Search

Glenn Warner Brown

Examiner (ID: 8011)

Most Active Art Unit
2858
Art Unit(s)
2608, 2607, 2858, 2213
Total Applications
836
Issued Applications
762
Pending Applications
49
Abandoned Applications
25

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4147374 [patent_doc_number] => 06060894 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-09 [patent_title] => 'Temporary package, method and system for testing semiconductor dice having backside electrodes' [patent_app_type] => 1 [patent_app_number] => 9/365676 [patent_app_country] => US [patent_app_date] => 1999-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 12 [patent_no_of_words] => 3788 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/060/06060894.pdf [firstpage_image] =>[orig_patent_app_number] => 365676 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/365676
Temporary package, method and system for testing semiconductor dice having backside electrodes Aug 1, 1999 Issued
Array ( [id] => 1436920 [patent_doc_number] => 06356097 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-12 [patent_title] => 'Capacitive probe for in situ measurement of wafer DC bias voltage' [patent_app_type] => B1 [patent_app_number] => 09/361649 [patent_app_country] => US [patent_app_date] => 1999-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 2932 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/356/06356097.pdf [firstpage_image] =>[orig_patent_app_number] => 09361649 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/361649
Capacitive probe for in situ measurement of wafer DC bias voltage Jul 26, 1999 Issued
Array ( [id] => 4311910 [patent_doc_number] => 06252392 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-26 [patent_title] => 'Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly' [patent_app_type] => 1 [patent_app_number] => 9/352154 [patent_app_country] => US [patent_app_date] => 1999-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2301 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/252/06252392.pdf [firstpage_image] =>[orig_patent_app_number] => 352154 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/352154
Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly Jul 11, 1999 Issued
Array ( [id] => 4284608 [patent_doc_number] => 06281697 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-28 [patent_title] => 'Semiconductor device evaluation apparatus' [patent_app_type] => 1 [patent_app_number] => 9/339399 [patent_app_country] => US [patent_app_date] => 1999-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 20 [patent_no_of_words] => 6597 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/281/06281697.pdf [firstpage_image] =>[orig_patent_app_number] => 339399 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/339399
Semiconductor device evaluation apparatus Jun 22, 1999 Issued
Array ( [id] => 1487214 [patent_doc_number] => 06366098 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-02 [patent_title] => 'Test structure, integrated circuit, and test method' [patent_app_type] => B1 [patent_app_number] => 09/336269 [patent_app_country] => US [patent_app_date] => 1999-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 5477 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/366/06366098.pdf [firstpage_image] =>[orig_patent_app_number] => 09336269 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/336269
Test structure, integrated circuit, and test method Jun 17, 1999 Issued
Array ( [id] => 4353042 [patent_doc_number] => 06285203 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-04 [patent_title] => 'Test system having alignment member for aligning semiconductor components' [patent_app_type] => 1 [patent_app_number] => 9/332838 [patent_app_country] => US [patent_app_date] => 1999-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 50 [patent_no_of_words] => 10035 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/285/06285203.pdf [firstpage_image] =>[orig_patent_app_number] => 332838 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/332838
Test system having alignment member for aligning semiconductor components Jun 13, 1999 Issued
Array ( [id] => 4375226 [patent_doc_number] => 06275045 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-14 [patent_title] => 'Microwave transmitter-receiver' [patent_app_type] => 1 [patent_app_number] => 9/319978 [patent_app_country] => US [patent_app_date] => 1999-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 3691 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/275/06275045.pdf [firstpage_image] =>[orig_patent_app_number] => 319978 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/319978
Microwave transmitter-receiver Jun 13, 1999 Issued
Array ( [id] => 4338993 [patent_doc_number] => 06313653 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-06 [patent_title] => 'IC chip tester with heating element for preventing condensation' [patent_app_type] => 1 [patent_app_number] => 9/328499 [patent_app_country] => US [patent_app_date] => 1999-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9342 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/313/06313653.pdf [firstpage_image] =>[orig_patent_app_number] => 328499 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/328499
IC chip tester with heating element for preventing condensation Jun 8, 1999 Issued
Array ( [id] => 4244679 [patent_doc_number] => 06144210 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-07 [patent_title] => 'Method and apparatus for finding and locating manufacturing defects on a printed circuit board' [patent_app_type] => 1 [patent_app_number] => 9/328735 [patent_app_country] => US [patent_app_date] => 1999-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 7638 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/144/06144210.pdf [firstpage_image] =>[orig_patent_app_number] => 328735 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/328735
Method and apparatus for finding and locating manufacturing defects on a printed circuit board Jun 8, 1999 Issued
Array ( [id] => 4336132 [patent_doc_number] => 06320401 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-20 [patent_title] => 'Substrate inspection using the propagation characteristics of RF electromagnetic waves' [patent_app_type] => 1 [patent_app_number] => 9/327672 [patent_app_country] => US [patent_app_date] => 1999-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 12300 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/320/06320401.pdf [firstpage_image] =>[orig_patent_app_number] => 327672 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/327672
Substrate inspection using the propagation characteristics of RF electromagnetic waves Jun 7, 1999 Issued
Array ( [id] => 1588386 [patent_doc_number] => 06359444 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-19 [patent_title] => 'Remote resonant-circuit analyte sensing apparatus with sensing structure and associated method of sensing' [patent_app_type] => B1 [patent_app_number] => 09/322403 [patent_app_country] => US [patent_app_date] => 1999-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 12942 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/359/06359444.pdf [firstpage_image] =>[orig_patent_app_number] => 09322403 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/322403
Remote resonant-circuit analyte sensing apparatus with sensing structure and associated method of sensing May 27, 1999 Issued
Array ( [id] => 4295776 [patent_doc_number] => 06211663 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-03 [patent_title] => 'Baseband time-domain waveform measurement method' [patent_app_type] => 1 [patent_app_number] => 9/322270 [patent_app_country] => US [patent_app_date] => 1999-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 7165 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/211/06211663.pdf [firstpage_image] =>[orig_patent_app_number] => 322270 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/322270
Baseband time-domain waveform measurement method May 27, 1999 Issued
Array ( [id] => 4256569 [patent_doc_number] => 06222367 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-24 [patent_title] => 'Combustion state detecting device for an internal combustion engine' [patent_app_type] => 1 [patent_app_number] => 9/322003 [patent_app_country] => US [patent_app_date] => 1999-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5069 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/222/06222367.pdf [firstpage_image] =>[orig_patent_app_number] => 322003 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/322003
Combustion state detecting device for an internal combustion engine May 27, 1999 Issued
Array ( [id] => 4284376 [patent_doc_number] => 06281682 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-28 [patent_title] => 'Sensor for detecting ignition current and ion current in ignition secondary circuit' [patent_app_type] => 1 [patent_app_number] => 9/320444 [patent_app_country] => US [patent_app_date] => 1999-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5093 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/281/06281682.pdf [firstpage_image] =>[orig_patent_app_number] => 320444 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/320444
Sensor for detecting ignition current and ion current in ignition secondary circuit May 26, 1999 Issued
Array ( [id] => 4267469 [patent_doc_number] => 06259242 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-10 [patent_title] => 'Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles' [patent_app_type] => 1 [patent_app_number] => 9/320496 [patent_app_country] => US [patent_app_date] => 1999-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 17246 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/259/06259242.pdf [firstpage_image] =>[orig_patent_app_number] => 320496 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/320496
Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles May 25, 1999 Issued
Array ( [id] => 4414723 [patent_doc_number] => 06300755 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-09 [patent_title] => 'Enhanced modified faraday cup for determination of power density distribution of electron beams' [patent_app_type] => 1 [patent_app_number] => 9/320226 [patent_app_country] => US [patent_app_date] => 1999-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 5628 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/300/06300755.pdf [firstpage_image] =>[orig_patent_app_number] => 320226 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/320226
Enhanced modified faraday cup for determination of power density distribution of electron beams May 25, 1999 Issued
Array ( [id] => 4378024 [patent_doc_number] => 06288528 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Method and system for evaluating a condition of a combustion vessel' [patent_app_type] => 1 [patent_app_number] => 9/313909 [patent_app_country] => US [patent_app_date] => 1999-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4239 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 262 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288528.pdf [firstpage_image] =>[orig_patent_app_number] => 313909 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/313909
Method and system for evaluating a condition of a combustion vessel May 17, 1999 Issued
Array ( [id] => 1588389 [patent_doc_number] => 06359445 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-19 [patent_title] => 'Microwave sensor for determining position for displacement of a movable part, such as a valve needle' [patent_app_type] => B1 [patent_app_number] => 09/308472 [patent_app_country] => US [patent_app_date] => 1999-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2231 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/359/06359445.pdf [firstpage_image] =>[orig_patent_app_number] => 09308472 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/308472
Microwave sensor for determining position for displacement of a movable part, such as a valve needle May 16, 1999 Issued
Array ( [id] => 4303595 [patent_doc_number] => 06198294 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-06 [patent_title] => 'In-situ backgrind wafer thickness monitor' [patent_app_type] => 1 [patent_app_number] => 9/312776 [patent_app_country] => US [patent_app_date] => 1999-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1963 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/198/06198294.pdf [firstpage_image] =>[orig_patent_app_number] => 312776 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/312776
In-situ backgrind wafer thickness monitor May 16, 1999 Issued
Array ( [id] => 4374847 [patent_doc_number] => 06275020 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-14 [patent_title] => 'Frequency analysis method and sweep type spectrum analyzer' [patent_app_type] => 1 [patent_app_number] => 9/312156 [patent_app_country] => US [patent_app_date] => 1999-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 29 [patent_no_of_words] => 11918 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/275/06275020.pdf [firstpage_image] =>[orig_patent_app_number] => 312156 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/312156
Frequency analysis method and sweep type spectrum analyzer May 13, 1999 Issued
Menu