Glenn Warner Brown

Array ( [id] => 3777532 [patent_doc_number] => 05773980 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-06-30 [patent_title] => 'One-terminal fault location system that corrects for fault resistance effects' [patent_app_type] => 1 [patent_app_number] => 8/791816 [patent_app_country] => US [patent_app_date] => 1997-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 5415 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/773/05773980.pdf [firstpage_image] =>[orig_patent_app_number] => 791816 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4063337 [patent_doc_number] => 05864240 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-01-26 [patent_title] => 'Method and apparatus for measuring concentration of matter in liquid by using microwaves' [patent_app_type] => 1 [patent_app_number] => 8/790425 [patent_app_country] => US [patent_app_date] => 1997-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3737 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/864/05864240.pdf [firstpage_image] =>[orig_patent_app_number] => 790425 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3986841 [patent_doc_number] => 05949246 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-09-07 [patent_title] => 'Test head for applying signals in a burn-in test of an integrated circuit' [patent_app_type] => 1 [patent_app_number] => 8/789926 [patent_app_country] => US [patent_app_date] => 1997-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2555 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/949/05949246.pdf [firstpage_image] =>[orig_patent_app_number] => 789926 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3982266 [patent_doc_number] => 05917333 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-29 [patent_title] => 'Semiconductor integrated circuit device with diagnostic circuit using resistor' [patent_app_type] => 1 [patent_app_number] => 8/788444 [patent_app_country] => US [patent_app_date] => 1997-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 7879 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/917/05917333.pdf [firstpage_image] =>[orig_patent_app_number] => 788444 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3768555 [patent_doc_number] => 05844420 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-12-01 [patent_title] => 'Fixture for testing a head gimbal assembly employing a flex interconnect circuit' [patent_app_type] => 1 [patent_app_number] => 8/788331 [patent_app_country] => US [patent_app_date] => 1997-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 16 [patent_no_of_words] => 2661 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/844/05844420.pdf [firstpage_image] =>[orig_patent_app_number] => 788331 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4081847 [patent_doc_number] => 05966024 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-12 [patent_title] => 'Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle' [patent_app_type] => 1 [patent_app_number] => 8/784325 [patent_app_country] => US [patent_app_date] => 1997-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 16 [patent_no_of_words] => 3737 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/966/05966024.pdf [firstpage_image] =>[orig_patent_app_number] => 784325 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4153762 [patent_doc_number] => 06064213 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-16 [patent_title] => 'Wafer-level burn-in and test' [patent_app_type] => 1 [patent_app_number] => 8/784862 [patent_app_country] => US [patent_app_date] => 1997-01-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 18 [patent_no_of_words] => 9308 [patent_no_of_claims] => 56 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/064/06064213.pdf [firstpage_image] =>[orig_patent_app_number] => 784862 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4277412 [patent_doc_number] => 06307393 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-23 [patent_title] => 'Device for detecting defects in solid-state image sensor' [patent_app_type] => 1 [patent_app_number] => 8/783518 [patent_app_country] => US [patent_app_date] => 1997-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5173 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/307/06307393.pdf [firstpage_image] =>[orig_patent_app_number] => 783518 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4189142 [patent_doc_number] => 06020753 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-01 [patent_title] => 'TFT and reliability evaluation method thereof' [patent_app_type] => 1 [patent_app_number] => 8/781254 [patent_app_country] => US [patent_app_date] => 1997-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 25 [patent_no_of_words] => 8751 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 270 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/020/06020753.pdf [firstpage_image] =>[orig_patent_app_number] => 781254 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3981953 [patent_doc_number] => 05905384 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-05-18 [patent_title] => 'Method for testing semiconductor element' [patent_app_type] => 1 [patent_app_number] => 8/779363 [patent_app_country] => US [patent_app_date] => 1997-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 52 [patent_no_of_words] => 11702 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/905/05905384.pdf [firstpage_image] =>[orig_patent_app_number] => 779363 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3886916 [patent_doc_number] => 05798648 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-08-25 [patent_title] => 'Apparatus and method for inspecting an electrolytic capacitor in an inverter circuit containing transistor switching elements' [patent_app_type] => 1 [patent_app_number] => 8/768205 [patent_app_country] => US [patent_app_date] => 1996-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 20 [patent_no_of_words] => 10339 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/798/05798648.pdf [firstpage_image] =>[orig_patent_app_number] => 768205 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3812872 [patent_doc_number] => 05854557 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-12-29 [patent_title] => 'Corrosion measurement system' [patent_app_type] => 1 [patent_app_number] => 8/763974 [patent_app_country] => US [patent_app_date] => 1996-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 8528 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/854/05854557.pdf [firstpage_image] =>[orig_patent_app_number] => 763974 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3884888 [patent_doc_number] => 05729144 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-03-17 [patent_title] => 'Systems and methods for determining location of a fault on an electric utility power distribution system' [patent_app_type] => 1 [patent_app_number] => 8/759297 [patent_app_country] => US [patent_app_date] => 1996-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2954 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/729/05729144.pdf [firstpage_image] =>[orig_patent_app_number] => 759297 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3776735 [patent_doc_number] => 05850149 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-12-15 [patent_title] => 'Evaluation method for semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 8/755616 [patent_app_country] => US [patent_app_date] => 1996-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 23 [patent_no_of_words] => 5138 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/850/05850149.pdf [firstpage_image] =>[orig_patent_app_number] => 755616 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3991031 [patent_doc_number] => 05910727 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-08 [patent_title] => 'Electrical inspecting apparatus with ventilation system' [patent_app_type] => 1 [patent_app_number] => 8/754767 [patent_app_country] => US [patent_app_date] => 1996-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 23 [patent_no_of_words] => 8195 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/910/05910727.pdf [firstpage_image] =>[orig_patent_app_number] => 754767 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4058836 [patent_doc_number] => 05933013 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-03 [patent_title] => 'Calibration circuit for calibrating frequency characteristics of an AC/DC converter' [patent_app_type] => 1 [patent_app_number] => 8/752320 [patent_app_country] => US [patent_app_date] => 1996-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 3537 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/933/05933013.pdf [firstpage_image] =>[orig_patent_app_number] => 752320 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3781999 [patent_doc_number] => 05808462 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-09-15 [patent_title] => 'Apparatus for detecting the amplitude and phase of an a.c. signal' [patent_app_type] => 1 [patent_app_number] => 8/752316 [patent_app_country] => US [patent_app_date] => 1996-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 10389 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/808/05808462.pdf [firstpage_image] =>[orig_patent_app_number] => 752316 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3892935 [patent_doc_number] => 05714877 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-02-03 [patent_title] => 'Apparatus for detecting the amplitude and phase of an A.C. signal' [patent_app_type] => 1 [patent_app_number] => 8/754504 [patent_app_country] => US [patent_app_date] => 1996-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 10294 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 208 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/714/05714877.pdf [firstpage_image] =>[orig_patent_app_number] => 754504 [rel_patent_id] =>[rel_patent_doc_number] =>)