
Glenn Warner Brown
Examiner (ID: 8011)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2608, 2607, 2858, 2213 |
| Total Applications | 836 |
| Issued Applications | 762 |
| Pending Applications | 49 |
| Abandoned Applications | 25 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4050240
[patent_doc_number] => 05912559
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-06-15
[patent_title] => 'Apparatus for detection and localization of electrostatic discharge (ESD) susceptible areas of electronic systems'
[patent_app_type] => 1
[patent_app_number] => 8/655715
[patent_app_country] => US
[patent_app_date] => 1996-05-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 2448
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 126
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/912/05912559.pdf
[firstpage_image] =>[orig_patent_app_number] => 655715
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/655715 | Apparatus for detection and localization of electrostatic discharge (ESD) susceptible areas of electronic systems | May 29, 1996 | Issued |
Array
(
[id] => 3956633
[patent_doc_number] => 05977785
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-11-02
[patent_title] => 'Method and apparatus for rapidly varying the operating temperature of a semiconductor device in a testing environment'
[patent_app_type] => 1
[patent_app_number] => 8/654311
[patent_app_country] => US
[patent_app_date] => 1996-05-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
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[patent_no_of_words] => 5545
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[patent_words_short_claim] => 101
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[pdf_file] => patents/05/977/05977785.pdf
[firstpage_image] =>[orig_patent_app_number] => 654311
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/654311 | Method and apparatus for rapidly varying the operating temperature of a semiconductor device in a testing environment | May 27, 1996 | Issued |
Array
(
[id] => 4071496
[patent_doc_number] => 05867033
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-02-02
[patent_title] => 'Circuit for testing the operation of a semiconductor device'
[patent_app_type] => 1
[patent_app_number] => 8/653321
[patent_app_country] => US
[patent_app_date] => 1996-05-24
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 653321
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/653321 | Circuit for testing the operation of a semiconductor device | May 23, 1996 | Issued |
Array
(
[id] => 3986855
[patent_doc_number] => 05949247
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-09-07
[patent_title] => 'Method and apparatus for automatically testing and evaluating electric generator sets'
[patent_app_type] => 1
[patent_app_number] => 8/652126
[patent_app_country] => US
[patent_app_date] => 1996-05-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 11986
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[firstpage_image] =>[orig_patent_app_number] => 652126
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/652126 | Method and apparatus for automatically testing and evaluating electric generator sets | May 22, 1996 | Issued |
Array
(
[id] => 3822815
[patent_doc_number] => 05789934
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-08-04
[patent_title] => 'Test circuit including a power supply with a current transformer to monitor capacitor output current'
[patent_app_type] => 1
[patent_app_number] => 8/652746
[patent_app_country] => US
[patent_app_date] => 1996-05-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[pdf_file] => patents/05/789/05789934.pdf
[firstpage_image] =>[orig_patent_app_number] => 652746
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/652746 | Test circuit including a power supply with a current transformer to monitor capacitor output current | May 22, 1996 | Issued |
Array
(
[id] => 4015010
[patent_doc_number] => 05889410
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-03-30
[patent_title] => 'Floating gate interlevel defect monitor and method'
[patent_app_type] => 1
[patent_app_number] => 8/652216
[patent_app_country] => US
[patent_app_date] => 1996-05-22
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[pdf_file] => patents/05/889/05889410.pdf
[firstpage_image] =>[orig_patent_app_number] => 652216
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/652216 | Floating gate interlevel defect monitor and method | May 21, 1996 | Issued |
Array
(
[id] => 3747195
[patent_doc_number] => 05786700
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-07-28
[patent_title] => 'Method for determining interconnection resistance of wire leads in electronic packages'
[patent_app_type] => 1
[patent_app_number] => 8/650505
[patent_app_country] => US
[patent_app_date] => 1996-05-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/05/786/05786700.pdf
[firstpage_image] =>[orig_patent_app_number] => 650505
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/650505 | Method for determining interconnection resistance of wire leads in electronic packages | May 19, 1996 | Issued |
Array
(
[id] => 4055595
[patent_doc_number] => 05869971
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-02-09
[patent_title] => 'Method and apparatus for ratiometric measurement of hematocrit'
[patent_app_type] => 1
[patent_app_number] => 8/649525
[patent_app_country] => US
[patent_app_date] => 1996-05-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 3060
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[pdf_file] => patents/05/869/05869971.pdf
[firstpage_image] =>[orig_patent_app_number] => 649525
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/649525 | Method and apparatus for ratiometric measurement of hematocrit | May 16, 1996 | Issued |
Array
(
[id] => 4068979
[patent_doc_number] => 05896034
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-04-20
[patent_title] => 'Method and apparatus for detecting and monitoring corrosion'
[patent_app_type] => 1
[patent_app_number] => 8/649456
[patent_app_country] => US
[patent_app_date] => 1996-05-17
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[pdf_file] => patents/05/896/05896034.pdf
[firstpage_image] =>[orig_patent_app_number] => 649456
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/649456 | Method and apparatus for detecting and monitoring corrosion | May 16, 1996 | Issued |
Array
(
[id] => 4163545
[patent_doc_number] => 06104203
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-08-15
[patent_title] => 'Test apparatus for electronic components'
[patent_app_type] => 1
[patent_app_number] => 8/648614
[patent_app_country] => US
[patent_app_date] => 1996-05-16
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/104/06104203.pdf
[firstpage_image] =>[orig_patent_app_number] => 648614
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/648614 | Test apparatus for electronic components | May 15, 1996 | Issued |
Array
(
[id] => 3768540
[patent_doc_number] => 05844419
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-12-01
[patent_title] => 'Method for testing semiconductor packages using decoupling capacitors to reduce noise'
[patent_app_type] => 1
[patent_app_number] => 8/647704
[patent_app_country] => US
[patent_app_date] => 1996-05-14
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[pdf_file] => patents/05/844/05844419.pdf
[firstpage_image] =>[orig_patent_app_number] => 647704
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/647704 | Method for testing semiconductor packages using decoupling capacitors to reduce noise | May 13, 1996 | Issued |
Array
(
[id] => 3893084
[patent_doc_number] => 05714887
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-02-03
[patent_title] => 'Fixture for use in microwave grain moisture measurement'
[patent_app_type] => 1
[patent_app_number] => 8/644185
[patent_app_country] => US
[patent_app_date] => 1996-05-10
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[pdf_file] => patents/05/714/05714887.pdf
[firstpage_image] =>[orig_patent_app_number] => 644185
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/644185 | Fixture for use in microwave grain moisture measurement | May 9, 1996 | Issued |
Array
(
[id] => 3982254
[patent_doc_number] => 05917332
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-06-29
[patent_title] => 'Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer'
[patent_app_type] => 1
[patent_app_number] => 8/647408
[patent_app_country] => US
[patent_app_date] => 1996-05-09
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[pdf_file] => patents/05/917/05917332.pdf
[firstpage_image] =>[orig_patent_app_number] => 647408
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/647408 | Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer | May 8, 1996 | Issued |
Array
(
[id] => 3817610
[patent_doc_number] => 05811977
[patent_country] => US
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[patent_issue_date] => 1998-09-22
[patent_title] => 'Device for electrically testing an electrical connection member'
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[patent_app_number] => 8/640766
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[pdf_file] => patents/05/811/05811977.pdf
[firstpage_image] =>[orig_patent_app_number] => 640766
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/640766 | Device for electrically testing an electrical connection member | May 5, 1996 | Issued |
Array
(
[id] => 3905502
[patent_doc_number] => 05751153
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[patent_kind] => NA
[patent_issue_date] => 1998-05-12
[patent_title] => 'Method and apparatus for characterizing a multiport circuit'
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[firstpage_image] =>[orig_patent_app_number] => 642236
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/642236 | Method and apparatus for characterizing a multiport circuit | May 1, 1996 | Issued |
Array
(
[id] => 4224904
[patent_doc_number] => 06087842
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-07-11
[patent_title] => 'Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry'
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[patent_app_number] => 8/639580
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[pdf_file] => patents/06/087/06087842.pdf
[firstpage_image] =>[orig_patent_app_number] => 639580
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/639580 | Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry | Apr 28, 1996 | Issued |
Array
(
[id] => 3837682
[patent_doc_number] => 05712573
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[patent_issue_date] => 1998-01-27
[patent_title] => 'Network analyzer with adaptable sweep time between measurement points'
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[firstpage_image] =>[orig_patent_app_number] => 638178
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/638178 | Network analyzer with adaptable sweep time between measurement points | Apr 25, 1996 | Issued |
Array
(
[id] => 3782260
[patent_doc_number] => 05757193
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[firstpage_image] =>[orig_patent_app_number] => 639835
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/639835 | Apparatus for detecting defects of wiring board | Apr 25, 1996 | Issued |
Array
(
[id] => 3892923
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[firstpage_image] =>[orig_patent_app_number] => 639065
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/639065 | In-service serial digital source signal-level and cable-length measurement | Apr 23, 1996 | Issued |
Array
(
[id] => 3766673
[patent_doc_number] => 05742156
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[patent_issue_date] => 1998-04-21
[patent_title] => 'Digital process for obtaining a measured parameter from an electric signal'
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[pdf_file] => patents/05/742/05742156.pdf
[firstpage_image] =>[orig_patent_app_number] => 604935
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/604935 | Digital process for obtaining a measured parameter from an electric signal | Apr 23, 1996 | Issued |