
Georgia Y. Epps
Supervisory Patent Examiner (ID: 9308, Phone: (571)272-2328 , Office: P/2878 )
| Most Active Art Unit | 2501 |
| Art Unit(s) | 2878, 2873, 2899, 2501, 2516 |
| Total Applications | 1297 |
| Issued Applications | 1115 |
| Pending Applications | 55 |
| Abandoned Applications | 127 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 12498150
[patent_doc_number] => 09997340
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-06-12
[patent_title] => RF-only detection scheme and simultaneous detection of multiple ions
[patent_app_type] => utility
[patent_app_number] => 15/021362
[patent_app_country] => US
[patent_app_date] => 2014-09-12
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15021362
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Array
(
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[patent_doc_number] => 20160217985
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[patent_kind] => A1
[patent_issue_date] => 2016-07-28
[patent_title] => 'TARGETED MASS ANALYSIS'
[patent_app_type] => utility
[patent_app_number] => 15/021108
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Array
(
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[patent_doc_number] => 20160247670
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[patent_issue_date] => 2016-08-25
[patent_title] => 'METHOD FOR ANALYZING IONIC STRUCTURE'
[patent_app_type] => utility
[patent_app_number] => 14/430533
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/430533 | Method for analyzing ionic structure | Sep 4, 2014 | Issued |
Array
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[patent_issue_date] => 2016-07-28
[patent_title] => 'Charged Particle Beam Device and Sample Holder for Charged Particle Beam Device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 15/023429 | Charged particle beam device and sample holder for charged particle beam device | Sep 4, 2014 | Issued |
Array
(
[id] => 10964535
[patent_doc_number] => 20140367565
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[patent_issue_date] => 2014-12-18
[patent_title] => 'Method of Screening a Sample for the Presence of One or More Known Compounds of Interest and a Mass Spectrometer Performing this Method'
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Array
(
[id] => 10709882
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[patent_issue_date] => 2016-02-25
[patent_title] => 'Apparatus and Methods for an Atmospheric Sampling Inlet for a Portable Mass Spectrometer'
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Array
(
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[patent_title] => Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereof
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[patent_app_number] => 14/464325
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Array
(
[id] => 11007015
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[patent_title] => 'ION MODIFICATION'
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Array
(
[id] => 10700360
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/459908 | Ultraviolet irradiation apparatus | Aug 13, 2014 | Issued |
Array
(
[id] => 13653151
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[patent_issue_date] => 2017-12-26
[patent_title] => Mass spectrometer arranged to perform MS/MS/MS
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[patent_app_number] => 14/445224
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Array
(
[id] => 9857714
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[patent_title] => 'DRAWING APPARATUS AND ARTICLE MANUFACTURING METHOD'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/335314 | DRAWING APPARATUS AND ARTICLE MANUFACTURING METHOD | Jul 17, 2014 | Abandoned |
Array
(
[id] => 13893291
[patent_doc_number] => 10199198
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[patent_issue_date] => 2019-02-05
[patent_title] => Electron microscope and method for transmission electron microscopy imaging of sample arrays
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Array
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Array
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Array
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Array
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Array
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