 10/738691
[patent_app_country] => US
[patent_app_date] => 2003-12-17
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[patent_drawing_sheets_cnt] => 8
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[pdf_file] => publications/A1/0257/20040257106.pdf
[firstpage_image] =>[orig_patent_app_number] => 10738691
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/738691 | Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same | Dec 16, 2003 | Issued |
Array
(
[id] => 6994479
[patent_doc_number] => 20050134255
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-23
[patent_title] => 'Coaxial cable unit, test apparatus, and CPU system'
[patent_app_type] => utility
[patent_app_number] => 10/738617
[patent_app_country] => US
[patent_app_date] => 2003-12-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => publications/A1/0134/20050134255.pdf
[firstpage_image] =>[orig_patent_app_number] => 10738617
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/738617 | Coaxial cable unit, test apparatus, and CPU system | Dec 16, 2003 | Issued |
Array
(
[id] => 1060504
[patent_doc_number] => 06853206
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-02-08
[patent_title] => 'Method and probe card configuration for testing a plurality of integrated circuits in parallel'
[patent_app_type] => utility
[patent_app_number] => 10/736356
[patent_app_country] => US
[patent_app_date] => 2003-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 3691
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[pdf_file] => patents/06/853/06853206.pdf
[firstpage_image] =>[orig_patent_app_number] => 10736356
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/736356 | Method and probe card configuration for testing a plurality of integrated circuits in parallel | Dec 14, 2003 | Issued |
Array
(
[id] => 7610824
[patent_doc_number] => 06842033
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-01-11
[patent_title] => 'Method for controlling delay time of signal in semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 10/731608
[patent_app_country] => US
[patent_app_date] => 2003-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[pdf_file] => patents/06/842/06842033.pdf
[firstpage_image] =>[orig_patent_app_number] => 10731608
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/731608 | Method for controlling delay time of signal in semiconductor device | Dec 8, 2003 | Issued |
Array
(
[id] => 1035405
[patent_doc_number] => 06876212
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-04-05
[patent_title] => 'Methods and structures for electronic probing arrays'
[patent_app_type] => utility
[patent_app_number] => 10/728308
[patent_app_country] => US
[patent_app_date] => 2003-12-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 8986
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/876/06876212.pdf
[firstpage_image] =>[orig_patent_app_number] => 10728308
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/728308 | Methods and structures for electronic probing arrays | Dec 3, 2003 | Issued |
Array
(
[id] => 7329748
[patent_doc_number] => 20040130341
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-08
[patent_title] => 'Method and apparatus for measuring three-dimensional distribution of electric field'
[patent_app_type] => new
[patent_app_number] => 10/721408
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[firstpage_image] =>[orig_patent_app_number] => 10721408
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/721408 | Method and apparatus for measuring three-dimensional distribution of electric field | Nov 25, 2003 | Issued |
Array
(
[id] => 7283992
[patent_doc_number] => 20040145383
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[patent_title] => 'Apparatus and method for contacting of test objects'
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[firstpage_image] =>[orig_patent_app_number] => 10716102
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/716102 | Apparatus and method for contacting of test objects | Nov 17, 2003 | Issued |
Array
(
[id] => 739635
[patent_doc_number] => 07034556
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-04-25
[patent_title] => 'Pulsed thermal monitor'
[patent_app_type] => utility
[patent_app_number] => 10/702001
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[firstpage_image] =>[orig_patent_app_number] => 10702001
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/702001 | Pulsed thermal monitor | Nov 4, 2003 | Issued |
Array
(
[id] => 7191243
[patent_doc_number] => 20040085060
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[patent_title] => 'Method and apparatus for testing BGA-type semiconductor devices'
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[firstpage_image] =>[orig_patent_app_number] => 10689983
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/689983 | Method and apparatus for testing BGA-type semiconductor devices | Oct 21, 2003 | Issued |
Array
(
[id] => 7203456
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[patent_issue_date] => 2004-05-06
[patent_title] => 'Method for testing chips on flat solder bumps'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/688418 | Method for testing chips on flat solder bumps | Oct 16, 2003 | Abandoned |
Array
(
[id] => 7191672
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[patent_title] => 'Selection of IC Vdd for improved voltage regulation of transciever/transponder modules'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/684317 | Selection of IC Vdd for improved voltage regulation of transciever/transponder modules | Oct 12, 2003 | Issued |
Array
(
[id] => 7160803
[patent_doc_number] => 20040075457
[patent_country] => US
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[patent_issue_date] => 2004-04-22
[patent_title] => 'Test pin unit for PCB test device and feeding device of the same'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/685078 | Test pin unit for PCB test device and feeding device of the same | Oct 12, 2003 | Abandoned |
Array
(
[id] => 7222196
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[patent_title] => 'Multiplexed dual-purpose magnetoresistive sensor and method of measuring current and temperature'
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Array
(
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[patent_title] => 'E-beam voltage potential circuit performance library'
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[firstpage_image] =>[orig_patent_app_number] => 10681544
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/681544 | E-beam voltage potential circuit performance library | Oct 7, 2003 | Issued |
Array
(
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[pdf_file] => publications/A1/0140/20040140821.pdf
[firstpage_image] =>[orig_patent_app_number] => 10680336
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/680336 | Test PCB and contactor for testing of electronic device | Oct 6, 2003 | Abandoned |