Search

Gordon J. Stock Jr.

Examiner (ID: 2049, Phone: (571)272-2431 , Office: P/2886 )

Most Active Art Unit
2877
Art Unit(s)
2886, 2877
Total Applications
1615
Issued Applications
1275
Pending Applications
105
Abandoned Applications
256

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20467584 [patent_doc_number] => 12523619 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-13 [patent_title] => Method and device of inspecting surface of interconnect structure [patent_app_type] => utility [patent_app_number] => 18/604508 [patent_app_country] => US [patent_app_date] => 2024-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 1147 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18604508 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/604508
Method and device of inspecting surface of interconnect structure Mar 13, 2024 Issued
Array ( [id] => 20929700 [patent_doc_number] => 12723869 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-09-01 [patent_title] => Clearance measuring apparatus [patent_app_type] => utility [patent_app_number] => 18/584974 [patent_app_country] => US [patent_app_date] => 2024-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 0 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18584974 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/584974
CLEARANCE MEASURING APPARATUS Feb 21, 2024 Pending
Array ( [id] => 19911262 [patent_doc_number] => 12287470 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-04-29 [patent_title] => Dark field microscope [patent_app_type] => utility [patent_app_number] => 18/441710 [patent_app_country] => US [patent_app_date] => 2024-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 18 [patent_no_of_words] => 4863 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18441710 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/441710
Dark field microscope Feb 13, 2024 Issued
Array ( [id] => 20387808 [patent_doc_number] => 12487533 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-02 [patent_title] => Amplitude asymmetry measurements in overlay metrology [patent_app_type] => utility [patent_app_number] => 18/422668 [patent_app_country] => US [patent_app_date] => 2024-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 10217 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18422668 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/422668
Amplitude asymmetry measurements in overlay metrology Jan 24, 2024 Issued
Array ( [id] => 19521991 [patent_doc_number] => 12123705 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-22 [patent_title] => Combiner alignment detector [patent_app_type] => utility [patent_app_number] => 18/421517 [patent_app_country] => US [patent_app_date] => 2024-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5479 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18421517 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/421517
Combiner alignment detector Jan 23, 2024 Issued
Array ( [id] => 20959633 [patent_doc_number] => 12730062 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-09-08 [patent_title] => Polarizer and analyzer configuration optimization method and polarizing and analyzing system [patent_app_type] => utility [patent_app_number] => 18/415388 [patent_app_country] => US [patent_app_date] => 2024-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 19 [patent_no_of_words] => 11557 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 314 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18415388 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/415388
POLARIZER AND ANALYZER CONFIGURATION OPTIMIZATION METHOD AND POLARIZING AND ANALYZING SYSTEM Jan 16, 2024 Pending
Array ( [id] => 19319505 [patent_doc_number] => 20240241048 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-18 [patent_title] => SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER [patent_app_type] => utility [patent_app_number] => 18/413139 [patent_app_country] => US [patent_app_date] => 2024-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 18000 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 238 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18413139 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/413139
SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER Jan 15, 2024 Pending
Array ( [id] => 20101147 [patent_doc_number] => 20250231083 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-17 [patent_title] => MULTIPLE MAGNIFICATION INSPECTION OF DUTS [patent_app_type] => utility [patent_app_number] => 18/412079 [patent_app_country] => US [patent_app_date] => 2024-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6752 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18412079 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/412079
MULTIPLE MAGNIFICATION INSPECTION OF DUTS Jan 11, 2024 Pending
Array ( [id] => 19302665 [patent_doc_number] => 20240231244 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-11 [patent_title] => MEASURING DEVICE AND MEASURING METHOD [patent_app_type] => utility [patent_app_number] => 18/405339 [patent_app_country] => US [patent_app_date] => 2024-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7350 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18405339 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/405339
Measuring device and measuring method Jan 4, 2024 Issued
Array ( [id] => 19390565 [patent_doc_number] => 20240280435 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-22 [patent_title] => OPTICAL MEASUREMENT APPARATUS [patent_app_type] => utility [patent_app_number] => 18/402505 [patent_app_country] => US [patent_app_date] => 2024-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7368 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18402505 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/402505
Optical measurement apparatus Jan 1, 2024 Issued
Array ( [id] => 19101003 [patent_doc_number] => 20240120231 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-11 [patent_title] => OFFSET ALIGNMENT AND REPAIR IN MICRO DEVICE TRANSFER [patent_app_type] => utility [patent_app_number] => 18/390304 [patent_app_country] => US [patent_app_date] => 2023-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2966 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18390304 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/390304
Offset alignment and repair in micro device transfer Dec 19, 2023 Issued
Array ( [id] => 20316614 [patent_doc_number] => 12455158 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-28 [patent_title] => Metrology system with high speed position and orientation tracking mode [patent_app_type] => utility [patent_app_number] => 18/542066 [patent_app_country] => US [patent_app_date] => 2023-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 29 [patent_no_of_words] => 16288 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 290 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18542066 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/542066
Metrology system with high speed position and orientation tracking mode Dec 14, 2023 Issued
Array ( [id] => 19084044 [patent_doc_number] => 20240110845 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-04 [patent_title] => Fiber Span Characterization Utilizing Paired Optical Time Domain Reflectometers [patent_app_type] => utility [patent_app_number] => 18/530940 [patent_app_country] => US [patent_app_date] => 2023-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6127 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 275 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18530940 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/530940
Fiber span characterization utilizing paired optical time domain reflectometers Dec 5, 2023 Issued
Array ( [id] => 19052673 [patent_doc_number] => 20240094642 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY [patent_app_type] => utility [patent_app_number] => 18/520244 [patent_app_country] => US [patent_app_date] => 2023-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7267 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18520244 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/520244
System and method for determining post bonding overlay Nov 26, 2023 Issued
Array ( [id] => 19035452 [patent_doc_number] => 20240085267 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-14 [patent_title] => Method and Device for Detecting Absolute or Relative Temperature and/or Absolute or Relative Wavelength [patent_app_type] => utility [patent_app_number] => 18/388307 [patent_app_country] => US [patent_app_date] => 2023-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10059 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 564 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18388307 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/388307
Method and device for detecting absolute or relative temperature and/or absolute or relative wavelength Nov 8, 2023 Issued
Array ( [id] => 18956311 [patent_doc_number] => 20240044638 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-08 [patent_title] => METHODS AND APPARATUS TO DETERMINE A SHAPE OF AN OPTICAL FIBER SENSOR [patent_app_type] => utility [patent_app_number] => 18/382315 [patent_app_country] => US [patent_app_date] => 2023-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12479 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18382315 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/382315
Methods and apparatus to determine a shape of an optical fiber sensor Oct 19, 2023 Issued
Array ( [id] => 19991914 [patent_doc_number] => 20250130136 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-24 [patent_title] => Optical Time Domain Reflectometry (OTDR) Device And Methods [patent_app_type] => utility [patent_app_number] => 18/490045 [patent_app_country] => US [patent_app_date] => 2023-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1212 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18490045 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/490045
Optical time domain reflectometry (OTDR) device and methods Oct 18, 2023 Issued
Array ( [id] => 19114355 [patent_doc_number] => 20240126105 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-18 [patent_title] => MEASUREMENT SYSTEM FOR MEASURING A POSITION OF AN EYEBOX OF A VIRTUAL IMAGE AND METHOD FOR MEASURING A POSITION OF AN EYEBOX OF A VIRTUAL IMAGE [patent_app_type] => utility [patent_app_number] => 18/485280 [patent_app_country] => US [patent_app_date] => 2023-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9466 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18485280 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/485280
Measurement system for measuring a position of an eyebox of a virtual image and method for measuring a position of an eyebox of a virtual image Oct 10, 2023 Issued
Array ( [id] => 20145327 [patent_doc_number] => 12379669 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-05 [patent_title] => Massive overlay metrology sampling with multiple measurement columns [patent_app_type] => utility [patent_app_number] => 18/376703 [patent_app_country] => US [patent_app_date] => 2023-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 8701 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 216 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18376703 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/376703
Massive overlay metrology sampling with multiple measurement columns Oct 3, 2023 Issued
Array ( [id] => 20897526 [patent_doc_number] => 12704790 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-08-11 [patent_title] => System and method for determining overlay measurement of a scanning target [patent_app_type] => utility [patent_app_number] => 18/372444 [patent_app_country] => US [patent_app_date] => 2023-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 18 [patent_no_of_words] => 6461 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 228 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18372444 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/372444
SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING TARGET Sep 24, 2023 Pending
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