Getente A. Yimer

Array ( [id] => 19005020 [patent_doc_number] => 20240069091 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-29 [patent_title] => Testing Device For Electronic Devices With In-Band Virtualized Wired Communications [patent_app_type] => utility [patent_app_number] => 18/464752 [patent_app_country] => US [patent_app_date] => 2023-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 18200 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18464752 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18863391 [patent_doc_number] => 20230417827 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => SEMICONDUCTOR INTEGRATED CIRCUIT [patent_app_type] => utility [patent_app_number] => 18/462639 [patent_app_country] => US [patent_app_date] => 2023-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7637 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18462639 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20159348 [patent_doc_number] => 12385969 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Semiconductor device and semiconductor device testing method [patent_app_type] => utility [patent_app_number] => 18/461463 [patent_app_country] => US [patent_app_date] => 2023-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4464 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18461463 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20109466 [patent_doc_number] => 12360178 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-15 [patent_title] => System and method for detecting faults in power transmission systems using oscillography [patent_app_type] => utility [patent_app_number] => 18/241148 [patent_app_country] => US [patent_app_date] => 2023-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7794 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18241148 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18818839 [patent_doc_number] => 20230393179 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-07 [patent_title] => METHOD AND DEVICE FOR MEASURING AN INSULATION RESISTANCE OF A DC VOLTAGE SOURCE CONNECTED TO A SPLIT INTERMEDIATE CIRCUIT IN MAINS PARALLEL OPERATION [patent_app_type] => utility [patent_app_number] => 18/453599 [patent_app_country] => US [patent_app_date] => 2023-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5581 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18453599 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19374910 [patent_doc_number] => 12066471 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-20 [patent_title] => Test system for an intelligent electronic device in an electric sub-station [patent_app_type] => utility [patent_app_number] => 18/236315 [patent_app_country] => US [patent_app_date] => 2023-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 9869 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 298 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18236315 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20174081 [patent_doc_number] => 12392822 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-19 [patent_title] => Voltage glitch detectors [patent_app_type] => utility [patent_app_number] => 18/235156 [patent_app_country] => US [patent_app_date] => 2023-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 0 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18235156 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19021360 [patent_doc_number] => 20240077531 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-07 [patent_title] => SYSTEMS AND METHODS FOR SILICON CRACK DETECTION STRUCTURE [patent_app_type] => utility [patent_app_number] => 18/450714 [patent_app_country] => US [patent_app_date] => 2023-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5122 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -26 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18450714 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19771419 [patent_doc_number] => 20250052845 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-13 [patent_title] => POWER SENSOR ARRANGEMENT FOR ON-WAFER POWER CALIBRATION [patent_app_type] => utility [patent_app_number] => 18/448411 [patent_app_country] => US [patent_app_date] => 2023-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5429 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18448411 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19933066 [patent_doc_number] => 12306269 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-20 [patent_title] => Electrical fault detection and interruption device and related electrical connectors and electrical appliances [patent_app_type] => utility [patent_app_number] => 18/447206 [patent_app_country] => US [patent_app_date] => 2023-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 1205 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18447206 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19773391 [patent_doc_number] => 20250054817 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-13 [patent_title] => TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME [patent_app_type] => utility [patent_app_number] => 18/230918 [patent_app_country] => US [patent_app_date] => 2023-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7250 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18230918 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18787330 [patent_doc_number] => 20230375614 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-23 [patent_title] => TEST CIRCUIT AND METHOD [patent_app_type] => utility [patent_app_number] => 18/363143 [patent_app_country] => US [patent_app_date] => 2023-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10424 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18363143 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19978300 [patent_doc_number] => 12345774 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-01 [patent_title] => Methods and apparatus to detect and diagnose faults in buck regulators [patent_app_type] => utility [patent_app_number] => 18/227149 [patent_app_country] => US [patent_app_date] => 2023-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7730 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18227149 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20563603 [patent_doc_number] => 12566209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-03-03 [patent_title] => Test tray system and related method [patent_app_type] => utility [patent_app_number] => 18/358101 [patent_app_country] => US [patent_app_date] => 2023-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 27 [patent_no_of_words] => 1038 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18358101 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19725238 [patent_doc_number] => 20250027989 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-23 [patent_title] => INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS [patent_app_type] => utility [patent_app_number] => 18/354808 [patent_app_country] => US [patent_app_date] => 2023-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2494 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18354808 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19114096 [patent_doc_number] => 20240125846 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-18 [patent_title] => SEMICONDUCTOR WAFER CONFIGURED FOR SINGLE TOUCH-DOWN TESTING [patent_app_type] => utility [patent_app_number] => 18/221824 [patent_app_country] => US [patent_app_date] => 2023-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8957 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18221824 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20078741 [patent_doc_number] => 12352801 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-08 [patent_title] => Wafer testing for current property of a power transistor [patent_app_type] => utility [patent_app_number] => 18/349780 [patent_app_country] => US [patent_app_date] => 2023-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 1187 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 357 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18349780 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19917110 [patent_doc_number] => 12292474 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-06 [patent_title] => Leakage current detection and interruption device for power cord and related electrical connectors and electrical appliances [patent_app_type] => utility [patent_app_number] => 18/347012 [patent_app_country] => US [patent_app_date] => 2023-07-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3462 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18347012 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19052310 [patent_doc_number] => 20240094279 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/347137 [patent_app_country] => US [patent_app_date] => 2023-07-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5938 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18347137 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19460006 [patent_doc_number] => 12100509 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-09-24 [patent_title] => Remote analyte testing system [patent_app_type] => utility [patent_app_number] => 18/344558 [patent_app_country] => US [patent_app_date] => 2023-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9544 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18344558 [rel_patent_id] =>[rel_patent_doc_number] =>)