Glenn Warner Brown

Array ( [id] => 4296185 [patent_doc_number] => 06211688 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-03 [patent_title] => 'Test area with automatic positioning of a microprobe and a method of producing such a test area' [patent_app_type] => 1 [patent_app_number] => 9/166017 [patent_app_country] => US [patent_app_date] => 1998-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2656 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/211/06211688.pdf [firstpage_image] =>[orig_patent_app_number] => 166017 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4415588 [patent_doc_number] => 06265878 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Reliable trailer tester' [patent_app_type] => 1 [patent_app_number] => 9/165813 [patent_app_country] => US [patent_app_date] => 1998-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 5909 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/265/06265878.pdf [firstpage_image] =>[orig_patent_app_number] => 165813 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4245347 [patent_doc_number] => 06081110 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-27 [patent_title] => 'Thermal isolation plate for probe card' [patent_app_type] => 1 [patent_app_number] => 9/164444 [patent_app_country] => US [patent_app_date] => 1998-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2593 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/081/06081110.pdf [firstpage_image] =>[orig_patent_app_number] => 164444 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4096814 [patent_doc_number] => 06133746 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-17 [patent_title] => 'Method for determining a reliable oxide thickness' [patent_app_type] => 1 [patent_app_number] => 9/163414 [patent_app_country] => US [patent_app_date] => 1998-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2631 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/133/06133746.pdf [firstpage_image] =>[orig_patent_app_number] => 163414 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4245854 [patent_doc_number] => 06166548 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-26 [patent_title] => 'Method of detecting battery capacity in a zinc-air battery' [patent_app_type] => 1 [patent_app_number] => 9/159719 [patent_app_country] => US [patent_app_date] => 1998-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3136 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/166/06166548.pdf [firstpage_image] =>[orig_patent_app_number] => 159719 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4321711 [patent_doc_number] => 06242920 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-05 [patent_title] => 'Apparatus for use in a DMM for measuring the battery voltage of the DMM' [patent_app_type] => 1 [patent_app_number] => 9/156319 [patent_app_country] => US [patent_app_date] => 1998-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2858 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/242/06242920.pdf [firstpage_image] =>[orig_patent_app_number] => 156319 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4279352 [patent_doc_number] => 06246247 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-12 [patent_title] => 'Probe card assembly and kit, and methods of using same' [patent_app_type] => 1 [patent_app_number] => 9/156957 [patent_app_country] => US [patent_app_date] => 1998-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 31 [patent_no_of_words] => 20442 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 32 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/246/06246247.pdf [firstpage_image] =>[orig_patent_app_number] => 156957 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4259856 [patent_doc_number] => 06208156 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-27 [patent_title] => 'Test carrier for packaging semiconductor components having contact balls and calibration carrier for calibrating semiconductor test systems' [patent_app_type] => 1 [patent_app_number] => 9/146715 [patent_app_country] => US [patent_app_date] => 1998-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 29 [patent_no_of_words] => 7202 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/208/06208156.pdf [firstpage_image] =>[orig_patent_app_number] => 146715 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4088581 [patent_doc_number] => 06054861 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-04-25 [patent_title] => 'Apparatus for monitoring power of battery to supply electric power to load' [patent_app_type] => 1 [patent_app_number] => 9/139756 [patent_app_country] => US [patent_app_date] => 1998-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 5737 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 216 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/054/06054861.pdf [firstpage_image] =>[orig_patent_app_number] => 139756 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4326011 [patent_doc_number] => 06249114 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-19 [patent_title] => 'Electronic component continuity inspection method and apparatus' [patent_app_type] => 1 [patent_app_number] => 9/138715 [patent_app_country] => US [patent_app_date] => 1998-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2012 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/249/06249114.pdf [firstpage_image] =>[orig_patent_app_number] => 138715 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4284594 [patent_doc_number] => 06281696 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-28 [patent_title] => 'Method and test circuit for developing integrated circuit fabrication processes' [patent_app_type] => 1 [patent_app_number] => 9/139629 [patent_app_country] => US [patent_app_date] => 1998-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 5627 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/281/06281696.pdf [firstpage_image] =>[orig_patent_app_number] => 139629 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4178649 [patent_doc_number] => 06140823 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-31 [patent_title] => 'Method and apparatus for measuring a transfer impedance of shielded devices and common mode currents in shieldings' [patent_app_type] => 1 [patent_app_number] => 9/133883 [patent_app_country] => US [patent_app_date] => 1998-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2943 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/140/06140823.pdf [firstpage_image] =>[orig_patent_app_number] => 133883 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4389676 [patent_doc_number] => 06278267 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-21 [patent_title] => 'Method of determining impurity content and apparatus for the same' [patent_app_type] => 1 [patent_app_number] => 9/134584 [patent_app_country] => US [patent_app_date] => 1998-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 14 [patent_no_of_words] => 6402 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/278/06278267.pdf [firstpage_image] =>[orig_patent_app_number] => 134584 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4424279 [patent_doc_number] => 06177802 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-23 [patent_title] => 'System and method for detecting defects in an interlayer dielectric of a semiconductor device using the hall-effect' [patent_app_type] => 1 [patent_app_number] => 9/131918 [patent_app_country] => US [patent_app_date] => 1998-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 6483 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/177/06177802.pdf [firstpage_image] =>[orig_patent_app_number] => 131918 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4335901 [patent_doc_number] => 06320390 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-20 [patent_title] => 'Probe for fault actuation devices' [patent_app_type] => 1 [patent_app_number] => 9/117969 [patent_app_country] => US [patent_app_date] => 1998-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3127 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/320/06320390.pdf [firstpage_image] =>[orig_patent_app_number] => 117969 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4040447 [patent_doc_number] => 05942911 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-24 [patent_title] => 'Electric field test of integrated circuit component' [patent_app_type] => 1 [patent_app_number] => 9/123149 [patent_app_country] => US [patent_app_date] => 1998-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6019 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/942/05942911.pdf [firstpage_image] =>[orig_patent_app_number] => 123149 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4299521 [patent_doc_number] => 06236227 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-22 [patent_title] => 'Method and apparatus for turn fault detection in multi-phase AC motors' [patent_app_type] => 1 [patent_app_number] => 9/121714 [patent_app_country] => US [patent_app_date] => 1998-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3178 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/236/06236227.pdf [firstpage_image] =>[orig_patent_app_number] => 121714 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4411780 [patent_doc_number] => 06271657 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-07 [patent_title] => 'Test head positioner for semiconductor device testing apparatus' [patent_app_type] => 1 [patent_app_number] => 9/119817 [patent_app_country] => US [patent_app_date] => 1998-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 10291 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/271/06271657.pdf [firstpage_image] =>[orig_patent_app_number] => 119817 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4303706 [patent_doc_number] => 06198301 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-06 [patent_title] => 'Method for determining the hot carrier lifetime of a transistor' [patent_app_type] => 1 [patent_app_number] => 9/121216 [patent_app_country] => US [patent_app_date] => 1998-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4042 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/198/06198301.pdf [firstpage_image] =>[orig_patent_app_number] => 121216 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4338849 [patent_doc_number] => 06313644 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-06 [patent_title] => 'Apparatus and method for measuring voltage standing wave ratio in antenna of base station' [patent_app_type] => 1 [patent_app_number] => 9/112012 [patent_app_country] => US [patent_app_date] => 1998-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 6255 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/313/06313644.pdf [firstpage_image] =>[orig_patent_app_number] => 112012 [rel_patent_id] =>[rel_patent_doc_number] =>)