Search

Getente A. Yimer

Examiner (ID: 2222, Phone: (571)270-7106 , Office: P/2181 )

Most Active Art Unit
2181
Art Unit(s)
2181
Total Applications
705
Issued Applications
588
Pending Applications
63
Abandoned Applications
74

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 17723396 [patent_doc_number] => 20220216118 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-07 [patent_title] => METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY MEASUREMENT [patent_app_type] => utility [patent_app_number] => 17/656556 [patent_app_country] => US [patent_app_date] => 2022-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5738 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17656556 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/656556
Methods and apparatus for test pattern forming and film property measurement Mar 24, 2022 Issued
Array ( [id] => 18591390 [patent_doc_number] => 11740281 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-29 [patent_title] => Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing [patent_app_type] => utility [patent_app_number] => 17/703438 [patent_app_country] => US [patent_app_date] => 2022-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 18 [patent_no_of_words] => 21071 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17703438 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/703438
Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing Mar 23, 2022 Issued
Array ( [id] => 18605934 [patent_doc_number] => 11747393 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-09-05 [patent_title] => Integrated circuit device, semiconductor substrate, and test system including the integrated circuit device [patent_app_type] => utility [patent_app_number] => 17/703535 [patent_app_country] => US [patent_app_date] => 2022-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 6876 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17703535 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/703535
Integrated circuit device, semiconductor substrate, and test system including the integrated circuit device Mar 23, 2022 Issued
Array ( [id] => 18304137 [patent_doc_number] => 11626048 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-11 [patent_title] => Electronic panel and electronic apparatus including the same [patent_app_type] => utility [patent_app_number] => 17/700056 [patent_app_country] => US [patent_app_date] => 2022-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 19916 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17700056 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/700056
Electronic panel and electronic apparatus including the same Mar 20, 2022 Issued
Array ( [id] => 17884101 [patent_doc_number] => 20220299578 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-22 [patent_title] => ARC FAULT DETECTION BASED ON PHOTOVOLTAIC OPERATING CHARACTERISTICS AND EXTRACTION OF PINK NOISE BEHAVIOR [patent_app_type] => utility [patent_app_number] => 17/698835 [patent_app_country] => US [patent_app_date] => 2022-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8476 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17698835 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/698835
Arc fault detection based on photovoltaic operating characteristics and extraction of pink noise behavior Mar 17, 2022 Issued
Array ( [id] => 19106856 [patent_doc_number] => 11959948 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-16 [patent_title] => High voltage signal and low voltage signal sampling and transmission system based on high voltage MCU [patent_app_type] => utility [patent_app_number] => 17/697680 [patent_app_country] => US [patent_app_date] => 2022-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1881 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17697680 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/697680
High voltage signal and low voltage signal sampling and transmission system based on high voltage MCU Mar 16, 2022 Issued
Array ( [id] => 17738090 [patent_doc_number] => 20220223552 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-14 [patent_title] => STORAGE SYSTEM, MEMORY CHIP UNIT, AND WAFER [patent_app_type] => utility [patent_app_number] => 17/695654 [patent_app_country] => US [patent_app_date] => 2022-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20833 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -26 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17695654 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/695654
Storage system, memory chip unit, and wafer Mar 14, 2022 Issued
Array ( [id] => 18605947 [patent_doc_number] => 11747407 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-09-05 [patent_title] => System and method for characterizing defects in electronic items using magnetic field detection [patent_app_type] => utility [patent_app_number] => 17/654349 [patent_app_country] => US [patent_app_date] => 2022-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 12265 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17654349 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/654349
System and method for characterizing defects in electronic items using magnetic field detection Mar 9, 2022 Issued
Array ( [id] => 17931160 [patent_doc_number] => 20220326285 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-13 [patent_title] => Method and System for Evaluating an Input Voltage of a Power Supply [patent_app_type] => utility [patent_app_number] => 17/686608 [patent_app_country] => US [patent_app_date] => 2022-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7804 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17686608 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/686608
Method and system for evaluating an input voltage of a power supply Mar 3, 2022 Issued
Array ( [id] => 18316071 [patent_doc_number] => 11630146 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-04-18 [patent_title] => Test arrangement for adjusting a setup of testing a device under test, a method of operating the test arrangement, and a non-transitory computer-readable recording medium [patent_app_type] => utility [patent_app_number] => 17/683646 [patent_app_country] => US [patent_app_date] => 2022-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5666 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17683646 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/683646
Test arrangement for adjusting a setup of testing a device under test, a method of operating the test arrangement, and a non-transitory computer-readable recording medium Feb 28, 2022 Issued
Array ( [id] => 19259049 [patent_doc_number] => 12019099 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-25 [patent_title] => High side current monitor [patent_app_type] => utility [patent_app_number] => 17/676885 [patent_app_country] => US [patent_app_date] => 2022-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5041 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17676885 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/676885
High side current monitor Feb 21, 2022 Issued
Array ( [id] => 19128483 [patent_doc_number] => 20240133836 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-25 [patent_title] => GRAIN MOISTURE METER NETWORKED TO SMARTPHONES [patent_app_type] => utility [patent_app_number] => 18/547166 [patent_app_country] => US [patent_app_date] => 2022-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3148 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18547166 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/547166
Grain moisture meter networked to smartphones Feb 21, 2022 Issued
Array ( [id] => 19128483 [patent_doc_number] => 20240133836 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-25 [patent_title] => GRAIN MOISTURE METER NETWORKED TO SMARTPHONES [patent_app_type] => utility [patent_app_number] => 18/547166 [patent_app_country] => US [patent_app_date] => 2022-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3148 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18547166 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/547166
Grain moisture meter networked to smartphones Feb 21, 2022 Issued
Array ( [id] => 20017287 [patent_doc_number] => 20250155509 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-15 [patent_title] => BATTERY STATE ESTIMATION APPARATUS, BATTERY STATE ESTIMATION METHOD, AND STORAGE MEDIUM [patent_app_type] => utility [patent_app_number] => 18/838274 [patent_app_country] => US [patent_app_date] => 2022-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5589 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18838274 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/838274
BATTERY STATE ESTIMATION APPARATUS, BATTERY STATE ESTIMATION METHOD, AND STORAGE MEDIUM Feb 20, 2022 Pending
Array ( [id] => 18872442 [patent_doc_number] => 11860238 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-01-02 [patent_title] => Circuit, semiconductor device and method for parameter PSRR measurement [patent_app_type] => utility [patent_app_number] => 17/673440 [patent_app_country] => US [patent_app_date] => 2022-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 5798 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17673440 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/673440
Circuit, semiconductor device and method for parameter PSRR measurement Feb 15, 2022 Issued
Array ( [id] => 19014212 [patent_doc_number] => 11921137 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-05 [patent_title] => Anomaly detection apparatus, method, and program [patent_app_type] => utility [patent_app_number] => 17/651306 [patent_app_country] => US [patent_app_date] => 2022-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 18 [patent_no_of_words] => 6720 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17651306 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/651306
Anomaly detection apparatus, method, and program Feb 15, 2022 Issued
Array ( [id] => 18188612 [patent_doc_number] => 11579188 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-02-14 [patent_title] => Monitoring circuit and semiconductor device [patent_app_type] => utility [patent_app_number] => 17/673029 [patent_app_country] => US [patent_app_date] => 2022-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 13232 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17673029 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/673029
Monitoring circuit and semiconductor device Feb 15, 2022 Issued
Array ( [id] => 18492997 [patent_doc_number] => 11698409 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-11 [patent_title] => Test method and system for testing connectivity of semiconductor structure [patent_app_type] => utility [patent_app_number] => 17/650849 [patent_app_country] => US [patent_app_date] => 2022-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 6035 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 210 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17650849 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/650849
Test method and system for testing connectivity of semiconductor structure Feb 11, 2022 Issued
Array ( [id] => 18428980 [patent_doc_number] => 11674191 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-06-13 [patent_title] => Sensing and control of position of an electrical discharge [patent_app_type] => utility [patent_app_number] => 17/588503 [patent_app_country] => US [patent_app_date] => 2022-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 11578 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 384 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17588503 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/588503
Sensing and control of position of an electrical discharge Jan 30, 2022 Issued
Array ( [id] => 18217563 [patent_doc_number] => 11592494 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-02-28 [patent_title] => Fuzzer test system for applications in electric power systems [patent_app_type] => utility [patent_app_number] => 17/585125 [patent_app_country] => US [patent_app_date] => 2022-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4061 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17585125 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/585125
Fuzzer test system for applications in electric power systems Jan 25, 2022 Issued
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