
Getente A. Yimer
Examiner (ID: 2222, Phone: (571)270-7106 , Office: P/2181 )
| Most Active Art Unit | 2181 |
| Art Unit(s) | 2181 |
| Total Applications | 705 |
| Issued Applications | 588 |
| Pending Applications | 63 |
| Abandoned Applications | 74 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 17723396
[patent_doc_number] => 20220216118
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-07-07
[patent_title] => METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY MEASUREMENT
[patent_app_type] => utility
[patent_app_number] => 17/656556
[patent_app_country] => US
[patent_app_date] => 2022-03-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5738
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17656556
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/656556 | Methods and apparatus for test pattern forming and film property measurement | Mar 24, 2022 | Issued |
Array
(
[id] => 18591390
[patent_doc_number] => 11740281
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-08-29
[patent_title] => Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing
[patent_app_type] => utility
[patent_app_number] => 17/703438
[patent_app_country] => US
[patent_app_date] => 2022-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 18
[patent_no_of_words] => 21071
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17703438
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/703438 | Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing | Mar 23, 2022 | Issued |
Array
(
[id] => 18605934
[patent_doc_number] => 11747393
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-09-05
[patent_title] => Integrated circuit device, semiconductor substrate, and test system including the integrated circuit device
[patent_app_type] => utility
[patent_app_number] => 17/703535
[patent_app_country] => US
[patent_app_date] => 2022-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 13
[patent_no_of_words] => 6876
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17703535
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/703535 | Integrated circuit device, semiconductor substrate, and test system including the integrated circuit device | Mar 23, 2022 | Issued |
Array
(
[id] => 18304137
[patent_doc_number] => 11626048
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-04-11
[patent_title] => Electronic panel and electronic apparatus including the same
[patent_app_type] => utility
[patent_app_number] => 17/700056
[patent_app_country] => US
[patent_app_date] => 2022-03-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
[patent_figures_cnt] => 21
[patent_no_of_words] => 19916
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 96
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17700056
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/700056 | Electronic panel and electronic apparatus including the same | Mar 20, 2022 | Issued |
Array
(
[id] => 17884101
[patent_doc_number] => 20220299578
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-09-22
[patent_title] => ARC FAULT DETECTION BASED ON PHOTOVOLTAIC OPERATING CHARACTERISTICS AND EXTRACTION OF PINK NOISE BEHAVIOR
[patent_app_type] => utility
[patent_app_number] => 17/698835
[patent_app_country] => US
[patent_app_date] => 2022-03-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8476
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 196
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17698835
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/698835 | Arc fault detection based on photovoltaic operating characteristics and extraction of pink noise behavior | Mar 17, 2022 | Issued |
Array
(
[id] => 19106856
[patent_doc_number] => 11959948
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-04-16
[patent_title] => High voltage signal and low voltage signal sampling and transmission system based on high voltage MCU
[patent_app_type] => utility
[patent_app_number] => 17/697680
[patent_app_country] => US
[patent_app_date] => 2022-03-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 1881
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 193
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17697680
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/697680 | High voltage signal and low voltage signal sampling and transmission system based on high voltage MCU | Mar 16, 2022 | Issued |
Array
(
[id] => 17738090
[patent_doc_number] => 20220223552
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-07-14
[patent_title] => STORAGE SYSTEM, MEMORY CHIP UNIT, AND WAFER
[patent_app_type] => utility
[patent_app_number] => 17/695654
[patent_app_country] => US
[patent_app_date] => 2022-03-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 20833
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -26
[patent_words_short_claim] => 135
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17695654
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/695654 | Storage system, memory chip unit, and wafer | Mar 14, 2022 | Issued |
Array
(
[id] => 18605947
[patent_doc_number] => 11747407
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-09-05
[patent_title] => System and method for characterizing defects in electronic items using magnetic field detection
[patent_app_type] => utility
[patent_app_number] => 17/654349
[patent_app_country] => US
[patent_app_date] => 2022-03-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 22
[patent_no_of_words] => 12265
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17654349
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/654349 | System and method for characterizing defects in electronic items using magnetic field detection | Mar 9, 2022 | Issued |
Array
(
[id] => 17931160
[patent_doc_number] => 20220326285
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-10-13
[patent_title] => Method and System for Evaluating an Input Voltage of a Power Supply
[patent_app_type] => utility
[patent_app_number] => 17/686608
[patent_app_country] => US
[patent_app_date] => 2022-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7804
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 174
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17686608
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/686608 | Method and system for evaluating an input voltage of a power supply | Mar 3, 2022 | Issued |
Array
(
[id] => 18316071
[patent_doc_number] => 11630146
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-04-18
[patent_title] => Test arrangement for adjusting a setup of testing a device under test, a method of operating the test arrangement, and a non-transitory computer-readable recording medium
[patent_app_type] => utility
[patent_app_number] => 17/683646
[patent_app_country] => US
[patent_app_date] => 2022-03-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5666
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 172
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17683646
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/683646 | Test arrangement for adjusting a setup of testing a device under test, a method of operating the test arrangement, and a non-transitory computer-readable recording medium | Feb 28, 2022 | Issued |
Array
(
[id] => 19259049
[patent_doc_number] => 12019099
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-06-25
[patent_title] => High side current monitor
[patent_app_type] => utility
[patent_app_number] => 17/676885
[patent_app_country] => US
[patent_app_date] => 2022-02-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5041
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17676885
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/676885 | High side current monitor | Feb 21, 2022 | Issued |
Array
(
[id] => 19128483
[patent_doc_number] => 20240133836
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-25
[patent_title] => GRAIN MOISTURE METER NETWORKED TO SMARTPHONES
[patent_app_type] => utility
[patent_app_number] => 18/547166
[patent_app_country] => US
[patent_app_date] => 2022-02-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3148
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18547166
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/547166 | Grain moisture meter networked to smartphones | Feb 21, 2022 | Issued |
Array
(
[id] => 19128483
[patent_doc_number] => 20240133836
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-25
[patent_title] => GRAIN MOISTURE METER NETWORKED TO SMARTPHONES
[patent_app_type] => utility
[patent_app_number] => 18/547166
[patent_app_country] => US
[patent_app_date] => 2022-02-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3148
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18547166
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/547166 | Grain moisture meter networked to smartphones | Feb 21, 2022 | Issued |
Array
(
[id] => 20017287
[patent_doc_number] => 20250155509
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-05-15
[patent_title] => BATTERY STATE ESTIMATION APPARATUS, BATTERY STATE ESTIMATION METHOD, AND STORAGE MEDIUM
[patent_app_type] => utility
[patent_app_number] => 18/838274
[patent_app_country] => US
[patent_app_date] => 2022-02-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5589
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18838274
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/838274 | BATTERY STATE ESTIMATION APPARATUS, BATTERY STATE ESTIMATION METHOD, AND STORAGE MEDIUM | Feb 20, 2022 | Pending |
Array
(
[id] => 18872442
[patent_doc_number] => 11860238
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-01-02
[patent_title] => Circuit, semiconductor device and method for parameter PSRR measurement
[patent_app_type] => utility
[patent_app_number] => 17/673440
[patent_app_country] => US
[patent_app_date] => 2022-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 9
[patent_no_of_words] => 5798
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 179
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17673440
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/673440 | Circuit, semiconductor device and method for parameter PSRR measurement | Feb 15, 2022 | Issued |
Array
(
[id] => 19014212
[patent_doc_number] => 11921137
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-03-05
[patent_title] => Anomaly detection apparatus, method, and program
[patent_app_type] => utility
[patent_app_number] => 17/651306
[patent_app_country] => US
[patent_app_date] => 2022-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 18
[patent_no_of_words] => 6720
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 57
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17651306
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/651306 | Anomaly detection apparatus, method, and program | Feb 15, 2022 | Issued |
Array
(
[id] => 18188612
[patent_doc_number] => 11579188
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-02-14
[patent_title] => Monitoring circuit and semiconductor device
[patent_app_type] => utility
[patent_app_number] => 17/673029
[patent_app_country] => US
[patent_app_date] => 2022-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 13232
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17673029
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/673029 | Monitoring circuit and semiconductor device | Feb 15, 2022 | Issued |
Array
(
[id] => 18492997
[patent_doc_number] => 11698409
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-07-11
[patent_title] => Test method and system for testing connectivity of semiconductor structure
[patent_app_type] => utility
[patent_app_number] => 17/650849
[patent_app_country] => US
[patent_app_date] => 2022-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 6035
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 210
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17650849
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/650849 | Test method and system for testing connectivity of semiconductor structure | Feb 11, 2022 | Issued |
Array
(
[id] => 18428980
[patent_doc_number] => 11674191
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-06-13
[patent_title] => Sensing and control of position of an electrical discharge
[patent_app_type] => utility
[patent_app_number] => 17/588503
[patent_app_country] => US
[patent_app_date] => 2022-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 14
[patent_no_of_words] => 11578
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 384
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17588503
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/588503 | Sensing and control of position of an electrical discharge | Jan 30, 2022 | Issued |
Array
(
[id] => 18217563
[patent_doc_number] => 11592494
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-02-28
[patent_title] => Fuzzer test system for applications in electric power systems
[patent_app_type] => utility
[patent_app_number] => 17/585125
[patent_app_country] => US
[patent_app_date] => 2022-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4061
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17585125
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/585125 | Fuzzer test system for applications in electric power systems | Jan 25, 2022 | Issued |