Search

Giovanni Astacio-oquendo

Examiner (ID: 5606, Phone: (571)270-5724 , Office: P/2867 )

Most Active Art Unit
2867
Art Unit(s)
2867, 2858
Total Applications
1151
Issued Applications
1005
Pending Applications
77
Abandoned Applications
90

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20180546 [patent_doc_number] => 20250264504 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-08-21 [patent_title] => VOLTAGE MEASUREMENT ASSEMBLY AND SUBSTRATE CHARGING MEASUREMENT METHOD USING THE SAME [patent_app_type] => utility [patent_app_number] => 18/812032 [patent_app_country] => US [patent_app_date] => 2024-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2134 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18812032 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/812032
VOLTAGE MEASUREMENT ASSEMBLY AND SUBSTRATE CHARGING MEASUREMENT METHOD USING THE SAME Aug 21, 2024 Pending
Array ( [id] => 19632570 [patent_doc_number] => 20240411019 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => OBJECT DETECTION CIRCUITRY [patent_app_type] => utility [patent_app_number] => 18/805994 [patent_app_country] => US [patent_app_date] => 2024-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7704 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18805994 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/805994
OBJECT DETECTION CIRCUITRY Aug 14, 2024 Pending
Array ( [id] => 20679586 [patent_doc_number] => 20260118400 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-04-30 [patent_title] => IN-SITU DIAGNOSTICS OF MICROWAVE INTERCONNECTS FOR QUANTUM COMPUTERS [patent_app_type] => utility [patent_app_number] => 18/805523 [patent_app_country] => US [patent_app_date] => 2024-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5455 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18805523 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/805523
IN-SITU DIAGNOSTICS OF MICROWAVE INTERCONNECTS FOR QUANTUM COMPUTERS Aug 13, 2024 Pending
Array ( [id] => 20188098 [patent_doc_number] => 12399208 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-26 [patent_title] => Method and device for insulation monitoring of a water-electrolysis installation [patent_app_type] => utility [patent_app_number] => 18/791601 [patent_app_country] => US [patent_app_date] => 2024-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 887 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 285 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18791601 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/791601
Method and device for insulation monitoring of a water-electrolysis installation Jul 31, 2024 Issued
Array ( [id] => 20379848 [patent_doc_number] => 20250362341 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-11-27 [patent_title] => INSERT INSERTED TO TRAY FOR TRANSPORTING SEMICONDUCTOR PRODUCTS, TRAY INCLUDING THE INSERT, AND SEMICONDUCTOR PRODUCT TEST SYSTEM INCLUDING THE INSERT [patent_app_type] => utility [patent_app_number] => 18/790667 [patent_app_country] => US [patent_app_date] => 2024-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5846 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18790667 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/790667
INSERT INSERTED TO TRAY FOR TRANSPORTING SEMICONDUCTOR PRODUCTS, TRAY INCLUDING THE INSERT, AND SEMICONDUCTOR PRODUCT TEST SYSTEM INCLUDING THE INSERT Jul 30, 2024 Pending
Array ( [id] => 19589264 [patent_doc_number] => 20240386821 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-21 [patent_title] => DISPLAY MOTHER BOARD, DISPLAY PANEL AND DISPLAY APPARATUS [patent_app_type] => utility [patent_app_number] => 18/784866 [patent_app_country] => US [patent_app_date] => 2024-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9903 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18784866 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/784866
Display mother board, display panel and display apparatus Jul 24, 2024 Issued
Array ( [id] => 19755785 [patent_doc_number] => 20250044350 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-06 [patent_title] => METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST DEVICE UNDER TEST, PROBE SYSTEM AND METHOD OF OPERATING THE SAME, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIA, METHOD OF TESTING UNPACKAGED SEMICONDUCTOR DEVICE, TESTED SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME, AND METHOD OF GENERATING VIRTUAL MARK IMAGE [patent_app_type] => utility [patent_app_number] => 18/781351 [patent_app_country] => US [patent_app_date] => 2024-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10568 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 208 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18781351 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/781351
METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST DEVICE UNDER TEST, PROBE SYSTEM AND METHOD OF OPERATING THE SAME, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIA, METHOD OF TESTING UNPACKAGED SEMICONDUCTOR DEVICE, TESTED SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME, AND METHOD OF GENERATING VIRTUAL MARK IMAGE Jul 22, 2024 Pending
Array ( [id] => 19818167 [patent_doc_number] => 20250076374 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-06 [patent_title] => SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 18/776540 [patent_app_country] => US [patent_app_date] => 2024-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7551 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18776540 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/776540
SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS Jul 17, 2024 Pending
Array ( [id] => 19817816 [patent_doc_number] => 20250076023 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-06 [patent_title] => ENCODER WITH LIGHT EMITTING DIODE [patent_app_type] => utility [patent_app_number] => 18/761469 [patent_app_country] => US [patent_app_date] => 2024-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6373 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18761469 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/761469
ENCODER WITH LIGHT EMITTING DIODE Jul 1, 2024 Pending
Array ( [id] => 20139423 [patent_doc_number] => 20250246467 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-31 [patent_title] => MANUFACTURING APPARATUS OF SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/762387 [patent_app_country] => US [patent_app_date] => 2024-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10849 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18762387 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/762387
MANUFACTURING APPARATUS OF SEMICONDUCTOR DEVICE Jul 1, 2024 Pending
Array ( [id] => 19659811 [patent_doc_number] => 20240426876 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-26 [patent_title] => LEAD FRAME FOR SENSOR [patent_app_type] => utility [patent_app_number] => 18/750165 [patent_app_country] => US [patent_app_date] => 2024-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6717 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18750165 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/750165
LEAD FRAME FOR SENSOR Jun 20, 2024 Pending
Array ( [id] => 20427690 [patent_doc_number] => 20250389780 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-12-25 [patent_title] => Distributed Impedance Measurement System [patent_app_type] => utility [patent_app_number] => 18/750347 [patent_app_country] => US [patent_app_date] => 2024-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7603 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18750347 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/750347
Distributed Impedance Measurement System Jun 20, 2024 Pending
Array ( [id] => 20130263 [patent_doc_number] => 12372570 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-29 [patent_title] => Method and electric circuit arrangement for selective insulation monitoring in a power supply system having isolable subsystems [patent_app_type] => utility [patent_app_number] => 18/749527 [patent_app_country] => US [patent_app_date] => 2024-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 0 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18749527 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/749527
Method and electric circuit arrangement for selective insulation monitoring in a power supply system having isolable subsystems Jun 19, 2024 Issued
Array ( [id] => 20796705 [patent_doc_number] => 20260177606 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-06-25 [patent_title] => WAFER-LEVEL BURN-IN TEST FIXTURE, TEST DEVICE, METHOD, AND SYSTEM [patent_app_type] => utility [patent_app_number] => 18/851686 [patent_app_country] => US [patent_app_date] => 2024-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10355 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18851686 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/851686
WAFER-LEVEL BURN-IN TEST FIXTURE, TEST DEVICE, METHOD, AND SYSTEM Jun 17, 2024 Pending
Array ( [id] => 19644022 [patent_doc_number] => 20240418542 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-19 [patent_title] => MAGNETIC SENSOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/743267 [patent_app_country] => US [patent_app_date] => 2024-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6159 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18743267 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/743267
MAGNETIC SENSOR DEVICE Jun 13, 2024 Pending
Array ( [id] => 20772850 [patent_doc_number] => 12656517 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-06-16 [patent_title] => Induction loop for mineral exploration [patent_app_type] => utility [patent_app_number] => 18/744186 [patent_app_country] => US [patent_app_date] => 2024-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 0 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18744186 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/744186
Induction loop for mineral exploration Jun 13, 2024 Issued
Array ( [id] => 20789548 [patent_doc_number] => 12663459 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-06-23 [patent_title] => Test signal circuit for testing a radio frequency receiver circuit, a semiconductor chip and a system comprising the test signal circuit [patent_app_type] => utility [patent_app_number] => 18/743626 [patent_app_country] => US [patent_app_date] => 2024-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18743626 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/743626
Test signal circuit for testing a radio frequency receiver circuit, a semiconductor chip and a system comprising the test signal circuit Jun 13, 2024 Issued
Array ( [id] => 20408218 [patent_doc_number] => 20250377327 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-12-11 [patent_title] => MEASUREMENT OF CHARACTERISTICS OF A FLUID [patent_app_type] => utility [patent_app_number] => 18/735693 [patent_app_country] => US [patent_app_date] => 2024-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18735693 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/735693
MEASUREMENT OF CHARACTERISTICS OF A FLUID Jun 5, 2024 Pending
Array ( [id] => 19685512 [patent_doc_number] => 20250004057 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-02 [patent_title] => VOLTAGE DETECTION UNIT AND POWER STORAGE DEVICE [patent_app_type] => utility [patent_app_number] => 18/735800 [patent_app_country] => US [patent_app_date] => 2024-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10638 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18735800 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/735800
Voltage detection unit and power storage device Jun 5, 2024 Issued
Array ( [id] => 20827549 [patent_doc_number] => 12681109 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-07-14 [patent_title] => Inspection apparatus and inspection method [patent_app_type] => utility [patent_app_number] => 18/736022 [patent_app_country] => US [patent_app_date] => 2024-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3585 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18736022 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/736022
Inspection apparatus and inspection method Jun 5, 2024 Issued
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