
Georgia Y. Epps
Supervisory Patent Examiner (ID: 9308, Phone: (571)272-2328 , Office: P/2878 )
| Most Active Art Unit | 2501 |
| Art Unit(s) | 2878, 2873, 2899, 2501, 2516 |
| Total Applications | 1297 |
| Issued Applications | 1115 |
| Pending Applications | 55 |
| Abandoned Applications | 127 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 11607906
[patent_doc_number] => 20170125209
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-05-04
[patent_title] => 'CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION / CORRECTION'
[patent_app_type] => utility
[patent_app_number] => 15/243753
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15243753
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/243753 | Charged particle microscope with vibration detection / correction | Aug 21, 2016 | Issued |
Array
(
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[patent_doc_number] => 20170062176
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[patent_issue_date] => 2017-03-02
[patent_title] => 'SAMPLE HOLDER'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 15/243301 | Sample holder | Aug 21, 2016 | Issued |
Array
(
[id] => 11459872
[patent_doc_number] => 20170053778
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[patent_kind] => A1
[patent_issue_date] => 2017-02-23
[patent_title] => 'METHOD OF PREPARING A PLAN-VIEW TRANSMISSION ELECTRON MICROSCOPE SAMPLE USED IN AN INTEGRATED CIRCUIT ANALYSIS'
[patent_app_type] => utility
[patent_app_number] => 15/241284
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[rel_patent_id] =>[rel_patent_doc_number] =>) 15/241284 | Method of preparing a plan-view transmission electron microscope sample used in an integrated circuit analysis | Aug 18, 2016 | Issued |
Array
(
[id] => 11326197
[patent_doc_number] => 20160356809
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-12-08
[patent_title] => 'CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 15/241029 | Chemical nano-identification of a sample using normalized near-field spectroscopy | Aug 17, 2016 | Issued |
Array
(
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[patent_title] => 'Fixing Mechanism Actuatable Without a Tool and Which Fixes a Measuring Probe in a Detachable Manner for a Scanning Probe Microscope'
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Array
(
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[patent_doc_number] => 20170052210
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[patent_issue_date] => 2017-02-23
[patent_title] => 'MEASURING METHOD FOR ATOMIC FORCE MICROSCOPE'
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Array
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[patent_title] => Acquisition and processing of data in a tomographic imaging apparatus
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Array
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[patent_issue_date] => 2018-02-15
[patent_title] => 'Scanning Probe and Electron Microscope Probes and Their Manufacture'
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[patent_app_number] => 15/235889
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Array
(
[id] => 13950493
[patent_doc_number] => 10211025
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[patent_title] => Determining a position of a defect in an electron beam image
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Array
(
[id] => 15656775
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[patent_title] => Library Search Tolerant to Isotopes
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[rel_patent_id] =>[rel_patent_doc_number] =>) 15/750557 | Library search tolerant to isotopes | Aug 8, 2016 | Issued |
Array
(
[id] => 12436137
[patent_doc_number] => 09978561
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[patent_issue_date] => 2018-05-22
[patent_title] => Post column filter with enhanced energy range
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[rel_patent_id] =>[rel_patent_doc_number] =>) 15/230667 | Post column filter with enhanced energy range | Aug 7, 2016 | Issued |
Array
(
[id] => 11495292
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[patent_title] => 'Ion Guide with Orthogonal Sampling'
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Array
(
[id] => 16199835
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Array
(
[id] => 11437390
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Array
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Array
(
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Array
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Array
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