Search

Glenn Warner Brown

Examiner (ID: 8011)

Most Active Art Unit
2858
Art Unit(s)
2608, 2607, 2858, 2213
Total Applications
836
Issued Applications
762
Pending Applications
49
Abandoned Applications
25

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4364831 [patent_doc_number] => 06169395 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-02 [patent_title] => 'Test for determining polarity of electrolytic capacitors within electronic assemblies' [patent_app_type] => 1 [patent_app_number] => 8/903321 [patent_app_country] => US [patent_app_date] => 1997-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3885 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/169/06169395.pdf [firstpage_image] =>[orig_patent_app_number] => 903321 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/903321
Test for determining polarity of electrolytic capacitors within electronic assemblies Jul 15, 1997 Issued
Array ( [id] => 4063307 [patent_doc_number] => 05864238 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-01-26 [patent_title] => 'High speed dynamic run-out testing apparatus and method' [patent_app_type] => 1 [patent_app_number] => 8/890675 [patent_app_country] => US [patent_app_date] => 1997-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 4431 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/864/05864238.pdf [firstpage_image] =>[orig_patent_app_number] => 890675 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/890675
High speed dynamic run-out testing apparatus and method Jul 8, 1997 Issued
Array ( [id] => 4005009 [patent_doc_number] => 05986459 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-16 [patent_title] => 'Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier' [patent_app_type] => 1 [patent_app_number] => 8/889217 [patent_app_country] => US [patent_app_date] => 1997-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 38 [patent_figures_cnt] => 72 [patent_no_of_words] => 17221 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/986/05986459.pdf [firstpage_image] =>[orig_patent_app_number] => 889217 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/889217
Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier Jul 7, 1997 Issued
Array ( [id] => 4223902 [patent_doc_number] => 06111398 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-29 [patent_title] => 'Method and apparatus for sensing and characterizing particles' [patent_app_type] => 1 [patent_app_number] => 8/887588 [patent_app_country] => US [patent_app_date] => 1997-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 20362 [patent_no_of_claims] => 65 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/111/06111398.pdf [firstpage_image] =>[orig_patent_app_number] => 887588 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/887588
Method and apparatus for sensing and characterizing particles Jul 2, 1997 Issued
Array ( [id] => 4011449 [patent_doc_number] => 06005405 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-21 [patent_title] => 'Probe plate assembly for high-node-count circuit board test fixtures' [patent_app_type] => 1 [patent_app_number] => 8/884689 [patent_app_country] => US [patent_app_date] => 1997-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2564 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/005/06005405.pdf [firstpage_image] =>[orig_patent_app_number] => 884689 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/884689
Probe plate assembly for high-node-count circuit board test fixtures Jun 29, 1997 Issued
Array ( [id] => 4191302 [patent_doc_number] => 06150825 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-21 [patent_title] => 'Electric circuit board tester' [patent_app_type] => 1 [patent_app_number] => 8/885976 [patent_app_country] => US [patent_app_date] => 1997-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3601 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/150/06150825.pdf [firstpage_image] =>[orig_patent_app_number] => 885976 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/885976
Electric circuit board tester Jun 29, 1997 Issued
Array ( [id] => 4199391 [patent_doc_number] => 06043666 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-28 [patent_title] => 'Electroconductive spring contact unit' [patent_app_type] => 1 [patent_app_number] => 8/884582 [patent_app_country] => US [patent_app_date] => 1997-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3454 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/043/06043666.pdf [firstpage_image] =>[orig_patent_app_number] => 884582 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/884582
Electroconductive spring contact unit Jun 26, 1997 Issued
Array ( [id] => 4255439 [patent_doc_number] => 06137299 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-24 [patent_title] => 'Method and apparatus for testing integrated circuit chips' [patent_app_type] => 1 [patent_app_number] => 8/884276 [patent_app_country] => US [patent_app_date] => 1997-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 4892 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/137/06137299.pdf [firstpage_image] =>[orig_patent_app_number] => 884276 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/884276
Method and apparatus for testing integrated circuit chips Jun 26, 1997 Issued
Array ( [id] => 3931181 [patent_doc_number] => 05945838 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-31 [patent_title] => 'Apparatus for testing circuit boards' [patent_app_type] => 1 [patent_app_number] => 8/883552 [patent_app_country] => US [patent_app_date] => 1997-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3757 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/945/05945838.pdf [firstpage_image] =>[orig_patent_app_number] => 883552 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/883552
Apparatus for testing circuit boards Jun 25, 1997 Issued
Array ( [id] => 4189102 [patent_doc_number] => 06020750 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-01 [patent_title] => 'Wafer test and burn-in platform using ceramic tile supports' [patent_app_type] => 1 [patent_app_number] => 8/882989 [patent_app_country] => US [patent_app_date] => 1997-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 5559 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/020/06020750.pdf [firstpage_image] =>[orig_patent_app_number] => 882989 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/882989
Wafer test and burn-in platform using ceramic tile supports Jun 25, 1997 Issued
Array ( [id] => 4040134 [patent_doc_number] => 05942889 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-24 [patent_title] => 'Capacitive probe for in situ measurement of wafer DC bias voltage' [patent_app_type] => 1 [patent_app_number] => 8/878855 [patent_app_country] => US [patent_app_date] => 1997-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 2286 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/942/05942889.pdf [firstpage_image] =>[orig_patent_app_number] => 878855 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/878855
Capacitive probe for in situ measurement of wafer DC bias voltage Jun 19, 1997 Issued
Array ( [id] => 4031118 [patent_doc_number] => RE036217 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-01 [patent_title] => 'Top load socket for ball grid array devices' [patent_app_type] => 2 [patent_app_number] => 8/927763 [patent_app_country] => US [patent_app_date] => 1997-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1924 [patent_no_of_claims] => 63 [patent_no_of_ind_claims] => 57 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/RE/036/RE036217.pdf [firstpage_image] =>[orig_patent_app_number] => 927763 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/927763
Top load socket for ball grid array devices Jun 18, 1997 Issued
Array ( [id] => 3965549 [patent_doc_number] => 05900726 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-05-04 [patent_title] => 'Differential conductivity hemodynamic monitor' [patent_app_type] => 1 [patent_app_number] => 8/876445 [patent_app_country] => US [patent_app_date] => 1997-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 6857 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 18 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/900/05900726.pdf [firstpage_image] =>[orig_patent_app_number] => 876445 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/876445
Differential conductivity hemodynamic monitor Jun 15, 1997 Issued
Array ( [id] => 3956658 [patent_doc_number] => 05977787 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-02 [patent_title] => 'Large area multiple-chip probe assembly and method of making the same' [patent_app_type] => 1 [patent_app_number] => 8/876664 [patent_app_country] => US [patent_app_date] => 1997-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3315 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/977/05977787.pdf [firstpage_image] =>[orig_patent_app_number] => 876664 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/876664
Large area multiple-chip probe assembly and method of making the same Jun 15, 1997 Issued
Array ( [id] => 6959755 [patent_doc_number] => 20010011887 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-08-09 [patent_title] => 'MICRO-MECHANICAL PROBES FOR CHARGE SENSING' [patent_app_type] => new [patent_app_number] => 08/873819 [patent_app_country] => US [patent_app_date] => 1997-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3402 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20010011887.pdf [firstpage_image] =>[orig_patent_app_number] => 08873819 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/873819
Micro-mechanical probes for charge sensing Jun 11, 1997 Issued
Array ( [id] => 4411991 [patent_doc_number] => 06271675 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-07 [patent_title] => 'Terminal contact-type IC card having terminal contact fault detector, IC card system using the IC card, and IC for the IC card' [patent_app_type] => 1 [patent_app_number] => 8/872989 [patent_app_country] => US [patent_app_date] => 1997-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7484 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/271/06271675.pdf [firstpage_image] =>[orig_patent_app_number] => 872989 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/872989
Terminal contact-type IC card having terminal contact fault detector, IC card system using the IC card, and IC for the IC card Jun 10, 1997 Issued
Array ( [id] => 4004304 [patent_doc_number] => 05923172 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-07-13 [patent_title] => 'Penning type gauge head with ignition aid' [patent_app_type] => 1 [patent_app_number] => 8/849506 [patent_app_country] => US [patent_app_date] => 1997-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 967 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/923/05923172.pdf [firstpage_image] =>[orig_patent_app_number] => 849506 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/849506
Penning type gauge head with ignition aid Jun 9, 1997 Issued
Array ( [id] => 3931063 [patent_doc_number] => 05945831 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-31 [patent_title] => 'Volume charge density measuring system' [patent_app_type] => 1 [patent_app_number] => 8/872875 [patent_app_country] => US [patent_app_date] => 1997-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 6935 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/945/05945831.pdf [firstpage_image] =>[orig_patent_app_number] => 872875 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/872875
Volume charge density measuring system Jun 9, 1997 Issued
Array ( [id] => 3946213 [patent_doc_number] => 05973500 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-26 [patent_title] => 'Apparatus for detecting insulation defects in devices connected into power distribution networks' [patent_app_type] => 1 [patent_app_number] => 8/871675 [patent_app_country] => US [patent_app_date] => 1997-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3183 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 219 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/973/05973500.pdf [firstpage_image] =>[orig_patent_app_number] => 871675 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/871675
Apparatus for detecting insulation defects in devices connected into power distribution networks Jun 8, 1997 Issued
Array ( [id] => 4019021 [patent_doc_number] => 05963027 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-05 [patent_title] => 'Probe station having environment control chambers with orthogonally flexible lateral wall assembly' [patent_app_type] => 1 [patent_app_number] => 8/870397 [patent_app_country] => US [patent_app_date] => 1997-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2301 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/963/05963027.pdf [firstpage_image] =>[orig_patent_app_number] => 870397 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/870397
Probe station having environment control chambers with orthogonally flexible lateral wall assembly Jun 5, 1997 Issued
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