
Glenn Warner Brown
Examiner (ID: 8011)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2608, 2607, 2858, 2213 |
| Total Applications | 836 |
| Issued Applications | 762 |
| Pending Applications | 49 |
| Abandoned Applications | 25 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4364831
[patent_doc_number] => 06169395
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-02
[patent_title] => 'Test for determining polarity of electrolytic capacitors within electronic assemblies'
[patent_app_type] => 1
[patent_app_number] => 8/903321
[patent_app_country] => US
[patent_app_date] => 1997-07-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 3885
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/169/06169395.pdf
[firstpage_image] =>[orig_patent_app_number] => 903321
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/903321 | Test for determining polarity of electrolytic capacitors within electronic assemblies | Jul 15, 1997 | Issued |
Array
(
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[patent_doc_number] => 05864238
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-01-26
[patent_title] => 'High speed dynamic run-out testing apparatus and method'
[patent_app_type] => 1
[patent_app_number] => 8/890675
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/890675 | High speed dynamic run-out testing apparatus and method | Jul 8, 1997 | Issued |
Array
(
[id] => 4005009
[patent_doc_number] => 05986459
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-11-16
[patent_title] => 'Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier'
[patent_app_type] => 1
[patent_app_number] => 8/889217
[patent_app_country] => US
[patent_app_date] => 1997-07-08
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Array
(
[id] => 4223902
[patent_doc_number] => 06111398
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-08-29
[patent_title] => 'Method and apparatus for sensing and characterizing particles'
[patent_app_type] => 1
[patent_app_number] => 8/887588
[patent_app_country] => US
[patent_app_date] => 1997-07-03
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/887588 | Method and apparatus for sensing and characterizing particles | Jul 2, 1997 | Issued |
Array
(
[id] => 4011449
[patent_doc_number] => 06005405
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-12-21
[patent_title] => 'Probe plate assembly for high-node-count circuit board test fixtures'
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[patent_app_number] => 8/884689
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/884689 | Probe plate assembly for high-node-count circuit board test fixtures | Jun 29, 1997 | Issued |
Array
(
[id] => 4191302
[patent_doc_number] => 06150825
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-21
[patent_title] => 'Electric circuit board tester'
[patent_app_type] => 1
[patent_app_number] => 8/885976
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/885976 | Electric circuit board tester | Jun 29, 1997 | Issued |
Array
(
[id] => 4199391
[patent_doc_number] => 06043666
[patent_country] => US
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[patent_issue_date] => 2000-03-28
[patent_title] => 'Electroconductive spring contact unit'
[patent_app_type] => 1
[patent_app_number] => 8/884582
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 884582
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/884582 | Electroconductive spring contact unit | Jun 26, 1997 | Issued |
Array
(
[id] => 4255439
[patent_doc_number] => 06137299
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-10-24
[patent_title] => 'Method and apparatus for testing integrated circuit chips'
[patent_app_type] => 1
[patent_app_number] => 8/884276
[patent_app_country] => US
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[pdf_file] => patents/06/137/06137299.pdf
[firstpage_image] =>[orig_patent_app_number] => 884276
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/884276 | Method and apparatus for testing integrated circuit chips | Jun 26, 1997 | Issued |
Array
(
[id] => 3931181
[patent_doc_number] => 05945838
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-08-31
[patent_title] => 'Apparatus for testing circuit boards'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/883552 | Apparatus for testing circuit boards | Jun 25, 1997 | Issued |
Array
(
[id] => 4189102
[patent_doc_number] => 06020750
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-01
[patent_title] => 'Wafer test and burn-in platform using ceramic tile supports'
[patent_app_type] => 1
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[pdf_file] => patents/06/020/06020750.pdf
[firstpage_image] =>[orig_patent_app_number] => 882989
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/882989 | Wafer test and burn-in platform using ceramic tile supports | Jun 25, 1997 | Issued |
Array
(
[id] => 4040134
[patent_doc_number] => 05942889
[patent_country] => US
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[patent_issue_date] => 1999-08-24
[patent_title] => 'Capacitive probe for in situ measurement of wafer DC bias voltage'
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[firstpage_image] =>[orig_patent_app_number] => 878855
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/878855 | Capacitive probe for in situ measurement of wafer DC bias voltage | Jun 19, 1997 | Issued |
Array
(
[id] => 4031118
[patent_doc_number] => RE036217
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-06-01
[patent_title] => 'Top load socket for ball grid array devices'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/927763 | Top load socket for ball grid array devices | Jun 18, 1997 | Issued |
Array
(
[id] => 3965549
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[patent_title] => 'Differential conductivity hemodynamic monitor'
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[firstpage_image] =>[orig_patent_app_number] => 876445
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/876445 | Differential conductivity hemodynamic monitor | Jun 15, 1997 | Issued |
Array
(
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[patent_title] => 'Large area multiple-chip probe assembly and method of making the same'
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Array
(
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[patent_issue_date] => 2001-08-09
[patent_title] => 'MICRO-MECHANICAL PROBES FOR CHARGE SENSING'
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Array
(
[id] => 4411991
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[patent_issue_date] => 2001-08-07
[patent_title] => 'Terminal contact-type IC card having terminal contact fault detector, IC card system using the IC card, and IC for the IC card'
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Array
(
[id] => 4004304
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Array
(
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/870397 | Probe station having environment control chambers with orthogonally flexible lateral wall assembly | Jun 5, 1997 | Issued |