Search

Ernest F Karlsen

Examiner (ID: 15736)

Most Active Art Unit
2607
Art Unit(s)
2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858
Total Applications
2295
Issued Applications
1990
Pending Applications
49
Abandoned Applications
256

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 696548 [patent_doc_number] => 07071679 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-07-04 [patent_title] => 'Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces' [patent_app_type] => utility [patent_app_number] => 10/444910 [patent_app_country] => US [patent_app_date] => 2003-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 6371 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/071/07071679.pdf [firstpage_image] =>[orig_patent_app_number] => 10444910 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/444910
Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces May 22, 2003 Issued
Array ( [id] => 976320 [patent_doc_number] => 06933739 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-08-23 [patent_title] => 'Ring oscillator system' [patent_app_type] => utility [patent_app_number] => 10/444901 [patent_app_country] => US [patent_app_date] => 2003-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 3260 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 49 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/933/06933739.pdf [firstpage_image] =>[orig_patent_app_number] => 10444901 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/444901
Ring oscillator system May 22, 2003 Issued
Array ( [id] => 1117228 [patent_doc_number] => 06801047 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-10-05 [patent_title] => 'Wafer probe station having environment control enclosure' [patent_app_type] => B2 [patent_app_number] => 10/441646 [patent_app_country] => US [patent_app_date] => 2003-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 4179 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/801/06801047.pdf [firstpage_image] =>[orig_patent_app_number] => 10441646 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/441646
Wafer probe station having environment control enclosure May 18, 2003 Issued
Array ( [id] => 6723718 [patent_doc_number] => 20030206030 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-11-06 [patent_title] => 'Universal wafer carrier for wafer level die burn-in' [patent_app_type] => new [patent_app_number] => 10/420249 [patent_app_country] => US [patent_app_date] => 2003-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3750 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0206/20030206030.pdf [firstpage_image] =>[orig_patent_app_number] => 10420249 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/420249
Universal wafer carrier for wafer level die burn-in Apr 20, 2003 Issued
Array ( [id] => 7414341 [patent_doc_number] => 20040207426 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-21 [patent_title] => 'Active prematching tuner system' [patent_app_type] => new [patent_app_number] => 10/418633 [patent_app_country] => US [patent_app_date] => 2003-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 4358 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20040207426.pdf [firstpage_image] =>[orig_patent_app_number] => 10418633 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/418633
Active prematching tuner system Apr 20, 2003 Abandoned
Array ( [id] => 6709312 [patent_doc_number] => 20030169061 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-11 [patent_title] => 'Closed-grid bus architecture for wafer interconnect structure' [patent_app_type] => new [patent_app_number] => 10/406669 [patent_app_country] => US [patent_app_date] => 2003-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7303 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20030169061.pdf [firstpage_image] =>[orig_patent_app_number] => 10406669 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/406669
Closed-grid bus architecture for wafer interconnect structure Apr 1, 2003 Issued
Array ( [id] => 7334890 [patent_doc_number] => 20040189279 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-30 [patent_title] => 'Online detection of shorted turns in a generator field winding' [patent_app_type] => new [patent_app_number] => 10/401600 [patent_app_country] => US [patent_app_date] => 2003-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4135 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0189/20040189279.pdf [firstpage_image] =>[orig_patent_app_number] => 10401600 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/401600
Online detection of shorted turns in a generator field winding Mar 30, 2003 Issued
Array ( [id] => 509003 [patent_doc_number] => 07202684 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-04-10 [patent_title] => 'Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments' [patent_app_type] => utility [patent_app_number] => 10/389632 [patent_app_country] => US [patent_app_date] => 2003-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 21 [patent_no_of_words] => 10291 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/202/07202684.pdf [firstpage_image] =>[orig_patent_app_number] => 10389632 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/389632
Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments Mar 12, 2003 Issued
Array ( [id] => 6738559 [patent_doc_number] => 20030155927 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-08-21 [patent_title] => 'Multiple directional scans of test structures on srmiconductor integrated circuits' [patent_app_type] => new [patent_app_number] => 10/390502 [patent_app_country] => US [patent_app_date] => 2003-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 36 [patent_figures_cnt] => 36 [patent_no_of_words] => 23169 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0155/20030155927.pdf [firstpage_image] =>[orig_patent_app_number] => 10390502 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/390502
Multiple directional scans of test structures on semiconductor integrated circuits Mar 12, 2003 Issued
Array ( [id] => 7377139 [patent_doc_number] => 20040178812 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-16 [patent_title] => 'Structures for testing circuits and methods for fabricating the structures' [patent_app_type] => new [patent_app_number] => 10/386875 [patent_app_country] => US [patent_app_date] => 2003-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 14571 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0178/20040178812.pdf [firstpage_image] =>[orig_patent_app_number] => 10386875 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/386875
Connecting a probe card and an interposer using a compliant connector Mar 11, 2003 Issued
Array ( [id] => 6709311 [patent_doc_number] => 20030169060 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-11 [patent_title] => 'Method and apparatus for inspecting integrated circuit pattern' [patent_app_type] => new [patent_app_number] => 10/379555 [patent_app_country] => US [patent_app_date] => 2003-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 22087 [patent_no_of_claims] => 61 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20030169060.pdf [firstpage_image] =>[orig_patent_app_number] => 10379555 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/379555
Method and apparatus for inspecting integrated circuit pattern Mar 5, 2003 Issued
Array ( [id] => 6981499 [patent_doc_number] => 20050151567 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-14 [patent_title] => 'Ac signal level detection circuit' [patent_app_type] => utility [patent_app_number] => 10/506641 [patent_app_country] => US [patent_app_date] => 2003-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7776 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0151/20050151567.pdf [firstpage_image] =>[orig_patent_app_number] => 10506641 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/506641
AC signal level detection circuit Mar 5, 2003 Issued
Array ( [id] => 7675910 [patent_doc_number] => 20040153917 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-05 [patent_title] => 'Method for detecting defectives in an integrated circuit' [patent_app_type] => new [patent_app_number] => 10/383190 [patent_app_country] => US [patent_app_date] => 2003-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1818 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20040153917.pdf [firstpage_image] =>[orig_patent_app_number] => 10383190 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/383190
Method for detecting defectives in an integrated circuit Mar 4, 2003 Abandoned
Array ( [id] => 949162 [patent_doc_number] => 06963198 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-08 [patent_title] => 'Signal detection contactor and signal correcting system' [patent_app_type] => utility [patent_app_number] => 10/485259 [patent_app_country] => US [patent_app_date] => 2003-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 5722 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/963/06963198.pdf [firstpage_image] =>[orig_patent_app_number] => 10485259 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/485259
Signal detection contactor and signal correcting system Mar 4, 2003 Issued
Array ( [id] => 531862 [patent_doc_number] => 07183786 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-27 [patent_title] => 'Modifying a semiconductor device to provide electrical parameter monitoring' [patent_app_type] => utility [patent_app_number] => 10/379178 [patent_app_country] => US [patent_app_date] => 2003-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3499 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/183/07183786.pdf [firstpage_image] =>[orig_patent_app_number] => 10379178 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/379178
Modifying a semiconductor device to provide electrical parameter monitoring Mar 3, 2003 Issued
Array ( [id] => 7310477 [patent_doc_number] => 20040032275 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-02-19 [patent_title] => 'Spray cooling and transparent cooling plate thermal management system' [patent_app_type] => new [patent_app_number] => 10/379925 [patent_app_country] => US [patent_app_date] => 2003-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8065 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0032/20040032275.pdf [firstpage_image] =>[orig_patent_app_number] => 10379925 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/379925
Spray cooling and transparent cooling plate thermal management system Mar 3, 2003 Issued
Array ( [id] => 6789051 [patent_doc_number] => 20030140290 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-24 [patent_title] => 'Synchronous semiconductor device, and inspection system and method for the same' [patent_app_type] => new [patent_app_number] => 10/373869 [patent_app_country] => US [patent_app_date] => 2003-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9959 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20030140290.pdf [firstpage_image] =>[orig_patent_app_number] => 10373869 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/373869
Synchronous semiconductor device, and inspection system and method for the same Feb 26, 2003 Issued
Array ( [id] => 6853234 [patent_doc_number] => 20030126735 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-10 [patent_title] => 'Probe for a wire inserting detection jig' [patent_app_type] => new [patent_app_number] => 10/369806 [patent_app_country] => US [patent_app_date] => 2003-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 20107 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0126/20030126735.pdf [firstpage_image] =>[orig_patent_app_number] => 10369806 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/369806
Probe for a wire inserting detection jig Feb 17, 2003 Issued
Array ( [id] => 6827951 [patent_doc_number] => 20030179009 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-25 [patent_title] => 'Compliant actuator for IC test fixtures' [patent_app_type] => new [patent_app_number] => 10/368100 [patent_app_country] => US [patent_app_date] => 2003-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4578 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20030179009.pdf [firstpage_image] =>[orig_patent_app_number] => 10368100 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/368100
Compliant actuator for IC test fixtures Feb 17, 2003 Issued
Array ( [id] => 6759204 [patent_doc_number] => 20030122565 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-03 [patent_title] => 'Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer' [patent_app_type] => new [patent_app_number] => 10/366922 [patent_app_country] => US [patent_app_date] => 2003-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 12447 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20030122565.pdf [firstpage_image] =>[orig_patent_app_number] => 10366922 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/366922
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Feb 12, 2003 Issued
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