Search

Georgia Y. Epps

Supervisory Patent Examiner (ID: 9308, Phone: (571)272-2328 , Office: P/2878 )

Most Active Art Unit
2501
Art Unit(s)
2878, 2873, 2899, 2501, 2516
Total Applications
1297
Issued Applications
1115
Pending Applications
55
Abandoned Applications
127

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 11607906 [patent_doc_number] => 20170125209 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-05-04 [patent_title] => 'CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION / CORRECTION' [patent_app_type] => utility [patent_app_number] => 15/243753 [patent_app_country] => US [patent_app_date] => 2016-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6752 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15243753 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/243753
Charged particle microscope with vibration detection / correction Aug 21, 2016 Issued
Array ( [id] => 11475393 [patent_doc_number] => 20170062176 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-02 [patent_title] => 'SAMPLE HOLDER' [patent_app_type] => utility [patent_app_number] => 15/243301 [patent_app_country] => US [patent_app_date] => 2016-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8158 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15243301 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/243301
Sample holder Aug 21, 2016 Issued
Array ( [id] => 11459872 [patent_doc_number] => 20170053778 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-02-23 [patent_title] => 'METHOD OF PREPARING A PLAN-VIEW TRANSMISSION ELECTRON MICROSCOPE SAMPLE USED IN AN INTEGRATED CIRCUIT ANALYSIS' [patent_app_type] => utility [patent_app_number] => 15/241284 [patent_app_country] => US [patent_app_date] => 2016-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3022 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15241284 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/241284
Method of preparing a plan-view transmission electron microscope sample used in an integrated circuit analysis Aug 18, 2016 Issued
Array ( [id] => 11326197 [patent_doc_number] => 20160356809 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-12-08 [patent_title] => 'CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY' [patent_app_type] => utility [patent_app_number] => 15/241029 [patent_app_country] => US [patent_app_date] => 2016-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 18161 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15241029 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/241029
Chemical nano-identification of a sample using normalized near-field spectroscopy Aug 17, 2016 Issued
Array ( [id] => 11493750 [patent_doc_number] => 20170067935 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-09 [patent_title] => 'Fixing Mechanism Actuatable Without a Tool and Which Fixes a Measuring Probe in a Detachable Manner for a Scanning Probe Microscope' [patent_app_type] => utility [patent_app_number] => 15/240148 [patent_app_country] => US [patent_app_date] => 2016-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 9932 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15240148 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/240148
Fixing mechanism actuatable without a tool and which fixes a measuring probe in a detachable manner for a scanning probe microscope Aug 17, 2016 Issued
Array ( [id] => 11458303 [patent_doc_number] => 20170052210 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-02-23 [patent_title] => 'MEASURING METHOD FOR ATOMIC FORCE MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 15/238326 [patent_app_country] => US [patent_app_date] => 2016-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5671 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15238326 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/238326
Measuring method for atomic force microscope Aug 15, 2016 Issued
Array ( [id] => 14148093 [patent_doc_number] => 10254419 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-04-09 [patent_title] => Acquisition and processing of data in a tomographic imaging apparatus [patent_app_type] => utility [patent_app_number] => 15/237309 [patent_app_country] => US [patent_app_date] => 2016-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5307 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15237309 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/237309
Acquisition and processing of data in a tomographic imaging apparatus Aug 14, 2016 Issued
Array ( [id] => 12186819 [patent_doc_number] => 20180045755 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-02-15 [patent_title] => 'Scanning Probe and Electron Microscope Probes and Their Manufacture' [patent_app_type] => utility [patent_app_number] => 15/235889 [patent_app_country] => US [patent_app_date] => 2016-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4065 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15235889 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/235889
Scanning probe and electron microscope probes and their manufacture Aug 11, 2016 Issued
Array ( [id] => 13950493 [patent_doc_number] => 10211025 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-02-19 [patent_title] => Determining a position of a defect in an electron beam image [patent_app_type] => utility [patent_app_number] => 15/233971 [patent_app_country] => US [patent_app_date] => 2016-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 12596 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 374 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15233971 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/233971
Determining a position of a defect in an electron beam image Aug 10, 2016 Issued
Array ( [id] => 15656775 [patent_doc_number] => 20200090918 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-03-19 [patent_title] => Library Search Tolerant to Isotopes [patent_app_type] => utility [patent_app_number] => 15/750557 [patent_app_country] => US [patent_app_date] => 2016-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9231 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 250 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15750557 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/750557
Library search tolerant to isotopes Aug 8, 2016 Issued
Array ( [id] => 12436137 [patent_doc_number] => 09978561 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-05-22 [patent_title] => Post column filter with enhanced energy range [patent_app_type] => utility [patent_app_number] => 15/230667 [patent_app_country] => US [patent_app_date] => 2016-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 13 [patent_no_of_words] => 7097 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 295 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15230667 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/230667
Post column filter with enhanced energy range Aug 7, 2016 Issued
Array ( [id] => 11495292 [patent_doc_number] => 20170069477 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-09 [patent_title] => 'Ion Guide with Orthogonal Sampling' [patent_app_type] => utility [patent_app_number] => 15/230980 [patent_app_country] => US [patent_app_date] => 2016-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6991 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15230980 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/230980
Ion guide with orthogonal sampling Aug 7, 2016 Issued
Array ( [id] => 16199835 [patent_doc_number] => 10724990 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-07-28 [patent_title] => Mass spectrometer [patent_app_type] => utility [patent_app_number] => 15/231045 [patent_app_country] => US [patent_app_date] => 2016-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 27 [patent_no_of_words] => 23402 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15231045 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/231045
Mass spectrometer Aug 7, 2016 Issued
Array ( [id] => 11437390 [patent_doc_number] => 20170038410 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-02-09 [patent_title] => 'HARMONIC FEEDBACK ATOMIC FORCE MICROSCOPY' [patent_app_type] => utility [patent_app_number] => 15/229515 [patent_app_country] => US [patent_app_date] => 2016-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 40876 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15229515 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/229515
Harmonic feedback atomic force microscopy Aug 4, 2016 Issued
Array ( [id] => 12181451 [patent_doc_number] => 20180040387 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-02-08 [patent_title] => 'Alpha/Beta Radiation Shielding Materials' [patent_app_type] => utility [patent_app_number] => 15/228448 [patent_app_country] => US [patent_app_date] => 2016-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7832 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15228448 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/228448
Alpha/beta radiation shielding materials Aug 3, 2016 Issued
Array ( [id] => 16020691 [patent_doc_number] => 20200185189 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-06-11 [patent_title] => Charged-Particle Beam Apparatus [patent_app_type] => utility [patent_app_number] => 16/313708 [patent_app_country] => US [patent_app_date] => 2016-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6456 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16313708 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/313708
Charged-particle beam apparatus Jul 27, 2016 Issued
Array ( [id] => 14587583 [patent_doc_number] => 20190221400 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-07-18 [patent_title] => Charged Particle Beam Device [patent_app_type] => utility [patent_app_number] => 16/311492 [patent_app_country] => US [patent_app_date] => 2016-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4536 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16311492 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/311492
Charged particle beam device Jul 27, 2016 Issued
Array ( [id] => 11130522 [patent_doc_number] => 20160327498 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-11-10 [patent_title] => 'MATERIAL EVALUATION DEVICE AND METHOD' [patent_app_type] => utility [patent_app_number] => 15/213913 [patent_app_country] => US [patent_app_date] => 2016-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3207 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15213913 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/213913
MATERIAL EVALUATION DEVICE AND METHOD Jul 18, 2016 Abandoned
Array ( [id] => 12168305 [patent_doc_number] => 09887076 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-02-06 [patent_title] => 'Method and system for controlling convective flow in a light-sustained plasma' [patent_app_type] => utility [patent_app_number] => 15/207136 [patent_app_country] => US [patent_app_date] => 2016-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 8318 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15207136 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/207136
Method and system for controlling convective flow in a light-sustained plasma Jul 10, 2016 Issued
Array ( [id] => 11110755 [patent_doc_number] => 20160307724 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-10-20 [patent_title] => 'ELECTRON EXIT WINDOW FOIL' [patent_app_type] => utility [patent_app_number] => 15/198067 [patent_app_country] => US [patent_app_date] => 2016-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3678 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15198067 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/198067
Electron exit window foil Jun 29, 2016 Issued
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