
Ernest F Karlsen
Examiner (ID: 15736)
| Most Active Art Unit | 2607 |
| Art Unit(s) | 2504, 2899, 2829, 2213, 2607, 2604, 2508, 2858 |
| Total Applications | 2295 |
| Issued Applications | 1990 |
| Pending Applications | 49 |
| Abandoned Applications | 256 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 104186
[patent_doc_number] => 07724010
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-05-25
[patent_title] => 'Torsion spring probe contactor design'
[patent_app_type] => utility
[patent_app_number] => 11/983521
[patent_app_country] => US
[patent_app_date] => 2007-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 30
[patent_no_of_words] => 6547
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/724/07724010.pdf
[firstpage_image] =>[orig_patent_app_number] => 11983521
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/983521 | Torsion spring probe contactor design | Nov 8, 2007 | Issued |
Array
(
[id] => 225411
[patent_doc_number] => 07605597
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-20
[patent_title] => 'Intra-chip power and test signal generation for use with test structures on wafers'
[patent_app_type] => utility
[patent_app_number] => 11/935297
[patent_app_country] => US
[patent_app_date] => 2007-11-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 30
[patent_no_of_words] => 24092
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 173
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/605/07605597.pdf
[firstpage_image] =>[orig_patent_app_number] => 11935297
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/935297 | Intra-chip power and test signal generation for use with test structures on wafers | Nov 4, 2007 | Issued |
Array
(
[id] => 4897303
[patent_doc_number] => 20080116916
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-22
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929924
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5005
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0116/20080116916.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929924
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929924 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4891219
[patent_doc_number] => 20080100316
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-01
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929634
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5005
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0100/20080100316.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929634
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929634 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4902155
[patent_doc_number] => 20080111568
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-15
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929676
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5005
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0111/20080111568.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929676
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929676 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4897301
[patent_doc_number] => 20080116914
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-22
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929806
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5004
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0116/20080116914.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929806
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929806 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4897302
[patent_doc_number] => 20080116915
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-22
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929821
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5005
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0116/20080116915.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929821
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929821 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4891227
[patent_doc_number] => 20080100324
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-01
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929736
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5005
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0100/20080100324.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929736
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929736 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4897300
[patent_doc_number] => 20080116913
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-22
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929768
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5005
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0116/20080116913.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929768
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929768 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4902157
[patent_doc_number] => 20080111570
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-15
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929911
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5005
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0111/20080111570.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929911
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929911 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4731669
[patent_doc_number] => 20080048647
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-28
[patent_title] => 'Chuck for holding a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/977050
[patent_app_country] => US
[patent_app_date] => 2007-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 5704
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0048/20080048647.pdf
[firstpage_image] =>[orig_patent_app_number] => 11977050
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/977050 | Chuck for holding a device under test | Oct 22, 2007 | Issued |
Array
(
[id] => 4769227
[patent_doc_number] => 20080054885
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-06
[patent_title] => 'Chuck for holding a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/977130
[patent_app_country] => US
[patent_app_date] => 2007-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 5702
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0054/20080054885.pdf
[firstpage_image] =>[orig_patent_app_number] => 11977130
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/977130 | Chuck for holding a device under test | Oct 22, 2007 | Abandoned |
Array
(
[id] => 4769226
[patent_doc_number] => 20080054884
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-06
[patent_title] => 'Chuck for holding a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/977054
[patent_app_country] => US
[patent_app_date] => 2007-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 5700
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0054/20080054884.pdf
[firstpage_image] =>[orig_patent_app_number] => 11977054
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/977054 | Chuck for holding a device under test | Oct 22, 2007 | Abandoned |
Array
(
[id] => 323124
[patent_doc_number] => 07518358
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-04-14
[patent_title] => 'Chuck for holding a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/977051
[patent_app_country] => US
[patent_app_date] => 2007-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 16
[patent_no_of_words] => 5707
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 169
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/518/07518358.pdf
[firstpage_image] =>[orig_patent_app_number] => 11977051
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/977051 | Chuck for holding a device under test | Oct 22, 2007 | Issued |
Array
(
[id] => 803713
[patent_doc_number] => 07423419
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-09-09
[patent_title] => 'Chuck for holding a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/975929
[patent_app_country] => US
[patent_app_date] => 2007-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 16
[patent_no_of_words] => 5707
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 177
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/423/07423419.pdf
[firstpage_image] =>[orig_patent_app_number] => 11975929
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/975929 | Chuck for holding a device under test | Oct 22, 2007 | Issued |
Array
(
[id] => 4667582
[patent_doc_number] => 20080042642
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-21
[patent_title] => 'Chuck for holding a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/977053
[patent_app_country] => US
[patent_app_date] => 2007-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 5701
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0042/20080042642.pdf
[firstpage_image] =>[orig_patent_app_number] => 11977053
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/977053 | Chuck for holding a device under test | Oct 22, 2007 | Abandoned |
Array
(
[id] => 4731670
[patent_doc_number] => 20080048648
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-28
[patent_title] => 'Chuck for holding a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/977052
[patent_app_country] => US
[patent_app_date] => 2007-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 5704
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0048/20080048648.pdf
[firstpage_image] =>[orig_patent_app_number] => 11977052
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/977052 | Chuck for holding a device under test | Oct 22, 2007 | Issued |
Array
(
[id] => 4884381
[patent_doc_number] => 20080258713
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-10-23
[patent_title] => 'MODULAR INTERFACE'
[patent_app_type] => utility
[patent_app_number] => 11/874603
[patent_app_country] => US
[patent_app_date] => 2007-10-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 33
[patent_figures_cnt] => 33
[patent_no_of_words] => 9603
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0258/20080258713.pdf
[firstpage_image] =>[orig_patent_app_number] => 11874603
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/874603 | Modular interface | Oct 17, 2007 | Issued |
Array
(
[id] => 4667618
[patent_doc_number] => 20080042678
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-21
[patent_title] => 'Wafer probe'
[patent_app_type] => utility
[patent_app_number] => 11/975176
[patent_app_country] => US
[patent_app_date] => 2007-10-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3398
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0042/20080042678.pdf
[firstpage_image] =>[orig_patent_app_number] => 11975176
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/975176 | Wafer probe | Oct 17, 2007 | Issued |
Array
(
[id] => 4667617
[patent_doc_number] => 20080042677
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-21
[patent_title] => 'Wafer probe'
[patent_app_type] => utility
[patent_app_number] => 11/975175
[patent_app_country] => US
[patent_app_date] => 2007-10-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3398
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0042/20080042677.pdf
[firstpage_image] =>[orig_patent_app_number] => 11975175
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/975175 | Wafer probe | Oct 17, 2007 | Issued |