
Ernest F Karlsen
Examiner (ID: 15736)
| Most Active Art Unit | 2607 |
| Art Unit(s) | 2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858 |
| Total Applications | 2295 |
| Issued Applications | 1990 |
| Pending Applications | 49 |
| Abandoned Applications | 256 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 696548
[patent_doc_number] => 07071679
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-07-04
[patent_title] => 'Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces'
[patent_app_type] => utility
[patent_app_number] => 10/444910
[patent_app_country] => US
[patent_app_date] => 2003-05-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 10
[patent_no_of_words] => 6371
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[patent_words_short_claim] => 169
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/071/07071679.pdf
[firstpage_image] =>[orig_patent_app_number] => 10444910
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/444910 | Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces | May 22, 2003 | Issued |
Array
(
[id] => 976320
[patent_doc_number] => 06933739
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-08-23
[patent_title] => 'Ring oscillator system'
[patent_app_type] => utility
[patent_app_number] => 10/444901
[patent_app_country] => US
[patent_app_date] => 2003-05-23
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/933/06933739.pdf
[firstpage_image] =>[orig_patent_app_number] => 10444901
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/444901 | Ring oscillator system | May 22, 2003 | Issued |
Array
(
[id] => 1117228
[patent_doc_number] => 06801047
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-10-05
[patent_title] => 'Wafer probe station having environment control enclosure'
[patent_app_type] => B2
[patent_app_number] => 10/441646
[patent_app_country] => US
[patent_app_date] => 2003-05-19
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[patent_drawing_sheets_cnt] => 7
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[pdf_file] => patents/06/801/06801047.pdf
[firstpage_image] =>[orig_patent_app_number] => 10441646
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/441646 | Wafer probe station having environment control enclosure | May 18, 2003 | Issued |
Array
(
[id] => 6723718
[patent_doc_number] => 20030206030
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-11-06
[patent_title] => 'Universal wafer carrier for wafer level die burn-in'
[patent_app_type] => new
[patent_app_number] => 10/420249
[patent_app_country] => US
[patent_app_date] => 2003-04-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[firstpage_image] =>[orig_patent_app_number] => 10420249
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/420249 | Universal wafer carrier for wafer level die burn-in | Apr 20, 2003 | Issued |
Array
(
[id] => 7414341
[patent_doc_number] => 20040207426
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[patent_kind] => A1
[patent_issue_date] => 2004-10-21
[patent_title] => 'Active prematching tuner system'
[patent_app_type] => new
[patent_app_number] => 10/418633
[patent_app_country] => US
[patent_app_date] => 2003-04-21
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0207/20040207426.pdf
[firstpage_image] =>[orig_patent_app_number] => 10418633
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/418633 | Active prematching tuner system | Apr 20, 2003 | Abandoned |
Array
(
[id] => 6709312
[patent_doc_number] => 20030169061
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-09-11
[patent_title] => 'Closed-grid bus architecture for wafer interconnect structure'
[patent_app_type] => new
[patent_app_number] => 10/406669
[patent_app_country] => US
[patent_app_date] => 2003-04-02
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[firstpage_image] =>[orig_patent_app_number] => 10406669
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/406669 | Closed-grid bus architecture for wafer interconnect structure | Apr 1, 2003 | Issued |
Array
(
[id] => 7334890
[patent_doc_number] => 20040189279
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[patent_issue_date] => 2004-09-30
[patent_title] => 'Online detection of shorted turns in a generator field winding'
[patent_app_type] => new
[patent_app_number] => 10/401600
[patent_app_country] => US
[patent_app_date] => 2003-03-31
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[pdf_file] => publications/A1/0189/20040189279.pdf
[firstpage_image] =>[orig_patent_app_number] => 10401600
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/401600 | Online detection of shorted turns in a generator field winding | Mar 30, 2003 | Issued |
Array
(
[id] => 509003
[patent_doc_number] => 07202684
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-04-10
[patent_title] => 'Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments'
[patent_app_type] => utility
[patent_app_number] => 10/389632
[patent_app_country] => US
[patent_app_date] => 2003-03-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
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[pdf_file] => patents/07/202/07202684.pdf
[firstpage_image] =>[orig_patent_app_number] => 10389632
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/389632 | Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments | Mar 12, 2003 | Issued |
Array
(
[id] => 6738559
[patent_doc_number] => 20030155927
[patent_country] => US
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[patent_issue_date] => 2003-08-21
[patent_title] => 'Multiple directional scans of test structures on srmiconductor integrated circuits'
[patent_app_type] => new
[patent_app_number] => 10/390502
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[firstpage_image] =>[orig_patent_app_number] => 10390502
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/390502 | Multiple directional scans of test structures on semiconductor integrated circuits | Mar 12, 2003 | Issued |
Array
(
[id] => 7377139
[patent_doc_number] => 20040178812
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-09-16
[patent_title] => 'Structures for testing circuits and methods for fabricating the structures'
[patent_app_type] => new
[patent_app_number] => 10/386875
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[patent_app_date] => 2003-03-12
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[pdf_file] => publications/A1/0178/20040178812.pdf
[firstpage_image] =>[orig_patent_app_number] => 10386875
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/386875 | Connecting a probe card and an interposer using a compliant connector | Mar 11, 2003 | Issued |
Array
(
[id] => 6709311
[patent_doc_number] => 20030169060
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[patent_issue_date] => 2003-09-11
[patent_title] => 'Method and apparatus for inspecting integrated circuit pattern'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/379555 | Method and apparatus for inspecting integrated circuit pattern | Mar 5, 2003 | Issued |
Array
(
[id] => 6981499
[patent_doc_number] => 20050151567
[patent_country] => US
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[patent_issue_date] => 2005-07-14
[patent_title] => 'Ac signal level detection circuit'
[patent_app_type] => utility
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[firstpage_image] =>[orig_patent_app_number] => 10506641
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/506641 | AC signal level detection circuit | Mar 5, 2003 | Issued |
Array
(
[id] => 7675910
[patent_doc_number] => 20040153917
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[patent_title] => 'Method for detecting defectives in an integrated circuit'
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[firstpage_image] =>[orig_patent_app_number] => 10383190
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/383190 | Method for detecting defectives in an integrated circuit | Mar 4, 2003 | Abandoned |
Array
(
[id] => 949162
[patent_doc_number] => 06963198
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[patent_issue_date] => 2005-11-08
[patent_title] => 'Signal detection contactor and signal correcting system'
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[firstpage_image] =>[orig_patent_app_number] => 10485259
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/485259 | Signal detection contactor and signal correcting system | Mar 4, 2003 | Issued |
Array
(
[id] => 531862
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Array
(
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[patent_title] => 'Spray cooling and transparent cooling plate thermal management system'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/379925 | Spray cooling and transparent cooling plate thermal management system | Mar 3, 2003 | Issued |
Array
(
[id] => 6789051
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Array
(
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Array
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Array
(
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[pdf_file] => publications/A1/0122/20030122565.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/366922 | Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer | Feb 12, 2003 | Issued |