Search

Glenn Warner Brown

Examiner (ID: 8011)

Most Active Art Unit
2858
Art Unit(s)
2608, 2607, 2858, 2213
Total Applications
836
Issued Applications
762
Pending Applications
49
Abandoned Applications
25

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4241197 [patent_doc_number] => 06118294 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-12 [patent_title] => 'Integrated circuit testing device' [patent_app_type] => 1 [patent_app_number] => 9/035459 [patent_app_country] => US [patent_app_date] => 1998-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2132 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/118/06118294.pdf [firstpage_image] =>[orig_patent_app_number] => 035459 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/035459
Integrated circuit testing device Mar 4, 1998 Issued
Array ( [id] => 4072703 [patent_doc_number] => 06008663 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-28 [patent_title] => 'Eliminating phase shift in an integrated circuit tester' [patent_app_type] => 1 [patent_app_number] => 9/030273 [patent_app_country] => US [patent_app_date] => 1998-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5752 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/008/06008663.pdf [firstpage_image] =>[orig_patent_app_number] => 030273 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/030273
Eliminating phase shift in an integrated circuit tester Feb 24, 1998 Issued
Array ( [id] => 4375405 [patent_doc_number] => 06275056 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-14 [patent_title] => 'Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof' [patent_app_type] => 1 [patent_app_number] => 9/027640 [patent_app_country] => US [patent_app_date] => 1998-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 5781 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/275/06275056.pdf [firstpage_image] =>[orig_patent_app_number] => 027640 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/027640
Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof Feb 22, 1998 Issued
Array ( [id] => 4414329 [patent_doc_number] => 06239609 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-29 [patent_title] => 'Reduced voltage quiescent current test methodology for integrated circuits' [patent_app_type] => 1 [patent_app_number] => 9/022353 [patent_app_country] => US [patent_app_date] => 1998-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3429 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/239/06239609.pdf [firstpage_image] =>[orig_patent_app_number] => 022353 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/022353
Reduced voltage quiescent current test methodology for integrated circuits Feb 10, 1998 Issued
Array ( [id] => 4058207 [patent_doc_number] => 05969537 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-19 [patent_title] => 'Semiconductor device testing apparatus' [patent_app_type] => 1 [patent_app_number] => 9/021369 [patent_app_country] => US [patent_app_date] => 1998-02-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 7926 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/969/05969537.pdf [firstpage_image] =>[orig_patent_app_number] => 021369 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/021369
Semiconductor device testing apparatus Feb 9, 1998 Issued
Array ( [id] => 4335957 [patent_doc_number] => 06320394 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-20 [patent_title] => 'Capacitive distance sensor' [patent_app_type] => 1 [patent_app_number] => 9/019496 [patent_app_country] => US [patent_app_date] => 1998-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3977 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/320/06320394.pdf [firstpage_image] =>[orig_patent_app_number] => 019496 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/019496
Capacitive distance sensor Feb 4, 1998 Issued
Array ( [id] => 3950150 [patent_doc_number] => 05982190 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-09 [patent_title] => 'Method to determine pixel condition on flat panel displays using an electron beam' [patent_app_type] => 1 [patent_app_number] => 9/018559 [patent_app_country] => US [patent_app_date] => 1998-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 18 [patent_no_of_words] => 4162 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/982/05982190.pdf [firstpage_image] =>[orig_patent_app_number] => 018559 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/018559
Method to determine pixel condition on flat panel displays using an electron beam Feb 3, 1998 Issued
Array ( [id] => 4092379 [patent_doc_number] => 06025733 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-15 [patent_title] => 'Semiconductor memory device' [patent_app_type] => 1 [patent_app_number] => 9/018055 [patent_app_country] => US [patent_app_date] => 1998-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 20 [patent_no_of_words] => 7207 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/025/06025733.pdf [firstpage_image] =>[orig_patent_app_number] => 018055 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/018055
Semiconductor memory device Feb 2, 1998 Issued
Array ( [id] => 4246037 [patent_doc_number] => 06091249 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-18 [patent_title] => 'Method and apparatus for detecting defects in wafers' [patent_app_type] => 1 [patent_app_number] => 9/012277 [patent_app_country] => US [patent_app_date] => 1998-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 25 [patent_no_of_words] => 7426 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/091/06091249.pdf [firstpage_image] =>[orig_patent_app_number] => 012277 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/012277
Method and apparatus for detecting defects in wafers Jan 22, 1998 Issued
Array ( [id] => 6920769 [patent_doc_number] => 20010028254 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-10-11 [patent_title] => 'TEST DEVICE FOR FLAT ELECTRONIC ASSEMBLIES' [patent_app_type] => new [patent_app_number] => 08/875666 [patent_app_country] => US [patent_app_date] => 1997-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4048 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20010028254.pdf [firstpage_image] =>[orig_patent_app_number] => 08875666 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/875666
Test device for flat electronic assemblies Dec 21, 1997 Issued
Array ( [id] => 4028712 [patent_doc_number] => 05926027 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-07-20 [patent_title] => 'Apparatus and method for testing a device' [patent_app_type] => 1 [patent_app_number] => 8/995734 [patent_app_country] => US [patent_app_date] => 1997-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 6263 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/926/05926027.pdf [firstpage_image] =>[orig_patent_app_number] => 995734 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/995734
Apparatus and method for testing a device Dec 21, 1997 Issued
Array ( [id] => 4077350 [patent_doc_number] => 06069483 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-30 [patent_title] => 'Pickup chuck for multichip modules' [patent_app_type] => 1 [patent_app_number] => 8/991955 [patent_app_country] => US [patent_app_date] => 1997-12-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 22 [patent_no_of_words] => 3976 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/069/06069483.pdf [firstpage_image] =>[orig_patent_app_number] => 991955 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/991955
Pickup chuck for multichip modules Dec 15, 1997 Issued
Array ( [id] => 4033384 [patent_doc_number] => 05903159 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-05-11 [patent_title] => 'Microwave sensor for sensing discharge faults' [patent_app_type] => 1 [patent_app_number] => 8/985754 [patent_app_country] => US [patent_app_date] => 1997-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 22 [patent_no_of_words] => 7808 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/903/05903159.pdf [firstpage_image] =>[orig_patent_app_number] => 985754 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/985754
Microwave sensor for sensing discharge faults Dec 4, 1997 Issued
Array ( [id] => 3952547 [patent_doc_number] => 05990684 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-23 [patent_title] => 'Method and apparatus for continuously monitoring an aqueous flow to detect and quantify ions' [patent_app_type] => 1 [patent_app_number] => 8/984256 [patent_app_country] => US [patent_app_date] => 1997-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7861 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/990/05990684.pdf [firstpage_image] =>[orig_patent_app_number] => 984256 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/984256
Method and apparatus for continuously monitoring an aqueous flow to detect and quantify ions Dec 1, 1997 Issued
Array ( [id] => 4362806 [patent_doc_number] => 06218847 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-17 [patent_title] => 'Test pattern for use in measuring thickness of insulating layer and method for using the same' [patent_app_type] => 1 [patent_app_number] => 8/977882 [patent_app_country] => US [patent_app_date] => 1997-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 6414 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/218/06218847.pdf [firstpage_image] =>[orig_patent_app_number] => 977882 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/977882
Test pattern for use in measuring thickness of insulating layer and method for using the same Nov 24, 1997 Issued
Array ( [id] => 4115013 [patent_doc_number] => 06057694 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-02 [patent_title] => 'Testing method including the removal of insulative films for electrical contact and apparatus therefor' [patent_app_type] => 1 [patent_app_number] => 8/977558 [patent_app_country] => US [patent_app_date] => 1997-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 7863 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/057/06057694.pdf [firstpage_image] =>[orig_patent_app_number] => 977558 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/977558
Testing method including the removal of insulative films for electrical contact and apparatus therefor Nov 24, 1997 Issued
Array ( [id] => 4000537 [patent_doc_number] => 05920199 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-07-06 [patent_title] => 'Charge detector with long integration time' [patent_app_type] => 1 [patent_app_number] => 8/975750 [patent_app_country] => US [patent_app_date] => 1997-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 3555 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/920/05920199.pdf [firstpage_image] =>[orig_patent_app_number] => 975750 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/975750
Charge detector with long integration time Nov 20, 1997 Issued
Array ( [id] => 4224834 [patent_doc_number] => 06087837 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-11 [patent_title] => 'Compact high resolution under wire water weight sensor array' [patent_app_type] => 1 [patent_app_number] => 8/977773 [patent_app_country] => US [patent_app_date] => 1997-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 5528 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 35 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/087/06087837.pdf [firstpage_image] =>[orig_patent_app_number] => 977773 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/977773
Compact high resolution under wire water weight sensor array Nov 20, 1997 Issued
Array ( [id] => 4213892 [patent_doc_number] => 06028439 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-22 [patent_title] => 'Modular integrated circuit tester with distributed synchronization and control' [patent_app_type] => 1 [patent_app_number] => 8/962472 [patent_app_country] => US [patent_app_date] => 1997-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 10111 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/028/06028439.pdf [firstpage_image] =>[orig_patent_app_number] => 962472 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/962472
Modular integrated circuit tester with distributed synchronization and control Oct 30, 1997 Issued
Array ( [id] => 4241039 [patent_doc_number] => 06118283 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-12 [patent_title] => 'Capacitive rotary position sensor' [patent_app_type] => 1 [patent_app_number] => 8/953886 [patent_app_country] => US [patent_app_date] => 1997-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 8100 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 268 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/118/06118283.pdf [firstpage_image] =>[orig_patent_app_number] => 953886 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/953886
Capacitive rotary position sensor Oct 19, 1997 Issued
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