
Glenn Warner Brown
Examiner (ID: 8011)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2608, 2607, 2858, 2213 |
| Total Applications | 836 |
| Issued Applications | 762 |
| Pending Applications | 49 |
| Abandoned Applications | 25 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4241197
[patent_doc_number] => 06118294
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-09-12
[patent_title] => 'Integrated circuit testing device'
[patent_app_type] => 1
[patent_app_number] => 9/035459
[patent_app_country] => US
[patent_app_date] => 1998-03-05
[patent_effective_date] => 0000-00-00
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[patent_figures_cnt] => 4
[patent_no_of_words] => 2132
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/118/06118294.pdf
[firstpage_image] =>[orig_patent_app_number] => 035459
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/035459 | Integrated circuit testing device | Mar 4, 1998 | Issued |
Array
(
[id] => 4072703
[patent_doc_number] => 06008663
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-12-28
[patent_title] => 'Eliminating phase shift in an integrated circuit tester'
[patent_app_type] => 1
[patent_app_number] => 9/030273
[patent_app_country] => US
[patent_app_date] => 1998-02-25
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/030273 | Eliminating phase shift in an integrated circuit tester | Feb 24, 1998 | Issued |
Array
(
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[patent_doc_number] => 06275056
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[patent_kind] => NA
[patent_issue_date] => 2001-08-14
[patent_title] => 'Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof'
[patent_app_type] => 1
[patent_app_number] => 9/027640
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[patent_app_date] => 1998-02-23
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/027640 | Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof | Feb 22, 1998 | Issued |
Array
(
[id] => 4414329
[patent_doc_number] => 06239609
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[patent_issue_date] => 2001-05-29
[patent_title] => 'Reduced voltage quiescent current test methodology for integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 9/022353
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[patent_app_date] => 1998-02-11
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[firstpage_image] =>[orig_patent_app_number] => 022353
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/022353 | Reduced voltage quiescent current test methodology for integrated circuits | Feb 10, 1998 | Issued |
Array
(
[id] => 4058207
[patent_doc_number] => 05969537
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-10-19
[patent_title] => 'Semiconductor device testing apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/021369 | Semiconductor device testing apparatus | Feb 9, 1998 | Issued |
Array
(
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[patent_doc_number] => 06320394
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[patent_issue_date] => 2001-11-20
[patent_title] => 'Capacitive distance sensor'
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[firstpage_image] =>[orig_patent_app_number] => 019496
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/019496 | Capacitive distance sensor | Feb 4, 1998 | Issued |
Array
(
[id] => 3950150
[patent_doc_number] => 05982190
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[patent_issue_date] => 1999-11-09
[patent_title] => 'Method to determine pixel condition on flat panel displays using an electron beam'
[patent_app_type] => 1
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[firstpage_image] =>[orig_patent_app_number] => 018559
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/018559 | Method to determine pixel condition on flat panel displays using an electron beam | Feb 3, 1998 | Issued |
Array
(
[id] => 4092379
[patent_doc_number] => 06025733
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-15
[patent_title] => 'Semiconductor memory device'
[patent_app_type] => 1
[patent_app_number] => 9/018055
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[pdf_file] => patents/06/025/06025733.pdf
[firstpage_image] =>[orig_patent_app_number] => 018055
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/018055 | Semiconductor memory device | Feb 2, 1998 | Issued |
Array
(
[id] => 4246037
[patent_doc_number] => 06091249
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[patent_issue_date] => 2000-07-18
[patent_title] => 'Method and apparatus for detecting defects in wafers'
[patent_app_type] => 1
[patent_app_number] => 9/012277
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[pdf_file] => patents/06/091/06091249.pdf
[firstpage_image] =>[orig_patent_app_number] => 012277
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/012277 | Method and apparatus for detecting defects in wafers | Jan 22, 1998 | Issued |
Array
(
[id] => 6920769
[patent_doc_number] => 20010028254
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[patent_issue_date] => 2001-10-11
[patent_title] => 'TEST DEVICE FOR FLAT ELECTRONIC ASSEMBLIES'
[patent_app_type] => new
[patent_app_number] => 08/875666
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[firstpage_image] =>[orig_patent_app_number] => 08875666
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/875666 | Test device for flat electronic assemblies | Dec 21, 1997 | Issued |
Array
(
[id] => 4028712
[patent_doc_number] => 05926027
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[patent_issue_date] => 1999-07-20
[patent_title] => 'Apparatus and method for testing a device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/995734 | Apparatus and method for testing a device | Dec 21, 1997 | Issued |
Array
(
[id] => 4077350
[patent_doc_number] => 06069483
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[patent_title] => 'Pickup chuck for multichip modules'
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[firstpage_image] =>[orig_patent_app_number] => 991955
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/991955 | Pickup chuck for multichip modules | Dec 15, 1997 | Issued |
Array
(
[id] => 4033384
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Array
(
[id] => 3952547
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[patent_title] => 'Method and apparatus for continuously monitoring an aqueous flow to detect and quantify ions'
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Array
(
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[patent_title] => 'Test pattern for use in measuring thickness of insulating layer and method for using the same'
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Array
(
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Array
(
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Array
(
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Array
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/953886 | Capacitive rotary position sensor | Oct 19, 1997 | Issued |