
Glenn Warner Brown
Examiner (ID: 8011)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2608, 2607, 2858, 2213 |
| Total Applications | 836 |
| Issued Applications | 762 |
| Pending Applications | 49 |
| Abandoned Applications | 25 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4147374
[patent_doc_number] => 06060894
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-09
[patent_title] => 'Temporary package, method and system for testing semiconductor dice having backside electrodes'
[patent_app_type] => 1
[patent_app_number] => 9/365676
[patent_app_country] => US
[patent_app_date] => 1999-08-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 12
[patent_no_of_words] => 3788
[patent_no_of_claims] => 24
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[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/060/06060894.pdf
[firstpage_image] =>[orig_patent_app_number] => 365676
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/365676 | Temporary package, method and system for testing semiconductor dice having backside electrodes | Aug 1, 1999 | Issued |
Array
(
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[patent_doc_number] => 06356097
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-12
[patent_title] => 'Capacitive probe for in situ measurement of wafer DC bias voltage'
[patent_app_type] => B1
[patent_app_number] => 09/361649
[patent_app_country] => US
[patent_app_date] => 1999-07-27
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/356/06356097.pdf
[firstpage_image] =>[orig_patent_app_number] => 09361649
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/361649 | Capacitive probe for in situ measurement of wafer DC bias voltage | Jul 26, 1999 | Issued |
Array
(
[id] => 4311910
[patent_doc_number] => 06252392
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-26
[patent_title] => 'Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly'
[patent_app_type] => 1
[patent_app_number] => 9/352154
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[patent_app_date] => 1999-07-12
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/352154 | Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly | Jul 11, 1999 | Issued |
Array
(
[id] => 4284608
[patent_doc_number] => 06281697
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-28
[patent_title] => 'Semiconductor device evaluation apparatus'
[patent_app_type] => 1
[patent_app_number] => 9/339399
[patent_app_country] => US
[patent_app_date] => 1999-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
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[firstpage_image] =>[orig_patent_app_number] => 339399
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/339399 | Semiconductor device evaluation apparatus | Jun 22, 1999 | Issued |
Array
(
[id] => 1487214
[patent_doc_number] => 06366098
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-02
[patent_title] => 'Test structure, integrated circuit, and test method'
[patent_app_type] => B1
[patent_app_number] => 09/336269
[patent_app_country] => US
[patent_app_date] => 1999-06-18
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/336269 | Test structure, integrated circuit, and test method | Jun 17, 1999 | Issued |
Array
(
[id] => 4353042
[patent_doc_number] => 06285203
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-09-04
[patent_title] => 'Test system having alignment member for aligning semiconductor components'
[patent_app_type] => 1
[patent_app_number] => 9/332838
[patent_app_country] => US
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[pdf_file] => patents/06/285/06285203.pdf
[firstpage_image] =>[orig_patent_app_number] => 332838
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/332838 | Test system having alignment member for aligning semiconductor components | Jun 13, 1999 | Issued |
Array
(
[id] => 4375226
[patent_doc_number] => 06275045
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-14
[patent_title] => 'Microwave transmitter-receiver'
[patent_app_type] => 1
[patent_app_number] => 9/319978
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[patent_app_date] => 1999-06-14
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[firstpage_image] =>[orig_patent_app_number] => 319978
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/319978 | Microwave transmitter-receiver | Jun 13, 1999 | Issued |
Array
(
[id] => 4338993
[patent_doc_number] => 06313653
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-06
[patent_title] => 'IC chip tester with heating element for preventing condensation'
[patent_app_type] => 1
[patent_app_number] => 9/328499
[patent_app_country] => US
[patent_app_date] => 1999-06-09
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[pdf_file] => patents/06/313/06313653.pdf
[firstpage_image] =>[orig_patent_app_number] => 328499
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/328499 | IC chip tester with heating element for preventing condensation | Jun 8, 1999 | Issued |
Array
(
[id] => 4244679
[patent_doc_number] => 06144210
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-07
[patent_title] => 'Method and apparatus for finding and locating manufacturing defects on a printed circuit board'
[patent_app_type] => 1
[patent_app_number] => 9/328735
[patent_app_country] => US
[patent_app_date] => 1999-06-09
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[pdf_file] => patents/06/144/06144210.pdf
[firstpage_image] =>[orig_patent_app_number] => 328735
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/328735 | Method and apparatus for finding and locating manufacturing defects on a printed circuit board | Jun 8, 1999 | Issued |
Array
(
[id] => 4336132
[patent_doc_number] => 06320401
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-20
[patent_title] => 'Substrate inspection using the propagation characteristics of RF electromagnetic waves'
[patent_app_type] => 1
[patent_app_number] => 9/327672
[patent_app_country] => US
[patent_app_date] => 1999-06-08
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[pdf_file] => patents/06/320/06320401.pdf
[firstpage_image] =>[orig_patent_app_number] => 327672
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/327672 | Substrate inspection using the propagation characteristics of RF electromagnetic waves | Jun 7, 1999 | Issued |
Array
(
[id] => 1588386
[patent_doc_number] => 06359444
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-19
[patent_title] => 'Remote resonant-circuit analyte sensing apparatus with sensing structure and associated method of sensing'
[patent_app_type] => B1
[patent_app_number] => 09/322403
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/322403 | Remote resonant-circuit analyte sensing apparatus with sensing structure and associated method of sensing | May 27, 1999 | Issued |
Array
(
[id] => 4295776
[patent_doc_number] => 06211663
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[patent_issue_date] => 2001-04-03
[patent_title] => 'Baseband time-domain waveform measurement method'
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[firstpage_image] =>[orig_patent_app_number] => 322270
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/322270 | Baseband time-domain waveform measurement method | May 27, 1999 | Issued |
Array
(
[id] => 4256569
[patent_doc_number] => 06222367
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-04-24
[patent_title] => 'Combustion state detecting device for an internal combustion engine'
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[patent_app_number] => 9/322003
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[firstpage_image] =>[orig_patent_app_number] => 322003
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/322003 | Combustion state detecting device for an internal combustion engine | May 27, 1999 | Issued |
Array
(
[id] => 4284376
[patent_doc_number] => 06281682
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[patent_title] => 'Sensor for detecting ignition current and ion current in ignition secondary circuit'
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[firstpage_image] =>[orig_patent_app_number] => 320444
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/320444 | Sensor for detecting ignition current and ion current in ignition secondary circuit | May 26, 1999 | Issued |
Array
(
[id] => 4267469
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[patent_issue_date] => 2001-07-10
[patent_title] => 'Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/320496 | Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles | May 25, 1999 | Issued |
Array
(
[id] => 4414723
[patent_doc_number] => 06300755
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[patent_issue_date] => 2001-10-09
[patent_title] => 'Enhanced modified faraday cup for determination of power density distribution of electron beams'
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Array
(
[id] => 4378024
[patent_doc_number] => 06288528
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[patent_title] => 'Method and system for evaluating a condition of a combustion vessel'
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/312156 | Frequency analysis method and sweep type spectrum analyzer | May 13, 1999 | Issued |