Search

Ernest F Karlsen

Examiner (ID: 15736)

Most Active Art Unit
2607
Art Unit(s)
2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858
Total Applications
2295
Issued Applications
1990
Pending Applications
49
Abandoned Applications
256

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7175793 [patent_doc_number] => 20040201389 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-14 [patent_title] => 'Needle assembly of probe card' [patent_app_type] => new [patent_app_number] => 10/742122 [patent_app_country] => US [patent_app_date] => 2003-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2831 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20040201389.pdf [firstpage_image] =>[orig_patent_app_number] => 10742122 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/742122
Needle assembly of probe card Dec 18, 2003 Issued
Array ( [id] => 450181 [patent_doc_number] => 07250780 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-31 [patent_title] => 'Probe card for semiconductor wafers having mounting plate and socket' [patent_app_type] => utility [patent_app_number] => 10/742729 [patent_app_country] => US [patent_app_date] => 2003-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 26 [patent_no_of_words] => 8980 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/250/07250780.pdf [firstpage_image] =>[orig_patent_app_number] => 10742729 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/742729
Probe card for semiconductor wafers having mounting plate and socket Dec 18, 2003 Issued
Array ( [id] => 721732 [patent_doc_number] => 07049842 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-23 [patent_title] => 'Simultaneous pin short and continuity test on IC packages' [patent_app_type] => utility [patent_app_number] => 10/739678 [patent_app_country] => US [patent_app_date] => 2003-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 1451 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/049/07049842.pdf [firstpage_image] =>[orig_patent_app_number] => 10739678 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/739678
Simultaneous pin short and continuity test on IC packages Dec 17, 2003 Issued
Array ( [id] => 7077311 [patent_doc_number] => 20050149777 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-07 [patent_title] => 'Characterizing circuit performance by separating device and interconnect impact on signal delay' [patent_app_type] => utility [patent_app_number] => 10/742300 [patent_app_country] => US [patent_app_date] => 2003-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6355 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0149/20050149777.pdf [firstpage_image] =>[orig_patent_app_number] => 10742300 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/742300
Characterizing circuit performance by separating device and interconnect impact on signal delay Dec 17, 2003 Issued
Array ( [id] => 514220 [patent_doc_number] => 07196534 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-27 [patent_title] => 'Semiconductor test instrument' [patent_app_type] => utility [patent_app_number] => 10/538901 [patent_app_country] => US [patent_app_date] => 2003-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 12318 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/196/07196534.pdf [firstpage_image] =>[orig_patent_app_number] => 10538901 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/538901
Semiconductor test instrument Dec 17, 2003 Issued
Array ( [id] => 7238291 [patent_doc_number] => 20040257106 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-23 [patent_title] => 'Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same' [patent_app_type] => new [patent_app_number] => 10/738691 [patent_app_country] => US [patent_app_date] => 2003-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5561 [patent_no_of_claims] => 53 [patent_no_of_ind_claims] => 26 [patent_words_short_claim] => 42 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0257/20040257106.pdf [firstpage_image] =>[orig_patent_app_number] => 10738691 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/738691
Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same Dec 16, 2003 Issued
Array ( [id] => 6994479 [patent_doc_number] => 20050134255 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-23 [patent_title] => 'Coaxial cable unit, test apparatus, and CPU system' [patent_app_type] => utility [patent_app_number] => 10/738617 [patent_app_country] => US [patent_app_date] => 2003-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4243 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0134/20050134255.pdf [firstpage_image] =>[orig_patent_app_number] => 10738617 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/738617
Coaxial cable unit, test apparatus, and CPU system Dec 16, 2003 Issued
Array ( [id] => 1060504 [patent_doc_number] => 06853206 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-02-08 [patent_title] => 'Method and probe card configuration for testing a plurality of integrated circuits in parallel' [patent_app_type] => utility [patent_app_number] => 10/736356 [patent_app_country] => US [patent_app_date] => 2003-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 3691 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/853/06853206.pdf [firstpage_image] =>[orig_patent_app_number] => 10736356 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/736356
Method and probe card configuration for testing a plurality of integrated circuits in parallel Dec 14, 2003 Issued
Array ( [id] => 7610824 [patent_doc_number] => 06842033 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-01-11 [patent_title] => 'Method for controlling delay time of signal in semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/731608 [patent_app_country] => US [patent_app_date] => 2003-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 5468 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/842/06842033.pdf [firstpage_image] =>[orig_patent_app_number] => 10731608 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/731608
Method for controlling delay time of signal in semiconductor device Dec 8, 2003 Issued
Array ( [id] => 1035405 [patent_doc_number] => 06876212 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-04-05 [patent_title] => 'Methods and structures for electronic probing arrays' [patent_app_type] => utility [patent_app_number] => 10/728308 [patent_app_country] => US [patent_app_date] => 2003-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 22 [patent_no_of_words] => 8986 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/876/06876212.pdf [firstpage_image] =>[orig_patent_app_number] => 10728308 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/728308
Methods and structures for electronic probing arrays Dec 3, 2003 Issued
Array ( [id] => 7329748 [patent_doc_number] => 20040130341 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-07-08 [patent_title] => 'Method and apparatus for measuring three-dimensional distribution of electric field' [patent_app_type] => new [patent_app_number] => 10/721408 [patent_app_country] => US [patent_app_date] => 2003-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4269 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0130/20040130341.pdf [firstpage_image] =>[orig_patent_app_number] => 10721408 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/721408
Method and apparatus for measuring three-dimensional distribution of electric field Nov 25, 2003 Issued
Array ( [id] => 7283992 [patent_doc_number] => 20040145383 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-07-29 [patent_title] => 'Apparatus and method for contacting of test objects' [patent_app_type] => new [patent_app_number] => 10/716102 [patent_app_country] => US [patent_app_date] => 2003-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 9961 [patent_no_of_claims] => 52 [patent_no_of_ind_claims] => 21 [patent_words_short_claim] => 19 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0145/20040145383.pdf [firstpage_image] =>[orig_patent_app_number] => 10716102 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/716102
Apparatus and method for contacting of test objects Nov 17, 2003 Issued
Array ( [id] => 739635 [patent_doc_number] => 07034556 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-04-25 [patent_title] => 'Pulsed thermal monitor' [patent_app_type] => utility [patent_app_number] => 10/702001 [patent_app_country] => US [patent_app_date] => 2003-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5070 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 241 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/034/07034556.pdf [firstpage_image] =>[orig_patent_app_number] => 10702001 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/702001
Pulsed thermal monitor Nov 4, 2003 Issued
Array ( [id] => 7191243 [patent_doc_number] => 20040085060 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-05-06 [patent_title] => 'Method and apparatus for testing BGA-type semiconductor devices' [patent_app_type] => new [patent_app_number] => 10/689983 [patent_app_country] => US [patent_app_date] => 2003-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5175 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20040085060.pdf [firstpage_image] =>[orig_patent_app_number] => 10689983 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/689983
Method and apparatus for testing BGA-type semiconductor devices Oct 21, 2003 Issued
Array ( [id] => 7203456 [patent_doc_number] => 20040087046 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-05-06 [patent_title] => 'Method for testing chips on flat solder bumps' [patent_app_type] => new [patent_app_number] => 10/688418 [patent_app_country] => US [patent_app_date] => 2003-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3118 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0087/20040087046.pdf [firstpage_image] =>[orig_patent_app_number] => 10688418 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/688418
Method for testing chips on flat solder bumps Oct 16, 2003 Abandoned
Array ( [id] => 7191672 [patent_doc_number] => 20040085155 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-05-06 [patent_title] => 'Selection of IC Vdd for improved voltage regulation of transciever/transponder modules' [patent_app_type] => new [patent_app_number] => 10/684317 [patent_app_country] => US [patent_app_date] => 2003-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2452 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20040085155.pdf [firstpage_image] =>[orig_patent_app_number] => 10684317 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/684317
Selection of IC Vdd for improved voltage regulation of transciever/transponder modules Oct 12, 2003 Issued
Array ( [id] => 7160803 [patent_doc_number] => 20040075457 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-22 [patent_title] => 'Test pin unit for PCB test device and feeding device of the same' [patent_app_type] => new [patent_app_number] => 10/685078 [patent_app_country] => US [patent_app_date] => 2003-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4539 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0075/20040075457.pdf [firstpage_image] =>[orig_patent_app_number] => 10685078 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/685078
Test pin unit for PCB test device and feeding device of the same Oct 12, 2003 Abandoned
Array ( [id] => 7222196 [patent_doc_number] => 20050077890 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-14 [patent_title] => 'Multiplexed dual-purpose magnetoresistive sensor and method of measuring current and temperature' [patent_app_type] => utility [patent_app_number] => 10/682344 [patent_app_country] => US [patent_app_date] => 2003-10-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5730 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0077/20050077890.pdf [firstpage_image] =>[orig_patent_app_number] => 10682344 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/682344
Multiplexed dual-purpose magnetoresistive sensor and method of measuring current and temperature Oct 8, 2003 Issued
Array ( [id] => 961393 [patent_doc_number] => 06952106 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-10-04 [patent_title] => 'E-beam voltage potential circuit performance library' [patent_app_type] => utility [patent_app_number] => 10/681544 [patent_app_country] => US [patent_app_date] => 2003-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 1045 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/952/06952106.pdf [firstpage_image] =>[orig_patent_app_number] => 10681544 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/681544
E-beam voltage potential circuit performance library Oct 7, 2003 Issued
Array ( [id] => 7305445 [patent_doc_number] => 20040140821 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-07-22 [patent_title] => 'Test PCB and contactor for testing of electronic device' [patent_app_type] => new [patent_app_number] => 10/680336 [patent_app_country] => US [patent_app_date] => 2003-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5245 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20040140821.pdf [firstpage_image] =>[orig_patent_app_number] => 10680336 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/680336
Test PCB and contactor for testing of electronic device Oct 6, 2003 Abandoned
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