
Glenn Warner Brown
Examiner (ID: 8011)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2608, 2607, 2858, 2213 |
| Total Applications | 836 |
| Issued Applications | 762 |
| Pending Applications | 49 |
| Abandoned Applications | 25 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4032240
[patent_doc_number] => 05883517
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-03-16
[patent_title] => 'Device for locating defects in underwater telecommunication links'
[patent_app_type] => 1
[patent_app_number] => 8/849505
[patent_app_country] => US
[patent_app_date] => 1997-06-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 6835
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/883/05883517.pdf
[firstpage_image] =>[orig_patent_app_number] => 849505
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/849505 | Device for locating defects in underwater telecommunication links | Jun 4, 1997 | Issued |
Array
(
[id] => 3952391
[patent_doc_number] => 05990673
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-11-23
[patent_title] => 'Digital phase comparator'
[patent_app_type] => 1
[patent_app_number] => 8/765595
[patent_app_country] => US
[patent_app_date] => 1997-06-03
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 765595
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/765595 | Digital phase comparator | Jun 2, 1997 | Issued |
Array
(
[id] => 4188870
[patent_doc_number] => 06020733
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-01
[patent_title] => 'Two port handheld vector network analyzer with frequency monitor mode'
[patent_app_type] => 1
[patent_app_number] => 8/865882
[patent_app_country] => US
[patent_app_date] => 1997-05-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => patents/06/020/06020733.pdf
[firstpage_image] =>[orig_patent_app_number] => 865882
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/865882 | Two port handheld vector network analyzer with frequency monitor mode | May 29, 1997 | Issued |
Array
(
[id] => 3893221
[patent_doc_number] => 05894226
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-04-13
[patent_title] => 'IC testing apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/864453
[patent_app_country] => US
[patent_app_date] => 1997-05-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[pdf_file] => patents/05/894/05894226.pdf
[firstpage_image] =>[orig_patent_app_number] => 864453
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/864453 | IC testing apparatus | May 27, 1997 | Issued |
Array
(
[id] => 4028738
[patent_doc_number] => 05926029
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-07-20
[patent_title] => 'Ultra fine probe contacts'
[patent_app_type] => 1
[patent_app_number] => 8/863268
[patent_app_country] => US
[patent_app_date] => 1997-05-27
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/926/05926029.pdf
[firstpage_image] =>[orig_patent_app_number] => 863268
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/863268 | Ultra fine probe contacts | May 26, 1997 | Issued |
Array
(
[id] => 3986648
[patent_doc_number] => 05949233
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-09-07
[patent_title] => 'Circuit for detecting overcharging and overdischarging'
[patent_app_type] => 1
[patent_app_number] => 8/862626
[patent_app_country] => US
[patent_app_date] => 1997-05-23
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/949/05949233.pdf
[firstpage_image] =>[orig_patent_app_number] => 862626
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/862626 | Circuit for detecting overcharging and overdischarging | May 22, 1997 | Issued |
Array
(
[id] => 3884352
[patent_doc_number] => 05804974
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-09-08
[patent_title] => 'Materials characterization cell for polarization spectrum and streaming electrification measurements'
[patent_app_type] => 1
[patent_app_number] => 8/859749
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[patent_app_date] => 1997-05-21
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[pdf_file] => patents/05/804/05804974.pdf
[firstpage_image] =>[orig_patent_app_number] => 859749
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/859749 | Materials characterization cell for polarization spectrum and streaming electrification measurements | May 20, 1997 | Issued |
Array
(
[id] => 3962942
[patent_doc_number] => 05936416
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-08-10
[patent_title] => 'Probe inspection apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/857852
[patent_app_country] => US
[patent_app_date] => 1997-05-16
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/936/05936416.pdf
[firstpage_image] =>[orig_patent_app_number] => 857852
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/857852 | Probe inspection apparatus | May 15, 1997 | Issued |
Array
(
[id] => 4319913
[patent_doc_number] => 06316950
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-13
[patent_title] => 'Method and apparatus for imaging semiconductor devices'
[patent_app_type] => 1
[patent_app_number] => 8/856561
[patent_app_country] => US
[patent_app_date] => 1997-05-15
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[pdf_file] => patents/06/316/06316950.pdf
[firstpage_image] =>[orig_patent_app_number] => 856561
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/856561 | Method and apparatus for imaging semiconductor devices | May 14, 1997 | Issued |
Array
(
[id] => 4028724
[patent_doc_number] => 05926028
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-07-20
[patent_title] => 'Probe card having separated upper and lower probe needle groups'
[patent_app_type] => 1
[patent_app_number] => 8/855952
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[patent_app_date] => 1997-05-14
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[pdf_file] => patents/05/926/05926028.pdf
[firstpage_image] =>[orig_patent_app_number] => 855952
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/855952 | Probe card having separated upper and lower probe needle groups | May 13, 1997 | Issued |
Array
(
[id] => 4040374
[patent_doc_number] => 05942907
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-08-24
[patent_title] => 'Method and apparatus for testing dies'
[patent_app_type] => 1
[patent_app_number] => 8/852470
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[pdf_file] => patents/05/942/05942907.pdf
[firstpage_image] =>[orig_patent_app_number] => 852470
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/852470 | Method and apparatus for testing dies | May 6, 1997 | Issued |
Array
(
[id] => 4021161
[patent_doc_number] => 05880590
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-03-09
[patent_title] => 'Apparatus and method for burn-in and testing of devices with solder bumps or preforms'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/852770 | Apparatus and method for burn-in and testing of devices with solder bumps or preforms | May 6, 1997 | Issued |
Array
(
[id] => 4121681
[patent_doc_number] => 06046598
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[patent_title] => 'Test board and a test method using the same providing improved electrical connection'
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[patent_app_number] => 8/852159
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[firstpage_image] =>[orig_patent_app_number] => 852159
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Array
(
[id] => 4058139
[patent_doc_number] => 05969532
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[patent_issue_date] => 1999-10-19
[patent_title] => 'Method of inspecting crack in ceramic substrate'
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[pdf_file] => patents/05/969/05969532.pdf
[firstpage_image] =>[orig_patent_app_number] => 841105
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/841105 | Method of inspecting crack in ceramic substrate | Apr 29, 1997 | Issued |
Array
(
[id] => 4211565
[patent_doc_number] => 06078188
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[patent_issue_date] => 2000-06-20
[patent_title] => 'Semiconductor device transporting and handling apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/817759 | Semiconductor device transporting and handling apparatus | Apr 27, 1997 | Issued |
Array
(
[id] => 3942620
[patent_doc_number] => 05929645
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[patent_title] => 'Integrated circuit tester using ion beam'
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[pdf_file] => patents/05/929/05929645.pdf
[firstpage_image] =>[orig_patent_app_number] => 846062
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/846062 | Integrated circuit tester using ion beam | Apr 24, 1997 | Issued |
Array
(
[id] => 3931053
[patent_doc_number] => 05945830
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[patent_kind] => NA
[patent_issue_date] => 1999-08-31
[patent_title] => 'Flow through fluid pH and conductivity sensor'
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[firstpage_image] =>[orig_patent_app_number] => 840805
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/840805 | Flow through fluid pH and conductivity sensor | Apr 15, 1997 | Issued |
Array
(
[id] => 3814245
[patent_doc_number] => 05831435
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[patent_title] => 'Battery tester for JIS Standard'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/834355 | Battery tester for JIS Standard | Apr 15, 1997 | Issued |
Array
(
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/833938 | Method of determining and displaying battery charge status | Apr 13, 1997 | Issued |