Search

Glenn Warner Brown

Examiner (ID: 8011)

Most Active Art Unit
2858
Art Unit(s)
2608, 2607, 2858, 2213
Total Applications
836
Issued Applications
762
Pending Applications
49
Abandoned Applications
25

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4050240 [patent_doc_number] => 05912559 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-15 [patent_title] => 'Apparatus for detection and localization of electrostatic discharge (ESD) susceptible areas of electronic systems' [patent_app_type] => 1 [patent_app_number] => 8/655715 [patent_app_country] => US [patent_app_date] => 1996-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2448 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/912/05912559.pdf [firstpage_image] =>[orig_patent_app_number] => 655715 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/655715
Apparatus for detection and localization of electrostatic discharge (ESD) susceptible areas of electronic systems May 29, 1996 Issued
Array ( [id] => 3956633 [patent_doc_number] => 05977785 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-02 [patent_title] => 'Method and apparatus for rapidly varying the operating temperature of a semiconductor device in a testing environment' [patent_app_type] => 1 [patent_app_number] => 8/654311 [patent_app_country] => US [patent_app_date] => 1996-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 5545 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/977/05977785.pdf [firstpage_image] =>[orig_patent_app_number] => 654311 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/654311
Method and apparatus for rapidly varying the operating temperature of a semiconductor device in a testing environment May 27, 1996 Issued
Array ( [id] => 4071496 [patent_doc_number] => 05867033 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-02-02 [patent_title] => 'Circuit for testing the operation of a semiconductor device' [patent_app_type] => 1 [patent_app_number] => 8/653321 [patent_app_country] => US [patent_app_date] => 1996-05-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 5134 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/867/05867033.pdf [firstpage_image] =>[orig_patent_app_number] => 653321 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/653321
Circuit for testing the operation of a semiconductor device May 23, 1996 Issued
Array ( [id] => 3986855 [patent_doc_number] => 05949247 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-09-07 [patent_title] => 'Method and apparatus for automatically testing and evaluating electric generator sets' [patent_app_type] => 1 [patent_app_number] => 8/652126 [patent_app_country] => US [patent_app_date] => 1996-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 11986 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/949/05949247.pdf [firstpage_image] =>[orig_patent_app_number] => 652126 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/652126
Method and apparatus for automatically testing and evaluating electric generator sets May 22, 1996 Issued
Array ( [id] => 3822815 [patent_doc_number] => 05789934 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-08-04 [patent_title] => 'Test circuit including a power supply with a current transformer to monitor capacitor output current' [patent_app_type] => 1 [patent_app_number] => 8/652746 [patent_app_country] => US [patent_app_date] => 1996-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1401 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/789/05789934.pdf [firstpage_image] =>[orig_patent_app_number] => 652746 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/652746
Test circuit including a power supply with a current transformer to monitor capacitor output current May 22, 1996 Issued
Array ( [id] => 4015010 [patent_doc_number] => 05889410 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-03-30 [patent_title] => 'Floating gate interlevel defect monitor and method' [patent_app_type] => 1 [patent_app_number] => 8/652216 [patent_app_country] => US [patent_app_date] => 1996-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3959 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/889/05889410.pdf [firstpage_image] =>[orig_patent_app_number] => 652216 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/652216
Floating gate interlevel defect monitor and method May 21, 1996 Issued
Array ( [id] => 3747195 [patent_doc_number] => 05786700 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-07-28 [patent_title] => 'Method for determining interconnection resistance of wire leads in electronic packages' [patent_app_type] => 1 [patent_app_number] => 8/650505 [patent_app_country] => US [patent_app_date] => 1996-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2495 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/786/05786700.pdf [firstpage_image] =>[orig_patent_app_number] => 650505 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/650505
Method for determining interconnection resistance of wire leads in electronic packages May 19, 1996 Issued
Array ( [id] => 4055595 [patent_doc_number] => 05869971 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-02-09 [patent_title] => 'Method and apparatus for ratiometric measurement of hematocrit' [patent_app_type] => 1 [patent_app_number] => 8/649525 [patent_app_country] => US [patent_app_date] => 1996-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3060 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/869/05869971.pdf [firstpage_image] =>[orig_patent_app_number] => 649525 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/649525
Method and apparatus for ratiometric measurement of hematocrit May 16, 1996 Issued
Array ( [id] => 4068979 [patent_doc_number] => 05896034 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-04-20 [patent_title] => 'Method and apparatus for detecting and monitoring corrosion' [patent_app_type] => 1 [patent_app_number] => 8/649456 [patent_app_country] => US [patent_app_date] => 1996-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1229 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/896/05896034.pdf [firstpage_image] =>[orig_patent_app_number] => 649456 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/649456
Method and apparatus for detecting and monitoring corrosion May 16, 1996 Issued
Array ( [id] => 4163545 [patent_doc_number] => 06104203 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-15 [patent_title] => 'Test apparatus for electronic components' [patent_app_type] => 1 [patent_app_number] => 8/648614 [patent_app_country] => US [patent_app_date] => 1996-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3488 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/104/06104203.pdf [firstpage_image] =>[orig_patent_app_number] => 648614 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/648614
Test apparatus for electronic components May 15, 1996 Issued
Array ( [id] => 3768540 [patent_doc_number] => 05844419 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-12-01 [patent_title] => 'Method for testing semiconductor packages using decoupling capacitors to reduce noise' [patent_app_type] => 1 [patent_app_number] => 8/647704 [patent_app_country] => US [patent_app_date] => 1996-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 8 [patent_no_of_words] => 2963 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/844/05844419.pdf [firstpage_image] =>[orig_patent_app_number] => 647704 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/647704
Method for testing semiconductor packages using decoupling capacitors to reduce noise May 13, 1996 Issued
Array ( [id] => 3893084 [patent_doc_number] => 05714887 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-02-03 [patent_title] => 'Fixture for use in microwave grain moisture measurement' [patent_app_type] => 1 [patent_app_number] => 8/644185 [patent_app_country] => US [patent_app_date] => 1996-05-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 11 [patent_no_of_words] => 2781 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/714/05714887.pdf [firstpage_image] =>[orig_patent_app_number] => 644185 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/644185
Fixture for use in microwave grain moisture measurement May 9, 1996 Issued
Array ( [id] => 3982254 [patent_doc_number] => 05917332 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-29 [patent_title] => 'Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 8/647408 [patent_app_country] => US [patent_app_date] => 1996-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 7946 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/917/05917332.pdf [firstpage_image] =>[orig_patent_app_number] => 647408 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/647408
Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer May 8, 1996 Issued
Array ( [id] => 3817610 [patent_doc_number] => 05811977 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-09-22 [patent_title] => 'Device for electrically testing an electrical connection member' [patent_app_type] => 1 [patent_app_number] => 8/640766 [patent_app_country] => US [patent_app_date] => 1996-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3788 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 305 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/811/05811977.pdf [firstpage_image] =>[orig_patent_app_number] => 640766 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/640766
Device for electrically testing an electrical connection member May 5, 1996 Issued
Array ( [id] => 3905502 [patent_doc_number] => 05751153 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-05-12 [patent_title] => 'Method and apparatus for characterizing a multiport circuit' [patent_app_type] => 1 [patent_app_number] => 8/642236 [patent_app_country] => US [patent_app_date] => 1996-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 2979 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/751/05751153.pdf [firstpage_image] =>[orig_patent_app_number] => 642236 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/642236
Method and apparatus for characterizing a multiport circuit May 1, 1996 Issued
Array ( [id] => 4224904 [patent_doc_number] => 06087842 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-11 [patent_title] => 'Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry' [patent_app_type] => 1 [patent_app_number] => 8/639580 [patent_app_country] => US [patent_app_date] => 1996-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 12 [patent_no_of_words] => 6174 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/087/06087842.pdf [firstpage_image] =>[orig_patent_app_number] => 639580 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/639580
Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry Apr 28, 1996 Issued
Array ( [id] => 3837682 [patent_doc_number] => 05712573 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-01-27 [patent_title] => 'Network analyzer with adaptable sweep time between measurement points' [patent_app_type] => 1 [patent_app_number] => 8/638178 [patent_app_country] => US [patent_app_date] => 1996-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1436 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/712/05712573.pdf [firstpage_image] =>[orig_patent_app_number] => 638178 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/638178
Network analyzer with adaptable sweep time between measurement points Apr 25, 1996 Issued
Array ( [id] => 3782260 [patent_doc_number] => 05757193 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-05-26 [patent_title] => 'Apparatus for detecting defects of wiring board' [patent_app_type] => 1 [patent_app_number] => 8/639835 [patent_app_country] => US [patent_app_date] => 1996-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 9982 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/757/05757193.pdf [firstpage_image] =>[orig_patent_app_number] => 639835 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/639835
Apparatus for detecting defects of wiring board Apr 25, 1996 Issued
Array ( [id] => 3892923 [patent_doc_number] => 05714876 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-02-03 [patent_title] => 'In-service serial digital source signal-level and cable-length measurement' [patent_app_type] => 1 [patent_app_number] => 8/639065 [patent_app_country] => US [patent_app_date] => 1996-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2021 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/714/05714876.pdf [firstpage_image] =>[orig_patent_app_number] => 639065 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/639065
In-service serial digital source signal-level and cable-length measurement Apr 23, 1996 Issued
Array ( [id] => 3766673 [patent_doc_number] => 05742156 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-04-21 [patent_title] => 'Digital process for obtaining a measured parameter from an electric signal' [patent_app_type] => 1 [patent_app_number] => 8/604935 [patent_app_country] => US [patent_app_date] => 1996-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2185 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 216 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/742/05742156.pdf [firstpage_image] =>[orig_patent_app_number] => 604935 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/604935
Digital process for obtaining a measured parameter from an electric signal Apr 23, 1996 Issued
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