Glenn Warner Brown

Array ( [id] => 4110084 [patent_doc_number] => 06051978 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-04-18 [patent_title] => 'TDR tester for x-y prober' [patent_app_type] => 1 [patent_app_number] => 9/066962 [patent_app_country] => US [patent_app_date] => 1998-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 2147 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/051/06051978.pdf [firstpage_image] =>[orig_patent_app_number] => 066962 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4188901 [patent_doc_number] => 06020735 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-01 [patent_title] => 'Switching device internal diode detection circuit and method of operating the same' [patent_app_type] => 1 [patent_app_number] => 9/065957 [patent_app_country] => US [patent_app_date] => 1998-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2869 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/020/06020735.pdf [firstpage_image] =>[orig_patent_app_number] => 065957 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4147282 [patent_doc_number] => 06060888 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-09 [patent_title] => 'Error correction method for reflection measurements of reciprocal devices in vector network analyzers' [patent_app_type] => 1 [patent_app_number] => 9/066801 [patent_app_country] => US [patent_app_date] => 1998-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2135 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/060/06060888.pdf [firstpage_image] =>[orig_patent_app_number] => 066801 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4229217 [patent_doc_number] => 06011398 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-01-04 [patent_title] => 'Current-leakage tester' [patent_app_type] => 1 [patent_app_number] => 9/064602 [patent_app_country] => US [patent_app_date] => 1998-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 23 [patent_no_of_words] => 6954 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/011/06011398.pdf [firstpage_image] =>[orig_patent_app_number] => 064602 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4147388 [patent_doc_number] => 06060895 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-09 [patent_title] => 'Wafer level dielectric test structure and related method for accelerated endurance testing' [patent_app_type] => 1 [patent_app_number] => 9/062907 [patent_app_country] => US [patent_app_date] => 1998-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 4259 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/060/06060895.pdf [firstpage_image] =>[orig_patent_app_number] => 062907 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4192355 [patent_doc_number] => 06094052 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-25 [patent_title] => 'Survivor capacity measuring apparatus for a battery' [patent_app_type] => 1 [patent_app_number] => 9/061905 [patent_app_country] => US [patent_app_date] => 1998-04-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 6697 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/094/06094052.pdf [firstpage_image] =>[orig_patent_app_number] => 061905 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4241211 [patent_doc_number] => 06118295 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-12 [patent_title] => 'Power supply voltage detection device' [patent_app_type] => 1 [patent_app_number] => 9/060827 [patent_app_country] => US [patent_app_date] => 1998-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 17 [patent_no_of_words] => 2508 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/118/06118295.pdf [firstpage_image] =>[orig_patent_app_number] => 060827 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4163551 [patent_doc_number] => 06107818 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-22 [patent_title] => 'High speed, real-time, state interconnect for automatic test equipment' [patent_app_type] => 1 [patent_app_number] => 9/060987 [patent_app_country] => US [patent_app_date] => 1998-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5778 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/107/06107818.pdf [firstpage_image] =>[orig_patent_app_number] => 060987 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4091970 [patent_doc_number] => 06025709 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-15 [patent_title] => 'One port complex transmission and group delay measurements' [patent_app_type] => 1 [patent_app_number] => 9/060538 [patent_app_country] => US [patent_app_date] => 1998-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4990 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 216 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/025/06025709.pdf [firstpage_image] =>[orig_patent_app_number] => 060538 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4160402 [patent_doc_number] => 06124715 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-26 [patent_title] => 'Testing of live circuit boards' [patent_app_type] => 1 [patent_app_number] => 9/059012 [patent_app_country] => US [patent_app_date] => 1998-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4123 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/124/06124715.pdf [firstpage_image] =>[orig_patent_app_number] => 059012 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4153470 [patent_doc_number] => 06064192 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-16 [patent_title] => 'Revenue meter with integral current transformer' [patent_app_type] => 1 [patent_app_number] => 9/056959 [patent_app_country] => US [patent_app_date] => 1998-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6387 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 19 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/064/06064192.pdf [firstpage_image] =>[orig_patent_app_number] => 056959 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4224250 [patent_doc_number] => 06111423 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-29 [patent_title] => 'Method and apparatus for measuring pinch-off voltage of a field effect transistor' [patent_app_type] => 1 [patent_app_number] => 9/055742 [patent_app_country] => US [patent_app_date] => 1998-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 23 [patent_no_of_words] => 9956 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/111/06111423.pdf [firstpage_image] =>[orig_patent_app_number] => 055742 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4110615 [patent_doc_number] => 06100711 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-08 [patent_title] => 'Miniature air gap inspection device' [patent_app_type] => 1 [patent_app_number] => 9/046563 [patent_app_country] => US [patent_app_date] => 1998-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2469 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/100/06100711.pdf [firstpage_image] =>[orig_patent_app_number] => 046563 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4115041 [patent_doc_number] => 06057696 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-02 [patent_title] => 'Apparatus, method and kit for aligning an integrated circuit to a test socket' [patent_app_type] => 1 [patent_app_number] => 9/046962 [patent_app_country] => US [patent_app_date] => 1998-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 5563 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/057/06057696.pdf [firstpage_image] =>[orig_patent_app_number] => 046962 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4192195 [patent_doc_number] => 06160410 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-12 [patent_title] => 'Apparatus, method and kit for adjusting integrated circuit lead deflection upon a test socket conductor' [patent_app_type] => 1 [patent_app_number] => 9/046757 [patent_app_country] => US [patent_app_date] => 1998-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 5561 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 42 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/160/06160410.pdf [firstpage_image] =>[orig_patent_app_number] => 046757 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4088711 [patent_doc_number] => 06054869 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-04-25 [patent_title] => 'Bi-level test fixture for testing printed circuit boards' [patent_app_type] => 1 [patent_app_number] => 9/044662 [patent_app_country] => US [patent_app_date] => 1998-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 4469 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 271 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/054/06054869.pdf [firstpage_image] =>[orig_patent_app_number] => 044662 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4245585 [patent_doc_number] => 06081124 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-27 [patent_title] => 'Testing unit for connector testing' [patent_app_type] => 1 [patent_app_number] => 9/042085 [patent_app_country] => US [patent_app_date] => 1998-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5573 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/081/06081124.pdf [firstpage_image] =>[orig_patent_app_number] => 042085 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4181934 [patent_doc_number] => 06084418 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-04 [patent_title] => 'Method for accurately detecting sensor element resistance' [patent_app_type] => 1 [patent_app_number] => 9/038005 [patent_app_country] => US [patent_app_date] => 1998-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 81 [patent_no_of_words] => 19290 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/084/06084418.pdf [firstpage_image] =>[orig_patent_app_number] => 038005 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4165002 [patent_doc_number] => 06114862 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-05 [patent_title] => 'Capacitive distance sensor' [patent_app_type] => 1 [patent_app_number] => 9/040261 [patent_app_country] => US [patent_app_date] => 1998-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 6148 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/114/06114862.pdf [firstpage_image] =>[orig_patent_app_number] => 040261 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4163468 [patent_doc_number] => 06107812 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-22 [patent_title] => 'Apparatus and method for testing integrated circuit components of a multi-component card' [patent_app_type] => 1 [patent_app_number] => 9/035167 [patent_app_country] => US [patent_app_date] => 1998-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2701 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/107/06107812.pdf [firstpage_image] =>[orig_patent_app_number] => 035167 [rel_patent_id] =>[rel_patent_doc_number] =>)